DE3063587D1 - Method of making a schottky diode with improved voltage properties - Google Patents

Method of making a schottky diode with improved voltage properties

Info

Publication number
DE3063587D1
DE3063587D1 DE8080400625T DE3063587T DE3063587D1 DE 3063587 D1 DE3063587 D1 DE 3063587D1 DE 8080400625 T DE8080400625 T DE 8080400625T DE 3063587 T DE3063587 T DE 3063587T DE 3063587 D1 DE3063587 D1 DE 3063587D1
Authority
DE
Germany
Prior art keywords
making
schottky diode
voltage properties
improved voltage
improved
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8080400625T
Other languages
German (de)
English (en)
Inventor
Marcel Roche
Jean-Paul Litot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Application granted granted Critical
Publication of DE3063587D1 publication Critical patent/DE3063587D1/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/112—Constructional design considerations for preventing surface leakage or controlling electric field concentration for preventing surface leakage due to surface inversion layers, e.g. by using channel stoppers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00—Diodes
    • H10D8/60—Schottky-barrier diodes 
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/018—Compensation doping
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/139—Schottky barrier
DE8080400625T 1979-06-22 1980-05-08 Method of making a schottky diode with improved voltage properties Expired DE3063587D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7916056A FR2460040A1 (fr) 1979-06-22 1979-06-22 Procede pour realiser une diode schottky a tenue en tension amelioree

Publications (1)

Publication Number Publication Date
DE3063587D1 true DE3063587D1 (en) 1983-07-07

Family

ID=9226970

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8080400625T Expired DE3063587D1 (en) 1979-06-22 1980-05-08 Method of making a schottky diode with improved voltage properties

Country Status (4)

Country Link
US (1) US4310362A (OSRAM)
EP (1) EP0021869B1 (OSRAM)
DE (1) DE3063587D1 (OSRAM)
FR (1) FR2460040A1 (OSRAM)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3124572A1 (de) * 1981-06-23 1982-12-30 Siemens AG, 1000 Berlin und 8000 München Verfahren zur herstellung von schottky-dioden
IT1171402B (it) * 1981-07-20 1987-06-10 Selenia Ind Eletroniche Associ Transistor ad effeto di campo a barriera metallo-semiconduttorre conzona svuotata modificata
DE3219598A1 (de) * 1982-05-25 1983-12-01 Siemens AG, 1000 Berlin und 8000 München Schottky-leistungsdiode
US4638551A (en) * 1982-09-24 1987-01-27 General Instrument Corporation Schottky barrier device and method of manufacture
JPS59232467A (ja) * 1983-06-16 1984-12-27 Toshiba Corp ガ−ドリング付きシヨツトキ−バリヤ−ダイオ−ド
US4622736A (en) * 1984-01-30 1986-11-18 Tektronix, Inc. Schottky barrier diodes
US4742377A (en) * 1985-02-21 1988-05-03 General Instrument Corporation Schottky barrier device with doped composite guard ring
KR880014692A (ko) * 1987-05-30 1988-12-24 강진구 반사경이 부착된 반도체 발광장치
US4874714A (en) * 1988-06-02 1989-10-17 Texas Instruments Incorporated Method of making laterally oriented Schottky diode
US4954864A (en) * 1988-12-13 1990-09-04 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Millimeter-wave monolithic diode-grid frequency multiplier
DE69433738T2 (de) * 1993-09-07 2005-03-17 Murata Mfg. Co., Ltd., Nagaokakyo Halbleiterelement und Verfahren zur Herstellung desselben
DE19526739C3 (de) * 1995-07-21 2001-03-29 Gen Semiconductor Ireland Macr Halbleiterbauelement
JPH0964381A (ja) * 1995-08-25 1997-03-07 Murata Mfg Co Ltd ショットキーバリアダイオード
US5763918A (en) * 1996-10-22 1998-06-09 International Business Machines Corp. ESD structure that employs a schottky-barrier to reduce the likelihood of latch-up
SE9700156D0 (sv) * 1997-01-21 1997-01-21 Abb Research Ltd Junction termination for Si C Schottky diode
JP3287269B2 (ja) 1997-06-02 2002-06-04 富士電機株式会社 ダイオードとその製造方法
EP0935816B1 (en) * 1997-09-03 2006-04-05 Koninklijke Philips Electronics N.V. Method of manufacturing a semiconductor device with a schottky junction
US6261932B1 (en) 1999-07-29 2001-07-17 Fairchild Semiconductor Corp. Method of fabricating Schottky diode and related structure
US6699775B2 (en) * 2000-02-22 2004-03-02 International Rectifier Corporation Manufacturing process for fast recovery diode
FR2832547A1 (fr) * 2001-11-21 2003-05-23 St Microelectronics Sa Procede de realisation d'une diode schottky sur substrat de carbure de silicium
US8901699B2 (en) 2005-05-11 2014-12-02 Cree, Inc. Silicon carbide junction barrier Schottky diodes with suppressed minority carrier injection
US10304971B2 (en) * 2016-07-16 2019-05-28 Champion Microelectronic Corp. High speed Schottky rectifier

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3541403A (en) * 1967-10-19 1970-11-17 Bell Telephone Labor Inc Guard ring for schottky barrier devices
IT985052B (it) * 1973-05-25 1974-11-30 Finike Italiana Marposs Metodo e relativa apparecchiatura per il controllo della rotazione di pezzi meccanici in lavorazione su rettificatrici
RO60829A2 (OSRAM) * 1973-12-05 1976-08-15
JPS51120674A (en) * 1975-04-16 1976-10-22 Hitachi Ltd Semiconductor device
US4096622A (en) * 1975-07-31 1978-06-27 General Motors Corporation Ion implanted Schottky barrier diode
GB1573309A (en) * 1976-03-24 1980-08-20 Mullard Ltd Semiconductor devices and their manufacture
US4110775A (en) * 1976-08-23 1978-08-29 Festa Thomas A Schottky diode with voltage limiting guard band
US4063964A (en) * 1976-12-27 1977-12-20 International Business Machines Corporation Method for forming a self-aligned schottky barrier device guardring
US4202002A (en) * 1977-01-19 1980-05-06 International Business Machines Corporation Ion-implanted layers with abrupt edges
US4149905A (en) * 1977-12-27 1979-04-17 Bell Telephone Laboratories, Incorporated Method of limiting stacking faults in oxidized silicon wafers

Also Published As

Publication number Publication date
EP0021869B1 (fr) 1983-06-01
EP0021869A1 (fr) 1981-01-07
US4310362A (en) 1982-01-12
FR2460040A1 (fr) 1981-01-16
FR2460040B1 (OSRAM) 1983-01-07

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee