DE3261786D1 - System for testing and indicating the operating condition of a logic circuit - Google Patents

System for testing and indicating the operating condition of a logic circuit

Info

Publication number
DE3261786D1
DE3261786D1 DE8282400124T DE3261786T DE3261786D1 DE 3261786 D1 DE3261786 D1 DE 3261786D1 DE 8282400124 T DE8282400124 T DE 8282400124T DE 3261786 T DE3261786 T DE 3261786T DE 3261786 D1 DE3261786 D1 DE 3261786D1
Authority
DE
Germany
Prior art keywords
testing
indicating
logic circuit
operating condition
condition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8282400124T
Other languages
German (de)
English (en)
Inventor
Andre Laviron
Claude Berard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Application granted granted Critical
Publication of DE3261786D1 publication Critical patent/DE3261786D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE8282400124T 1981-01-27 1982-01-22 System for testing and indicating the operating condition of a logic circuit Expired DE3261786D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8101463A FR2498763A1 (fr) 1981-01-27 1981-01-27 Systeme de test et de visualisation d'etats de fonctionnement d'un circuit logique

Publications (1)

Publication Number Publication Date
DE3261786D1 true DE3261786D1 (en) 1985-02-21

Family

ID=9254545

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8282400124T Expired DE3261786D1 (en) 1981-01-27 1982-01-22 System for testing and indicating the operating condition of a logic circuit

Country Status (4)

Country Link
EP (1) EP0057147B1 (https=)
JP (1) JPS57147072A (https=)
DE (1) DE3261786D1 (https=)
FR (1) FR2498763A1 (https=)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3562644A (en) * 1968-06-14 1971-02-09 Nicholas De Wolf Circuit tester providing circuit-selected test parameters
US3881260A (en) * 1973-07-05 1975-05-06 James M Hombs Self-teaching machine for binary logic
US3924181A (en) * 1973-10-16 1975-12-02 Hughes Aircraft Co Test circuitry employing a cyclic code generator

Also Published As

Publication number Publication date
FR2498763A1 (fr) 1982-07-30
EP0057147A1 (fr) 1982-08-04
JPS57147072A (en) 1982-09-10
FR2498763B1 (https=) 1983-02-18
EP0057147B1 (fr) 1985-01-09

Similar Documents

Publication Publication Date Title
EP0182388A3 (en) Logic circuit test probe
DE3377810D1 (en) Critical temperature indicator
GB2098323B (en) Indicator device
GB2108278B (en) Test signal reloader
GB2110391B (en) Fault location and diagnosis
GB2127603B (en) Alarm system test circuits
GB2104697B (en) Testing systems
IE823101L (en) Test circuit
JPS57161668A (en) Inspection and evaluation circuit for proximity switch
GB8426074D0 (en) Well completion and testing system
DE3276990D1 (en) Josephson-junction logic circuit
DE3274299D1 (en) Fertility indicator system
DE3274040D1 (en) An integrated logic circuit
JPS57207430A (en) Logic circuit
DE3570290D1 (en) System for testing the proper or bad functioning of a circuit of logic components
ZA824408B (en) Signal conditioning circuit
DE3261786D1 (en) System for testing and indicating the operating condition of a logic circuit
JPS57152100A (en) Operation indicator
DE3264370D1 (en) Procedure and measuring circuit for stopping an elevator
HK50087A (en) Line circuit testing
DE3262367D1 (en) System for testing failure or good functioning of a circuit consisting of logic components
GB2112972B (en) Logic circuit
DE3279891D1 (en) Logic circuit test probe
JPS57194433A (en) Fuse operation indicator
ZA826918B (en) Logic circuits and testing

Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee