DE3687029D1 - Optische messapparate. - Google Patents

Optische messapparate.

Info

Publication number
DE3687029D1
DE3687029D1 DE8686307065T DE3687029T DE3687029D1 DE 3687029 D1 DE3687029 D1 DE 3687029D1 DE 8686307065 T DE8686307065 T DE 8686307065T DE 3687029 T DE3687029 T DE 3687029T DE 3687029 D1 DE3687029 D1 DE 3687029D1
Authority
DE
Germany
Prior art keywords
measurement
station
photo
array means
graticule
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686307065T
Other languages
English (en)
Other versions
DE3687029T2 (de
Inventor
Philip James Eric Aldred
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hexagon Metrology Ltd
Original Assignee
Tesa Metrology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tesa Metrology Ltd filed Critical Tesa Metrology Ltd
Application granted granted Critical
Publication of DE3687029D1 publication Critical patent/DE3687029D1/de
Publication of DE3687029T2 publication Critical patent/DE3687029T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Communication System (AREA)
DE8686307065T 1985-09-13 1986-09-12 Optische messapparate. Expired - Lifetime DE3687029T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08522750A GB2180640A (en) 1985-09-13 1985-09-13 Optical measurement apparatus

Publications (2)

Publication Number Publication Date
DE3687029D1 true DE3687029D1 (de) 1992-12-03
DE3687029T2 DE3687029T2 (de) 1993-03-04

Family

ID=10585159

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686307065T Expired - Lifetime DE3687029T2 (de) 1985-09-13 1986-09-12 Optische messapparate.

Country Status (5)

Country Link
US (1) US4747689A (de)
EP (1) EP0216587B1 (de)
AT (1) ATE81907T1 (de)
DE (1) DE3687029T2 (de)
GB (1) GB2180640A (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5184307A (en) * 1988-04-18 1993-02-02 3D Systems, Inc. Method and apparatus for production of high resolution three-dimensional objects by stereolithography
US4906098A (en) * 1988-05-09 1990-03-06 Glass Technology Development Corporation Optical profile measuring apparatus
GB9107037D0 (en) * 1991-04-04 1991-05-22 Tesa Metrology Ltd Improvements in or relating to electro-optical measurement apparatus
GB9315843D0 (en) * 1993-07-30 1993-09-15 Litton Uk Ltd Improved machine tool
US5757425A (en) * 1995-12-19 1998-05-26 Eastman Kodak Company Method and apparatus for independently calibrating light source and photosensor arrays
WO2003100127A1 (de) * 2002-05-24 2003-12-04 Sig Technology Ltd. Verfahren und vorrichtung zur plasmabehandlung von werkstücken
US8035094B2 (en) 2002-06-17 2011-10-11 Quest Metrology, LLC Methods for measuring at least one physical characteristic of a component
US8410466B2 (en) * 2002-06-17 2013-04-02 Quest Metrology Group, Llc Non-contact component inspection system
US7745805B2 (en) 2002-06-17 2010-06-29 Johnson Thread-View Systems Product inspection system and a method for implementing same that incorporates a correction factor
US20100259764A1 (en) * 2003-06-13 2010-10-14 Johnson Stanley P Product inspection system and a method for implementing same
DE102004011404A1 (de) * 2004-03-05 2005-09-22 Prüftechnik Dieter Busch AG Messgerät zur Bestimmung der Geradheit von Wellen oder Wellentunneln
US7633635B2 (en) * 2006-08-07 2009-12-15 GII Acquisitions, LLC Method and system for automatically identifying non-labeled, manufactured parts
DE102007038785A1 (de) 2007-08-06 2009-02-19 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Vorrichtung zum Bestimmen von Geometriedaten eines Messobjekts
US7633046B2 (en) * 2007-10-23 2009-12-15 Gii Acquisition Llc Method for estimating thread parameters of a part
US8643717B2 (en) * 2009-03-04 2014-02-04 Hand Held Products, Inc. System and method for measuring irregular objects with a single camera
US8892398B2 (en) * 2010-04-21 2014-11-18 Tesa Sa Optical measurement method and apparatus
JP6247050B2 (ja) * 2013-08-28 2017-12-13 Ｎｅｃプラットフォームズ株式会社 情報処理装置、及び、位置検出方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3856412A (en) * 1973-06-08 1974-12-24 Zygo Corp Optical noncontacting gauge
US4043673A (en) * 1975-04-09 1977-08-23 Autech Corporation Reticle calibrated diameter gauge
US4182259A (en) * 1978-10-04 1980-01-08 The Dow Chemical Company Apparatus for measuring coating thickness on an applicator roll
JPS5654307A (en) * 1979-10-09 1981-05-14 Inoue Japax Res Inc Measuring instrument for work precision
US4490617A (en) * 1979-11-26 1984-12-25 European Electronic Systems Limited Optical width measuring system using two cameras
US4394683A (en) * 1980-06-26 1983-07-19 Diffracto Ltd. New photodetector array based optical measurement systems
US4498778A (en) * 1981-03-30 1985-02-12 Technical Arts Corporation High speed scanning method and apparatus
JPS6014106A (ja) * 1983-07-05 1985-01-24 Koyo Seiko Co Ltd 寸法測定方法とその装置

Also Published As

Publication number Publication date
EP0216587A2 (de) 1987-04-01
DE3687029T2 (de) 1993-03-04
ATE81907T1 (de) 1992-11-15
US4747689A (en) 1988-05-31
GB8522750D0 (en) 1985-10-16
EP0216587B1 (de) 1992-10-28
GB2180640A (en) 1987-04-01
EP0216587A3 (en) 1989-03-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: BROWN & SHARPE LTD., TELFORD, SHROSPIRE, GB