DE4135112A1 - High speed pyrometer - has an offset compensation circuit to give rapid and absolute measurement in a wide temp. range - Google Patents

Abstract

A pyrometer, esp. a high speed pyrometer, is used to check the temp. rise at a heated switch contact carrier to check the contact quality, or the temp. ratio and/or particle deposition rate when thermal spraying of particles in a heated medium, or to register the reflected radiation from coated optical components. A pyrometer is also used to determine the voltages at components on a circuit board through their temp. comparisons and temp. loss, and the friction heat generated by drawn metal wires when they are worked into a material. ADVANTAGE - The high speed pyrometer gives a rapid and absolute temp. measurement within a wide temp. range, for industrial applications.

Description

The invention relates to a pyrometer, in particular a High speed pyrometer, with a non-contact working tendency radiation detector, one after the radiation detector switched electrical amplifier device, one of the Radiation detector upstream optics, an operating chip power supply and a control and data acquisition unit direction, preferably a microprocessor or controller.

The invention further relates to various methods, ins special control procedures in which the above Pyro meter can be used in a particularly advantageous manner.

For example, a high-speed pyrometer is off the magazine publication by L. Coslovi et al in Journal of Physics, Part E, Scientific Instruments, Volume 12, from 1979, known as "The high speed pyrometer of IMGC".

The high-speed pyrometer described there has a measuring range of about 1300 to 2000 K, so that a Temperature measurement only from temperatures of around 1000 ° C is possible. Only at such a temperature is sufficient Radiation intensity available from that radiation  Detector of the pyrometer can be registered, with one such radiation intensity may occur drifters appearances due to relatively simple elimi device designs can be renated. The silicon radiation detector used gates are also only in the optical spectral range of about 400 sensitive to 1100 nm, so that is also the reason for this of high temperatures on measurements are possible. The potash The known pyrometer is bridged using a comparative measurement solutions of the radiation intensity of a pilot light in the pyrome ter with the help of a chopper disc. This process is very cumbersome and therefore not quick industrial Soluten temperature measurement can be used.

The invention is therefore based on the object, a ver improved pyrometer, especially a high speed py rometer to indicate the fastest and most accurate solute temperature measurement in a temperature as wide as possible area is possible and can be used industrially.

Furthermore, the object of the invention is to proceed to show sensible solutions in which the fiction moderate pyrometer preferably advantageous as a solution feature can be used.

In solving the problem of the invention, he stands out pyrometer according to the invention by means of an offset compensation circuit before the amplifying the detector output signal Amplifier device.

The pyrometer according to the invention, which with a beam contact detector the temperature of a test object  or its radiation emission, has advantageously an offset compensation circuit in the area of the amplifier ereinrichtung, in which preferably the radiation detector is included, which causes a more accurate temperature measurement solution is possible and the pyrometer according to the invention also under rough industrial conditions.

The offset compensation circuit is preferably at Un suppression of the respective temperature measurement range corresponding signal voltage base level of the radiation detector Emphasis on signal voltage changes (temperature changes provided). This changes the signal voltage are highlighted more strongly and are therefore more precisely reinforced bar and measurable, so that in particular temperature changes of the object to be measured very precisely. This fiction appropriate arrangement can be called a temperature magnifier, because the temperature changes in an excellent temperature range to highlight the measurement accuracy who highlighted the. According to the invention, a temperature resolution of approximately 10 mK can be achieved.

With the aid of the offset compensation circuit according to the invention, the temperature range highlighted with the temperature magnifier can also be changed, so that the temperature range setting can be changed by changing the compensation. This means that the measuring range can be continuously adjusted. Even the falling or rising temperature and its speed can be taken into account when choosing the new measuring range. The offset voltage could be kept constant in a mode 1 after the range change or could be tracked in a mode 2 every sampling cycle. The device provided for control and data acquisition tasks, in particular a microprocessor or controller, can advantageously also be provided for the very precise setting of the offset compensation. In particular, the compensation voltage can be specified with high accuracy with this microcontroller.

To achieve an offset compensation circuit, the Radiation detector in different ways in the area of Amplifier device connected in relation to measuring resistors be. For example, the radiation detector in the Negative feedback branch of an inverting amplifier be switched; a circuit that is characterized by a special high measuring sensitivity.

Other options are radiation detection gate with measuring resistors in series or in form to switch a bridge circuit.

Another alternative is to use the amplifiers direction with at least two amplifiers and one Offset compensation voltage input at the summation point of the provide inverting input of the second amplifier.

There are also other circuit types within the scope of the Invention conceivable.

A next development of the invention provides that the operating voltage supply of the radiation detector and / or the amplifier device via a multiple screening  and / or shielded cable routing and wiring so that the analog part of the electronics is extremely low-interference, low drift, hum and noise can be kept. It is thereby z. B. possible, even at high temperatures of z. B. 1500 ° C the resulting signal voltage with an offset Suppress compensation circuit and so small Voltage or temperature changes of at least 2 K too register and via the subsequent reinforcement To achieve temperature resolution of about 10 mK. The signal- As a result, the noise ratio can be in the range of approximately 50: 1 to be brought. In particular, this also enables measurements at lower temperatures in the range of room temperature and also measurements over longer distances.

The radiation detector according to the invention consists of a photoconductive material such. B. HgCdTe, PbSe, PbS, GaAs, Si, Indium antimonide. Other pyroelectric detectors or Thermophiles can be used. The only thing that matters is that an evaluable electrical voltage with accordingly short rise times for the radiation detector is achieved. The rates of increase of the detectors mentioned are in a range from about 10 nanoseconds to about 10 micro seconds. By using a correspondingly fast ver stronger device, a corresponding analog / digital wall lers can thus sampling times of a Hochge invention speed pyrometer in the range of less than or equal to 36 Microseconds can be achieved.

A next development of the invention provides that  the radiation detector is cooled, preferably with a Peltier element. The first amplifier is preferred stage of the amplifier device to minimize the line length directly on the cooling block of the detector cooling arranges.

The pyrometer according to the invention preferably also has via a measuring device for determining the temperature of the Radiation detector as a reference temperature at the absolute Temperature measurement. Just like the measured crystal temperature The radiation detector can also measure the temperature of the cooling block, the housing and if the cooling block also with a cooling medium is kept at a constant temperature, too the temperature of the cooling medium when determining the to mes send absolute temperature are taken into account. It results a correction for the absolute detector voltage and taking into account the detector temperature, a correction the detector sensitivity.

The functional connection is:
T = f _o (ε _o , T _o ) + f _d (ε _d , T _d ) + f _k (ε _k , T _k ) + f _g (ε _g , T _g ) + f _i (ε _i , T _i ).

T means the temperatures, ε the emissivity, o the measurement object, d the radiation detector, k the cooling block, g the housing and i other influencing variables.

The influences of the individual parts are measured, ge weighted and be in determining the absolute temperature considered.

A next development of the invention provides that the radiation detector is part of a pyrometer head,  which also the optics, possibly the cooling block and the Amplifier device comprises, the pyrometer head a Includes base plate and a housing to reduce the mutual influence are separated.

A next development of the invention provides that an infrared radiation detector is provided, which is also in the Spectral range of radiation in the range from room temperature is sensitive to measurement.

Another development of the invention, for which too independent protection is claimed, provides that by sharp focusing optics design, small detector size and a favorable signal-to-noise ratio due to constant drift poor and low hum power supply, preferably in loading range of 50: 1, a lateral resolution of the detector of less than or equal to 0.1 mm is guaranteed. The optics include preferably anti-reflective lenses with the highest possible transmission and best image quality (corrected lenses). By the Attaching suitable pinhole diaphragms Ratio further improved.

Due to the complexity of the measurement method used for The pyrometer and evaluation via the internal microcontroller. This controls the adjustment control, the measured value recording, the off evaluation, the transmission of measured values, a self-test and a Calibration. As these functions internally and automatically run, the pyrometer according to the invention faces the user which is very user-friendly. Only the  Emissivity and the measuring range specified and it will be the absolute temperature after measurement is displayed. With the mic controllers can be used in production using the invent pyrometers according to the invention directly via signal lines devices and systems. Because the data The pyrome can be present digitally in the microcontroller system system easily into digital measuring, control and regulating circuits to get integrated.

To determine the emissivity to be set the pyrometer according to the invention in a further development Invention for which independent protection is also claimed preferably via a light emission device for irradiation development of the test object with adjustable wavelength, pulse duration and intensity, be equipped and with a device for Detection of the emissivity of the object based on the Object reflected light emission radiation. As radiation Source can be, for example, a laser or a photodiode be seen.

Another development of the invention, for the self Protection is claimed, provides that the invention appropriate pyrometer for determining the temperature via quotas ten or more radiation detectors, which are aligned to the same measurement spot of the measurement object and using filters in different wavelength ranges are sensitive.

With such a quotient pyrometer it is assumed that the Stefan-Boltz  mann distribution function not only for a blackbody radiator, but also applies to the surface to be measured. From the specific charisma of two different ones Wavelengths can be equated to emissivity and elimi be kidneyed, so that the absolute temperature be directly can vote.

Both radiation detectors used for this are in front preferably adjusted via the microcontroller, via a Analog / digital converter read into the microcontroller, and there is based on the signals and other control variables, such as Block and crystal temperature, the quotient formation men.

Another development of the invention, for which too independent protection is claimed, provides that the Py rometer to achieve a line scan over a measurement Spot of the radiation detector changing its position steering device. This can be done with an appropriate optical element can be achieved, for example by poly gon wheels or oscillating mirrors. Come for small excursions but also prisms or lenses in question.

To adjust the pyrometer according to the invention can this via an actuatable detector shutter (shutter) feature that completely closes the opening of the detector can eat. Such a comparison is always preferred made when a high speed measurement started shall be. Since none of the measurement object is closed when the shutter is closed If more radiation falls on the detector, it can then be measured  Reference radiation can be used for zero adjustment. The Shutter can also be equipped with an additional temperature sensor, for example, an NTC or PTC, so that the reference temperature can be specified at the same time.

In a next development of the invention Pyrometer according to the invention via a laser pointer to the Markie tion of the measurement spot of the radiation detector on the measurement object. The laser can be adjusted in that the ent talking optics changed, especially twisted until a maximum signal is emitted at the radiation detector. Such adjustment can also be done fully automatically. The Maximum of the detector signal indicates that the measurement spot on the Radiation detector is sharply imaged, in the same way, how it would be done with an eyepiece.

The optics used in the pyrometer according to the invention is preferably in their setting and / or their components combination changeable. For the targeted change of the opti imaging properties can optical elements such as Mirrors, lenses, filters or attenuation units in the Beam path can be folded or rotated. This will be a extremely variable use of the pyrometer according to the invention possible.

In particular the high speed according to the invention pyrometer is a solution feature for solving various ver suitable driving tasks in a particularly advantageous manner. Here is the scope of the Pyro according to the invention meters scattered.  

A procedure for checking the contact quality of switch con Clocking can be characterized by the fact that the contact tra appropriate carrier is heated and the resulting temp temperature rise on the contact material using a pyrometer will measure.

For soldering, welding, riveting and other joints the quality of contact between the contact material can move and the wearer. The carrier material is preferably by means of radiation, e.g. B. by a laser, he warms and the rapid rise in temperature on the contact material due to the heat transfer from the carrier material to the con tact material is made with a high-speed pyrometer measured according to the invention. Conversely, the arrangement can also be so be built up that the contact material is heated and on the Carrier the temperature increase is measured. The pyrometer and the heat source, for example the laser, can both be on same side of the carrier, for example a contact which, as well as being arranged on different sides. It would also be conceivable, the control procedure with the withdrawal of Heat through the targeted introduction of coolant or -carry out gases.

Overall, with good thermal contact between Trä and contact material the temperature rise faster than in case of bad contact. Thermal and electrical contact can be regarded as equivalent to each other. Each the better the thermal contact surface is formed, the more the electrical contact resistance is better.  

With the method according to the invention, one hundred percent production control, e.g. B. in the manufacture of Contacts for relays, possible. The measuring times can typically around 10 milliseconds to 100 milliseconds lie, so that the quality control directly after the contact material can be attached.

A process to control the manufacturing process at thermal spraying, in which solid particles are heated up in a introduced medium, be melted and never as a coating on a surface to be coated derschlag, is characterized in that the Temperaturver conditions are monitored with a pyrometer.

Thermal spraying represents a high speed operation in which is in a hot flame or a hot Plasma solid particles, for example metals, ceramics, art substances, inorganic and organic compounds become, which melt through the heat transfer and when Impact on the surface to be coated form. For monitoring the substrate or layer temperature temperature during the spraying process becomes high-speed speed pyrometer used. The pyrometer can point towards the coating surface in the middle of the plasma jet or in the edge areas of the plasma jet or across the plasma beam aligned. There can be different physics lical quantities are recorded according to the invention with the pyrometer, e.g. B. the temperature of the layer just created, the Tem temperature of individual particles encountered, heating and  the cooling rates of the particles, the number of particles and the Impact rate and particle size and distribution.

The temperatures with a sampling rate of at for example less than 36 microseconds and a selectable Measuring spot recorded and evaluated on a computer, see above that the specified parameters can be determined. It particles can be detected, for example Reach speeds of 150 to 600 meters per second.

With the procedure according to the invention it is possible perform a process control during plasma spraying and the spraying system to optimize the layer properties from the pyrometer or from a downstream or inte control computer.

A method to control the coating of an opti rule component, the coating being a relatively large ren reflectance and a relatively smaller transmission degree than the material of the optical component, is characterized in that the coating by means of a Radiator irradiated and the transmitted or reflected Radiation is registered with a pyrometer.

For example, window panes are used to avoid the Heat loss is provided with a coating that is high Reflectance and low transmittance in the In owns red. The wavelength range is around 10 up to 5 micrometers. To the quality of such coatings too examine, the inventive method can be applied will. The high speed pyrometer is on one side  arranged of the medium and the radiator can on the same or arranged on the opposite side of the medium will. Accordingly, either the transmi measured or reflected radiation from the emitter. Especially when using the signs mentioned at the beginning ten pyrometers can reflectivity differences or Differences in transmittance can be resolved very finely because the main part of the signal through the offset compensation circuit can be suppressed.

A method of quality testing using electrical This is characterized by components on printed circuit boards from that electrical voltage is applied to the circuit board and the temperature equalization processes, that of temperature fields emanate from the power loss of the construction elements te generated with a high speed pyrometer be followed.

The circuit board is energized, so Tempe fields due to the power loss of the individual components to track men. Either the pyrometer is used for the measurement moved with line-shaped scanning device or the ladder plate. Due to the high scanning speed of the Hochge Speed pyrometers can compensate for temperature be resolved in the microsecond range. It is due to the high sampling rate also possible, the number of such tested Printed circuit boards per unit of time compared to a conventional one Increase test by a factor of 100 to 1000.

An image processing system can follow the pyrometer  be switched, which the tem depicts temperature distribution. Faulty circuit board This can be done by operator intervention or are automatically marked and sorted out. Doing so usually the temperature distribution with a reference line terplatte compared. The decision to sort out one tested circuit board is due to the deviation from the Norm likes.

A method of controlling the production of filiform or flat structures, especially drawn wires, drawing is characterized by the fact that in the manufacture of the structures, in particular heating of the structures caused by friction, is checked with a pyrometer and the manufacturing Process controlled according to the control result or is regulated.

In the production of wires and threads, or also of planar structures, such as foils, are often uniform Temperature is critical in manufacturing for product quality. In the manufacture of e.g. B. metal The sometimes small cross section of e.g. B. 0.2 mm measuring the temperature with standard devices, likewise the metallic shiny surface, which in general has a low emissivity. When pulling wires is the feed, d. H. the wire speed, the cross section reduction in the drawing die and the forming behavior of Bedeu device for the formation of the wire temperature or the structure and thus the product quality. With an inventive  High speed pyrometer can measure and temperature the production process can be optimally controlled. For In addition to a high scanning speed, measurement is small ner measurement spot and a high temperature resolution necessary, Bedin conditions that of the initially described invention Pyrometers can be met.

When applying the method to threads and yarns at Production process or later use in the fabric and Fabric manufacturing is far ahead of wire manufacturing from higher feed speeds. In addition, the Size of the measuring spot, for example, in the order of magnitude below 0.2 mm. The temperatures in the yarn and fabric production are between room temperature and a maximum of approx. 500 ° C for the metallic guide elements. The temperatures on the yarn As a result of the friction between yarns and Metal parts are also temporarily higher.

A pyrometer according to the invention can be used in particular for Monitoring the yarn temperature and thus for quality control insert le. But it is also possible to use mechanical components to monitor the production process so as to be preventive To initiate maintenance measures.

Embodiments from which further inventive Characteristics result are shown in the drawing. It shows gene:

FIG. 1a to 1d different switching possibilities of an offset compensating circuit by engaging them of the radiation detector of a pyrometer according to Inventive in the block diagram,

Fig. 2 is a supplemented by additional components block diagram including the compensation circuit of FIG. 1c,

Figure 3 shows the schematic arrangement of th. Of a pyrometer according to the invention in a test of Schalterkontak,

Fig. 4 shows the temperature as a function of time in the con tact test according to FIG. 3,

Fig. 5 is a schematic arrangement of an inventive SEN pyrometer in a thermal spraying process,

Fig. 6 shows the arrangement of FIG. 5 with modified terausrichtung Pyrome,

Fig. 7 is a temperature-time diagram for the control of accelerator as Figs. 5 or 6,

Fig. 8 and 9 are schematic arrangements of a pyrometer in controlling the coating of an optical component, in particular a window.

Figs. 1a to 1d show different possibilities of an offset compensating circuit.

In the embodiment of FIG. 1a, the radiation detector D is arranged in the negative feedback branch of the amplifier IC of the amplifier device. The circuit also includes measuring resistors R.

In the circuit according to FIG. 1b, the radiation detector D with the measuring resistors R is partly arranged in a bridge circuit.

In the embodiment according to Fig. 1c of the radia tion detector D to the measurement resistor R in series in front of the amplifier IC is connected.

The amplifier device according to FIG. 1d comprises two amplifiers IS1 and IS2 connected in series, the detector signal being applied to the input of the amplifier IS1. In addition to the input coming from the amplifier IS1, the second amplifier IS2 has an input for applying a compensation voltage V _F.

The circuit of FIG. 2 is based on the circuit ge Mäss Fig. 1c. The drawing also shows a voltage supply V, a digital / analog converter D / A, a computer C and a repeater IC between the digital / analog converter and the voltage supply.

Fig. 3 shows a pyrometer P which a carrier T such as a spring contact, a switch is close to a contact K. The carrier T is irradiated and heated by means of a laser L. With the help of the pyrometer P, the temperature rise of the contact material K is controlled by the heat transfer from T to K. It is assumed that good thermal contact between K and T also reflects good electrical contact between K and T.

Fig. 4 shows the temperature curve as a function of time, once as curve 1 with good contact and once as curve 2 with poor contact schematically indicates.

FIGS. 5 and 6 show a pyrometer P in the control of a thermal spraying process, are heated in the solid particles, particles or masses M in a flame or a hot plasma F and are applied as a coating B on a substrate S and there knock down. The pyrometer P is aligned with the coating B in the arrangement of FIG. 5, while it is aligned with the flame F in the arrangement of FIG. 6. In the arrangement shown in FIGS. 5 and 6 can be of the hot plasma gases suppresses the radiation. In this case, the temperatures and the number of individual particles or particle accumulations can be measured or determined.

With the arrangement of FIG. 5 are detected, the flattened, already cooled drops of the particles M on the surface of the substrate within the coating F B, while be detected in the arrangement of FIG. 6 spherical drops or particles M. By comparing the two measurements, a geometric degree of flattening can also be determined, for example.

The pyrometer can be used during plasma spraying A process control can be carried out and the spraying system to optimize the layer properties from the pyrometer or from a downstream or integrated computer to be controlled.

FIGS. 8 and 9 show schematic arrangements of a Py rometers P of an optical carrier material T, for example, a coated sters Fen in controlling the coating. For this purpose, the carrier material T is irradiated with a radiator S, and with the pyrometer P in the arrangement of FIG. 8, the transmittance and with the arrangement of FIG. 9, the reflectance of the carrier material or the coating thereof is determined.

The emitter can be a laser, a discharge lamp or a blackbody. With the aid of the pyrometer, it is possible to clearly assign different layers and layer thicknesses, in particular in relation to the measured transmittance according to FIG. 8. The carrier T to be tested can be scanned area-wide, so that a hundred percent testing of the carrier is possible.

Claims (28)

1. A method for checking the contact quality of switch contacts, characterized in that the contact (K) carrying carrier (T) is heated and the resulting temperature rise in the contact material (K) is measured by means of a pyrometer (P). 2. Procedure for controlling the manufacturing process at thermal spraying, in which solid particles are heated up in a introduced medium, be melted and never as a coating on a surface to be coated hit, characterized, that the temperature conditions and / or the impact rate of the Particles (M) are monitored with a pyrometer (P). 3. Method for checking the coating of an opti rule component, the coating being a relatively large ren reflectance and a relatively smaller transmission degree than the material of the optical component, characterized, that the coating is irradiated by means of an emitter (S) and the transmitted or reflected radiation with a pyro meter (P) is registered. 4. Procedure for quality control of using electrical Components with printed circuit boards,  characterized, that electrical voltage is applied to the circuit board and rapid temperature compensation processes by temperature field assume that the power loss of the components generated with a high speed pyrometer ver be followed. 5. Process of control of manufacture and processing tion of thread-like or flat structures, in particular gezo generic metallic wires or yarns, characterized, that in the manufacture and processing of the structures, ins particular heating of the structures caused by friction controlled by a pyrometer and the manufacturing process ent controlled or regulated according to the control result becomes. 6. pyrometer, in particular high-speed pyrometer, with a non-contact radiation detector, one downstream of the radiation detector electrical amplifier Kereinrichtung, one upstream of the radiation detector Optics, an operating voltage supply and a control and data acquisition device, preferably a micropro processor or controller, preferably for performing a or more of the methods according to the preceding claims che, marked by  an offset compensation circuit in front of the detector amplification device. 7. Pyrometer according to claim 6, characterized in that the radiation detector (D) in the offset compensation scarf tion is involved. 8. Pyrometer according to claim 7, characterized in that the offset compensation circuit to suppress the respective temperature measurement range corresponding signal span Base level of the radiation detector (D) for emphasis the signal voltage changes (temperature changes) pre see is (temperature magnifying glass). 9. Pyrometer according to one of the preceding claims, there characterized in that the microprocessor or controller (C) is provided for controlling the offset compensation. 10. Pyrometer according to one of the preceding claims, there characterized in that the radiation detector (D) in Ge gene coupling branch of the amplifier (IC) is connected. 11. Pyrometer according to one of claims 6 to 9, characterized characterized in that the radiation detector (D) with measuring resistor stands (R) of the offset compensation circuit in series is switched.   12. Pyrometer according to one of claims 6 to 9, characterized characterized in that the radiation detector (D) with Meßwi derstands (R) of the offset compensation circuit in one Bridge circuit is switched. 13. Pyrometer according to one of claims 6 to 9, characterized in that an amplifier circuit with at least two series-connected amplifiers (IS1, IS2) is seen before, with an offset compensation voltage input (V _F ) at the summation point of the inverting input of the two amplifier (IS2). 14. Pyrometer according to one or more of the preceding Claims, characterized in that the operating voltage Supply (V) of the radiation detector (D) and / or the Ver stronger device via a multiple screening and / or one shielded cable routing and wiring. 15. Pyrometer according to one or more of the preceding Claims, characterized in that the radiation detector (D) consists of a photoconductive material. 16. Pyrometer according to one or more of the preceding Claims, characterized in that the radiation detector (D) is preferably cooled by means of a Peltier element. 17. Pyrometer according to claim 16, characterized in  that the first amplifier stage of the amplifier device for Minimize the length of the cable on the cooling block of the detector cooling is arranged. 18. Pyrometer according to one or more of the preceding Claims, characterized in that the radiation detector (D) is part of a pyrometer head, which is also the Optics, if necessary the cooling block and the amplifier direction includes, the pyrometer head a base plate and includes a housing to reduce mutual Influence are separated from each other. 19. Pyrometer according to one or more of the preceding Claims, in particular according to claim 16, characterized net that a measuring device for determining the temperature of the Radiation detector (D) is provided as a reference temperature. 20. Pyrometer, preferably according to one or more of the preceding claims, characterized in that a Amplifier device, an analog / digital converter (A / D) and a radiation detector (D) can be selected which has a sampling time of the pyrometer (P) in the range of less than or equal to 36 microse ensure customers. 21. Pyrometer, preferably according to one or more of the preceding claims, characterized in that a Infrared radiation detector (D) is provided, which also in  Spectral range of radiation in the range from room temperature is sensitive to measurement. 22. Pyrometer, preferably according to one or more of the preceding claims, characterized in that by sharp focusing optics design, small detector dimensions and a favorable signal-to-noise ratio due to constant drift poor and low hum power supply preferably in the area of 50: 1 a lateral resolution of the detector (D) of approximately 0.1 mm is guaranteed. 23. Pyrometer, preferably according to one or more of the preceding claims, characterized in that there is a Light emission device for irradiating the measurement object with adjustable wavelength, pulse duration and intensity includes and a device for recording the emissivity of the object due to the light emission beam reflected by the object lung. 24. Pyrometer, preferably according to one or more of the preceding claims, characterized in that it for Determination of the temperature by forming the quotient over two or has several radiation detectors on the same Measuring spot of the measuring object are aligned and using a filter are sensitive in different wavelength ranges. 25. Pyrometer, preferably according to one or more of the  preceding claims, characterized in that it for Achieving a line scan over the measuring spot of the Radiation detector (D) changing its position steering device. 26. Pyrometer, preferably according to one or more of the preceding claims, characterized by an actuated Detectable shutter (shutter) to balance the Pyro meters (P). 27. Pyrometer, preferably according to one or more of the preceding claims, characterized by a laser pointer for marking the measuring spot of the radiation detector (D) on the measurement object. 28. Pyrometer, preferably according to one or more of the previous claims, characterized by one in their Setting and / or their component combination changeable optics.