DE2850207B1 - Schaltungsanordnung zur Koinzidenzpruefung von digitalen Signalen - Google Patents
Schaltungsanordnung zur Koinzidenzpruefung von digitalen SignalenInfo
- Publication number
- DE2850207B1 DE2850207B1 DE19782850207 DE2850207A DE2850207B1 DE 2850207 B1 DE2850207 B1 DE 2850207B1 DE 19782850207 DE19782850207 DE 19782850207 DE 2850207 A DE2850207 A DE 2850207A DE 2850207 B1 DE2850207 B1 DE 2850207B1
- Authority
- DE
- Germany
- Prior art keywords
- data shift
- circuit arrangement
- coincidence
- shift register
- digital signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
- H03K5/15013—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs
- H03K5/1502—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs programmable
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19782850207 DE2850207B1 (de) | 1978-11-20 | 1978-11-20 | Schaltungsanordnung zur Koinzidenzpruefung von digitalen Signalen |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19782850207 DE2850207B1 (de) | 1978-11-20 | 1978-11-20 | Schaltungsanordnung zur Koinzidenzpruefung von digitalen Signalen |
Publications (2)
Publication Number | Publication Date |
---|---|
DE2850207B1 true DE2850207B1 (de) | 1980-02-28 |
DE2850207C2 DE2850207C2 (US07321065-20080122-C00020.png) | 1980-10-16 |
Family
ID=6055102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19782850207 Granted DE2850207B1 (de) | 1978-11-20 | 1978-11-20 | Schaltungsanordnung zur Koinzidenzpruefung von digitalen Signalen |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE2850207B1 (US07321065-20080122-C00020.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0455294A2 (en) * | 1990-05-01 | 1991-11-06 | Fluke Corporation | Self-aligning sampling system and logic analyser comprising a number of such sampling systems |
-
1978
- 1978-11-20 DE DE19782850207 patent/DE2850207B1/de active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0455294A2 (en) * | 1990-05-01 | 1991-11-06 | Fluke Corporation | Self-aligning sampling system and logic analyser comprising a number of such sampling systems |
EP0455294A3 (en) * | 1990-05-01 | 1991-11-13 | N.V. Philips' Gloeilampenfabrieken | Self-aligning sampling system and logic analyser comprising a number of such sampling systems |
Also Published As
Publication number | Publication date |
---|---|
DE2850207C2 (US07321065-20080122-C00020.png) | 1980-10-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8320 | Willingness to grant licences declared (paragraph 23) | ||
8339 | Ceased/non-payment of the annual fee |