DE502008002730D1 - CONTROLLING OPERATION OF A COORDINATE MEASURING DEVICE - Google Patents
CONTROLLING OPERATION OF A COORDINATE MEASURING DEVICEInfo
- Publication number
- DE502008002730D1 DE502008002730D1 DE502008002730T DE502008002730T DE502008002730D1 DE 502008002730 D1 DE502008002730 D1 DE 502008002730D1 DE 502008002730 T DE502008002730 T DE 502008002730T DE 502008002730 T DE502008002730 T DE 502008002730T DE 502008002730 D1 DE502008002730 D1 DE 502008002730D1
- Authority
- DE
- Germany
- Prior art keywords
- operational parameter
- value
- component
- measuring device
- sequence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0426—Programming the control sequence
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
In a method for controlling an operation of a coordinate measuring device, at least one operational parameter is determined. One value of the operational parameter is allocated to a plurality of components. A sequence for determining the operational parameter is provided for the majority of the components. The method for determining the operational parameter in the predetermined sequence for each component is now described. It starts with the component that is first in the sequence: i) if the value of the operational parameter is allocated to the component, the value is adopted as a value of the operational parameter that is available for the operation, ii) if no value of the operational parameter is allocated to the components, one available value of the operational parameter that was available until then still remains available, iii) if another component is provided in the sequence, the method is carried out with the component.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102007004423A DE102007004423A1 (en) | 2007-01-23 | 2007-01-23 | Control of an operation of a coordinate measuring machine |
PCT/EP2008/000408 WO2008089929A1 (en) | 2007-01-23 | 2008-01-21 | Control of an operation of a coordinate measuring device |
Publications (1)
Publication Number | Publication Date |
---|---|
DE502008002730D1 true DE502008002730D1 (en) | 2011-04-14 |
Family
ID=39402742
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102007004423A Ceased DE102007004423A1 (en) | 2007-01-23 | 2007-01-23 | Control of an operation of a coordinate measuring machine |
DE502008002730T Active DE502008002730D1 (en) | 2007-01-23 | 2008-01-21 | CONTROLLING OPERATION OF A COORDINATE MEASURING DEVICE |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102007004423A Ceased DE102007004423A1 (en) | 2007-01-23 | 2007-01-23 | Control of an operation of a coordinate measuring machine |
Country Status (6)
Country | Link |
---|---|
US (1) | US8600523B2 (en) |
EP (1) | EP2115538B1 (en) |
JP (1) | JP6016321B2 (en) |
AT (1) | ATE500541T1 (en) |
DE (2) | DE102007004423A1 (en) |
WO (1) | WO2008089929A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5179602B2 (en) * | 2010-02-08 | 2013-04-10 | アンリツ株式会社 | Measurement parameter input control apparatus and method |
DE102010015780A1 (en) | 2010-04-20 | 2011-10-20 | Carl Zeiss Industrielle Messtechnik Gmbh | Operation of a coordinate measuring machine or a machine tool |
EP2384851B1 (en) * | 2010-05-03 | 2018-01-03 | Tesa Sa | Coordinate Measuring System with rotatory adapter |
CH710648A1 (en) * | 2015-01-23 | 2016-07-29 | Erowa Ag | Measuring machine for measuring workpieces. |
EP3537102B1 (en) | 2018-03-05 | 2020-05-13 | Carl Zeiss Industrielle Messtechnik GmbH | Method and assembly for increasing throughput with sufficient accuracy when measuring workpieces |
US11347368B2 (en) * | 2019-05-07 | 2022-05-31 | Hexagon Metrology, Inc. | Automated inspection process for batch production |
CN112082445B (en) * | 2020-09-16 | 2021-11-12 | 湖北恒隆汽车系统集团有限公司 | Detection method and detection device for attenuation change of spiral trajectory of steering screw |
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DE3637410A1 (en) | 1986-11-03 | 1988-05-11 | Zeiss Carl Fa | METHOD FOR MEASURING TURNTABLE DEVIATIONS |
CA1299362C (en) * | 1986-12-10 | 1992-04-28 | Gregory James Mcdonald | Coordinate measuring system |
DE3740070A1 (en) * | 1987-11-26 | 1989-06-08 | Zeiss Carl Fa | TURN SLEWING DEVICE FOR TEST COOKING OF COORDINATE MEASURING DEVICES |
JPH0715715Y2 (en) * | 1989-10-19 | 1995-04-12 | 東芝機械株式会社 | Machine tool position correction device |
JP3065768B2 (en) * | 1992-02-07 | 2000-07-17 | 株式会社日立製作所 | Scanning tunneling microscope, scanning atomic force microscope and similar measuring devices |
DE4245012B4 (en) * | 1992-04-14 | 2004-09-23 | Carl Zeiss | Method for measuring shaped elements on a coordinate measuring machine |
US5753983A (en) * | 1992-06-16 | 1998-05-19 | 1012384 Ontario, Inc. | Multi-function control switch for electrically operating devices |
US5453933A (en) * | 1993-09-08 | 1995-09-26 | Hurco Companies, Inc. | CNC control system |
DE4330873A1 (en) * | 1993-09-13 | 1995-03-16 | Zeiss Carl Fa | Coordinate measuring device with a probe and electronics for processing the probe signal |
EP0650824B1 (en) * | 1993-11-03 | 2000-06-14 | Bridgestone Corporation | Method and apparatus for ablative processing of elastomeric products |
DE4342312A1 (en) * | 1993-12-11 | 1995-06-14 | Zeiss Carl Fa | Method for correcting vibration-related measurement errors in coordinate measuring machines |
DE19529574A1 (en) * | 1995-08-11 | 1997-02-13 | Zeiss Carl Fa | Coordinate measuring device with a control that moves the probe head of the measuring device according to target data |
FR2745649B1 (en) * | 1996-03-01 | 1998-04-30 | Bull Sa | SYSTEM FOR CONFIGURING PRECONFIGURED SOFTWARE ON NETWORK OPEN SYSTEMS IN A DISTRIBUTED ENVIRONMENT AND METHOD IMPLEMENTED BY SUCH A SYSTEM |
DE29612861U1 (en) * | 1996-07-24 | 1996-09-12 | Fa. Carl Zeiss, 89518 Heidenheim | Coordinate measuring device with measurement time optimization |
JPH10103948A (en) * | 1996-09-30 | 1998-04-24 | Tokyo Seimitsu Co Ltd | Method of setting measuring conditions for surface roughness shape measuring apparatus and apparatus therefor |
JPH11156672A (en) * | 1997-08-25 | 1999-06-15 | Yoshiaki Kakino | Numerical control device, and machine tool having it |
DE19809690A1 (en) * | 1998-03-06 | 1999-09-09 | Zeiss Carl Fa | Coordinate measuring device with user guidance |
WO2000012964A1 (en) | 1998-08-28 | 2000-03-09 | Mitutoyo Corporation | Apparatus and method concerning analysis and generation of part program for measuring coordinates and surface properties |
US6198246B1 (en) * | 1999-08-19 | 2001-03-06 | Siemens Energy & Automation, Inc. | Method and apparatus for tuning control system parameters |
US6591146B1 (en) * | 1999-09-16 | 2003-07-08 | Hewlett-Packard Development Company L.C. | Method for learning switching linear dynamic system models from data |
DE10055583B4 (en) * | 1999-12-09 | 2014-06-18 | Heidelberger Druckmaschinen Ag | Method for planning and process control of production processes |
GB0004194D0 (en) * | 2000-02-22 | 2000-04-12 | Nat Power Plc | System and method for monitoring a control process in a process plant |
US6917845B2 (en) * | 2000-03-10 | 2005-07-12 | Smiths Detection-Pasadena, Inc. | Method for monitoring environmental condition using a mathematical model |
US6961625B2 (en) * | 2000-04-04 | 2005-11-01 | Yamaha Hatsudoki Kabushiki Kaisha | Characteristic control device for control subject |
JP2001350571A (en) * | 2000-06-08 | 2001-12-21 | Canon Inc | Controller and control method for device controlled by computer |
JP4170567B2 (en) * | 2000-07-07 | 2008-10-22 | 株式会社ソディック | Machine tool moving device and method of controlling machine tool moving device |
DE10111540A1 (en) * | 2001-03-10 | 2002-09-12 | Zeiss Carl | The coordinate |
ES2250278T3 (en) * | 2001-09-05 | 2006-04-16 | Mikron Comp-Tec Ag | A METHOD AND OPERATOR SUPPORT SYSTEM INTENDED TO HELP AN OPERATOR TO ADJUST MACHINE PARAMETERS. |
JP2003324055A (en) * | 2002-04-30 | 2003-11-14 | Canon Inc | Managing system, managing device, managing method, aligner and control method therefor |
DE10254010B4 (en) * | 2002-11-19 | 2009-01-02 | Siemens Ag | Method for automatic configuration of a parameterization surface of machine tools or production machines |
KR20050009912A (en) * | 2003-07-18 | 2005-01-26 | 삼성전자주식회사 | System for measuring performance |
DE10340363A1 (en) * | 2003-09-02 | 2005-05-25 | Technische Universität Ilmenau | Automatic set-up of optimal parameters method e.g. for lighting, focus, picture sensor, involves determining functional dependence of function goal on k independent measured variables |
DE102004003941A1 (en) * | 2004-01-26 | 2005-08-11 | Carl Zeiss Industrielle Messtechnik Gmbh | Determination of coordinates of a workpiece |
JP4782990B2 (en) * | 2004-05-31 | 2011-09-28 | 株式会社ミツトヨ | Surface scanning measuring device, surface scanning measuring method, surface scanning measuring program, and recording medium |
DE102004045196A1 (en) * | 2004-09-17 | 2006-03-30 | Siemens Ag | Method for adapting parameters of a control or regulating device |
DE102005016019B4 (en) * | 2005-04-07 | 2010-12-09 | Carl Zeiss Industrielle Messtechnik Gmbh | Coordinate measuring system with a touch probe and method for adjusting the sensitivity of the touch probe of the coordinate |
JP2006308476A (en) * | 2005-04-28 | 2006-11-09 | Tokyo Seimitsu Co Ltd | Apparatus for measuring surface roughness/shape |
DE102005032944A1 (en) * | 2005-07-14 | 2007-01-18 | Robert Bosch Gmbh | Method and software system for configuring a modular system |
WO2010078487A2 (en) * | 2008-12-31 | 2010-07-08 | Pacific Bearing Company | Simultaneous integral milling operation machine |
-
2007
- 2007-01-23 DE DE102007004423A patent/DE102007004423A1/en not_active Ceased
-
2008
- 2008-01-21 US US12/524,197 patent/US8600523B2/en active Active
- 2008-01-21 JP JP2009546677A patent/JP6016321B2/en active Active
- 2008-01-21 AT AT08707141T patent/ATE500541T1/en active
- 2008-01-21 DE DE502008002730T patent/DE502008002730D1/en active Active
- 2008-01-21 WO PCT/EP2008/000408 patent/WO2008089929A1/en active Application Filing
- 2008-01-21 EP EP08707141A patent/EP2115538B1/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP2115538B1 (en) | 2011-03-02 |
WO2008089929A1 (en) | 2008-07-31 |
EP2115538A1 (en) | 2009-11-11 |
US20100100199A1 (en) | 2010-04-22 |
US8600523B2 (en) | 2013-12-03 |
ATE500541T1 (en) | 2011-03-15 |
JP2010517020A (en) | 2010-05-20 |
JP6016321B2 (en) | 2016-10-26 |
DE102007004423A1 (en) | 2008-07-31 |
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