DE2900389A1 - Monochromatic light frequency determining device - has light deflecting prism and silicon photodetector with properties dependent on light impingement point - Google Patents

Monochromatic light frequency determining device - has light deflecting prism and silicon photodetector with properties dependent on light impingement point

Info

Publication number
DE2900389A1
DE2900389A1 DE19792900389 DE2900389A DE2900389A1 DE 2900389 A1 DE2900389 A1 DE 2900389A1 DE 19792900389 DE19792900389 DE 19792900389 DE 2900389 A DE2900389 A DE 2900389A DE 2900389 A1 DE2900389 A1 DE 2900389A1
Authority
DE
Germany
Prior art keywords
light
frequency
prism
photodetector
determining device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19792900389
Other languages
German (de)
Inventor
Sd Mehdi Ramshad
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE19792900389 priority Critical patent/DE2900389A1/en
Publication of DE2900389A1 publication Critical patent/DE2900389A1/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength

Abstract

The monochromatic light, whose frequency is to be determined, is generated by a laser source. The light (2) is deflected by a prism incorporated in the beam path. Behind the prism is mounted a silicon photodetector (4), whose electric characteristics depend on the position of a light impingement point. The arrangement is such that on impingement of the light beam onto the photodetector the changes in electric characteristics of the same are uses as a rate for frequency determination. The prism deflects the light beam according to the light frequency (2', 2", 2"'). In this way frequency can be expressed as a variable photodetector characteristic which can be tapped by a line (5).

Description

"Vorrichtung zum Bestimmen der Frequenz "Device for determining the frequency

von monochromatischem Licht" Der Erfindung liegt die Aufgabe zugrunde, eine einfache und genau arbeitende Vorrichtung zum Bestimmen der Frequenz von monochromatischem Licht zu schaffen. of monochromatic light "The invention is based on the object a simple and accurate device for determining the frequency of monochromatic To create light.

Diese Aufgabe wird gelöst durch ein das Licht ablenkendes erstes Element, z.B. ein Prisma, das im Strahlengang angeordnet ist, und ein an sich bekanntes zweites Element, z.B.This object is achieved by a first element which deflects the light, e.g. a prism, which is arranged in the beam path, and a second known per se Element, e.g.

einen Silizium-Photodetektor, dessen elektrische Eigenschaften von der Lage eines Lichtauftreffpunktes abhängen und das in Strahlenrichtung hinter dem ersten Element angeordnet ist, derart, daß das Licht das zweite Element beaufschlagt und die Änderung der elektrischen Eigenschaften ein Maß für die Frequenz ist. Silizium-Photodetektoren werden zum Positionieren von Arbeitstischen od.dgl. verwandt.a silicon photodetector whose electrical properties are from depend on the position of a point of incidence of light and that behind in the direction of the rays the first element is arranged in such a way that the light impinges on the second element and the change in electrical properties is a measure of the frequency. Silicon photodetectors are for positioning work tables or the like. related.

Weitere Einzelheiten der Erfindung ergeben sich aus der Zeichnung, in der ein Ausführungsbeispiel veranschaulicht ist.Further details of the invention emerge from the drawing, in which an embodiment is illustrated.

Darin ist mit 1 eine Laserstrahl-Quelle bezeichnet, die monochromatisches Licht 2 auf ein Prisma 3 sendet. Dieses lenkt das Licht je nach Frequenz desselben ab, siehe die Strahlen 2', 2" und 2"'. Diese fallen auf einen Si-Photodetektor, dessen elektrische Eigenschaften von der Lage des Auftreffpunktes des Lichtstrahles abhängen. Diese sind somit ein Maß für die Frequenz des Lichtes und können über die Leitung 5 erfaßt werden.Therein, 1 denotes a laser beam source, the monochromatic one Sends light 2 onto a prism 3. This directs the light depending on its frequency see rays 2 ', 2 "and 2"'. These fall on a Si photodetector, its electrical properties depend on the position of the point of impact of the light beam depend. These are thus a measure of the frequency of the light and can be over the line 5 can be detected.

Claims (1)

Anspruch Vorrichtung zum Bestimmen der Frequenz von monochromatischem Licht, insbesondere solchem einer Laserstrahl-Quelle, g e -k e n n z e i c h n e t durch ein das Licht (2) ablenkendes erstes Element, z.B. ein Prisma (3), das im Strahlengang (2) angeordnet ist, und ein an sich bekanntes zweites Element, z.B. einen SiZzium-Photodetektor (4), dessen elektrische Eigenschaften von der Lage eines Lichtauftreffpunktes abhängen und das in Strahlenrichtung hinter dem ersten Element (3) angeordnet ist, derart, daß das Licht (2) das zweite Element (4) beaufschlagt und die Änderung der elektrischen Eigenschaften ein Maß für die Frequenz ist. Claim device for determining the frequency of monochromatic Light, in particular that of a laser beam source, is not indicated t by a first element that deflects the light (2), e.g. a prism (3), which is placed in the Beam path (2) is arranged, and a per se known second element, e.g. a SiZzium photodetector (4) whose electrical properties depend on the location of a Depending on the point of incidence of light and that in the direction of the rays behind the first element (3) is arranged in such a way that the light (2) impinges on the second element (4) and the change in electrical properties is a measure of the frequency.
DE19792900389 1979-01-04 1979-01-04 Monochromatic light frequency determining device - has light deflecting prism and silicon photodetector with properties dependent on light impingement point Pending DE2900389A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19792900389 DE2900389A1 (en) 1979-01-04 1979-01-04 Monochromatic light frequency determining device - has light deflecting prism and silicon photodetector with properties dependent on light impingement point

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19792900389 DE2900389A1 (en) 1979-01-04 1979-01-04 Monochromatic light frequency determining device - has light deflecting prism and silicon photodetector with properties dependent on light impingement point

Publications (1)

Publication Number Publication Date
DE2900389A1 true DE2900389A1 (en) 1980-07-10

Family

ID=6060120

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19792900389 Pending DE2900389A1 (en) 1979-01-04 1979-01-04 Monochromatic light frequency determining device - has light deflecting prism and silicon photodetector with properties dependent on light impingement point

Country Status (1)

Country Link
DE (1) DE2900389A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1630532B1 (en) * 2004-08-23 2016-05-18 Palo Alto Research Center Incorporated Wavelength detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1630532B1 (en) * 2004-08-23 2016-05-18 Palo Alto Research Center Incorporated Wavelength detector

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