DE3410350C2 - - Google Patents
Info
- Publication number
- DE3410350C2 DE3410350C2 DE19843410350 DE3410350A DE3410350C2 DE 3410350 C2 DE3410350 C2 DE 3410350C2 DE 19843410350 DE19843410350 DE 19843410350 DE 3410350 A DE3410350 A DE 3410350A DE 3410350 C2 DE3410350 C2 DE 3410350C2
- Authority
- DE
- Germany
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B17/00—Details of cameras or camera bodies; Accessories therefor
- G03B17/18—Signals indicating condition of a camera member or suitability of light
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
- Indication In Cameras, And Counting Of Exposures (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58047644A JPS59172634A (ja) | 1983-03-22 | 1983-03-22 | 写真撮影用顕微鏡 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3410350A1 DE3410350A1 (de) | 1984-10-04 |
DE3410350C2 true DE3410350C2 (da) | 1987-02-26 |
Family
ID=12780949
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19843410350 Granted DE3410350A1 (de) | 1983-03-22 | 1984-03-21 | Kameramikroskop |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS59172634A (da) |
DE (1) | DE3410350A1 (da) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3506492A1 (de) * | 1985-02-23 | 1986-08-28 | Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar | Verfahren und vorrichtung zum eingeben, sichtbarmachen und/oder registrieren eines variablen messfleckes in einen strahlengang einer kamera fuer optische geraete |
JP2548865Y2 (ja) * | 1988-04-21 | 1997-09-24 | 株式会社ニコン | 写真撮影装置を有する顕微鏡 |
JP2543073Y2 (ja) * | 1991-05-08 | 1997-08-06 | オリンパス光学工業株式会社 | オートブラケット機能付き顕微鏡用写真撮影装置 |
IT1279699B1 (it) * | 1995-12-12 | 1997-12-16 | C S O Costruzione Strumenti Of | Microscopio stereoscopico ad ottica convergente con lampada a fessura per la ripresa video |
JP4831877B2 (ja) * | 2001-03-13 | 2011-12-07 | オリンパス株式会社 | 顕微鏡撮影装置 |
DE102006019012A1 (de) * | 2005-11-02 | 2007-05-03 | Volkswagen Ag | Montagestrasse für Werkstücke |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6010297B2 (ja) * | 1976-03-04 | 1985-03-16 | キヤノン株式会社 | カメラの制御装置 |
US4272161A (en) * | 1978-03-20 | 1981-06-09 | Designs For Vision, Inc. | Method of splitting a parallel beam of light at first and second camera locations to provide par focal registration |
-
1983
- 1983-03-22 JP JP58047644A patent/JPS59172634A/ja active Granted
-
1984
- 1984-03-21 DE DE19843410350 patent/DE3410350A1/de active Granted
Also Published As
Publication number | Publication date |
---|---|
DE3410350A1 (de) | 1984-10-04 |
JPH0481169B2 (da) | 1992-12-22 |
JPS59172634A (ja) | 1984-09-29 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
D2 | Grant after examination | ||
8363 | Opposition against the patent | ||
8331 | Complete revocation |