DE2926580C2 - - Google Patents
Info
- Publication number
- DE2926580C2 DE2926580C2 DE19792926580 DE2926580A DE2926580C2 DE 2926580 C2 DE2926580 C2 DE 2926580C2 DE 19792926580 DE19792926580 DE 19792926580 DE 2926580 A DE2926580 A DE 2926580A DE 2926580 C2 DE2926580 C2 DE 2926580C2
- Authority
- DE
- Germany
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19792926580 DE2926580A1 (de) | 1979-06-30 | 1979-06-30 | Vorrichtung zur dickenmessung duenner schichten |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19792926580 DE2926580A1 (de) | 1979-06-30 | 1979-06-30 | Vorrichtung zur dickenmessung duenner schichten |
Publications (2)
Publication Number | Publication Date |
---|---|
DE2926580A1 DE2926580A1 (de) | 1981-01-15 |
DE2926580C2 true DE2926580C2 (US06262066-20010717-C00424.png) | 1987-04-02 |
Family
ID=6074664
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19792926580 Granted DE2926580A1 (de) | 1979-06-30 | 1979-06-30 | Vorrichtung zur dickenmessung duenner schichten |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE2926580A1 (US06262066-20010717-C00424.png) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3144145C2 (de) * | 1981-11-06 | 1986-06-19 | Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen | Blendenvorrichtung zum Messen dünner Schichten |
CN108050972B (zh) * | 2017-12-30 | 2024-02-27 | 苏州宇邦新型材料股份有限公司 | 一种圆丝焊带涂层厚度测量装置及测量方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2858450A (en) * | 1956-12-20 | 1958-10-28 | Industrial Nucleonics Corp | Shutter system |
US3223840A (en) * | 1961-04-27 | 1965-12-14 | Industrial Nucleonics Corp | Method and apparatus for measuring the property of a magnetizable workpiece using nuclear radiation |
US3499152A (en) * | 1966-03-18 | 1970-03-03 | Industrial Nucleonics Corp | Method and apparatus for improving backscatter gauge response |
-
1979
- 1979-06-30 DE DE19792926580 patent/DE2926580A1/de active Granted
Also Published As
Publication number | Publication date |
---|---|
DE2926580A1 (de) | 1981-01-15 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8110 | Request for examination paragraph 44 | ||
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |