DE3360758D1 - Apparatus for and method of testing the conductive properties of a conductor - Google Patents

Apparatus for and method of testing the conductive properties of a conductor

Info

Publication number
DE3360758D1
DE3360758D1 DE8383102551T DE3360758T DE3360758D1 DE 3360758 D1 DE3360758 D1 DE 3360758D1 DE 8383102551 T DE8383102551 T DE 8383102551T DE 3360758 T DE3360758 T DE 3360758T DE 3360758 D1 DE3360758 D1 DE 3360758D1
Authority
DE
Germany
Prior art keywords
conductor
testing
conductive properties
conductive
properties
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383102551T
Other languages
German (de)
English (en)
Inventor
Stefano Thomas Herman Di
Arnold Halperin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3360758D1 publication Critical patent/DE3360758D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49004—Electrical device making including measuring or testing of device or component part

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DE8383102551T 1982-04-30 1983-03-15 Apparatus for and method of testing the conductive properties of a conductor Expired DE3360758D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/373,318 US4496900A (en) 1982-04-30 1982-04-30 Nonlinearity detection using fault-generated second harmonic

Publications (1)

Publication Number Publication Date
DE3360758D1 true DE3360758D1 (en) 1985-10-17

Family

ID=23471888

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383102551T Expired DE3360758D1 (en) 1982-04-30 1983-03-15 Apparatus for and method of testing the conductive properties of a conductor

Country Status (4)

Country Link
US (1) US4496900A (cg-RX-API-DMAC7.html)
EP (1) EP0094486B1 (cg-RX-API-DMAC7.html)
JP (1) JPS58191973A (cg-RX-API-DMAC7.html)
DE (1) DE3360758D1 (cg-RX-API-DMAC7.html)

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HU210576B (en) * 1986-08-13 1995-05-29 Budapesti Eletromos Muevek Instrument for measuring contact resistance for checking completness of the mains line connections
US4777146A (en) * 1987-02-24 1988-10-11 American Telephone And Telegraph Company, At&T Bell Laboratories Fabrication process involving semi-insulating material
GB8717130D0 (en) * 1987-07-20 1987-08-26 Francais Isolants Braided composite article
US4902960A (en) * 1988-03-17 1990-02-20 Myron Zucker, Inc. Voltage input for harmonimeter, and methods of constructing and utilizing same
US4818947A (en) * 1988-03-17 1989-04-04 Myron Zucker, Inc. Apparatus for measuring harmonic distortion in a conductor, and methods of constructing and utilizing same
US4919971A (en) * 1988-09-23 1990-04-24 International Business Machines Corporation Self-induced repairing of conductor lines
US4868506A (en) * 1988-12-02 1989-09-19 International Business Machines Corporation Defect detection using intermodulation signals
US4940944A (en) * 1989-02-16 1990-07-10 Westinghouse Electric Corp. Cathodic protection analyzer in which the fundamental and odd harmonics of a power line frequency are removed
US4994154A (en) * 1990-02-06 1991-02-19 International Business Machines Corporation High frequency electrochemical repair of open circuits
JPH0816607B2 (ja) * 1990-10-30 1996-02-21 インターナショナル・ビジネス・マシーンズ・コーポレイション 薄膜処理制御方法
US5141602A (en) * 1991-06-18 1992-08-25 International Business Machines Corporation High-productivity method and apparatus for making customized interconnections
US5504434A (en) * 1992-12-18 1996-04-02 International Business Machines Corporation Instrument for the measurement of electrical characteristics during manufacturing processes
US5379630A (en) * 1993-06-28 1995-01-10 Hewlett-Packard Company Thermal conductivity detector
US5469051A (en) * 1994-04-29 1995-11-21 International Business Machines Corp. Electrical defect detector for circuit lines
US5736862A (en) * 1995-06-22 1998-04-07 Genrad, Inc. System for detecting faults in connections between integrated circuits and circuit board traces
US5994905A (en) * 1997-12-02 1999-11-30 Wavetek Corporation Frequency domain reflectometer and method of suppressing harmonics
JP3402221B2 (ja) * 1998-10-20 2003-05-06 株式会社村田製作所 圧電トランス素子のスクリーニング方法
GB0019434D0 (en) * 2000-08-09 2000-09-27 Rolls Royce Plc A device and method for fatigue testing of materials
US8283810B2 (en) 2005-01-21 2012-10-09 C.E. Niehoff & Co. System and method for generator phase signal monitoring and control of electrical current distribution
US8227941B2 (en) 2009-07-23 2012-07-24 C.E. Niehoff & Co. System and method for generator phase signal monitoring and control
JP5415134B2 (ja) * 2009-04-16 2014-02-12 日置電機株式会社 検査装置および検査方法
US8537050B2 (en) * 2009-10-23 2013-09-17 Nokomis, Inc. Identification and analysis of source emissions through harmonic phase comparison
GB201011620D0 (en) * 2010-07-12 2010-08-25 Vivax Metrotech Corp Fault locator
WO2014130806A1 (en) * 2013-02-22 2014-08-28 SmartKable, LLC Method and apparatus for monitoring condition of a splice
US9964583B2 (en) * 2013-02-22 2018-05-08 Smartkable Llc Method and apparatus for predicting life cycle of a splice
US9560737B2 (en) 2015-03-04 2017-01-31 International Business Machines Corporation Electronic package with heat transfer element(s)
US10426037B2 (en) 2015-07-15 2019-09-24 International Business Machines Corporation Circuitized structure with 3-dimensional configuration
US9911012B2 (en) 2015-09-25 2018-03-06 International Business Machines Corporation Overlapping, discrete tamper-respondent sensors
US10098235B2 (en) 2015-09-25 2018-10-09 International Business Machines Corporation Tamper-respondent assemblies with region(s) of increased susceptibility to damage
US9578764B1 (en) 2015-09-25 2017-02-21 International Business Machines Corporation Enclosure with inner tamper-respondent sensor(s) and physical security element(s)
US9591776B1 (en) 2015-09-25 2017-03-07 International Business Machines Corporation Enclosure with inner tamper-respondent sensor(s)
US10175064B2 (en) 2015-09-25 2019-01-08 International Business Machines Corporation Circuit boards and electronic packages with embedded tamper-respondent sensor
US10172239B2 (en) 2015-09-25 2019-01-01 International Business Machines Corporation Tamper-respondent sensors with formed flexible layer(s)
US9894749B2 (en) 2015-09-25 2018-02-13 International Business Machines Corporation Tamper-respondent assemblies with bond protection
US9924591B2 (en) 2015-09-25 2018-03-20 International Business Machines Corporation Tamper-respondent assemblies
US10143090B2 (en) 2015-10-19 2018-11-27 International Business Machines Corporation Circuit layouts of tamper-respondent sensors
US9978231B2 (en) 2015-10-21 2018-05-22 International Business Machines Corporation Tamper-respondent assembly with protective wrap(s) over tamper-respondent sensor(s)
US9913389B2 (en) 2015-12-01 2018-03-06 International Business Corporation Corporation Tamper-respondent assembly with vent structure
US9555606B1 (en) 2015-12-09 2017-01-31 International Business Machines Corporation Applying pressure to adhesive using CTE mismatch between components
US10327343B2 (en) 2015-12-09 2019-06-18 International Business Machines Corporation Applying pressure to adhesive using CTE mismatch between components
US9554477B1 (en) 2015-12-18 2017-01-24 International Business Machines Corporation Tamper-respondent assemblies with enclosure-to-board protection
US9916744B2 (en) 2016-02-25 2018-03-13 International Business Machines Corporation Multi-layer stack with embedded tamper-detect protection
US9904811B2 (en) 2016-04-27 2018-02-27 International Business Machines Corporation Tamper-proof electronic packages with two-phase dielectric fluid
US9881880B2 (en) 2016-05-13 2018-01-30 International Business Machines Corporation Tamper-proof electronic packages with stressed glass component substrate(s)
US9913370B2 (en) 2016-05-13 2018-03-06 International Business Machines Corporation Tamper-proof electronic packages formed with stressed glass
US9858776B1 (en) 2016-06-28 2018-01-02 International Business Machines Corporation Tamper-respondent assembly with nonlinearity monitoring
US10321589B2 (en) 2016-09-19 2019-06-11 International Business Machines Corporation Tamper-respondent assembly with sensor connection adapter
US10299372B2 (en) 2016-09-26 2019-05-21 International Business Machines Corporation Vented tamper-respondent assemblies
US10271424B2 (en) 2016-09-26 2019-04-23 International Business Machines Corporation Tamper-respondent assemblies with in situ vent structure(s)
RU2747611C2 (ru) * 2016-10-19 2021-05-11 Смарткабле, Ллц Способ и устройство для прогнозирования цикла службы сростка
US9999124B2 (en) 2016-11-02 2018-06-12 International Business Machines Corporation Tamper-respondent assemblies with trace regions of increased susceptibility to breaking
US10327329B2 (en) 2017-02-13 2019-06-18 International Business Machines Corporation Tamper-respondent assembly with flexible tamper-detect sensor(s) overlying in-situ-formed tamper-detect sensor
US10448864B1 (en) 2017-02-24 2019-10-22 Nokomis, Inc. Apparatus and method to identify and measure gas concentrations
US11489847B1 (en) 2018-02-14 2022-11-01 Nokomis, Inc. System and method for physically detecting, identifying, and diagnosing medical electronic devices connectable to a network
US10306753B1 (en) 2018-02-22 2019-05-28 International Business Machines Corporation Enclosure-to-board interface with tamper-detect circuit(s)
US11122682B2 (en) 2018-04-04 2021-09-14 International Business Machines Corporation Tamper-respondent sensors with liquid crystal polymer layers

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Publication number Priority date Publication date Assignee Title
US2758276A (en) * 1952-01-10 1956-08-07 Magnetic Analysis Corp Apparatus for the non-destructive testing of magnetizable objects
US3192474A (en) * 1961-03-30 1965-06-29 Texas Instruments Inc Method and apparatus for determining the quality of a weld or solder joint by measurement of the dynamic resistance of the joint
US3299351A (en) * 1964-03-27 1967-01-17 Northern Electric Co Apparatus for detecting faults in buried cables including means for applying a composite signal having fundamental and even harmonic frequency components
US3500188A (en) * 1966-06-02 1970-03-10 Amp Inc Method and means for measuring constriction resistance based on nonlinearity
US3624496A (en) * 1969-12-31 1971-11-30 Nasa Method and apparatus for swept-frequency impedance measurements of welds
US3733545A (en) * 1972-04-13 1973-05-15 Us Navy Method for locating nonlinear mechanical junctions of metallic electrical conductors

Also Published As

Publication number Publication date
JPS58191973A (ja) 1983-11-09
EP0094486B1 (en) 1985-09-11
US4496900A (en) 1985-01-29
JPH0317109B2 (cg-RX-API-DMAC7.html) 1991-03-07
EP0094486A1 (en) 1983-11-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee