DE3482632D1 - Elektronendetektor. - Google Patents

Elektronendetektor.

Info

Publication number
DE3482632D1
DE3482632D1 DE8484307068T DE3482632T DE3482632D1 DE 3482632 D1 DE3482632 D1 DE 3482632D1 DE 8484307068 T DE8484307068 T DE 8484307068T DE 3482632 T DE3482632 T DE 3482632T DE 3482632 D1 DE3482632 D1 DE 3482632D1
Authority
DE
Germany
Prior art keywords
electron detector
electron
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8484307068T
Other languages
English (en)
Inventor
Simon Christopher John Garth
William Charles Nixon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of DE3482632D1 publication Critical patent/DE3482632D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/05—Arrangements for energy or mass analysis
    • H01J2237/053—Arrangements for energy or mass analysis electrostatic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2443—Scintillation detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2448—Secondary particle detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2449—Detector devices with moving charges in electric or magnetic fields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Radiation (AREA)
DE8484307068T 1983-10-17 1984-10-16 Elektronendetektor. Expired - Lifetime DE3482632D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB838327737A GB8327737D0 (en) 1983-10-17 1983-10-17 Electron detector

Publications (1)

Publication Number Publication Date
DE3482632D1 true DE3482632D1 (de) 1990-08-09

Family

ID=10550319

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484307068T Expired - Lifetime DE3482632D1 (de) 1983-10-17 1984-10-16 Elektronendetektor.

Country Status (5)

Country Link
US (1) US4658137A (de)
EP (1) EP0138610B1 (de)
JP (1) JPH068854B2 (de)
DE (1) DE3482632D1 (de)
GB (1) GB8327737D0 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0153963B1 (de) * 1984-02-18 1989-06-21 Leybold Aktiengesellschaft Einrichtung zur Beobachtung von gestreuten Elektronen
US4864228A (en) * 1985-03-15 1989-09-05 Fairchild Camera And Instrument Corporation Electron beam test probe for integrated circuit testing
GB8515250D0 (en) * 1985-06-17 1985-07-17 Texas Instruments Ltd Testing of integrated circuits
FR2584234B1 (fr) * 1985-06-28 1988-12-09 Cameca Testeur de circuit integre a faisceau d'electrons
US4912405A (en) * 1985-08-16 1990-03-27 Schlumberger Technology Corporation Magnetic lens and electron beam deflection system
GB8604181D0 (en) * 1986-02-20 1986-03-26 Texas Instruments Ltd Electron beam apparatus
US4864130A (en) * 1986-06-04 1989-09-05 Arch Development Corporation Photo ion spectrometer
NL8602177A (nl) * 1986-08-27 1988-03-16 Philips Nv Electronen detectie met energie discriminatie.
EP0262365A3 (de) * 1986-09-30 1989-12-27 Siemens Aktiengesellschaft Spektrometer-Detektoranordnung für quantitative Potentialmessungen
DE3638682A1 (de) * 1986-11-13 1988-05-19 Siemens Ag Spektrometerobjektiv fuer korpuskularstrahlmesstechnik
DE3750659T2 (de) * 1986-11-28 1995-02-16 Nippon Telegraph & Telephone Beobachtungsvorrichtung, die geladene teilchenstrahlen verwendet und eine solhe vorrichtung verwendendes oberflächenbeobachtungsverfahren.
GB2201288B (en) * 1986-12-12 1990-08-22 Texas Instruments Ltd Electron beam apparatus
DE3766092D1 (de) * 1986-12-12 1990-12-13 Integrated Circuit Testing Detektoranordnung mit einem detektorobjektiv fuer korpuskularstrahlgeraete.
EP0281743B1 (de) * 1987-02-02 1994-03-30 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Detektorobjectiv für Rastermikroskope
US4786806A (en) * 1987-06-22 1988-11-22 Gaf Corporation Retarding field spectrometer
US4983833A (en) * 1988-11-21 1991-01-08 Siemens Aktiengesellschaft Device for the detecting of charged secondary particles
US4958079A (en) * 1989-02-21 1990-09-18 Galileo Electro-Optics Corps. Detector for scanning electron microscopy apparatus
US5594245A (en) * 1990-10-12 1997-01-14 Hitachi, Ltd. Scanning electron microscope and method for dimension measuring by using the same
US5866904A (en) * 1990-10-12 1999-02-02 Hitachi, Ltd. Scanning electron microscope and method for dimension measuring by using the same
US5412210A (en) * 1990-10-12 1995-05-02 Hitachi, Ltd. Scanning electron microscope and method for production of semiconductor device by using the same
US5155394A (en) * 1991-02-12 1992-10-13 National Semiconductor Corporation Bias distribution circuit and method using FET and bipolar
JP2919170B2 (ja) * 1992-03-19 1999-07-12 株式会社日立製作所 走査電子顕微鏡
GB9719417D0 (en) * 1997-09-13 1997-11-12 Univ York Electron microscope
DE19802848B4 (de) * 1998-01-26 2012-02-02 Display Products Group,Inc. Verfahren und Vorrichtung zum Testen eines Substrats
GB2348048A (en) 1999-03-19 2000-09-20 Shimadzu Research Lab Magnetic immersion lenses
EP1139091B1 (de) * 2000-03-27 2009-08-19 ELLCIE Maintenance GmbH Elektronenspektrometer mit Ablenkeinheit
JP2003068241A (ja) * 2000-11-08 2003-03-07 Seiko Instruments Inc 走査型電子線装置
JP4636897B2 (ja) * 2005-02-18 2011-02-23 株式会社日立ハイテクサイエンスシステムズ 走査電子顕微鏡
DE602005006967D1 (de) * 2005-03-17 2008-07-03 Integrated Circuit Testing Analyse-System und Teilchenstrahlgerät
US7705301B2 (en) * 2006-07-07 2010-04-27 Hermes Microvision, Inc. Electron beam apparatus to collect side-view and/or plane-view image with in-lens sectional detector
US7863563B2 (en) * 2007-03-08 2011-01-04 International Business Machines Corporation Carbon tube for electron beam application
US8222600B2 (en) * 2009-05-24 2012-07-17 El-Mul Technologies Ltd. Charged particle detection system and method
US20110266436A1 (en) * 2010-04-29 2011-11-03 Battelle Energy Alliance, Llc Apparatuses and methods for forming electromagnetic fields
US8502159B2 (en) 2010-04-29 2013-08-06 Battelle Energy Alliance, Llc Apparatuses and methods for generating electric fields
US8759764B2 (en) * 2012-06-29 2014-06-24 Fei Company On-axis detector for charged particle beam system
AU2018273352B2 (en) 2017-05-22 2023-07-27 Howmedica Osteonics Corp. Device for in-situ fabrication process monitoring and feedback control of an electron beam additive manufacturing process
EP3597333A1 (de) 2018-07-19 2020-01-22 Howmedica Osteonics Corporation System und verfahren für prozessinterne elektronenstrahlprofil- und positionsanalysen

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1128107A (en) * 1965-06-23 1968-09-25 Hitachi Ltd Scanning electron microscope
JPS4936496B1 (de) * 1970-04-18 1974-10-01
US3822382A (en) * 1971-08-17 1974-07-02 Jeol Ltd Apparatus for analyzing electron energy
DE2151167C3 (de) * 1971-10-14 1974-05-09 Siemens Ag, 1000 Berlin Und 8000 Muenchen Elektronenstrahl-Mikroanalysator mit Auger-Elektronen-Nachweis
AU521225B2 (en) * 1977-04-19 1982-03-25 Delalande S.A. Alkylenedioxy phenyl derivatives
KR850001390B1 (ko) * 1980-07-31 1985-09-24 니혼 덴시 가부시끼 가이샤 2차 전자 검출장치
JPS586472A (ja) * 1981-07-03 1983-01-14 Fujitsu Ltd 電子ビ−ムによる電圧測定装置
DE3138929A1 (de) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Verbessertes sekundaerelektronen-spektrometer fuer die potentialmessung an einer probe mit einer elektronensonde
DE3138927A1 (de) * 1981-09-30 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Abbildendes spektrometer fuer die elektronenstrahl-messtechnik und elektronenstrahl-messgeraet
US4587425A (en) * 1982-07-16 1986-05-06 Plows Graham S Electron beam apparatus and electron collectors therefor

Also Published As

Publication number Publication date
EP0138610A2 (de) 1985-04-24
US4658137A (en) 1987-04-14
GB8327737D0 (en) 1983-11-16
EP0138610B1 (de) 1990-07-04
JPH068854B2 (ja) 1994-02-02
EP0138610A3 (en) 1986-09-17
JPS60247178A (ja) 1985-12-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee