DE2816017C2 - Lichtmeßgerät - Google Patents

Lichtmeßgerät

Info

Publication number
DE2816017C2
DE2816017C2 DE19782816017 DE2816017A DE2816017C2 DE 2816017 C2 DE2816017 C2 DE 2816017C2 DE 19782816017 DE19782816017 DE 19782816017 DE 2816017 A DE2816017 A DE 2816017A DE 2816017 C2 DE2816017 C2 DE 2816017C2
Authority
DE
Germany
Prior art keywords
light
dome
sub
cylinder
evaluation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19782816017
Other languages
German (de)
English (en)
Other versions
DE2816017A1 (de
Inventor
Dieter Dipl.-Phys. Dr. Ernst
Dieter 3000 Hannover Reinhardt
Original Assignee
Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München filed Critical Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München
Priority to DE19782816017 priority Critical patent/DE2816017C2/de
Priority to AT41879A priority patent/AT376041B/de
Priority to NL7900630A priority patent/NL178276C/xx
Priority to GB7912174A priority patent/GB2023812B/en
Priority to SE7903223A priority patent/SE440400B/sv
Publication of DE2816017A1 publication Critical patent/DE2816017A1/de
Application granted granted Critical
Publication of DE2816017C2 publication Critical patent/DE2816017C2/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0474—Diffusers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0271—Housings; Attachments or accessories for photometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19782816017 1978-04-13 1978-04-13 Lichtmeßgerät Expired DE2816017C2 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE19782816017 DE2816017C2 (de) 1978-04-13 1978-04-13 Lichtmeßgerät
AT41879A AT376041B (de) 1978-04-13 1979-01-19 Lichtmessgeraet
NL7900630A NL178276C (nl) 1978-04-13 1979-01-26 Lichtmeetinrichting.
GB7912174A GB2023812B (en) 1978-04-13 1979-04-06 Photometer
SE7903223A SE440400B (sv) 1978-04-13 1979-04-11 Ljusmetinstrument for kosinusriktig metning av alla infallsriktningar fran ett halvrum

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19782816017 DE2816017C2 (de) 1978-04-13 1978-04-13 Lichtmeßgerät

Publications (2)

Publication Number Publication Date
DE2816017A1 DE2816017A1 (de) 1979-10-25
DE2816017C2 true DE2816017C2 (de) 1987-04-23

Family

ID=6036888

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19782816017 Expired DE2816017C2 (de) 1978-04-13 1978-04-13 Lichtmeßgerät

Country Status (5)

Country Link
AT (1) AT376041B (US07579456-20090825-P00002.png)
DE (1) DE2816017C2 (US07579456-20090825-P00002.png)
GB (1) GB2023812B (US07579456-20090825-P00002.png)
NL (1) NL178276C (US07579456-20090825-P00002.png)
SE (1) SE440400B (US07579456-20090825-P00002.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005025606A1 (de) * 2005-06-03 2006-12-07 Vishay Semiconductor Gmbh Sonnensensor und Herstellungsverfahren hierfür

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3622075A1 (de) * 1986-07-01 1988-01-14 Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh Geraet zur messung inhomogener optischer strahlung und verfahren zur messung
FR2608742B1 (fr) * 1986-12-19 1990-02-23 Sevelinge Gerard Systeme de controle pour le suivi du soleil et le positionnement des heliostats d'un capteur solaire a concentration lineaire a lames mobiles
DE4329665C1 (de) * 1993-09-02 1994-05-11 Se Scient Electronics Muenchen Sensor zum Erfassen von elektromagnetischer Strahlung
GB9719614D0 (en) * 1997-09-10 1997-11-19 Wood John Solar radiation sensor
CN103411885A (zh) * 2013-07-18 2013-11-27 江苏大学 一种多光谱成像系统的漫反射照明装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1028357B (de) * 1955-03-22 1958-04-17 Patra Patent Treuhand Beleuchtungsmesservorsatz fuer cos-richtige Beleuchtungsstaerkemessungen
DE1813306B2 (de) * 1968-12-07 1971-07-22 Korrekturlinse fuer lichtmessfuehler
US3880528A (en) * 1973-07-02 1975-04-29 Tektronix Inc Light probe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005025606A1 (de) * 2005-06-03 2006-12-07 Vishay Semiconductor Gmbh Sonnensensor und Herstellungsverfahren hierfür
DE102005025606B4 (de) * 2005-06-03 2015-10-01 Vishay Semiconductor Gmbh Sonnensensor und Herstellungsverfahren hierfür

Also Published As

Publication number Publication date
NL178276B (nl) 1985-09-16
SE7903223L (sv) 1979-10-14
ATA41879A (de) 1984-02-15
DE2816017A1 (de) 1979-10-25
AT376041B (de) 1984-10-10
GB2023812B (en) 1982-11-24
SE440400B (sv) 1985-07-29
NL178276C (nl) 1986-02-17
NL7900630A (nl) 1979-10-16
GB2023812A (en) 1980-01-03

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee