DE2744168C3 - Magnetooptisches Spektralphotometer - Google Patents

Magnetooptisches Spektralphotometer

Info

Publication number
DE2744168C3
DE2744168C3 DE2744168A DE2744168A DE2744168C3 DE 2744168 C3 DE2744168 C3 DE 2744168C3 DE 2744168 A DE2744168 A DE 2744168A DE 2744168 A DE2744168 A DE 2744168A DE 2744168 C3 DE2744168 C3 DE 2744168C3
Authority
DE
Germany
Prior art keywords
light
polarization
plane
bundles
dispersive element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2744168A
Other languages
German (de)
English (en)
Other versions
DE2744168B2 (de
DE2744168A1 (de
Inventor
Masaru Kodaira Ito
Seiichi Kokubunji Murayama
Kounosuke Mito Ibaraki Ohishi
Manabu Odawara Kanagawa Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of DE2744168A1 publication Critical patent/DE2744168A1/de
Publication of DE2744168B2 publication Critical patent/DE2744168B2/de
Application granted granted Critical
Publication of DE2744168C3 publication Critical patent/DE2744168C3/de
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103Atomic absorption analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
DE2744168A 1976-10-01 1977-09-30 Magnetooptisches Spektralphotometer Expired DE2744168C3 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11716176A JPS5343592A (en) 1976-10-01 1976-10-01 Spectrophotometer by magneto-optical effect

Publications (3)

Publication Number Publication Date
DE2744168A1 DE2744168A1 (de) 1978-04-06
DE2744168B2 DE2744168B2 (de) 1979-03-08
DE2744168C3 true DE2744168C3 (de) 1979-10-31

Family

ID=14704955

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2744168A Expired DE2744168C3 (de) 1976-10-01 1977-09-30 Magnetooptisches Spektralphotometer

Country Status (5)

Country Link
US (1) US4166697A (enExample)
JP (1) JPS5343592A (enExample)
DE (1) DE2744168C3 (enExample)
FR (1) FR2366551A1 (enExample)
GB (1) GB1582753A (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5515031A (en) * 1978-07-20 1980-02-01 Japan Spectroscopic Co Polarized fluorescence measuring unit
DE3520867A1 (de) * 1985-06-11 1986-12-11 Grün Optik Wetzlar GmbH, 6330 Wetzlar Vorrichtung zum getrennten nachweis von mit einer polarisationskennung versehenen strahlungsanteilen eines messlichtstrahlenbuendels
KR100444176B1 (ko) * 2001-12-15 2004-08-09 한국전자통신연구원 전기 신호에 의해 동작되는 광 편향기 및 이를 이용한파장 가변형 외부 공진기
DE10210436A1 (de) * 2002-03-09 2003-10-02 Michael Licht Verfahren und Vorrichtung zur zerstörungsfreien spektroskopischen Bestimmung von Analytkonzentrationen
JP2007527997A (ja) * 2004-03-06 2007-10-04 マイケル トレイナー, 粒子のサイズおよび形状を決定する方法および装置
JP5176937B2 (ja) * 2008-12-24 2013-04-03 横河電機株式会社 光スペクトラムアナライザ
JP6708197B2 (ja) 2017-11-10 2020-06-10 横河電機株式会社 分光分析装置
CN113834797B (zh) * 2021-11-29 2022-02-15 广东利诚检测技术有限公司 基于光场和磁场检测谷物食品中微量硒元素的方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2165106C2 (de) * 1971-01-05 1984-02-09 Varian Techtron Proprietary Ltd., North Springvale, Victoria Verfahren und Vorrichtung zur Analyse von Atomspektren
US4035083A (en) * 1972-05-30 1977-07-12 Woodriff Ray A Background correction in spectro-chemical analysis

Also Published As

Publication number Publication date
DE2744168B2 (de) 1979-03-08
GB1582753A (en) 1981-01-14
US4166697A (en) 1979-09-04
DE2744168A1 (de) 1978-04-06
FR2366551B1 (enExample) 1980-11-21
FR2366551A1 (fr) 1978-04-28
JPS5343592A (en) 1978-04-19
JPS5621093B2 (enExample) 1981-05-18

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Legal Events

Date Code Title Description
OAP Request for examination filed
OD Request for examination
C3 Grant after two publication steps (3rd publication)
8328 Change in the person/name/address of the agent

Free format text: STREHL, P., DIPL.-ING. DIPL.-WIRTSCH.-ING. SCHUEBEL-HOPF, U., DIPL.-CHEM. DR.RER.NAT., PAT.-ANW., 8000 MUENCHEN