DE3477265D1 - Method of and apparatus for measuring the transverse moments of the electromagnetic field associated with an optical beam - Google Patents

Method of and apparatus for measuring the transverse moments of the electromagnetic field associated with an optical beam

Info

Publication number
DE3477265D1
DE3477265D1 DE8484113432T DE3477265T DE3477265D1 DE 3477265 D1 DE3477265 D1 DE 3477265D1 DE 8484113432 T DE8484113432 T DE 8484113432T DE 3477265 T DE3477265 T DE 3477265T DE 3477265 D1 DE3477265 D1 DE 3477265D1
Authority
DE
Germany
Prior art keywords
measuring
electromagnetic field
optical beam
field associated
transverse moments
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484113432T
Other languages
English (en)
Inventor
Gianni Coppa
Vita Pietro Di
Umberto Rossi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Optical Technologies Center Srl Turin/torino
Original Assignee
CSELT Centro Studi e Laboratori Telecomunicazioni SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CSELT Centro Studi e Laboratori Telecomunicazioni SpA filed Critical CSELT Centro Studi e Laboratori Telecomunicazioni SpA
Application granted granted Critical
Publication of DE3477265D1 publication Critical patent/DE3477265D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0892—Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
DE8484113432T 1983-11-10 1984-11-07 Method of and apparatus for measuring the transverse moments of the electromagnetic field associated with an optical beam Expired DE3477265D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT68171/83A IT1171039B (it) 1983-11-10 1983-11-10 Procedimento ed apparecchiatura per la misura dei monenti radiali del campo elettromagnetico associato a un fascio ottico

Publications (1)

Publication Number Publication Date
DE3477265D1 true DE3477265D1 (en) 1989-04-20

Family

ID=11308314

Family Applications (2)

Application Number Title Priority Date Filing Date
DE8484113432T Expired DE3477265D1 (en) 1983-11-10 1984-11-07 Method of and apparatus for measuring the transverse moments of the electromagnetic field associated with an optical beam
DE198484113432T Pending DE145936T1 (de) 1983-11-10 1984-11-07 Verfahren und vorrichtung zur messung der transversalmomente des elektromagnetischen feldes in einem optischen strahl.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE198484113432T Pending DE145936T1 (de) 1983-11-10 1984-11-07 Verfahren und vorrichtung zur messung der transversalmomente des elektromagnetischen feldes in einem optischen strahl.

Country Status (6)

Country Link
US (1) US4934819A (de)
EP (1) EP0145936B1 (de)
JP (1) JPH0781908B2 (de)
CA (1) CA1214556A (de)
DE (2) DE3477265D1 (de)
IT (1) IT1171039B (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1182686B (it) * 1985-11-15 1987-10-05 Cselt Centro Studi Lab Telecom Procedimento ed apparecchiatura per la determinazione del raggio modale di fibre ottiche monomodo
US5023445A (en) * 1990-04-27 1991-06-11 Tektronix, Inc. Signal acquisition method and automatic masking system for an OTDR
JP2591758Y2 (ja) * 1991-10-31 1999-03-10 株式会社小松製作所 切粉処理装置
US9304058B2 (en) * 2012-10-09 2016-04-05 Ofs Fitel, Llc Measuring modal content of multi-moded fibers
CN106537086B (zh) * 2016-01-11 2019-02-22 周瑾 用渐变孔径光学积分法测量单模光纤模场直径的方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2179000A (en) * 1938-01-07 1939-11-07 Peter L Tea Area measuring device
US2839149A (en) * 1950-05-19 1958-06-17 Phillips Petroleum Co Method of and apparatus for multiplying and integrating variables
US3910687A (en) * 1972-08-18 1975-10-07 West Electric Co Light control device
US4046929A (en) * 1975-05-09 1977-09-06 Vicon Industries, Inc. Attenuation spot filters manufacturing process
US4037964A (en) * 1976-01-15 1977-07-26 Leeds & Northrup Company Method and apparatus for measuring the sum of the radii of particles in a collection
IT1119485B (it) * 1979-11-15 1986-03-10 Cselt Centro Studi Lab Telecom Perfezionamenti ai metodi determinazione dell indice di rifrazione di fibre ottiche
DE3126356A1 (de) * 1981-07-03 1983-01-20 Siemens AG, 1000 Berlin und 8000 München Verfahren zum pruefen von objekten
GB2133540B (en) * 1982-12-24 1986-04-09 Plessey Co Plc Optical fibre apparatus

Also Published As

Publication number Publication date
EP0145936A3 (en) 1987-05-20
DE145936T1 (de) 1987-10-15
US4934819A (en) 1990-06-19
EP0145936A2 (de) 1985-06-26
IT8368171A0 (it) 1983-11-10
JPS60114725A (ja) 1985-06-21
IT1171039B (it) 1987-06-10
EP0145936B1 (de) 1989-03-15
JPH0781908B2 (ja) 1995-09-06
CA1214556A (en) 1986-11-25

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: OPTICAL TECHNOLOGIES CENTER S.R.L., TURIN/TORINO,

8339 Ceased/non-payment of the annual fee