DE202005021171U1 - Laser micro-shaping and cutting assembly has two or more arrays of convex mirrors bearing a dielectric coating - Google Patents
Laser micro-shaping and cutting assembly has two or more arrays of convex mirrors bearing a dielectric coating Download PDFInfo
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- DE202005021171U1 DE202005021171U1 DE202005021171U DE202005021171U DE202005021171U1 DE 202005021171 U1 DE202005021171 U1 DE 202005021171U1 DE 202005021171 U DE202005021171 U DE 202005021171U DE 202005021171 U DE202005021171 U DE 202005021171U DE 202005021171 U1 DE202005021171 U1 DE 202005021171U1
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- 238000007493 shaping process Methods 0.000 title claims abstract description 15
- 238000003491 array Methods 0.000 title claims abstract description 8
- 239000011248 coating agent Substances 0.000 title abstract description 3
- 238000000576 coating method Methods 0.000 title abstract description 3
- 239000011261 inert gas Substances 0.000 claims description 12
- 238000005459 micromachining Methods 0.000 claims description 11
- 238000003384 imaging method Methods 0.000 claims description 10
- 239000000758 substrate Substances 0.000 claims description 6
- 239000000203 mixture Substances 0.000 claims description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 18
- 239000000463 material Substances 0.000 description 13
- 229910052757 nitrogen Inorganic materials 0.000 description 9
- 230000005540 biological transmission Effects 0.000 description 8
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- 238000011010 flushing procedure Methods 0.000 description 4
- 230000005855 radiation Effects 0.000 description 3
- 241001270131 Agaricus moelleri Species 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
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- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
- B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/0604—Shaping the laser beam, e.g. by masks or multi-focusing by a combination of beams
- B23K26/0613—Shaping the laser beam, e.g. by masks or multi-focusing by a combination of beams having a common axis
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
- B23K26/0643—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms comprising mirrors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
- B23K26/0648—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms comprising lenses
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/0665—Shaping the laser beam, e.g. by masks or multi-focusing by beam condensation on the workpiece, e.g. for focusing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/12—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure
- B23K26/1224—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure in vacuum
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/12—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure
- B23K26/123—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure in an atmosphere of particular gases
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/12—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure
- B23K26/123—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure in an atmosphere of particular gases
- B23K26/125—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure in an atmosphere of particular gases of mixed gases
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/12—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure
- B23K26/127—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure in an enclosure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/12—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure
- B23K26/127—Working by laser beam, e.g. welding, cutting or boring in a special atmosphere, e.g. in an enclosure in an enclosure
- B23K26/128—Laser beam path enclosures
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
- G02B19/0009—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only
- G02B19/0014—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed having refractive surfaces only at least one surface having optical power
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
- G02B19/0052—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source the light source comprising a laser diode
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0095—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with ultraviolet radiation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
- G02B27/0938—Using specific optical elements
- G02B27/0977—Reflective elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
- G02B27/0938—Using specific optical elements
- G02B27/0977—Reflective elements
- G02B27/0983—Reflective elements being curved
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- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- General Physics & Mathematics (AREA)
- Laser Beam Processing (AREA)
Abstract
Description
Die Erfindung betrifft einen Homogenisierer einer Lasermikrobearbeitungsstation, die beispielsweise zumindest umfasst: einen UV-Laser mit einer Wellenlänge kleiner als 200 nm, eine Vorrichtung zur Strahlformung, eine Vorrichtung zum Abbilden des Laserstrahls auf das zu bearbeitende Substrat und ein Positioniersystem, welches in einer Bearbeitungskammer angeordnet ist.The The invention relates to a homogenizer of a laser micromachining station, which for example comprises at least: a UV laser with a wavelength smaller as 200 nm, a device for beam shaping, a device for imaging the laser beam onto the substrate to be processed and a Positioning system, which is arranged in a processing chamber is.
Die Mikrobearbeitung verschiedenster Materialien gewinnt zunehmend an Bedeutung für Anwendungen in verschiedenen innovativen Bereichen von Forschung und Industrie, beispielsweise in der Mikrosystemtechnik, Medizintechnik und Biotechnologie.The Micro-machining of various materials is increasingly gaining ground Meaning of Applications in various innovative areas of research and industry, for example in microsystems technology, medical technology and biotechnology.
Zur Mikrobearbeitung im Sinne der Erfindung zählen neben dem Materialabtrag auch Modifizierungen von Oberflächen und Materialeigenschaften durch Einwirkung von Laserstrahlen.to Micro-machining within the meaning of the invention are in addition to the material removal also modifications of surfaces and material properties by the action of laser beams.
Zur Mikrobearbeitung verschiedenster Materialien werden so genannte Lasermikrobearbeitungsstationen eingesetzt, die mit Lasern unterschiedlichster Wellenlängen, beispielsweise λ = 248 nm oder λ = 193 nm, arbeiten.to Micro processing of various materials are called Lasermikrobearbeitungsstationen used with lasers of various Wavelengths, for example, λ = 248 nm or λ = 193 nm, work.
Diese Lasermikrobearbeitungsstationen umfassen insbesondere folgende Bauteile: einen Laser, z.B.: einen Excimerlaser, eine Vorrichtung zur Strahlformung, eine Vorrichtung zum Abbilden des Laserstrahls auf das zu bearbeitende Substrat und ein Positioniersystem zur präzisen Bewegung des Substrates.These Laser micromachining stations comprise in particular the following components: a laser, e.g., an excimer laser, a beam shaping device, a device for imaging the laser beam on the to be processed Substrate and a positioning system for precise movement of the substrate.
Die Vorrichtung zur Strahlformung dient der Erzeugung eines Flat-Top Profils in der Maskenebene. Die Maske kann beliebig geformte Öffnungen enthalten, deren maximale Ausdehnung durch die Größe des Laserstrahlquerschnitts in der Maskenebene bestimmt wird. Die Maske begrenzt die Laserstrahlung auf den gewünschten Bereich. Die Laserstrahlung soll dabei mit möglichst gleichmäßiger Energiedichteverteilung (so genannter Flat-Top Intensitätsverteilung) auf die strahlungsdurchlässigen Bereiche der Maske gelenkt werden.The Beam shaping device is used to generate a flat-top Profiles in the mask layer. The mask can be any shaped openings whose maximum extent is determined by the size of the laser beam cross section is determined at the mask level. The mask limits the laser radiation to the desired Area. The laser radiation should thereby with as even energy density distribution (so-called flat-top intensity distribution) on the radiation-transmissive Areas of the mask are steered.
Der von einem Excimerlaser emittierte Laserstrahl hat in der Regel keine gleichförmige Intensitätsverteilung über seinen Querschnitt. Der von einem Excimerlaser abgegebene Laserstrahl hat einen etwa rechteckförmigen Querschnitt. In Richtung der langen Achse ist das Intensitätsprofil des Laserstrahls etwa trapezförmig mit Intensitätsschwankungen. In Richtung der kurzen Achse hat der Laserstrahl ein Intensitätsprofil, welches etwa einer Gauß-Kurve entspricht. Für eine präzise Bearbeitung des Substrates ist jedoch häufig eine möglichst gleichförmige Intensitätsverteilung über einen bestimmten, häufig quadratischen Querschnitt erwünscht.Of the As a rule, the laser beam emitted by an excimer laser has no uniform Intensity distribution over his Cross-section. The laser beam emitted by an excimer laser has an approximately rectangular Cross-section. In the direction of the long axis is the intensity profile of the laser beam approximately trapezoidal with intensity fluctuations. In the direction of the short axis, the laser beam has an intensity profile, which is about a Gaussian curve equivalent. For a precise one Processing of the substrate, however, is often a very uniform intensity distribution over a certain, often square cross section desired.
Der F2-Laser bietet aufgrund seiner kurzen Wellenlänge von ca. 157 nm und der damit verbundenen hohen Photonenenergie von ca. 7,9 eV eine Reihe von Möglichkeiten, die mit anderen Lasern nicht oder nur bedingt realisiert werden können. So können beispielsweise Materialien, die bei der Wellenlänge 193 nm eine zu geringe Absorption aufweisen, z.B.: Quarzglas und PTFE, in guter Qualität bearbeitet werden. Durch die kurze Wellenlänge ist zudem eine höhere Strukturauflösung im Vergleich zur Bearbeitung mit größeren Wellenlängen möglich.Due to its short wavelength of approx. 157 nm and the associated high photon energy of approx. 7.9 eV, the F 2 laser offers a number of possibilities that can not or only partially be realized with other lasers. Thus, for example, materials which have too low absorption at the wavelength of 193 nm, for example: quartz glass and PTFE, can be processed in good quality. Due to the short wavelength, a higher structure resolution is possible in comparison to processing with longer wavelengths.
Die Laserstrahlung der F2-Laser, d. h. die Wellenlänge beträgt ca. 157 nm, wird bei Vorhandensein von Luftsauerstoff unter Bildung von Ozon absorbiert, was die Strahlführung an Luft unmöglich macht. Schon eine Konzentration von wenigen ppm Sauerstoff führt, beispielsweise in einem ca. 4 m langen Strahlweg. zu einem spürbaren Verlust an Laserleistung.The laser radiation of the F 2 laser, ie the wavelength is about 157 nm, is absorbed in the presence of atmospheric oxygen to form ozone, which makes the beam guidance in air impossible. Even a concentration of a few ppm of oxygen leads, for example, in an approximately 4 m long beam path. to a noticeable loss of laser power.
Deshalb wird in entsprechenden Anlagen angestrebt, den Strahlengang von Sauerstoff möglichst frei zu halten. Diesbezüglich gibt es derzeit zwei bekannte Lösungskonzepte. Bei der ersten Lösung verläuft zumindest ein Teil des Strahlengangs des Lasers im Vakuum.Therefore is aimed at in appropriate facilities, the beam path of Oxygen as free as possible to keep. In this regard, There are currently two known solution concepts. At the first solution extends at least part of the beam path of the laser in a vacuum.
Beim zweiten Konzept wird der Strahlengang vor und während der Laserbearbeitung, mit Inertgas, beispielsweise mit Stickstoff, gespült, um mit dem Spülmedium auch den Luftsauerstoff aus dem Bereich des Strahlenganges auszutragen. Ein solches Spülen ist zeitaufwendig, u. a. durch das erforderliche Spülen vor Beginn der Bearbeitung, und bedarf großer Mengen des Spülmediums.At the second concept is the beam path before and during laser processing, with inert gas, for example, with nitrogen, rinsed with the flushing medium also remove the atmospheric oxygen from the area of the beam path. Such a rinse is time consuming, u. a. by the required rinsing Beginning of processing, and requires large amounts of flushing medium.
Aus der Literatur, Peter R. Herman, Kevin P. Chen, Midori Wei, Jie Zhang, Jürgen Ihlemann, Dirk Schäfer, Gerd Marowsky, Peter Oesterlin and Berthold Burghardt, „F2-lasers: High-Resolution Otical Processing System for Shaping Photonic Components" in Proceedings of SPIE Vol. 4274 (2001) pp 149-157, ist eine F2-Lasermikrobearbeitungsstation bekannt, deren Strahlengang mit Stickstoff gespült wird. Mit dieser Anlage soll auf einer Fläche von 240 μm × 240 μm eine Laserfluenz von 2.5 J/cm2 erreicht werden.From the literature, Peter R. Herman, Kevin P. Chen, Midori Wei, Jie Zhang, Jurgen Ihlemann, Dirk Schaefer, Gerd Marowsky, Peter Oesterlin and Berthold Burghardt, "F 2 Laser: High-Resolution Otical Processing System for Shaping Photonic Components "in Proceedings of SPIE Vol. 4274 (2001) pp 149-157, an F 2 laser micromachining station is known, the beam path is purged with nitrogen.This system is on a surface of 240 microns × 240 microns, a laser fluence of 2.5 J / cm 2 can be achieved.
Ein
spezielles Strahlführungssystem
für Laser
mit Wellenlängen
kleiner als 200 nm ist aus der
Aufgabe der Erfindung ist es, einen Homogenisierer für eine Lasermikrobearbeitungsstation der eingangs genannten Art bereitzustellen, mit welcher eine höhere Effizienz bezüglich der Laserfluenz bei hoher Abbildungsqualität erreichbar ist.task The invention is a homogenizer for a laser micromachining station of the type mentioned above, with which a higher efficiency in terms of the laser fluence can be achieved with high imaging quality.
Die Aufgabe der Erfindung wird durch einen Homogenisierer für eine Lasermikrobearbeitungsstation gemäß den Merkmalen des Anspruchs 1 gelöst.The The object of the invention is achieved by a homogenizer for a laser micromachining station according to the characteristics of claim 1.
Erfindungswesentlich ist, dass dieser zumindest aus zwei Spiegelarrays besteht.essential to the invention is that this consists of at least two mirror arrays.
Außerdem ist wesentlich, dass die Vorrichtung zur Strahlformung aus zumindest mehreren reflektierenden Bauteilen besteht, die Vorrichtung zur Strahlformung und die Vorrichtung zum Abbilden des Laserstrahls in einem druck- und vakuumdichten Kammersystem angeordnet sind, welches evakuierbar und mit zumindest einem Inertgas befüllbar ist, und die Bearbeitungskammer druck- und vakuumdicht ist.Besides that is essential that the device for beam forming from at least consists of several reflective components, the device for beam shaping and the apparatus for imaging the laser beam in a pressurized and vacuum-tight chamber system are arranged, which can be evacuated and can be filled with at least one inert gas, and the processing chamber is pressure and vacuum tight.
Durch den Umstand, dass die Vorrichtung zur Strahlformung aus zumindest mehreren reflektierenden Bauteilen besteht, können Verluste bezüglich der Laserenergie, welche in Vorrichtungen zur Strahlformung, die im wesentlichen mit Linsensystemen arbeiten, nicht zu verhindern sind, stark reduziert werden. Ein geringerer Verschleiß des Lasers und der Bauelemente, die direkt nach dem Laserausgang angeordnet sind, ist zu verzeichnen. Für Linsen ist regelmäßig ein Transmissionsverhalten von ca. 85 typisch. Die Effizienz von Spiegeln beträgt dagegen ca. 93 bis 97 %.By the fact that the device for beam forming from at least consists of several reflective components, losses in terms of Laser energy used in beam shaping devices used in the essentially working with lens systems, are not preventable be greatly reduced. Less wear of the laser and components, which are located directly after the laser output is recorded. For lenses is a regular one Transmission behavior of approx. 85 typical. The efficiency of mirrors is By contrast, about 93 to 97%.
Außerdem ist durch die erfindungsgemäße Merkmalskombination ermöglicht, dass der Querschnitt der Kammer des Strahlenganges größer dimensioniert werden kann, ohne die Effizienz der Anlage zu reduzieren. Bei solchen Querschnitten, beispielsweise von 300 bis 400 mm, verringert sich die Gefahr durch unerwünschtes Beschichten der optischen Bauteile durch von den Wänden abgetragenes Material.Besides that is by the feature combination according to the invention allows that the cross section of the chamber of the beam path larger dimensions without reducing the efficiency of the plant. In such Cross sections, for example from 300 to 400 mm, decreases the danger of unwanted Coating the optical components by material removed from the walls.
Weitere vorteilhafte Ausgestaltung der Erfindung sind in den Ansprüchen 2 bis 7 beschrieben, wobei dies keine abschließende Darstellung der Erfindung ist.Further advantageous embodiment of the invention are in the claims 2 to 7, this being not a final illustration of the invention is.
Sehr bevorzugt ist, dass dieser Homogenisierer mit einem Beam Combiner (Divergenzangleicher) kombiniert ist, der zumindest aus zwei Umlenkspiegelsystemen besteht, beispielsweise 90°-Umlenkspiegelsystemen, die jeweils aus drei treppenförmig montierten Spiegeln aufgebaut sind.Very it is preferred that this homogenizer with a beam combiner (Divergenzangleicher) is composed, which consists of at least two deflection mirror systems, for example 90 ° mirror systems, each made up of three stepped mounted mirrors are constructed.
Die Erfindung wird nachfolgend an einem Ausführungsbeispiel anhand einer Zeichnung näher erläutert.The The invention is described below using an exemplary embodiment with reference to FIG Drawing explained in more detail.
Es zeigen:It demonstrate:
Die
F2-Lasermikrobearbeitungsstation
In
der ersten Baueinheit
An
den Strahlausgang des Excimerlasers
Entsprechend
des Verlaufes des aus dem Bauteil
Entsprechend
des Verlaufes des Strahlenganges des eingekoppelten Laserstrahls
(innerhalb dieses Bauteils
Die
zur Bearbeitung benötigte
Laserpulsenergie wird mit Hilfe eines an sich bekannten, rechnergesteuerten
Laserstrahl-Abschwächer
Der
Beam Combiner
Nach
der Komprimierung der langen Achse (X-Koordinate) im Kompressor
Ein
Homogenisierer
In
der Baueinheit
Das
Transmissions-Objektiv
Die
optimale Justierbarkeit ist gewährleistet durch
mehrere Handschuhflansche an der Seite der Kammern
Mit
Hilfe einer zusätzlichen
Leistungsmessung, in
Das
Transmissions-Objektiv
Am
Transmissions-Objektiv
Das
Transmissions-Objektiv
Die druck- und vakuumdichten Kammersysteme mit der Vorrichtung zur Strahlformung und der Vorrichtung zum Abbilden des Laserstrahls, das Objektiv und bei Bedarf auch die Bearbeitungskammer werden zunächst evakuiert und im Anschluss mit einem Inertgas oder Inertgasgemisch befüllt, so dass eine Materialbearbeitung mit der Laserwellenlänge 157 nm über einen Zeitraum von mehreren Stunden ohne Spülen und ohne einen Abfall an Laserfluenz auf der Probenoberfläche möglich ist.The Pressure and vacuum-tight chamber systems with the device for beam shaping and the apparatus for imaging the laser beam, the objective and if necessary, the processing chamber are first evacuated and subsequently filled with an inert gas or inert gas mixture, then that a material processing with the laser wavelength 157th nm over a period of several hours without rinsing and without a drop off Laser fluence on the sample surface possible is.
Die
Kammer
Die Justage der Bauteile der Vorrichtung zur Strahlformung bzw. der Vorrichtung zum Abbilden des Laserstrahls erfolgt manuell unter Nutzung von Handschuhen, welche gasdicht mit der jeweiligen Kammer verbunden sind.The Adjustment of the components of the device for beam shaping or the Device for imaging the laser beam is done manually under Use of gloves, which are gas-tight with the respective chamber are connected.
Die Auswahl der beschriebenen Bauteile, deren Dimensionierung und die Materialauswahl erfolgen in Abhängigkeit vom jeweiligen Verwendungszweck der Lasermikrobearbeitungsstation in bekannter Art und Weise.The Selection of the components described, their dimensions and the Material selection is dependent from the respective intended use of the laser micro-processing station in a known manner.
Beispiele zur Materialbearbeitung mittels der F2-Lasermikrobearbeitungsstation: Mit der F2-Laserstation wurden im Labor Bearbeitungen mit verschiedenen Masken und Materialien durchgeführt. Die Ergebnisse belegen das hohe Auflösungsvermögen der Abbildungsoptik sowie die Präzision des Positioniersystems.Examples of material processing using the F 2 laser micro-machining station: The F 2 laser station was used to perform various masks and materials in the laboratory. The results prove the high resolution of the imaging optics as well as the precision of the positioning system.
PMMA-Proben wurden mit einer Fluenz von 130 mJ/cm2 bearbeitet. Für die Strukturierung wurden 1 bis 50 Pulse pro Position verwendet.PMMA samples were processed at a fluence of 130 mJ / cm 2 . For structuring, 1 to 50 pulses per position were used.
Quarzglas und Pyrexglas wurden mit einer Fluenz von 4.3 J/cm2 mit 1 bis 100 Pulsen pro Position bearbeitet. Die Abtragsrate beträgt ca. 120 nm pro Puls.Quartz glass and pyrex glass were processed at a fluence of 4.3 J / cm 2 with 1 to 100 pulses per position. The removal rate is about 120 nm per pulse.
In
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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DE202005021171U DE202005021171U1 (en) | 2005-09-12 | 2005-09-12 | Laser micro-shaping and cutting assembly has two or more arrays of convex mirrors bearing a dielectric coating |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE202005021171U DE202005021171U1 (en) | 2005-09-12 | 2005-09-12 | Laser micro-shaping and cutting assembly has two or more arrays of convex mirrors bearing a dielectric coating |
DE102005043596A DE102005043596B4 (en) | 2005-09-12 | 2005-09-12 | Laser micro processing station, beam transformation device and homogenizer for a laser micro processing station |
Publications (1)
Publication Number | Publication Date |
---|---|
DE202005021171U1 true DE202005021171U1 (en) | 2007-06-21 |
Family
ID=38220065
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---|---|---|---|
DE202005021171U Expired - Lifetime DE202005021171U1 (en) | 2005-09-12 | 2005-09-12 | Laser micro-shaping and cutting assembly has two or more arrays of convex mirrors bearing a dielectric coating |
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DE (1) | DE202005021171U1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102018103131A1 (en) | 2018-02-13 | 2019-08-14 | Innovavent Gmbh | Optical system for processing at least one incoming laser beam |
-
2005
- 2005-09-12 DE DE202005021171U patent/DE202005021171U1/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102018103131A1 (en) | 2018-02-13 | 2019-08-14 | Innovavent Gmbh | Optical system for processing at least one incoming laser beam |
WO2019158497A1 (en) | 2018-02-13 | 2019-08-22 | Innovavent Gmbh | Optical system for processing at least one incident laser beam |
DE102018103131B4 (en) | 2018-02-13 | 2020-07-09 | Innovavent Gmbh | Device for generating an illumination line, optical system and method for processing at least one incoming laser beam |
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