DE2800351C3 - - Google Patents

Info

Publication number
DE2800351C3
DE2800351C3 DE2800351A DE2800351A DE2800351C3 DE 2800351 C3 DE2800351 C3 DE 2800351C3 DE 2800351 A DE2800351 A DE 2800351A DE 2800351 A DE2800351 A DE 2800351A DE 2800351 C3 DE2800351 C3 DE 2800351C3
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2800351A
Other languages
German (de)
Other versions
DE2800351B2 (de
DE2800351A1 (de
Inventor
Erwin 8021 Icking Sick
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Erwin Sick GmbH Optik Elektronik
Original Assignee
Erwin Sick GmbH Optik Elektronik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Erwin Sick GmbH Optik Elektronik filed Critical Erwin Sick GmbH Optik Elektronik
Priority to DE2800351A priority Critical patent/DE2800351B2/de
Priority to GB7849309A priority patent/GB2023868B/en
Priority to SE7813256A priority patent/SE428973B/sv
Priority to US05/972,301 priority patent/US4248537A/en
Priority to JP16544578A priority patent/JPS5497475A/ja
Priority to FR7900035A priority patent/FR2422933A1/fr
Publication of DE2800351A1 publication Critical patent/DE2800351A1/de
Publication of DE2800351B2 publication Critical patent/DE2800351B2/de
Application granted granted Critical
Publication of DE2800351C3 publication Critical patent/DE2800351C3/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE2800351A 1978-01-04 1978-01-04 Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn Granted DE2800351B2 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
DE2800351A DE2800351B2 (de) 1978-01-04 1978-01-04 Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn
GB7849309A GB2023868B (en) 1978-01-04 1978-12-20 Optical apparatus for determining light exit angles
SE7813256A SE428973B (sv) 1978-01-04 1978-12-22 Optisk anordning for bestemning av ljusuttredesvinkeln vid en av en ljusfleck treffad materialbana
US05/972,301 US4248537A (en) 1978-01-04 1978-12-22 Optical apparatus for determining the light exit angle from a material strip illuminated by a light bead
JP16544578A JPS5497475A (en) 1978-01-04 1978-12-29 Rays radiation angle detecting optical device from beltlike body scanned by rays
FR7900035A FR2422933A1 (fr) 1978-01-04 1979-01-02 Dispositif optique pour determiner l'angle de sortie des rayons lumineux dans une bande de materiau balayee par un spot lumineux

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2800351A DE2800351B2 (de) 1978-01-04 1978-01-04 Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn

Publications (3)

Publication Number Publication Date
DE2800351A1 DE2800351A1 (de) 1979-07-05
DE2800351B2 DE2800351B2 (de) 1979-11-15
DE2800351C3 true DE2800351C3 (US08177716-20120515-C00003.png) 1980-07-31

Family

ID=6028981

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2800351A Granted DE2800351B2 (de) 1978-01-04 1978-01-04 Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn

Country Status (6)

Country Link
US (1) US4248537A (US08177716-20120515-C00003.png)
JP (1) JPS5497475A (US08177716-20120515-C00003.png)
DE (1) DE2800351B2 (US08177716-20120515-C00003.png)
FR (1) FR2422933A1 (US08177716-20120515-C00003.png)
GB (1) GB2023868B (US08177716-20120515-C00003.png)
SE (1) SE428973B (US08177716-20120515-C00003.png)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3307591A1 (de) * 1983-03-03 1984-10-11 Kraftwerk Union AG, 4330 Mülheim Verfahren zur optischen kontrolle der oberflaeche eines pruefgutes
DE3428435A1 (de) * 1984-08-01 1986-02-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Rauheitssonde

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2827704C3 (de) * 1978-06-23 1981-03-19 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung der Lichtaustrittswinkel
DE2827705C3 (de) * 1978-06-23 1981-07-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Gerät zur Feststellung von Fehlern an Bahnmaterial
SE440405B (sv) * 1979-03-02 1985-07-29 Svenska Textilforskningsinst Anordning for bestemning av riktningsfordelningen av fibrer i planet for ett dukformigt material
DE3006072C2 (de) * 1980-02-19 1984-11-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlstellenermittlungsvorrichtung für Materialbahnen
DE3037622C2 (de) * 1980-10-04 1987-02-26 Theodor Prof. Dr.-Ing. 1000 Berlin Gast Einrichtung zur Bestimmung der Oberflächengüte
EP0123929B1 (de) * 1983-04-22 1988-06-22 Erwin Sick GmbH Optik-Elektronik Fehlerfeststellungsvorrichtung
DE3411934C2 (de) * 1983-04-22 1986-04-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlerfeststellungsvorrichtung
DE3408106A1 (de) * 1984-03-05 1985-09-12 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optischer rauheits-scanner
US5448364A (en) * 1993-03-22 1995-09-05 Estek Corporation Particle detection system with reflective line-to-spot collector
EP1241466A1 (fr) * 2001-03-13 2002-09-18 Daniel Malaise Dispositif et procédé optoélectronique de mesure en temps réel de la lumière diffusée par une surface en défilement

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL279098A (US08177716-20120515-C00003.png) * 1961-05-31
DE1473746A1 (de) * 1964-06-15 1969-01-09 Eastman Kodak Co Vorrichtung zum photoelektrischen Abtasten eines gefuehrten Bandes
US3618063A (en) * 1970-02-11 1971-11-02 Eastman Kodak Co Defect inspection apparatus
DE2051908A1 (de) * 1970-10-22 1972-04-27 Licentia Gmbh Photoelektronische Oberflachenabtast einrichtung
GB1347777A (en) * 1970-12-12 1974-02-27 Sick Optik Elektronik Erwin Photoelectric length measuring apparatus
GB1389444A (en) * 1971-03-09 1975-04-03 Sira Institute Apparatus for automatic inspection of materials
JPS4879686A (US08177716-20120515-C00003.png) * 1972-01-28 1973-10-25
JPS5035437A (US08177716-20120515-C00003.png) * 1973-07-31 1975-04-04
US3866054A (en) * 1973-09-28 1975-02-11 Du Pont Defect size discriminator circuit for web inspection system
US3919531A (en) * 1974-05-16 1975-11-11 Libbey Owens Ford Co Method of and apparatus for inspecting the contours of moving bent articles
GB1496765A (en) * 1974-12-19 1978-01-05 Ciba Geigy Ag Examining sheet material photoelectrically
JPS5210793A (en) * 1975-07-15 1977-01-27 Yaskawa Electric Mfg Co Ltd Fault detector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3307591A1 (de) * 1983-03-03 1984-10-11 Kraftwerk Union AG, 4330 Mülheim Verfahren zur optischen kontrolle der oberflaeche eines pruefgutes
DE3428435A1 (de) * 1984-08-01 1986-02-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Rauheitssonde

Also Published As

Publication number Publication date
JPS5497475A (en) 1979-08-01
GB2023868B (en) 1982-06-23
FR2422933B1 (US08177716-20120515-C00003.png) 1984-03-02
GB2023868A (en) 1980-01-03
FR2422933A1 (fr) 1979-11-09
DE2800351B2 (de) 1979-11-15
JPS638420B2 (US08177716-20120515-C00003.png) 1988-02-23
SE428973B (sv) 1983-08-01
US4248537A (en) 1981-02-03
DE2800351A1 (de) 1979-07-05
SE7813256L (sv) 1979-07-05

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Legal Events

Date Code Title Description
OAM Search report available
OAP Request for examination filed
OC Search report available
OD Request for examination
OI Miscellaneous see part 1
OI Miscellaneous see part 1
C3 Grant after two publication steps (3rd publication)
8339 Ceased/non-payment of the annual fee