DE3280230D1 - METHOD FOR PRODUCING SENSITIVE POSITIVE ELECTRON BEAM RESISTS. - Google Patents

METHOD FOR PRODUCING SENSITIVE POSITIVE ELECTRON BEAM RESISTS.

Info

Publication number
DE3280230D1
DE3280230D1 DE8282302301T DE3280230T DE3280230D1 DE 3280230 D1 DE3280230 D1 DE 3280230D1 DE 8282302301 T DE8282302301 T DE 8282302301T DE 3280230 T DE3280230 T DE 3280230T DE 3280230 D1 DE3280230 D1 DE 3280230D1
Authority
DE
Germany
Prior art keywords
electron beam
positive electron
sensitive positive
beam resists
producing sensitive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8282302301T
Other languages
German (de)
Inventor
Juey H Lai
Richard Douglas
Lloyd Shepherd
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell Inc
Original Assignee
Honeywell Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Inc filed Critical Honeywell Inc
Application granted granted Critical
Publication of DE3280230D1 publication Critical patent/DE3280230D1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/168Finishing the coated layer, e.g. drying, baking, soaking

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Electron Beam Exposure (AREA)
DE8282302301T 1981-05-07 1982-05-06 METHOD FOR PRODUCING SENSITIVE POSITIVE ELECTRON BEAM RESISTS. Expired - Fee Related DE3280230D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26142781A 1981-05-07 1981-05-07

Publications (1)

Publication Number Publication Date
DE3280230D1 true DE3280230D1 (en) 1990-09-20

Family

ID=22993259

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8282302301T Expired - Fee Related DE3280230D1 (en) 1981-05-07 1982-05-06 METHOD FOR PRODUCING SENSITIVE POSITIVE ELECTRON BEAM RESISTS.

Country Status (3)

Country Link
EP (1) EP0064864B1 (en)
JP (1) JPS5858734A (en)
DE (1) DE3280230D1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4389482A (en) * 1981-12-14 1983-06-21 International Business Machines Corporation Process for forming photoresists with strong resistance to reactive ion etching and high sensitivity to mid- and deep UV-light
JPS58110038A (en) * 1981-12-23 1983-06-30 Nec Corp Pattern formation
US4564585A (en) * 1983-11-28 1986-01-14 Magnetic Peripherals, Inc. Process for fabricating negative pressure sliders
DE3433334A1 (en) * 1983-11-28 1985-06-05 Magnetic Peripherals Inc., Minneapolis, Minn. METHOD FOR PRODUCING A VACUUM SLIDE FOR A MAGNETIC HEAD
DE3446074A1 (en) * 1984-12-18 1986-06-19 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen METHOD FOR PRODUCING ROENTGEN RESISTS
JPH0442229A (en) * 1990-06-08 1992-02-12 Fujitsu Ltd Resist material and pattern forming method

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3914462A (en) * 1971-06-04 1975-10-21 Hitachi Ltd Method for forming a resist mask using a positive electron resist
US4011351A (en) * 1975-01-29 1977-03-08 International Business Machines Corporation Preparation of resist image with methacrylate polymers
US3984582A (en) * 1975-06-30 1976-10-05 Ibm Method for preparing positive resist image
JPS5934296B2 (en) * 1976-06-16 1984-08-21 松下電器産業株式会社 Electron beam resist and its usage
US4087569A (en) * 1976-12-20 1978-05-02 International Business Machines Corporation Prebaking treatment for resist mask composition and mask making process using same
JPS5381114A (en) * 1976-12-25 1978-07-18 Toshiba Corp Radiation sensitive material

Also Published As

Publication number Publication date
EP0064864A1 (en) 1982-11-17
JPS5858734A (en) 1983-04-07
EP0064864B1 (en) 1989-12-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee