DE2360646A1 - STERILIZING DEVICE - Google Patents

Description

Patent attorney Dipl.-Phys. Gerhard Liedl 8 Munich 22 Steinsdorfstr. 21-22 Tel. 298462

B 6374

TANABE SEIYAKU Co., Ltd.
3-21, Dosho-maehi, Higashi-ku, Osaka-shi, OSAKA / Japan

and

NlHON DENSHI KABUSHKr KAISHA
1418, Nakagami-cho, Akishima-shi, TOKYO / Japan

Sterilizing device

The invention relates to a sterilizing device for liquids containing ampoules with a heating chamber in which the ampoules passed through a transport means by means of microwave radiation to be heated »

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In the event that you have a sterilized liquid agent such as an injection medium, one normally applies a sterilization treatment by means of external heating. This The sterilization process is carried out by means of a heated stream or the like. However, if the agent against heat sterilization If it is not resistant, sterilization can only be carried out in the rarest of cases be performed.

Another would be a substitute for an external sterilization process Sterilization process in which a sealed container, for example, a medical liquid, such as an injection, contains, is irradiated with microwaves. Have the microwaves with you a frequency of about 300-10,000 MHz. The irradiation takes place for a few seconds or minutes, with the sealed container is rotated (DT-OS 2 029 792).

In this procedure, the medical fluid itself becomes such rapidly heated to a high temperature that advantageously dLe medical liquid is quickly and completely sterilized in connection with the sterilizing effect of microwaves without the main agent decomposes. If you now use sealed ampoules as a container, these are appropriately skewed rolled through the heating chamber where they used the microwaves be irradiated. Here, the medical liquid is Ln den Ampoules are inevitably stirred or circulated so that the temperature of the liquid increases unevenly. This results from a combined effect of convection as a function of temperature rise and foot behavior during the rotation of the ampoules. With this method, many ampoules can be used one after the other

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be subjected to automatic sterilization processes. Productivity is significantly improved as a result.

When a medicinal liquid is sterilized by heat treatment, pyrolysis can appear in the main agent » when the heating temperature is high. However, it is complete and sufficient sterilization impossible when the heating temperature is too low. Accordingly, the heating temperature has an allowable range, this allowable range being proportionate is narrow when using ampoules. From this you see the risk that an ampoule under the microwave sterilization permissible temperature range is heated. This can result from small changes in the energy of the microwave irradiation, the Amount of enclosed liquid and the irradiation time result (with continuous sterilization, the processing time depends on the Ampoule through the heating chamber on the conveyor speed the ampoule conveyor).

An ampoule that is heated below the prescribed or permissible temperature range is defective because the main agent is itself has either decomposed or the sterilization is incomplete. One Defective ampoule must be precisely sorted out from the ampoules which have been heated within the permissible temperature range be.

Accordingly, it is an object of the invention to provide a sterilizing device show in the case of liquids enclosed in ampoules by microwave radiation can be heated and then an automatic sorting out of the good and defective ampoules is possible. The sterilization of the ampoules should be able to be carried out continuously be.

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In the case of the sterilization device, this task is described in the introduction Type solved according to the invention by a temperature measuring device for the temperature of the transported through the heating chamber Ampoules, a control circuit that generates a corresponding temperature signal with a comparison signal for a permissible temperature range compares, the control circuit providing a corresponding output signal if the temperature signal is either within or is below the comparison signal range and by an ampoule sorting device, which from the output signal of the control circuit is controlled.

When practicing the invention, the liquid which is in the Ampoules is enclosed, heated by microwave radiation. The temperature of the heated ampoules is then measured and corresponding temperature signals are generated. These temperature signals are compared with a comparison signal, whereby one can determine whether the ampoules are at the desired temperature have been heated. The result of this check now enables the good and defective ampoules to be separated from one another.

Accordingly, there is the advantage of the invention that one can obtain good ampoules which have been heated to a desired temperature damaged ampoules that have been heated to a temperature outside the permissible temperature range can be separated. When performing the sterilization process using microwaves, it is thus possible to find out whether the liquid-tight sealed ampoules have been heated to the desired temperature.

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In the accompanying figures are preferred embodiments of the Invention shown and it is intended to the invention with reference to the figures will be explained in more detail. Show it:

Fig. 1 is a block diagram of an embodiment of the invention;

2 shows an embodiment example in an oblique, perspective view

for an ampoule conveyor;

3 shows an exemplary embodiment for an ampoule sorting device:

4 shows a block diagram of an exemplary embodiment of a radiation thermometer;

Fig. 5 is an illustration of the electrical signals which are generated in the

Device according to the invention come into use;

6 is a block diagram for a synchronizing signal generator;

Fig. 7 Block diagrams of exemplary embodiments for control

^{BLS 10} circuits for the device in FIG. 1; 11 shows an integrator circuit for the device in FIG. 10;

Fig. 12 is a block diagram for a logic circuit in the device according to FIG. 1;

Fig. 13 is a block diagram of a signal generator in the? Fig. 1 and

14 shows a block diagram of a signal processing circuit for the device according to Fig.l.

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In Fig. 1 is an embodiment of a sterilizing device according to of the invention shown. In the figure, a heating chamber 1 is shown which contains a waveguide or an oven. Microwaves, which have a frequency of 2,450 MHz, for example, are from a microwave source 2, for example a magnetron, supplied to the heating chamber 1. This delivery takes place via a waveguide 3. Those emitted by the microwave source 2 Microwaves are controlled by a voltage source 4.

A temperature detector 5 is arranged next to the heating chamber 1. It is provided with a radiation thermometer 40 (prior art), which has an infrared detector, light sources 6a and 6b, photocells 7a and 7b and a black body 10. The radiation thermometer 40 and the black body or black body 10 and the light source 6a and the photocell 7a and the light source 6b and the Photocell 7b are arranged so that they face each other. The corresponding pairs of components are at a distance of 1/2 away from each other, in the direction of movement of an ampoule vial conveyor 20, which will be described below. The direction of movement or conveying direction is through a Arrow A indicated.

A base plate 12 is arranged stationary with respect to the heating chamber 1 and the ampoule conveyor 20 for ampoules 11 moves continuously on the base plate 12 in the direction of arrow A. A drive mechanism which is not shown in detail is used for this purpose. The ampoules are moved through the heating chamber 1 and through the temperature detector 5 . The ampoules 11 are arranged in ampoule holding parts on the ampoule conveyor 20 and are sequentially through the heating chamber 1 and

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the temperature detector 5 passed through. While going through the heating chamber pass through, they are heated and sterilized by absorption of the microwaves. The distance between the center lines of two adjacent ampoule holding parts is I.

Openings 12a, 12b and 12c are spaced 1/2 in. From each other the base plate 12 is provided in the radiation thermometer 40. On both sides of these openings are the radiation thermometer 40 and the black body 10, the photocell 7a and the light source 6a and the photocell 7b and the light source 6b are arranged, these components aligned with the three holes. A further opening 13 is provided between two adjacent ampoule holding parts, these openings 13 above openings 12a, 12b and 12c run while the ampoule conveyor 20 is moving.

When the ampoule conveyor 20 is moved accordingly the light-sensitive surface of the radiation thermometer 40 is struck by an infrared beam emanating from the ampoule 11, while the ampoule passes under the thermometer. It is also activated by an infrared beam emitted by the ampoule conveyor 20 and hit by an infrared ray emanating from the black body 10. The latter occurs when the opening 13 moves across the opening 12a.

The individual infrared rays are through the radiation thermometer detected as corresponding electrical temperature signals. These temperature signals are sent to a control circuit 90 of the radiation thermometer 40 and supplied to the signal processing circuit 150. The photocells 7a and 7b detect the rays coming from the light sources 6a and 6b go out and convert these into electrical signals. this takes place when the openings 13 of the ampoule conveying device

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tion 20 run over the openings 12b and 12c of the base plate 12. These electrical signals become corresponding synchronizing signal generators 60a and 60b supplied. These generate first and second synchronizing signals based on the input signals.

The first sync signal generated by the sync signal generator 60a is, is in sync with the temperature measurement of the ampoule 11 by the radiation thermometer 40, since the distance between two adjacent ampoule holding parts on the ampoule conveyor 20 double the distance (1/2) between two openings 12a and 12b. The first synchronizing signal is sent to a control circuit 100 for the synchronizing signal ^ a signal generator 120, a counting circuit 140 and applied to the signal processing circuit 150.

The second sync signal generated by the sync signal generator 60b is in sync with the temperature measurement of the black Emitter 10 through the radiation thermometer 40, the temperature signal for the black body 10 to the control circuit 90 and the signal processing circuit 150 is set, since the distance between two adjacent ampoule holding parts on the Ampoule conveyor 20 is equal to the distance between openings 12a and 12c. The second sync signal is sent to the Control circuit 90 and the control circuit IQO placed.

The generation of the first and second sync signals is in progress unchanged in synchronism with the temperature measurement of the heated »ampoule 11 and the infrared radiation of the black body 10, too when the conveying speed of the ampoule conveyor 20 changes. This is because the distance between the photo

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cells 7a and 7b from the radiation thermometer 40 1/2 and I (I. = distance of the transported ampoules 11).

The black body 10 is raised by means of a voltage source 14 kept at a constant temperature. The temperature of the black Radiator 10 is detected by a control circuit 70 and it is a corresponding electrical signal, which corresponds to this temperature, is compared with a reference signal. When the temperature is within the range of the reference signal (normal), the control circuit 70 generates a pulse "1" and when the temperature is below the temperature range of the reference signal (abnormal), the control circuit 70 generates a pulse "0". These pulses are applied to a logic circuit 130 via terminals 15a and 15b. By monitoring or checking the temperature of the blackbody 10, which in the said manner. occurs, it prevents good ampoules with defective ampoules mixed or confused due to a change in the temperature of the black body or black body 10 can be done.

The voltage, which from a voltage source 16 to all circuits is supplied with the reference signal by means of the test circuit controlled. When the voltage of the voltage source 16 is within the range of the reference signal (normal), the test circuit 80 generates the pulse "1". When the voltage is below the range of the reference signal is (abnormal), the test circuit 80 generates the pulse "0". Both pulses are provided to logic circuit 130. By checking the output voltage of the source 16 for this This prevents good and defective or faulty ampoules from being mixed with one another due to circuit faults which result from an unstable supply voltage can.

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The control circuit of the radiation thermometer 40 extracts a reference signal which corresponds to the detected temperature of the reference temperature source, which is kept at a constant, known temperature. It also checks whether this extracted signal has a desired value and whether the radiation thermometer 70 is operating normally. Accordingly, the control circuit 90 extracts a temperature signal from the black body 10, which is the reference temperature source. The control circuit 90 extracts this comparison signal or reference temperature signal from the temperature signals which have been detected by the radiation thermometer 40 using the second synchronous signal and compares this temperature signal with the reference signal. When the temperature signal is within the range of the reference signal (normal), the control circuit 90 generates a pulse "1" and when the temperature signal is below this temperature range (abnormal), the control circuit 90 generates a pulse "0 ^H. The output pulses" 1 " and "0" are supplied to logic circuit 130, respectively.

The control circuit 100 checks whether the synchronizing signals supplied from the synchronizing signal generators 6a and 6b are normal. When they are normal, the control circuit 100 generates the pulse "1", and when they are abnormal, the control circuit generates the pulse "0". The output pulses ¹¹ I "and" 0 "are supplied to the logic circuit 130.

The logic circuit 130 generates the "1" pulse when all of the inputs are of the "1" (normal) pulse shape and generates one Pulse "0", if one of the input signals has the pulse shape "0" (abnormal) Has. The output pulses "1" or "0" are sent to the signal processing circuit 150 delivered. The logic circuit checks whether the ampoule

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The sterilizer is working normally because of input signals from the control circuits or test circuits 70, 80, 90 and 100 are supplied.

Based on the first sync signal from the sync signal generator 60a and the pulse "1" or "0" from logic circuit 130 travels the signal generator 120 continues to provide an error indication signal for a certain period of time when a pulse "0" appears, i.e. H. if the Output pulse of logic circuit 130 is "0" (one of the devices then gives an error message). This means that even if the outputs from all other test circuits are normal, the Ampoules are discarded until the device has stabilized. The operational reliability of the device thereby becomes considerable elevated. The output pulses "1" or "0" of the signal generator are supplied to the signal processing circuit 150.

When comparing the ampoule temperature signals with the reference signal, the signal processing circuit 150 checks whether the ampoules which just below the light-sensitive surface of the radiation thermometer40 pass through, are heated to the desired temperature and generated logical outputs of the checked signal and other input signals. These logical outputs are always "good ampoules" signals only if all input signals are normal and "faulty ampoule" signals if one of the signals is abnormal or an error indication is.

The output of the signal processing circuit 150 is applied to voltage sources 17a and 17b and applied to the counting circuit 140. The voltage sources 17a and 17b drive ampoule sorting devices 30a and 30a 30b, so that defective or faulty ampoules fall through openings 12d and I2e in the base plate 12. This is only done

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when a "faulty ampoule" signal is received or delivered. The counting circuit 140 counts the "good ampoule" signals and the "faulty ampoule" signals separately from one another.

The ampoule sorting devices 30a and 30b are arranged at certain distances from the temperature detector 5 and from the temperature measuring device 5, respectively. These distances are a multiple of the Distance (I) between two adjacent ampoule holding points of the Ampoule conveyor 20. These distances are 101 and 81, for example. Accordingly, signal processing circuit 150 includes two timing circles so that the tent delay from the time to which by means of the radiation thermometer 40 the temperature of a Ampoule has been measured until the time when an ampoule sorter is operated based on this temperature measurement signal is to be compensated accordingly. The time during which an ampoule, measured for its temperature, has been transported from the underside of the radiation thermometer 40 to the ampoule sorting devices 30a and 30b is taken into account accordingly by the time setting circuits Provides ampoule sorting devices, it is possible to compensate for a poor operation of an ampoule sorting device with the ampoule sorting devices, as a result of which defective and good ampoules can be sorted or separated even better from one another.

Fig. 2 shows an oblique, perspective view of an embodiment of an ampoule conveying device 20 in the VorrlehtuBg, which in the wing. 1 is shown. The Ampullenbeförderungselnrlehtung consists of a conveyor belt 21 which is continuously in! Direction dee Arrow B moves on the base plate 12 and a conveyor body22,

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which is arranged on the conveyor belt 21. The! Conveying body 22 has a plurality of narrow pressure plates 23 which are arranged in parallel and press in the ampoules 11 biaw. press and roll as well as connecting links 24 which connect the pressure plates to one another at their ends. Each pressure plate 23 has the one already mentioned above Opening 13. The connecting links are the same width as that Conveyor belt 21 and they can be connected to the conveyor belt 21, for example by means of screws.

The ampoules 11. or the material to be heated is in the ampoule holding parts placed between the pressure plates 23 and conveyed, the ampoules being held in direct contact with the base plate 12. The ampoules are opposite the vertical arranged inclined, up to such an angle that the included Liquid the withdrawal part of the ampoule, while the Ampoule is rotated due to the pressure of the pressure plate 23, not touched. The rotation takes place in the direction of arrow B and results from the self-resistance (frictional force) due to the contact of the Ampoule with the base plate 12. To now the ampoule in an inclined arrangement to transport, the base plate 12 and the ampoule conveyor 20 can be inclined so that the removal part of the Ampoule is facing up. The optimal angle of inclination of a ml ampoule with respect to the vertical is between 45 and 75. This nesting * However, the angle changes depending on the type and "shape of the Ampoule.

A carrier 25, which prevents the ampoule from slipping off, is attached to the Connecting member 24 is integrally formed and can be molded in one piece therewith. This carrier prevents. that during transport due to the inclined arrangement, the ampoule from your ampoule holder

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part of the ampoule conveyor 20 slips out.

Slots or openings 12d and I2e have a somewhat larger one Width than the container part of the ampoule and are at certain distances (for example 101 and 81) from the opening 12a (in FIG. 1) in the conveying direction (parallel to the ampoules) in the base plate arranged. Under these openings I2d and I2e are the ampoule sorting devices 30a and 30b (according to FIG. 1) arranged.

To now the ampoules in a suitable manner in an inclined arrangement to convey, it is desirable that the surface of the base plate 12, which is in contact with the ampoules 11, has slight unevenness. Since this reduces the contact resistance (frictional force) between the base plate 12 and the ampoules 11 becomes greater than the friction resistance between the pressure plates 23 and the ampoules 11, the ampoules are set in rotary motion. It is not necessary that the entire surface be made uneven.

If the pressure plates 23 are trapezoidal, like the In Fig. 2 is shown, the ampoules with increased security be set in rotary motion, since the pressure plates 23 contain a pressure component which press the ampoules 10 upwards. In this case, an angle θ of 80 - 90 ° is optimal.

3 shows an embodiment of an ampoule sorting device 30a (or 30b), as indicated in FIG. 1. The atapullen sorting device has a movable part 31 which is arranged under the opening 12d (or I2e) of the base plate 12. A lifting magnet 32 is used to control the movement of the movable part

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j PAIRED]

The movable part 31 is connected to one end of a control table 33 of the solenoid 32 connected. Due to the force of a coil spring 34 the opening 12d (or I2e) of the base plate 12 remains closed »with is a stop and 36 denotes a guide.

When a signal is supplied from the voltage source 17a (or 17b), If the control rod 33 is in the ampoule sorting device against the force the spiral spring 34 moves and thus the movable part 31 moved parallel to the base plate 12, so that the opening 12d (or »12e> is opened. Accordingly, the ampoule, which is just passing through the ampoule sorting device 30a (or 30b), falls downwards, as shown by the dashed lines, and is eliminated by means of the guide 36.

When the signal coming from the voltage source 17a (or 17b) is switched off is, the movable part 31 locks the opening 12d (or 12e) again due to the force of the coil spring 34.

FIG. 4 shows a block diagram of an exemplary embodiment of the radiation thermometer 40 in FIG. 1. The radiation thermometer 40 includes a motor 41, a breaker plate 42 which is driven by the motor at a constant speed, and is set in rotary motion. The breaker plate is slotted 42a, which are equally spaced from one another. Pick-up

1 + 2
that's the black body TW. provided in order to maintain a Vexglelchswert at a temperature (for example 120 C) which is approximately the same as the temperature to which the ampoule is to be heated. In addition, the radiation thermometer contains an infrared detector 44, which detects the infrared rays coming through the slits 42a of the breaker plate 42 and, depending on their intensity,

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see converts signals. The thermometer also contains an amplifier 45, a band-pass filter 46, a synchronous rectifier 47, a low-pass filter 48 and a synchronous signal generator 51 which generates signals, which is synchronous with the interruption frequency for the infrared beam are, this interruption frequency is determined by the above-mentioned interruption plate 42 by the emanating from a light source 49 Light rays pass through the slits 42a of the breaker plate and are detected by a photocell 50.

If now heated ampoules one after the other by means of the ampoule conveyor 20 are brought under the light or radiation-sensitive surface of the radiation thermometer 40, like the In As shown in Fig. 1, the breaker plate 42 reaches an infrared ray which changes as shown in Fig. 5 (a). In this figure is with the intensity of the infrared ray emitted by the heated Ampoules run out. 56 denotes the intensity of the infrared beam that emanates from the ampoule conveyor device 20. 57 denotes the Intensity of the infrared beam emitted by the black strebler 10 (see Fig. 1) is sent out. The infrared rays are released by means of the breaker plate 42 interrupted, for example, at a frequency of 1 fcHZ and the infrared ray emitted from the black body 43 and the infrared rays alternately reach the Infrared detector 44. The infrared rays are detected by means of the infrared detector 44 converted into corresponding electrical signals. These depend on the intensity of the radiation. Via an amplifier 45 the electrical signals are supplied to the bandpass filter 46. This Bandpass filter 46 has a pass bandwidth around a certain frequency (e.g. around IkHZ). Which got through the band pass filter Signals then reach the synchronous rectifier 47. The synchronous rectifier 47 is transmitted with a synchronous signal from the synchronous signal *

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generator 51 supplied (whereby the sync signal with the interruption frequency for the infrared rays is synchronized). The synchronous rectifier 47 directs the input signals coming from the bandpass filter 46 with the help of the synchronous signal and delivers them to the Low pass filter 48.

The low pass filter 48 removes the high frequency components in the input signal and delivers the signal obtained as a temperature signal via a Output terminal 52 to the control circuit 90 and the signal processing circuit 150 in Fig. 1. The output of the low pass filter 48 has the same waveform as the waveform in Fig. 5 (b). This waveform corresponds to the waveform that the breaker plate 42 reaches.

Fig. 6 shows a block diagram of an embodiment of the first Synchronizing signal generator 60a in FIG. 1. The synchronizing signal generator has an amplifier 61, which receives the input signals coming from the photocell 7a amplified and a waveguide circuit 62 which the forms first sync signals as shown in Fig. 5 (c) by the wave shaping circuit shaping the amplified signal into a corresponding waveform. The output of the wave shaping circuit 62, d. H. the first sync signal is in sync with the Ampoule temperature signal among the temperature signals which from the radiation thermometer 40 to the signal processing circuit 150 to be delivered. The first sync signal is sent via a terminal 63 to the control circuit 100, the signal generator 120, the counting circuit 140 and the signal processing circuit 150 are laid. The sync signal generator in FIG. 6 can also be used as a signal generator 60b for the second synchronous signal, as is shown in FIG.

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In this case, the output of the wave shaping circuit 62 forms the second sync signal, the shape of which is shown in Fig. 5 (d). This is synchronous with the temperature signal of the black body among the other temperature signals which are supplied to the signal processing circuit 150 by the radiation thermometer.

Fig. 7 shows a block diagram of an embodiment of the control circuit 70 of the apparatus in Fig. 1. This control circuit includes a temperature detector circuit 71 which detects the temperature of the black beam 10 as an electric signal, upper and lower limit detectors 72 and 73, which of the output Compare the temperature detector circuit 71 with the upper and lower reference signals, an inverting circuit 74 which inverts the output of the detector 72, a NANÜT gate 75 which generates NAND outputs for the inverting circuit 74 and the lower limit value detector 73, and an inverting circuit 76 which inverts the NAND Reverse outputs.

The temperature detector circuit 71 can be a bridge-like circuit, this bridge having a component whose resistance value changes with temperature, for example a thermistor. The bridge circuit also contains three resistors and interacts with the black body 10. Accordingly, a voltage can be tapped off at the bridge, which is a measure of the change in temperature of the black body 10. This voltage is applied to the upper and lower limit value detectors 72 and 73.

The upper limit detector 72 is set to the reference signal and is identical in value to a signal to be supplied from the temperature detecting circuit 71 when the temperature of the black body 10 within the permissible range

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of the upper value. When the input signal from the temperature detector circuit 71 is above the reference signal value (abnormal or error display), a "1" pulse is generated. When the input signal, coming from the temperature detector circuit is below the reference signal value is (normal), the pulse "0" is generated. The pulses "1" or "0" are applied to the NAND gate 75 after they have been sent by of the reverse circuit 74 have been reversed.

The lower limit value detector 73 is set to a reference signal, the value of which is identical to a signal that is supplied by the temperature detector circuit when the temperature of the black Radiator 10 is within the permissible range of the lower value. Is the input signal coming from the temperature detector circuit 71 comes above the reference signal value (normal), becomes the Pulse "1" generated and when that from the temperature detector circuit incoming input is below the reference signal value (abnormal), the pulse "0" is generated. The pulses "1" or "0" are sent to the NAND element 75 supplied.

The NAND gate 75 generates the pulse ^fI 0! 'When both input signals are "1", ie when the temperature of the black body 10 is within the permissible range (normal) and it generates the pulse "1" when either of the Input signals shows the pulse form "0" (abnormal or error display). The NAND output is applied to the logic circuit 130 via a terminal 77 after it has been converted to "1" or "0" by the inverter 76. Accordingly, the output pulse of the monitoring circuit 70 ^{11 is} I "when the temperature of the black body 10 is normal and" 0 "when it is abnormal or when there is an error indication.

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8 shows a block diagram of an exemplary embodiment of the test circuit 80 in the device in Fig. 1. This test circuit includes upper and lower limit value detectors 82 and 83, - which a signal that is supplied via a terminal 81 from the voltage source 16, with compares upper and lower reference signals. It also contains an inverter 84 which inverts the output of the upper limit value detector, a NAND gate 85 which the NAND outputs for the output generated by the reversing element 84 and the lower limit value detector 83, and an inverter 86 which inverts the output of the NAND gate 85.

The operation of the circuits 82, 83, 84, 85 and 86, which the Configuring the test circuit is the same as that of the circuits 72, 73, 74, 75 and 76 constituting the control circuit 70 in FIG. Accordingly has a signal which is supplied via a terminal 87 to the logic circuit 130, the pulse form "1" when the output of the voltage source 16 is normal and the pulse shape "0" when the Voltage source output is abnormal.

9 shows an exemplary embodiment of the control circuit 90 in the device which is shown in Fig.l. This control circuit 90 contains a sample and hold circuit 93, which a temperature signal, that corresponds to the temperature of the black body 10 (Fig. 1) among the temperature signals, which from the radiation »* · thermometer 40 can be connected to an input terminal 91 using of the second synchronizing signal, which is applied to an input terminal 92 wlrt, samples and which the sampled signal to the next sample holds. Furthermore, the control circuit 90 includes upper and lower lower limit value detectors 94 and 95, which the signal with upper and lower reference signals compare., an inverter 96 that the

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The output of the upper limit value detector 94 reverses, a NAND gate 97, the NAND outputs for the output of the inverter 96 and the lower limit value detector 95 provides as well as an inverter 98, the reverses the output of NAND gate 97.

The reference signal values set in the upper and lower limit detectors 94 and 95 are the upper and lower Limit values of the temperature signals of the black body 10, which from the sample and hold circuit 93. The mode of action the upper and lower limit detectors 94 and 95, the inverters 96 and 98 and the NAND gate 97 is the same as that of the detectors 72 and 73, the inverters 74 and 76 and the NAND gate 75, which are shown in FIG. Accordingly, the delivers. Control circuit. 90 a pulse shape "1" when the radiation thermometer 40 is normal and a pulse shape "0" when the output radiation thermometer is abnormal.

Fig. 10 shows a block diagram of an embodiment of the Control circuit 100 for checking the synchronization signal in the device in FIG. 1. This control circuit checks whether the first and second sync signal generators 60a and 60b normal and whether the first and second sync signals are normal and discards all signals that are currently in the time setting circuit are stored in the signal processing circuit 150, in the event that the sync signals are abnormal. The first synchronizing signal is sent to the control circuit through a terminal 101 and the second sync signal is provided through a terminal 102. These synchronous signals are in the waveformers 103, 104 and 105 shaped accordingly.

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In an up-down counter 106, the synchronizing signal coming from the wave shaper 103 is applied to the adder terminal and the second Sync signal coming from wave shaper 104 is applied to the subtracting terminal. The output of a monostable multivibrator becomes placed on the extinguishing terminal. Since the counter 106 acts to add the first sync signal and subtract the second sync signal, the output is always "0" when the first and the second synchronous signal are normal and the output Is · "1" when one of the synchronizing signals is abnormal, for example when one is absent or it contains noise, which is achieved by counting in either the positive or negative direction will.

In a bistable multivibrator 108, the output of the up-down counter 106 is applied to the set terminal and the output of the monostable multivibrator 109 is applied to the reset terminal. The reset output of the flip-flop circuit 108 has the pulse shape ¹¹ I "(abnormal) when the output of the counter 106 has the pulse shape" 1 "(abnormal) and the pulse shape" 0 "(normal) when the pulse shape of the counter is" 0 "( normal) is.

In a 4-bit counter 107, the reset output becomes the bistable Toggle circuit 108 is applied to the clear terminal and the output of the Waveshaper 103 is applied to the adder terminal. If accordingly the reset output of the bistable multivibrator has the pulse shape If "1" (abnormal), the counter 107 starts counting. Wenß the counter 107 has counted 16 of the first synchronizing signals supplied by the wave shaper 103, the counter generates the pulse "1" and applies it to the monostable multivibrator 109. The counter 107 continues to generate the pulse "1" (normal) until it is deleted or except that it is deleted.

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The output of the monostable multivibrator 109 is the constant one Pulse "1" if the output of counter 107 has the pulse shape "1" (normal) and the monostable multivibrator has an output "0", when the counter delivers a pulse "0" (abnormal). The outcome of the The monostable multivibrator is supplied to the clear terminal of the counter 106 and to the reset terminal of the bistable multivibrator 108. As shown in FIG. 11, an integrator circuit 110 includes a component 171, which is opened and closed by the first sync signal will. This first sync signal is supplied by the wave shaper 105. Furthermore, the integrator circuit contains an integrating one Capacitor 172 connected in parallel with component 171. In addition, the integrator circuit includes a resistor 173, the is connected between a direct voltage source, not shown in detail, and the integrating capacitor, as well as a series resistor 174. Only if the first sync signal, which is sent via a terminal 175 to the component 171, which can be opened or closed, is placed, the component becomes conductive and it discharges the integrator Capacitor 172. Accordingly, when there is no sync signal, the integrating capacitor 172 is continuously charged, whereby the electrical potential increases. The potential at terminal 176 is supplied to a comparator 111.

By comparing the potential at the integrator circuit 110 with the train signal, the comparator 111 generates a pulse "0" when the Potential is below the value of the reference signal (normal) and one Impulse "1" if the potential at the integrator circuit is above the value of the Reference signal (abnormal). The output of the comparator will be applied to a NAND gate 116 via an inverter 114. The value of the reference signal is slightly above the maximum value of the Potential obtained when the first sync signal is normal is.

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Accordingly, it is using the wave shaper 105 of the integrator circuit 110 and the comparator 111 possible, a misbehavior or a faulty function of the up-down counter 1C6 or the 4-bit counter 107 to compensate when the first and second sync signals are abnormal at the same time.

The NAND gate 116 generates the pulse shape "0" only if both the reset output, which via the reversing circuit 112 from the bistable multivibrator 108 is supplied and the output of the inverter 114 also have the pulse shape "1" (normal). The from NAND gate supplied pulse is via an inverter 115 and a terminal 117 is applied to the logic circuit 130. Accordingly, the control circuit 100 generates a pulse "1" only when first and second sync signals are normal.

FIG. 12 shows an embodiment of the logic circuit 130 in the device of FIG. 1. This logic circuit contains a NAND element 131 and an inverting element 132. The NAND element 131 is connected to the outputs of the control or test circuits 70, 80, 90 and 100 supplied via terminals 133, 134, 135 and 136. It generates a pulse "0" only if all inputs have the pulse shape ¹¹ I "(normal). The output of the NAND element is supplied via a terminal 137 to the signal generator 12.0 and the signal processing circuit 150 after it has been transmitted by means of the inverter 131 has been reversed.

13 shows a block diagram of an embodiment of the Signal generator 120 in the device of FIG. 1. If the output of the logic timer 130 has the pulse form "0" (abnormal), the generator generates an abnormal signal (pulse "0") for a

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the correct length of time and discards all ampoules during this time. The first synchronous signal, which is supplied via a terminal 126, is subjected to a waveform shaping in the signal generator 120 by means of a wave shaper 121. This signal is then applied to the adder terminal of the 4-Blt counter 122. The output of the logic circuit 130 is applied to a terminal 127 and supplied to the clear terminal of the counter 122 via an inverter 124. Accordingly, the counter 122 is cleared when the output of the logic circuit 130 is "0" (abnormal). The counter then continuously generates a signal indicating a defective ampoule (pulse shape "0") until the output of the logic circuit and the output of the wave shaper 121 provide a pulse "1" (normal), namely 16 times in succession. The output pulse of the counter is applied to the reset terminal of a flip-flop 123. The control terminal of the bistable multivibrator 123 is supplied with the output of the reversing device 124. Accordingly, if the reset input has a pulse form "1" and the control input a pulse form "0" (abnormal), the reset output of the bistable multivibrator generates the pulse "1" and if the reset input has the pulse form "0" and the control input the pulse form "1" (normal), the bistable multivibrator generates the pulse ¹¹ O ¹¹ . If the reset output continues to have the pulse shape "0" and the control input has the pulse shape "0", the previous state is maintained. This means that the reset output of the bistable multivibrator only has the pulse form "0" when normal operation is in progress. The output is converted into the pulse form “1” or “0” by the inverter 125 and then supplied to the signal processing circuit 150 via a terminal 128.

14 shows a block diagram of an embodiment of the Signal processing circuit 150 in the apparatus of FIG

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Signal processing circuitry includes a pair of discriminator circuits 150a and 150b. The discriminator circuit 150a has a test circuit, the upper and lower limit detectors 151a and 152a, inverters 153a and 154 and a NAND element 155a.

The upper limit detector 151a is on the reference signal that is within of the permissible range of the upper limit of the temperature signal, this temperature signal to the output terminal 166 is laid. The lower limit detector 152a is fixed to the reference signal that is within the allowable range the lower limit. Like detectors 71 and 73 in Fig. 7, limit detectors 151a and 152a generate "1" pulses or "0" by comparing the temperature signal with the reference signal. Accordingly, both detectors produce the pulse shape "1", if the temperature signal is above the permissible range of the upper limit (abnormal) and both detectors generate the pulse "0", when the temperature signal is below the allowable range of the lower limit (abnormal). Furthermore, the upper limit value defector generates 151a generates the pulse "0" and the lower limit value detector 152a generates the pulse "1" if the temperature signal is within the permissible Range of the reference signal (normal).

The reversing element 153a reverses the output "1" or "0" of the upper one Limit detector 151a to "0" or "1" and delivers this pulse to the NAND gate 155a.

The NAND gate 155a is connected to the output of the inverter 153a, the output of the lower limit value detector 152a and the first Synchronous signal supplied by an input terminal 167. The NAND element generates a pulse "0" only if all input signals »

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have the pulse shape "1" (normal). If one or more impulses are "Ö" (abnormal) among the input impulses, this is generated NAND gate the pulse "0". If accordingly the temperature signal (57 in Fig. 5) of the black ray 10 (Fig. 1) under the temperature signals is applied to the input terminal 166 and is forwarded to the NAND gate 155a, the output of the NAND gate has the pulse shape "1", which is distinguishable from a "good ampoule signal. The The output of the NAND gate has the pulse shape "0", since the first synchronizing signal has the pulse shape "0" (FIGS. 5 (a) and (c)) '.

When the ampoule temperature signal is normal, the output of the NAND gate, as shown in Fig. 5 (e), has a waveform similar to to that of the first sync signal shown in Fig. 5 (c) to-. is swept. This pulse "0" respectively. "1" is sent to the NAND gate 156a after it has been converted into the pulse form "1" or "0" by means of the Inversion member 154a as shown in Fig. (F) has been converted.

The NAND gate 156a generates a pulse "0" only when a Test signal has been supplied by the inverter 154a and the output of the logic circuit, which is supplied via a terminal 158, has the pulse shape "It '(normal). The NAND gate generates the Pulse shape "1" on another occasion (if any pulse "Q", i.e. is abnormal). Accordingly, the output of the NAND <slied has a Waveform as shown in Fig. 5 (e) when both input signals are normal. ,

A NAND gate 157a is connected to the first sync signal via the Terminal 167 supplied. This NAND gate generates the pulse "0" only when the input signal from the NAND gate 156a has the pulse shape "1" (abnormal), and it generates the pulse "1" for others

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Conditions. This means that this NAND ^{gate continues to generate the pulse 11} I "(good pulse signal) until or unless the input signal from the NAND gate 156a changes to the pulse form" 1 "(abnormal". This pulse ") 1 "or" 0 "is supplied to a bistable multivibrator 159a via an inverter 158a.

The control input of the bistable multivibrator 159a is supplied with the output of the reversing element 158a and the reset input is with the output signal of the NAND element 156a via a conversion element 160a supplied. Accordingly, the control output of the bistable multivibrator constantly generates the pulse "1" (good ampoule signal) up to and including except that the control input changes to pulse form "1" (faulty Ampoule signal). The output signal of the flip-flop is forwarded to a shift register 161a.

The shift register 161a is a timing adjuster that is used to compensate the time from the measurement of the ampoule temperature by means of the radiation thermometer until the ampoule sorting device starts operating 30a according to the temperature signal and the time in which the ampoule measured for temperature from the bottom of the radiation thermometer to the ampoule sorting device 30a has been promoted.

The shift register 161a is supplied with the first sync signal, the has been subjected to wave shaping by means of the wave shaper 162a, the synchronizing signal acting as a clock pulse. The shift register 161a has 11 bits, for example, and the 9th and 11th bits are connected to the NAND gate 163a. Accordingly the input signals from the flip-flop 159a are shifted one by one by the clock pulses on the last bit

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postponed. The signals which have been shifted to the 9th, 10th and 11th bits are supplied to the NAND gate 163a. Accordingly, the NAND gate 163a generates. three consecutive faulty ampoule signals (pulses ¹¹ I "), if a faulty ampoule signal (pulse" 0 ") is present among the input signals.

The output of the NAND gate 163a is provided to the NAND gate 165a after being reversed by the inverter 164a is.

The NAND gate 165a is supplied with the outputs of the logic circuit 130 and the signal generator 120 via the terminals 168 and 169. The NAND element 165a generates the pulse "0" only if all input signals have the pulse shape ¹¹ I "(normal). The output of the NAND element is supplied to the voltage source 17a in FIG. 1 via a terminal 170a.

The voltage source 17a supplies the ampoule sorting device 30a only with current when the output of the NAND gate 165a has the pulse shape "1" (abnormal).

The discriminator circuit 150b is constructed in the same way except that the number of bits of shift register 161b is differs from that of the discriminator circuit a just described. Accordingly, the output of a NAND gate 165b becomes on the voltage source 17b, which is described in Pig. I is shown delivered.

The shift register 161b, which is designed as a time setting circuit, has 9 bits, for example, since the ampoule sorting device 30b shown in FIG. 1 is closer to the temperature detector 5 is arranged as the ampoule sorting device 30a. Accordingly

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the 7th, 8th and 9th bits are connected to the NAND gate 163b.

In the embodiment described above, the ampoule sorting device is constructed in such a way that it is actuated by a logic signal output via a test circuit. However, there can be several Ampoule sorting devices independently of one another by means of output signals their corresponding test circuits are operated.

Whether or not the temperature of a heated ampoule is normal can be checked by one of the discriminator circuits. For the case that several ampoule sorting devices from the exit of the the same discriminator circuit can be prevented be that defective ampoules mixed with good ampoules due to incorrect operation of the ampoule sorting device will.

In addition, the material of the conveyor itself or the sections where openings la are provided from a Matertal exist that allows infrared radiation to pass through. This avoids that holes or slots or openings 13 in the ampoule conveyor 20 are available.

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Claims (1)

■ Claims Iy sterilization device for ampoules containing liquids, with a heating chamber in which the ampoules are irradiated with microwaves while the ampoules are subjected to heating moved through the heating chamber by an ampoule conveyor are characterized by a temperature measuring device (5) for the heated ampoules (11) ,, a control circuit for checking of the temperature signals delivered to the temperature measuring device, with a permissible range delimiting reference signals and for generating a Output signal when the temperature signal is either within or is below the range of the reference signal and by an ampoule sorting device (30a or 30b), which is controlled by the output signal of the control circuit. 2. Apparatus according to claim 1, characterized in that the temperature measuring device for the heated ampoules contains a radiation thermometer (40). 3. Apparatus according to claim 1, characterized in that the Control circuit contains a comparison circuit to compare the temperature signals with reference signals for upper and lower limit values and that a circuit for generating logical outputs of both compared signals are provided. 4. Device according to one of the preceding claims, characterized in that that a black radiator (10) is provided, which is kept at a constant temperature, that the radiation thermometer (40) In addition to the temperatures of the heated ampoules, the temperature of the black body measures that the comparison day 409827/0961 the temperature signals assigned to the ampoules from the Output signals of the radiation thermometer with the reference signals compares and generates a first test signal when the temperature signal either within or below the allowable range that a comparator will detect a temperature signal below the output signals the radiation thermometer, which corresponds to the temperature of the black body, with the reference signal, the one indicates allowable range, compares and delivers a second test signal if the temperature signal for the blackbody either is within or below the permitted range, and that an ampoule sorting device (30a or 30b) is provided, which are controlled by the first test signal and / or the second test signal will. 5. Apparatus according to claim 4, characterized in that each comparison circuit has a comparator for comparing the temperature signal, that comes from the radiation thermometer, with an upper limit setting reference signal and a comparator for comparing the temperature signal with a reference signal defining a lower limit and a device for generating it a logical output of both compared signals. , 6. Apparatus according to claim 4, characterized in that a Device for generating the logical outputs (A) of the first and second test signals generated, wherein the ampoule sorting device is controlled by the logic outputs (A). 40982 77 096 7. The device according spoke 4, characterized in that one Device for recording the temperature of the black body is provided as an electrical signal that a comparison device is provided which this signal with a reference signal, the one limits the permissible range, compares and generates a third test signal if the signal detected as a function of the temperature either within or below the range given by the reference signal is pegged, lies, the ampoule storage device at least is controlled by a test signal, namely the first, second or third. 8. Apparatus according to claim 7, characterized in that the Comparison device which generates the third test signal, comparison circuits has, which depends on the temperature of the black body detected signal with, a reference signal, the one upper limit and a reference signal that defines a lower limit defines, compares, contains and that furthermore a device for Generation of logical outputs of the two compared signals is provided. 9. Apparatus according to claim 7, characterized in that devices for generating logic outputs (B) for the first, second and third test signals are provided, the ampoule sorting device is controlled by the logical outputs (B). 10. Apparatus according to claim 7, characterized in that devices are provided for generating logical outputs (C) of the second and third test signals, the AmpuUensolagereinrichtung from the first test signal and / or the logical outputs (C) is controlled. . 40 9827/096 1 11. The device according to claim 10, characterized in that devices for generating logic outputs (D) of the first test signal and the logic outputs (C) are provided, wherein the ampoule sorting device from the logical outputs (D) controls is. 12. The device according to claim 7, characterized in that a voltage source is provided which supplies each circuit with voltage, that a comparison circuit is provided which compares the output signal of the voltage source with a reference signal staking out a permissible range and that a device for generating a fourth Test signal is provided when the output signal of the voltage source is either within or below the permissible range, the ampoule sorting device being controlled by at least one of the first, second, third and fourth test signals, 13. The apparatus according to claim 12, characterized in that the Comparison circuit and the device for generating a fourth Test signal contains comparison devices which determine the output signal of the voltage source with an upper limit Compare reference signal and a lower limit defining reference signal, and that means for generating the logical outputs of the two compared signals is provided. 14. Apparatus according to claim 12, characterized in that one Device for generating logical outputs (E) from the first, second, third and fourth test signals are provided, the ampoule sorting device being controlled by the logic outputs (E) is. 409827/0961
> 374 15. Apparatus according to claim 12, characterized in that one Device for generating logical outputs (F) from the second, third and fourth test signals is provided, the AmpuUensortieinrichtung is controlled by the logic outputs (F) and / or the first test signal. 16. The device according to claim 15, characterized in that a Device for generating logical outputs (G) from the first Test signal and the logic outputs (F) is provided, the Ampoule sorting device is controlled by the logic outputs (G). 17. The device according to claim 4, characterized in that a Device for generating a first synchronous signal with the measurement of the ampoule temperature by the radiation thermometer is in synchronization and a device for generating logic outputs (H) from the first sync signal and the first test signal are provided, the ampoule sorting device being controlled by the logic outputs (H). 18. The device according to claim 4, characterized in that a device for generating a second synchronizing signal, which with the temperature measurement of the black body is synchronized by the radiation thermometer, is provided, the device for generating the second test signal contains means with which the temperature signal, which corresponds to the temperature of the black beam, is extracted from the output signals of the radiation thermometer by means of the second synchronous signal. 6374 409827 / 0-9 19. Device according to claim 4, characterized in that a test device is provided for checking the first and second synchronous signals, the ampoule sorting device being controlled by at least one of the first and second test signals and the output of the test circuit for checking the first and second synchronous signal. 20. Apparatus according to claim 12, characterized in that a Device for generating faulty ampoule signals for a A certain period of time is provided which discards the ampoules when at least one of the second, third and fourth test signals is on supplies faulty ampoule signal, the ampoule sorting device on the first test signal and / or the faulty ampoule signals is controlled. 21. Device according to one of the preceding claims, characterized in that the ampoule sorting device on a base plate, over which the ampoules are conveyed is provided and that the base plate in the area of the ampoule sorting device is provided with an opening which is larger than the container part the ampoule and that this opening is opened or closed controlled by the test and / or logic outputs. 22. The device according to claim 4, characterized in that the ampoule sorting device is provided at a certain distance from the temperature measuring device for the ampoules and that a time setting circuit for delaying the output signals of the device which supplies the first test signal is provided between the ampoule sorting device and the signal generating device . ₆₃₇₄ 4098 2 7/0961 23. The device according to claim 22, characterized in that the Time setting circuit for tent compensation between the time during which the temperature of the ampoule has been measured by means of the radiation thermometer until the time during which the ampoule sorting device is operated, the time is compensated, which the Ampoule in the transport from the temperature measuring position to the Ampoule sorting facility required. 24i device according to claim 23, characterized in that the Timing circuit is a shift register. 25. Device according to one of the preceding claims, characterized in that that the ampoule conveyor for pulling the ampoules through the heating chamber ampoule holding parts with regular Spaced apart and between the ampoules Has openings that the radiation thermometer on one side the ampoule conveyor and the black body on the opposite one Side of the Ampullenfördereinriehtung is provided, wherein the radiation thermometer and the black body with each other are aligned that a comparison device for comparing the temperature signal, which corresponds to the ampoule temperature among the output signals of the radiation thermometer, with a reference signal, that defines a permissible range and for generating the first test signal when the temperature signal is either within or is below the permissible range that further a comparison circuit Is intended to compare the temperature signal, which corresponds to the temperature of the black body, with a reference signal, that defines a permissible area and for generating. of the second test signal if the temperature signal is either within or below the allowable range and that at least one ampoule sorting device is provided, which is controlled by the first ond / or second test signal. - - ' 6374 409827/0961 26. The device according to claim 25, characterized in that several narrow pressure plates are parallel and at certain intervals are provided on the ampoule conveyor. 27. The device according to claim 26, characterized in that the space between two adjacent pressure plates on the ampoule conveyor serves as an ampoule holding part. 28. The device according to claim 27, characterized in that a End of one printing plate with one end of an adjacent printing plate connected is. 29. The device according to claim 28, characterized in that a carrier is provided on a connecting member between two adjacent pressure plates, so that slipping of the ampoule is avoided . 30. The device according to claim 20, characterized in that the Cross-section of each printing plate is trapezoidal. 409827/0961 33. Blank page