DE3855926D1 - Gerät zur messung der dicke oder des spezifischen gewichtes - Google Patents

Gerät zur messung der dicke oder des spezifischen gewichtes

Info

Publication number
DE3855926D1
DE3855926D1 DE3855926T DE3855926T DE3855926D1 DE 3855926 D1 DE3855926 D1 DE 3855926D1 DE 3855926 T DE3855926 T DE 3855926T DE 3855926 T DE3855926 T DE 3855926T DE 3855926 D1 DE3855926 D1 DE 3855926D1
Authority
DE
Germany
Prior art keywords
specific weight
measuring thickness
measuring
thickness
weight
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3855926T
Other languages
English (en)
Other versions
DE3855926T2 (de
Inventor
John W Pettit
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Adaptive Technologies Inc
Original Assignee
Adaptive Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adaptive Technologies Inc filed Critical Adaptive Technologies Inc
Publication of DE3855926D1 publication Critical patent/DE3855926D1/de
Application granted granted Critical
Publication of DE3855926T2 publication Critical patent/DE3855926T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/44—Resins; Plastics; Rubber; Leather
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/24—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE3855926T 1987-03-31 1988-03-31 Gerät zur messung der dicke oder des spezifischen gewichtes Expired - Fee Related DE3855926T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US3263987A 1987-03-31 1987-03-31
PCT/US1988/000975 WO1988007671A1 (en) 1987-03-31 1988-03-31 Thickness/density measuring apparatus

Publications (2)

Publication Number Publication Date
DE3855926D1 true DE3855926D1 (de) 1997-07-03
DE3855926T2 DE3855926T2 (de) 1997-11-20

Family

ID=21866013

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3855926T Expired - Fee Related DE3855926T2 (de) 1987-03-31 1988-03-31 Gerät zur messung der dicke oder des spezifischen gewichtes

Country Status (7)

Country Link
EP (1) EP0308493B1 (de)
JP (1) JPH01503639A (de)
KR (1) KR970007068B1 (de)
AU (1) AU1572488A (de)
CA (1) CA1307056C (de)
DE (1) DE3855926T2 (de)
WO (1) WO1988007671A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5099504A (en) * 1987-03-31 1992-03-24 Adaptive Technologies, Inc. Thickness/density mesuring apparatus
EP0628808B1 (de) * 1993-06-07 1998-05-13 Honeywell Ag Vorrichtung zur Flächengewichtsmessung
NZ538649A (en) 2005-03-07 2006-10-27 Inst Geolog Nuclear Sciences Estimating strengths of wooden supports using gamma rays
CN106610386B (zh) * 2017-03-01 2023-04-07 国家电网公司 基于x射线剂量的干变绕组材质快速鉴别方法及检测装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3016460A (en) * 1958-04-14 1962-01-09 Goodyear Tire & Rubber Method and apparatus for web thickness control
US3562500A (en) * 1968-02-16 1971-02-09 Industrial Nucleonics Corp Composite profile apparatus and method
DE2915472A1 (de) * 1979-04-17 1980-10-23 Polymer Physik Gmbh Verfahren und vorrichtung zur kontinuierlichen massendickenmessung an extrudierten kunststoff-profilen
WO1980002746A1 (en) * 1979-06-07 1980-12-11 Nat Res Dev The detection and determination of species by fluorescence measurements
US4292645A (en) * 1979-10-18 1981-09-29 Picker Corporation Charge splitting resistive layer for a semiconductor gamma camera
US4301366A (en) * 1980-06-06 1981-11-17 Nucleonic Data Systems Chatter detection in thickness measuring gauges and the like

Also Published As

Publication number Publication date
KR970007068B1 (ko) 1997-05-02
AU1572488A (en) 1988-11-02
EP0308493B1 (de) 1997-05-28
KR890700823A (ko) 1989-04-27
DE3855926T2 (de) 1997-11-20
EP0308493A4 (en) 1990-10-10
CA1307056C (en) 1992-09-01
EP0308493A1 (de) 1989-03-29
JPH01503639A (ja) 1989-12-07
WO1988007671A1 (en) 1988-10-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee