DE3152081T1 - MEASURING DEVICE FOR DETERMINING THE HARDENING DURATION OF BINDING MATERIALS AND CORE COMPOUNDS - Google Patents

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Claims (1)

j W ": 'Y -Φ ^1. « 88 701-Ιί-61 '1. Measuring device for determining the solidification *: zei ^ frvon binders and core molding compositions which comprise a container used in a heating furnace with a test pattern, a contacted with the test pattern generator for electrophysical parameters, means connected to the heating furnace temperature measuring unit for the heating furnace, and a start-stop unit connected to the container and an indicator electrically coupled to the transmitter for electrophysical parameters of the test sample. The value of the measuring unit having electrophysical parameters for electrophysical parameters of the core molding compound, which are interconnected, contains, because the measuring unit (11) for electrophysical parameters of the test sample additionally has a converter (13) for electrophysical parameters, which is connected to the indicator (12) for the vVert of the electro-physical parameters, the transmitter (7) for electro-physical parameters, the start-stop unit (10) and the temperature measuring unit (9) for the heating furnace is electrically coupled. 2 device according to claim 1, characterized in that that the converter (13) for electrophysical parameters from a series connection one with the transmitter (7) for electrophysical parameters connected signal converter (15) ι a registration unit (16) for the curing time of the test sample, a storage unit (17) »to each of the display units (19) is connected for the information, and one to the registration unit (16) for the curing time the unit (13) connected to the test sample for the flow distance of the electrophysical parameters as well as one to the registration unit (16) for the curing time of the test sample and to the unit (1d) for the distance between the electrophysical parameters connected pulse generator (20) and one to the signal converter (15) »the registration unit (16) for the Hardening time of the YerguohsfflustiQi-a us4 m 41 § collects (17) a connected control unit (21) and a comparison unit (22) coupled to it for the values of the electrophysical parameters, which is sent to the recording unit (16) for the hardening time Test sample and to those with the signal converter (15) connected storage unit (17) is connected. 3 · Device according to claim 2, characterized characterized in that the signal converter (15) one to the encoder (7) for electrophysical Primary converter (23) connected to the parameters and an analog-to-digital converter (25) coupled to this and connected to the control unit (21) a series circuit of a single pulse shaper (31) »a flip-flop (32) t a basic AND circuit (35) and a counter (36) for the curing time of the / application pattern and a series circuit of an additional AND circuit (37)» one input (3d) of which is connected to a further input (39) of the AND basic circuit (35) and to the pulse generator (20), a selector (40) for the elapsed time, a main switch unit (41) and a control circuit (43) for the information output, the other input (53) with the input (5D of the individual pulse shaper Q1) and with the other input (.32) of the counter (36) for the curing time of the test sample together and to the Ste ueinheit (21) is turned on, at the other Input (45) an additional control unit (46) is connected, one input (4d) with a white tere input (47) of the main switch unit (41) together and to a time registration counter (50) at ^ eschal- '? cet is · contains; where the other üanganß (55) des Flip-flops (.32), the other unhang (56) of the additional UNi> switch £ (37) and the other input (57) of the * "* · ^: ""3Ί52081 Counter (40) for the running time to the control unit (21), the output of flip-flop (33) ^ _d i _e storage unit (17), the input (59) of üeitregistrierzählers (50) / far he he input ( 5ö) the additional switch unit (46) and the last input (60) of the control circuit (43) for the information output to the unit (18) for the measuring distance of the electrophysical i-parameters, the signal converter (15) and the comparison unit (22) for the values of the electrophysical parameters are connected 5. Device according to claim 4, characterized in that the memory unit (17) is a series circuit of a main shaper (61) for individual pulses, the input of which is coupled to the flip-flop (52) of the registration unit (16) for the curing time of the test sample, an OR basic circuit (62), a main delay element (67), a flip-flop (63), an additional single pulse shaper (76) and a main storage register (77) , at the other input (03) of which an additional OR circuit (66) is connected, one input of which (64) with the input (65) of the main delay element (67) is interconnected, as well as an additional delay element (72) $ desr.en input (71) with the other input (70) of the flip-flop and connected to the unit (1d) for the ideal spacing of the electrical physical parameters and contains two additional storage registers (d1, ö2), one being , . (registers Input (79) of a memory) to the main former (61) for single pulses and one input (ö4) of the other is connected to the additional OR circuit (66), the other input (oO) of the latter is combined with the input (71) of the additional delay element (72)) furthermore the one Inputs (ö7, ü6, da) of the Haußjispeicherretfister (77) and the additional memory registers (Öl, 02) together and connected to the analog-to-digital converter (Z ^) of the signal converter (15), 0 · öj 3 "ϊ * 52081 ^ another c # a) · input (92) of the OR basic circuit (62) .and. the output of the additional delay element {72) to the comparison unit (22λ for the words around the electrophysical parameter ^, an input (93) of the additional OR circuit (66) is connected to the control unit (21). 6 · Device according to claim 5 »characterized in that the unit (18) for the measuring distance of the electrophysical parameters a series connection of an AND circuit (94), their inputs (IO3, 104) with the pulse generator (20) or with the flip-flop (6ö) of the memory unit (17) are coupled to a counter (95) »aa the one Adjuster (98), the other input (105) of which ^ 5 the additional OR circuit (66) of the memory unit (17) is connected, contains a decipherer (99) and a single pulse shaper (101). 7 · Device according to claim 6, characterized marked that the control unit (21) a main threshold element (106) to which an input (10ö) of an AND basic circuit (110) is connected is, an additional threshold element (107) »to another input (109) of the UUD basic circuit (110) and an input (114) of an additional UriD circuit (115) are connected, one connected to a further input (111) of the AND basic circuit (110) Single pulse shaper (112), one to the input (116) of the single pulse shaper (112) and one • other input (117) of the additional AND circuit (115) connected flip-flop (11S) ¹¹ JSuIe OR circuit (123), one input (121) with. one input (119) of the slip-flop (118) is connected together and to the start-stop unit (10), the other input (122) of the OR circuit (123) at _t the comparison unit (22) for the fourth of the electrophysical parameters, the inputs of the main threshold element (106) and the additional threshold element (107) to the temperature measuring unit (9) for the heating furnace or are connected to the primary converter (23) of the signal converter (15)