DE3171761D1 - X-ray diffraction camera - Google Patents

X-ray diffraction camera

Info

Publication number
DE3171761D1
DE3171761D1 DE8181300436T DE3171761T DE3171761D1 DE 3171761 D1 DE3171761 D1 DE 3171761D1 DE 8181300436 T DE8181300436 T DE 8181300436T DE 3171761 T DE3171761 T DE 3171761T DE 3171761 D1 DE3171761 D1 DE 3171761D1
Authority
DE
Germany
Prior art keywords
ray diffraction
camera
diffraction camera
sample
gear train
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8181300436T
Other languages
English (en)
Inventor
Vincent John Manners
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commonwealth of Australia
Original Assignee
Commonwealth of Australia
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commonwealth of Australia filed Critical Commonwealth of Australia
Application granted granted Critical
Publication of DE3171761D1 publication Critical patent/DE3171761D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Radiography Using Non-Light Waves (AREA)
DE8181300436T 1980-02-05 1981-02-03 X-ray diffraction camera Expired DE3171761D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AUPE224880 1980-02-05

Publications (1)

Publication Number Publication Date
DE3171761D1 true DE3171761D1 (en) 1985-09-19

Family

ID=3768428

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8181300436T Expired DE3171761D1 (en) 1980-02-05 1981-02-03 X-ray diffraction camera

Country Status (7)

Country Link
US (1) US4413354A (de)
EP (1) EP0034035B1 (de)
JP (1) JPS56132329A (de)
AT (1) ATE14935T1 (de)
AU (1) AU534668B2 (de)
CA (1) CA1151779A (de)
DE (1) DE3171761D1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4573182A (en) * 1983-03-29 1986-02-25 Manners Vincent J X-Ray diffraction camera
GB2169480B (en) * 1985-01-03 1988-12-07 Erno Raumfahrttechnik Gmbh A method of non-destructive testing of structural members
ES2266772T3 (es) * 2002-01-15 2007-03-01 Avantium International B.V. Metodo para realizar analisis de difraccion de polvo.
US20060264294A1 (en) * 2005-05-18 2006-11-23 Summa David L Hypocycloidal drive unit for conversion of rotary to linear motion particularly for use in fiberglass insulation production machinery
JP5879567B2 (ja) * 2011-10-13 2016-03-08 国立研究開発法人物質・材料研究機構 Ｘ線回折試料揺動装置、ｘ線回折装置及びｘ線回折パターンの測定方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1119511A (en) * 1964-10-12 1968-07-10 Exxon Research Engineering Co Elimination of the preferred orientation distortions of an x-ray diffraction pattern
DE1772741A1 (de) * 1968-06-27 1971-06-03 Walter Prof Dr Hoppe Einrichtung fuer die Durchfuehrbarkeit von Roentgenfeinstrukturmessungen mit Diffraktometern mit offener Eulerwiege
US3626185A (en) * 1968-10-10 1971-12-07 Philips Corp X-ray powder camera having a semicylindrical film holder and means to simultaneously rotate a specimen about two mutually perpendicular axes
CA1004375A (en) * 1975-02-28 1977-01-25 Gabrielle Donnay Resolving cone-axis camera

Also Published As

Publication number Publication date
JPS56132329A (en) 1981-10-16
EP0034035A2 (de) 1981-08-19
AU534668B2 (en) 1984-02-09
US4413354A (en) 1983-11-01
AU6683881A (en) 1981-08-13
ATE14935T1 (de) 1985-08-15
EP0034035B1 (de) 1985-08-14
CA1151779A (en) 1983-08-09
EP0034035A3 (en) 1982-01-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee