DE3687593T2 - METHOD FOR CARRYING OUT THERMAL CHOCKS IN THE ELECTRONICS AREA. - Google Patents

METHOD FOR CARRYING OUT THERMAL CHOCKS IN THE ELECTRONICS AREA.

Info

Publication number
DE3687593T2
DE3687593T2 DE8686105359T DE3687593T DE3687593T2 DE 3687593 T2 DE3687593 T2 DE 3687593T2 DE 8686105359 T DE8686105359 T DE 8686105359T DE 3687593 T DE3687593 T DE 3687593T DE 3687593 T2 DE3687593 T2 DE 3687593T2
Authority
DE
Germany
Prior art keywords
temperatures
carrying
out thermal
distill
cst
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686105359T
Other languages
German (de)
Other versions
DE3687593D1 (en
Inventor
Gianangelo Bargigia
Gerardo Caporiccio
Claudio Tonelli
Luciano Flabbi
Giuseppe Marchionni
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Solvay Specialty Polymers Italy SpA
Original Assignee
Montedison SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Montedison SpA filed Critical Montedison SpA
Publication of DE3687593D1 publication Critical patent/DE3687593D1/en
Application granted granted Critical
Publication of DE3687593T2 publication Critical patent/DE3687593T2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G01M3/22—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators
    • G01M3/226—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Lubricants (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Photovoltaic Devices (AREA)
  • Sealing Material Composition (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Solid-Sorbent Or Filter-Aiding Compositions (AREA)
  • Developing Agents For Electrophotography (AREA)
  • Detergent Compositions (AREA)
  • Polyethers (AREA)

Abstract

Perfluoropolyethers having an average molecular weight higher than 390 and respectively having a kinematic viscosity lower than 8.5 cSt (at 20°C), and such as to distill by not more than 10% at temperatures lower than 140 °C, and by at least 90% at temperatures not higher than 260°C, or, in the case in which the perfluoropolyether does not contain CF-(CF<sub>3</sub>)CF,O units, having a viscosity lower than 18 cSt (at 20°C), and such as to distill by not more than 10% at temperatures lower than 140 °C, and by at least 90% at temperatures not higher than 280°C, are used as the only high-temperature and low- temperature working fluid in the Thermal Shock Tests to which the electronic components are submitted, and at the same time are advantageously used in other tests used in the electronic industry, such as the Gross Leak Test and the Burn in Test, allowing the operators in this field to use one single fluid for a whole set of uses.
DE8686105359T 1985-04-24 1986-04-17 METHOD FOR CARRYING OUT THERMAL CHOCKS IN THE ELECTRONICS AREA. Expired - Lifetime DE3687593T2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT20477/85A IT1201416B (en) 1985-04-24 1985-04-24 PERFLUOROPOLYETERS USED AS FLUIDS FOR TESTING IN ELECTRONICS

Publications (2)

Publication Number Publication Date
DE3687593D1 DE3687593D1 (en) 1993-03-11
DE3687593T2 true DE3687593T2 (en) 1993-07-15

Family

ID=11167529

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686105359T Expired - Lifetime DE3687593T2 (en) 1985-04-24 1986-04-17 METHOD FOR CARRYING OUT THERMAL CHOCKS IN THE ELECTRONICS AREA.

Country Status (13)

Country Link
US (2) US4955726A (en)
EP (1) EP0203348B1 (en)
JP (1) JPH0713236B2 (en)
KR (1) KR950007523B1 (en)
AT (1) ATE85117T1 (en)
AU (1) AU594049B2 (en)
CA (1) CA1272944A (en)
CS (1) CS273174B2 (en)
DE (1) DE3687593T2 (en)
ES (1) ES8900089A1 (en)
IL (1) IL78524A (en)
IT (1) IT1201416B (en)
ZA (1) ZA862863B (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6288561B1 (en) 1988-05-16 2001-09-11 Elm Technology Corporation Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
US5539059A (en) * 1988-09-28 1996-07-23 Exfluor Research Corporation Perfluorinated polyethers
EP0436669A1 (en) * 1988-09-28 1991-07-17 Minnesota Mining And Manufacturing Company Perfluoroacetal and perfluoroketal compounds and use thereof in thermal shock testing
US5506309A (en) * 1988-09-28 1996-04-09 Exfluor Research Corporation Perfluorinates polyethers
US5362919A (en) * 1988-12-02 1994-11-08 Minnesota Mining And Manufacturing Company Direct fluorination process for making perfluorinated organic substances
US5039228A (en) * 1989-11-02 1991-08-13 The United States Of America As Represented By The Secretary Of The Navy Fixtureless environmental stress screening apparatus
IT1237887B (en) * 1989-12-12 1993-06-18 Ausimont Spa PERFLUOROPOLIETEREI LUBRICANTS WITH WEAR PROPERTIES
DE4025348A1 (en) * 1990-08-10 1992-02-13 Hoechst Ag METHOD AND DEVICE FOR THE THERMOSHOCK TEST
EP0522357A1 (en) * 1991-06-28 1993-01-13 Hoechst Aktiengesellschaft Qualitative and quantitative method for testing the hermeticity of hollow bodies
US5369983A (en) * 1992-04-17 1994-12-06 Minnesota Mining And Manufacturing Company Detection medium and method for use in hermetic seal testing
JP3514766B2 (en) * 1994-04-15 2004-03-31 フラマトム アンプ ゲゼルシャフト ミット ベシュレンクテル ハフツング Test solution for testing the functionality of electrical components in power plants
JP4002393B2 (en) * 1997-10-15 2007-10-31 スリーエム カンパニー Use of hydrofluoroethers as test solutions in the testing of electronic components
US20020151527A1 (en) * 2000-12-20 2002-10-17 Benjamin Wiegand Method for reducing acne or improving skin tone
EP1522838B1 (en) * 2003-10-10 2010-09-22 Greatbatch Ltd. Leak testing of hermetic enclosures for implantable energy storage devices
JP4881051B2 (en) * 2005-09-16 2012-02-22 株式会社アドバンテスト Filter unit for conductive fluid detection device and conductive fluid detection device using the same
JP5591806B2 (en) * 2008-09-26 2014-09-17 ソルヴェイ・スペシャルティ・ポリマーズ・イタリー・エッセ・ピ・ア Heat transfer method
WO2012032106A1 (en) 2010-09-10 2012-03-15 Solvay Specialty Polymers Italy S.P.A. Method for transferring heat
DE102020112333A1 (en) 2020-05-07 2021-11-11 Bayerische Motoren Werke Aktiengesellschaft Process for aging an electronic assembly, evaluation process for evaluating the durability of electronic assemblies and electronic assemblies

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3242218A (en) * 1961-03-29 1966-03-22 Du Pont Process for preparing fluorocarbon polyethers
DE1249247B (en) * 1961-04-25 1967-09-07 E. I. Du Pont De Nemours And Company, Wilmington, Del. (V. St. A.) Process for the preparation of perfluoroolefin polyethers
US3665041A (en) * 1967-04-04 1972-05-23 Montedison Spa Perfluorinated polyethers and process for their preparation
GB1226566A (en) * 1967-04-04 1971-03-31
US3761808A (en) * 1970-07-08 1973-09-25 Aai Corp Testing arrangement
JPS4945719A (en) * 1972-09-04 1974-05-01 Fuji Photo Film Co Ltd Ichiganrefukamera no miraakaido nyoru shogekikanshosochi
JPS51132778A (en) * 1975-05-14 1976-11-18 Hitachi Ltd Inspection method of semiconductor apparatus
US4523039A (en) * 1980-04-11 1985-06-11 The University Of Texas Method for forming perfluorocarbon ethers
EP0148482B1 (en) * 1983-12-26 1992-03-25 Daikin Industries, Limited Process for preparing halogen-containing polyether

Also Published As

Publication number Publication date
CS273174B2 (en) 1991-03-12
US4955726A (en) 1990-09-11
JPH0713236B2 (en) 1995-02-15
IT8520477A0 (en) 1985-04-24
ES8900089A1 (en) 1988-12-01
EP0203348B1 (en) 1993-01-27
ATE85117T1 (en) 1993-02-15
AU594049B2 (en) 1990-03-01
ZA862863B (en) 1986-12-30
KR950007523B1 (en) 1995-07-11
JPS626184A (en) 1987-01-13
IT1201416B (en) 1989-02-02
DE3687593D1 (en) 1993-03-11
CA1272944A (en) 1990-08-21
CS298986A2 (en) 1990-07-12
KR860008457A (en) 1986-11-15
EP0203348A3 (en) 1987-01-28
IL78524A (en) 1990-03-19
US5083082A (en) 1992-01-21
EP0203348A2 (en) 1986-12-03
AU5632786A (en) 1986-10-30
ES554257A0 (en) 1988-12-01
IL78524A0 (en) 1986-08-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AUSIMONT S.P.A., MAILAND/MILANO, IT

8328 Change in the person/name/address of the agent

Free format text: BARZ, P., DIPL.-CHEM. DR.RER.NAT., PAT.-ANW., 80803 MUENCHEN