DE3174606D1 - Analyzer for measuring laser pulse characteristics - Google Patents

Analyzer for measuring laser pulse characteristics

Info

Publication number
DE3174606D1
DE3174606D1 DE8181101856T DE3174606T DE3174606D1 DE 3174606 D1 DE3174606 D1 DE 3174606D1 DE 8181101856 T DE8181101856 T DE 8181101856T DE 3174606 T DE3174606 T DE 3174606T DE 3174606 D1 DE3174606 D1 DE 3174606D1
Authority
DE
Germany
Prior art keywords
analyzer
laser pulse
measuring laser
pulse characteristics
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8181101856T
Other languages
English (en)
Inventor
Roger E Lund
Michael P Wirick
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Application granted granted Critical
Publication of DE3174606D1 publication Critical patent/DE3174606D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/0014—Monitoring arrangements not otherwise provided for

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE8181101856T 1980-03-31 1981-03-13 Analyzer for measuring laser pulse characteristics Expired DE3174606D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/135,408 US4320462A (en) 1980-03-31 1980-03-31 High speed laser pulse analyzer

Publications (1)

Publication Number Publication Date
DE3174606D1 true DE3174606D1 (en) 1986-06-19

Family

ID=22467977

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8181101856T Expired DE3174606D1 (en) 1980-03-31 1981-03-13 Analyzer for measuring laser pulse characteristics

Country Status (4)

Country Link
US (1) US4320462A (de)
EP (1) EP0036983B1 (de)
JP (1) JPS56154631A (de)
DE (1) DE3174606D1 (de)

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US4490039A (en) * 1980-12-12 1984-12-25 United Technologies Corporation Wave front sensor
JPS57117238A (en) * 1981-01-14 1982-07-21 Nippon Kogaku Kk <Nikon> Exposing and baking device for manufacturing integrated circuit with illuminometer
US4591996A (en) * 1981-05-18 1986-05-27 Vachon Reginald I Apparatus and method for determining stress and strain in pipes, pressure vessels, structural members and other deformable bodies
US4478290A (en) * 1981-08-26 1984-10-23 Orthwein William G Anti-buckling device for mine-roof bolting machines
JPS59112233A (ja) * 1982-11-26 1984-06-28 ナショナル・リサ−チ・ディベロプメント・コ−ポレ−ション 光ビ−ム特性測定装置
US4693600A (en) * 1983-11-01 1987-09-15 Westinghouse Electric Corp. Optical beam analyzer
CA1221557A (en) * 1983-11-01 1987-05-12 Michael A. Cross Optical beam analyzer
US4640620A (en) * 1983-12-29 1987-02-03 Robotic Vision Systems, Inc. Arrangement for rapid depth measurement using lens focusing
US4629324A (en) * 1983-12-29 1986-12-16 Robotic Vision Systems, Inc. Arrangement for measuring depth based on lens focusing
US4657393A (en) * 1983-12-29 1987-04-14 Robotic Vision Systems, Inc. Pattern optimization when measuring depth to a surface using lens focusing
US4658368A (en) * 1985-04-30 1987-04-14 Canadian Patents And Development Limited-Societe Canadienne Des Brevets Et D'exploitation Limitee Peak position detector
US4650321A (en) * 1985-07-05 1987-03-17 The Perkin-Elmer Corporation Spatial/spectral real time imaging
US4760537A (en) * 1985-11-29 1988-07-26 Gte Government Systems Corporation System for analyzing laser beam profiles
US4871250A (en) * 1985-12-19 1989-10-03 Amada Engineering Service Co., Inc. Beam monitor for a high-output laser
US4712914A (en) * 1986-01-10 1987-12-15 Westinghouse Electric Corp. Device for characterizing wide angle beams
US4703994A (en) * 1986-03-24 1987-11-03 Grumman Aerospace Corporation System and method for automatically fabricating multi-hologram optical elements
US4772118A (en) * 1986-07-14 1988-09-20 Gte Laboratories Incorporated Methods of and apparatus for measuring picosecond semiconductor laser pulse duration using the internally generated second harmonic emission accompanying the laser output
US4760257A (en) * 1986-08-22 1988-07-26 Hughes Aircraft Company Apparatus for measuring properties of a laser emission
JP2571054B2 (ja) * 1987-04-28 1997-01-16 キヤノン株式会社 露光装置及び素子製造方法
FR2619475B1 (fr) * 1987-08-10 1990-01-26 Strasbourg Sa Electricite Dispositif d'analyse en mode continu et en mode impulsionnel de la repartition d'energie au sein d'un faisceau laser de puissance
US4792690A (en) * 1987-08-21 1988-12-20 University Of Tennessee Research Corporation Ultraviolet laser beam monitor using radiation responsive crystals
US4764655A (en) * 1987-08-31 1988-08-16 General Electric Company Real-time laser beam diameter determination in a laser-materials processing system
US5495328A (en) * 1988-04-18 1996-02-27 3D Systems, Inc. Apparatus and method for calibrating and normalizing a stereolithographic apparatus
CA1341214C (en) * 1988-04-18 2001-04-10 Stuart Thomas Spence Stereolithographic beam profiling
EP0350595A3 (de) * 1988-07-14 1990-09-05 Oerlikon-Contraves AG Verfahren zum Messen schneller optischer Vorgänge und Vorrichtung dazu
US5017004A (en) * 1988-12-22 1991-05-21 Westinghouse Electric Corp. Multifunction electro-optical system test tool
DE3919571A1 (de) * 1989-06-15 1990-12-20 Diehl Gmbh & Co Vorrichtung zur messung des intensitaetsprofils eines laserstrahls
ES2074248T3 (es) * 1990-06-26 1995-09-01 Strasbourg Elec Dispositivo de analisis de manera continua y a impulsos de la distribucion de energia en el seno de un haz laser de potencia y de alineacion de este ultimo.
US5574479A (en) * 1994-01-07 1996-11-12 Selectech, Ltd. Optical system for determining the roll orientation of a remote unit relative to a base unit
US5576827A (en) * 1994-04-15 1996-11-19 Micromeritics Instrument Corporation Apparatus and method for determining the size distribution of particles by light scattering
JPH0875542A (ja) * 1994-09-05 1996-03-22 Otsuka Denshi Kk 表示画素の光量測定方法並びに表示画面の検査方法及び装置
US5959725A (en) * 1997-07-11 1999-09-28 Fed Corporation Large area energy beam intensity profiler
US5872626A (en) * 1997-09-16 1999-02-16 Lockheed Martin Corporation Consolidated laser alignment and test station
DE10208781B4 (de) * 2002-02-28 2004-02-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zum Bestimmen der Intensitätsverteilung beim Auftreffen eines Laserstrahls auf eine Objektoberfläche
EP1546783A1 (de) * 2002-09-27 2005-06-29 Koninklijke Philips Electronics N.V. Optisches element, verfahren zur herstellung eines solchen elements und verfahren zum ausrichten eines lichtstrahls und eines solchen elements
JP2004184349A (ja) * 2002-12-06 2004-07-02 Sankyo Seiki Mfg Co Ltd 光強度分布計測方法、および光強度分布計測装置
US8928881B2 (en) * 2009-01-23 2015-01-06 University Of Washington Cytometer with automatic continuous alignment correction
TW201416166A (zh) * 2012-10-18 2014-05-01 Max See Industry Co Ltd 加工機之工件檢測方法及其裝置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3619066A (en) * 1969-03-07 1971-11-09 Bell Telephone Labor Inc Beam position and width sensing by scattering
US3612885A (en) * 1969-12-10 1971-10-12 Bell Telephone Labor Inc Gaussian laser beam-waist radius measuring apparatus
US3838284A (en) * 1973-02-26 1974-09-24 Varian Associates Linear particle accelerator system having improved beam alignment and method of operation
US3918812A (en) * 1973-05-07 1975-11-11 Us Energy Diagnoses of disease states by fluorescent measurements utilizing scanning laser beams
US3861801A (en) * 1973-06-18 1975-01-21 Perkin Elmer Corp Device for sampling laser beams
US3879128A (en) * 1973-08-15 1975-04-22 Bell Telephone Labor Inc Method and apparatus for measuring the refractive index and diameter of optical fibers
US4075462A (en) * 1975-01-08 1978-02-21 William Guy Rowe Particle analyzer apparatus employing light-sensitive electronic detector array
US4037959A (en) * 1975-12-15 1977-07-26 The United States Of America As Represented By The Secretary Of The Navy Means for real-time laser source characterization
US4045140A (en) * 1975-12-15 1977-08-30 The United States Of America As Represented By The Secretary Of The Navy Means for near real time C-W laser source characterization
FR2363779A1 (fr) * 1976-09-02 1978-03-31 Iria Procede et appareil optiques pour la determination tridimensionnelle de la forme d'objets a l'aide d'un calculateur
JPS53106078A (en) * 1977-02-26 1978-09-14 Ritsuo Hasumi Luminous radiation angle measuring instrument
US4215694A (en) * 1978-06-01 1980-08-05 Isakov Viktor L Laser therapy apparatus
US4228515A (en) * 1978-06-13 1980-10-14 Sebastian Genna Method and apparatus of digital calibration and position analysis of a radiant emission

Also Published As

Publication number Publication date
EP0036983B1 (de) 1986-05-14
EP0036983A1 (de) 1981-10-07
JPS56154631A (en) 1981-11-30
US4320462A (en) 1982-03-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee