DE3674981D1 - Testschaltung fuer einen differential-kaskaden-spannungsschalter. - Google Patents
Testschaltung fuer einen differential-kaskaden-spannungsschalter.Info
- Publication number
- DE3674981D1 DE3674981D1 DE8686108504T DE3674981T DE3674981D1 DE 3674981 D1 DE3674981 D1 DE 3674981D1 DE 8686108504 T DE8686108504 T DE 8686108504T DE 3674981 T DE3674981 T DE 3674981T DE 3674981 D1 DE3674981 D1 DE 3674981D1
- Authority
- DE
- Germany
- Prior art keywords
- test circuit
- voltage switch
- cascade voltage
- differential cascade
- differential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318541—Scan latches or cell details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318572—Input/Output interfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318577—AC testing, e.g. current testing, burn-in
- G01R31/31858—Delay testing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Tests Of Electronic Circuits (AREA)
- Electronic Switches (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/759,804 US4656417A (en) | 1985-07-29 | 1985-07-29 | Test circuit for differential cascode voltage switch |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3674981D1 true DE3674981D1 (de) | 1990-11-22 |
Family
ID=25057017
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686108504T Expired - Fee Related DE3674981D1 (de) | 1985-07-29 | 1986-06-21 | Testschaltung fuer einen differential-kaskaden-spannungsschalter. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4656417A (de) |
EP (1) | EP0218794B1 (de) |
JP (1) | JPS6228679A (de) |
CA (1) | CA1229384A (de) |
DE (1) | DE3674981D1 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4967151A (en) * | 1988-08-17 | 1990-10-30 | International Business Machines Corporation | Method and apparatus for detecting faults in differential current switching logic circuits |
US4935646A (en) * | 1989-02-22 | 1990-06-19 | International Business Machines Corporation | Fully static CMOS cascode voltage switch logic systems |
US5299136A (en) * | 1991-06-05 | 1994-03-29 | International Business Machines Corp. | Fully testable DCVS circuits with single-track global wiring |
US5448164A (en) * | 1992-12-24 | 1995-09-05 | Delco Electronics Corp. | Electrical test apparatus and method of checking the apparatus |
US5389836A (en) * | 1993-06-04 | 1995-02-14 | International Business Machines Corporation | Branch isolation circuit for cascode voltage switch logic |
US5910730A (en) * | 1996-12-13 | 1999-06-08 | International Business Machines Corporation | Digital circuit noise margin improvement |
US5995010A (en) * | 1997-01-02 | 1999-11-30 | Texas Instruments Incorporated | Output buffer providing testability |
US6104213A (en) * | 1998-03-02 | 2000-08-15 | International Business Machines Corporation | Domino logic circuit having a clocked precharge |
US6097207A (en) * | 1998-08-21 | 2000-08-01 | International Business Machines Corporation | Robust domino circuit design for high stress conditions |
US6181155B1 (en) | 1999-04-28 | 2001-01-30 | International Business Machines Corporation | Method and apparatus for testing dynamic logic using an improved reset pulse |
JP3980560B2 (ja) * | 2002-04-02 | 2007-09-26 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | テスト可能なカスコード回路およびそれをテストする方法 |
CN109522640B (zh) * | 2018-11-14 | 2020-11-27 | 北京航空航天大学 | 基于电流再分配的电路系统级联失效传播路径确定方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4183460A (en) * | 1977-12-23 | 1980-01-15 | Burroughs Corporation | In-situ test and diagnostic circuitry and method for CML chips |
DE2905271A1 (de) * | 1979-02-12 | 1980-08-21 | Philips Patentverwaltung | Integrierte schaltungsanordnung in mos-technik mit feldeffekttransistoren |
JPS57107637A (en) * | 1980-12-25 | 1982-07-05 | Fujitsu Ltd | Ecl integrated circuit |
-
1985
- 1985-07-29 US US06/759,804 patent/US4656417A/en not_active Expired - Fee Related
-
1986
- 1986-05-07 CA CA000508658A patent/CA1229384A/en not_active Expired
- 1986-06-21 DE DE8686108504T patent/DE3674981D1/de not_active Expired - Fee Related
- 1986-06-21 EP EP86108504A patent/EP0218794B1/de not_active Expired
- 1986-06-27 JP JP61149841A patent/JPS6228679A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPS6228679A (ja) | 1987-02-06 |
EP0218794B1 (de) | 1990-10-17 |
CA1229384A (en) | 1987-11-17 |
EP0218794A1 (de) | 1987-04-22 |
US4656417A (en) | 1987-04-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |