DE19835070A1 - Arrangement for adjustable wavelength-dependent detection in fluorescent microscope has combination(s) of short and long pass filters producing adjustable band pass filter - Google Patents

Arrangement for adjustable wavelength-dependent detection in fluorescent microscope has combination(s) of short and long pass filters producing adjustable band pass filter

Info

Publication number
DE19835070A1
DE19835070A1 DE1998135070 DE19835070A DE19835070A1 DE 19835070 A1 DE19835070 A1 DE 19835070A1 DE 1998135070 DE1998135070 DE 1998135070 DE 19835070 A DE19835070 A DE 19835070A DE 19835070 A1 DE19835070 A1 DE 19835070A1
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DE
Germany
Prior art keywords
filter
short
arrangement according
adjustable
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE1998135070
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German (de)
Other versions
DE19835070B4 (en
Inventor
Torsten Antrack
Ulrich Simon
Michael Stock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
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Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=7876336&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE19835070(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Carl Zeiss Jena GmbH filed Critical Carl Zeiss Jena GmbH
Priority to DE1998135070 priority Critical patent/DE19835070B4/en
Priority to JP21781199A priority patent/JP4608688B2/en
Publication of DE19835070A1 publication Critical patent/DE19835070A1/en
Application granted granted Critical
Publication of DE19835070B4 publication Critical patent/DE19835070B4/en
Anticipated expiration legal-status Critical
Revoked legal-status Critical Current

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The arrangement consists of at least one combination of at least one short pass and at least one long pass filter for producing an adjustable band pass filter (FE). At least one filter can be replaced by one of a different wavelength characteristic and/or can be adjusted in wavelength characteristic. Filter changers are provided for both long pass and short pass filters. An Independent claim is also included for a method of image acquisition using the arrangement.

Description

Die Erfindung betrifft die Hintereinanderschaltung von variablen oder diskreten Kurzpaß- und Langpaßfiltern zur Realisierung eines frei programmierbaren Bandpaßfilters für den Einsatz in der Fluoreszenzmikroskopie, insbesondere in einem Laser- Scanning-Mikroskop.The invention relates to the series connection of variable or discrete Short pass and long pass filters to implement a freely programmable Bandpass filter for use in fluorescence microscopy, especially in a laser scanning microscope.

Diese Filter können vorteilhaft auch an neu auf den Markt kommende Farbstoffe in der Fluoreszenzfärbung angepaßt werden.These filters can also be beneficial to new dyes coming onto the market be adapted to the fluorescence staining.

In Fig. 1 ist schematisch eine Mikroskopeinheit M und ein angekoppelter Scankopf S dargestellt. Im Mikroskop ist eine Lichtquelle LQ1 mit einer Beleuchtungsoptik vorgesehen, die über einen Strahlteiler ST1 das Objekt auf dem Mikroskoptisch T konventionell beleuchtet.In Fig. 1, a microscope unit M and a coupled scan head S is shown schematically. A light source LQ1 with illumination optics is provided in the microscope, which conventionally illuminates the object on the microscope stage T via a beam splitter ST1.

Ein schwenkbarer Spiegel S3 dient zur Umschaltung auf Durchlichtbeleuchtung mittels einer Lichtquelle LQ2 über den Kondensor KO. Über eine Tubuslinse TL und einen Spiegel S1 erfolgt die Beobachtung über ein Okular OK.A swiveling mirror S3 is used to switch to transmitted light illumination by means of a light source LQ2 via the condenser KO. The observation takes place via a tube lens TL and a mirror S1 Eyepiece OK.

Über diesen Spiegel oder Strahlteiler S1 wird weiterhin der Scanstrahlengang eingekoppelt, über die Scanlinse SL und den Scanner SC.The scanning beam path continues via this mirror or beam splitter S1 coupled, via the scan lens SL and the scanner SC.

Das Licht eines Lasers L wird über Verschluß V, Einkoppeloptik EO, Spiegel S2 und Strahlteiler ST2 in Richtung des Scanners SC eingekoppelt. Über den dichroitische Strahlteiler ST2 gelangt das vom Objekt kommende Reflexions- und/oder Fluoreszenzlicht über eine Kollimationsoptik KO und ein Pinhole PH auf einen Detektor dem eine erfindungsgemäße Filtereinheit FE vorgeordnet ist, die in Fig. 1a schematisch vergrößert dargestellt ist. The light from a laser L is coupled in in the direction of the scanner SC via shutter V, coupling optics EO, mirror S2 and beam splitter ST2. Via the dichroic beam splitter ST2, the reflection and / or fluorescent light coming from the object passes through a collimating lens KO and a pinhole PH to a detector which is preceded by a filter unit FE according to the invention, which is shown schematically enlarged in FIG. 1a.

Die Filtereinheit besteht vorteilhaft aus auswechselbaren Kurzpaß- und Langpaßfiltern, wodurch sich die Breite und der Schwerpunkt eines gewünschten Bandpasses einstellen lassen. Zusätzlich kann noch ein sogenannter "Notch"-Filter vorgesehen sein, der nur die Anregungswellenlänge mit hoher optischer Dichte unterdrückt, was die Nachweisempfindlichkeit für das Fluoreszenzlicht noch erhöht. Es können natürlich auch in mehreren Detektionskanälen die beschriebenen Filtereinheiten verwendet werden, wobei die Aufteilung der Detektionskanäle in bekannter Weise, beispielsweise gemäß DE 19 70 275A1, mittels dichroitischer Strahlteiler, auch auswechselbar auf einem Teilerrevolver, zur groben Vorselektion des Spektralbereiches erfolgen kann und die Feineinstellung über die erfindungsgemäßen Filtereinheiten erfolgt.The filter unit advantageously consists of exchangeable short-pass and Long pass filters, which changes the width and center of gravity of a desired one Have bandpasses set. In addition, a so-called "notch" filter can be provided, which only the Excitation wavelength with high optical density suppresses what the Detection sensitivity for the fluorescent light still increased. Of course, the described ones can also be used in several detection channels Filter units are used, the division of the detection channels into known manner, for example according to DE 19 70 275A1, using dichroic beam splitters, also exchangeable on a divider turret, for rough preselection of the spectral range can be done and the fine adjustment takes place via the filter units according to the invention.

Fig. 2a-d zeigen Beispiele von erfindungsgemäßen Filteranordnungen, Fig. 2a hintereinandergeschaltete Filterschieber FS1, FS2 mit kreisförmigen Filtern F1 bzw. F2, wobei in optischen Achse A jeweils zwei unterschiedliche Filter miteinander kombiniert sind. 2a-d show. Examples of inventive filter arrangement, Fig. 2a cascaded filter slide FS1, FS2 with circular filters F1 and F2, respectively, two different filters are combined with each other in the optical axis A, respectively.

In Fig. 2b sind die Filter F1, F2 auf drehbaren Filterrädern FR1, FR2 angeordnet und miteinander in der optischen Achse A kombinierbar.In Fig. 2b, the filter F1, F2, and arranged on rotating filter wheels FR1 FR2 each other in the optical axis A can be combined.

Besonders vorteilhaft ist die Kombination mindestens zweier kontinuierlicher Verlaufs-Kantenfilter VF1, VF2, in Fig. 2c kreisförmig und jeweils verdrehbar in Fig. 2d verschiebbar dargestellt.The combination of at least two continuous profile edge filters VF1, VF2 is shown in a particularly advantageous manner, circular in FIG. 2c and displaceable in each case in a rotatable manner in FIG. 2d.

Derartige Kantenfilter sind beispielsweise von COHERENT (Variable Edge-pass-Filters) erhältlich.Edge filters of this type are, for example, from COHERENT (variable Edge pass filters) available.

In Fig. 2d sind die Verlaufskurven einzelner Filterabschnitte dargestellt, in VF2 als Kurzpassfilter SP, in VF1 als Langpaßfilter LP.In Fig. 2d the trajectories of individual filter sections are shown in VF2 as a short pass filter SP, in VF1 as long pass filter LP.

In Fig. 3 ist anhand von zwei unterschiedlichen Einstellungen dargestellt, wie durch Kombination der Kurz- und Langpaßfilter und gegenseitige Verdrehung beliebig breite Bandpaßfilter für die zu detektierende Wellenlänge erzeugt werden kann.In Fig. 3 is illustrated by way of two different settings as may be generated by combining the short and long pass filter and band-pass filter for mutual rotation of any width to be detected wavelength.

Besonders vorteilhaft besteht hierdurch die Möglichkeit, komplette Fluoreszenzspektren von untersuchten exogenen oder endogenen Fluophoren in der Probe durch kontinuierliches schmalbandiges Durchscannen der Wellenlänge, im Sinne eines in der Wellenlänge variablen Monochromators, aufzunehmen. Dadurch kann durch Ansteuerung des Scanners, des Probentisches und der Detektion eine wellenlängenabhängige und zeitabhängige Detektion in x,y und z-Richtung erfolgen, wodurch die fünfdimensionale Generierung (x, y, z, t, λ) eines Probenbildes erfolgt, d. h. die Aufnahme eines Spektrums zu jedem Pixel und jederzeit im Takt der jeweiligen Abtastung.This makes it particularly advantageous for complete Fluorescence spectra of examined exogenous or endogenous fluophores in the sample by continuously scanning the wavelength, in the sense of a variable wavelength monochromator. This can be done by controlling the scanner, the sample table and the Detection a wavelength-dependent and time-dependent detection in x, y and z direction, whereby the five-dimensional generation (x, y, z, t, λ) a sample picture is taken, d. H. recording a spectrum for each pixel and at any time in time with the respective scan.

Die erfindungsgemäßen Filtereinheiten können weiterhin vorteilhaft zur spektralen Selektion auf der Beleuchtungsseite eingesetzt werden, beispielsweise an der Stelle des Verschlusses V, beispielsweise zur spektralen Einengung einer breitbandigen Laserlichtquelle oder zur Wellenlängenselektion bei einer HBO oder HAL-Lampe.The filter units according to the invention can furthermore advantageously be spectral Selection can be used on the lighting side, for example on the spot of the closure V, for example for the spectral narrowing of a broadband Laser light source or for wavelength selection with an HBO or HAL lamp.

Claims (8)

1. Anordnung zur einstellbaren wellenlängenabhängigen Detektion in einem Fluoreszenzmikroskop, vorzugsweise in einem Laser-Scanning-Mikroskop, bestehend aus mindestens einer im Detektionsstrahlengang angeordneten Kombination aus mindestens einem Kurzpaß- und mindestens einem Langpaßfilter zur Erzeugung eines einstellbaren Bandpasses.1. Arrangement for adjustable wavelength-dependent detection in one Fluorescence microscope, preferably in a laser scanning microscope, consisting of at least one arranged in the detection beam path Combination of at least one short pass and at least one long pass filter to create an adjustable band pass. 2. Anordnung nach Anspruch 1, wobei mindestens ein Filter gegen einen anderen Filter anderer Wellenlängencharakteristik auswechselbar und/oder bezüglich seiner Wellenlängencharakteristik einstellbar ist.2. Arrangement according to claim 1, wherein at least one filter against another Filters of other wavelength characteristics interchangeable and / or with respect to it Wavelength characteristic is adjustable. 3. Anordnung nach Anspruch 1 oder 2, wobei für Kurzpaß und/oder Langpaßfilter Filterwechsler vorgesehen sind.3. Arrangement according to claim 1 or 2, wherein for short pass and / or long pass filter Filter changers are provided. 4. Anordnung nach Anspruch 3, wobei die Filterwechsler Filterschieber oder Filterräder sind.4. Arrangement according to claim 3, wherein the filter changer or filter slide Are filter wheels. 5. Anordnung nach einem der Ansprüche 1-4, mit mindestens einem dreh- und/oder verschiebbare kontinuierlich variierende Kurz- und/oder Langgpaßfilter.5. Arrangement according to one of claims 1-4, with at least one rotating and / or sliding continuously varying short and / or long pass filters. 6. Anordnung nach einem der Ansprüche 1-5, wobei die Filter und/oder Filterwechsler austauschbar sind. 6. Arrangement according to one of claims 1-5, wherein the filter and / or filter changer are interchangeable.   7. Anordnung nach einem der Ansprüche 1-6, wobei Filter und/oder Filterwechsler motorisch angetrieben werden.7. Arrangement according to one of claims 1-6, wherein filter and / or filter changer be driven by a motor. 8. Verfahren zur Bildaufnahme unter Verwendung einer Anordnung nach einem der Ansprüche 1-7, vorzugsweise in einem Laser-Scanning-Mikroskop, mit einer Zeit- und wellenlängenabhängigen Aufnahme durch eine Detektionseinheit und Abspeicherung in einer Speichereinheit.8. A method for image acquisition using an arrangement according to one of the Claims 1-7, preferably in a laser scanning microscope, with a time and wavelength dependent recording by a detection unit and storage in a storage unit.
DE1998135070 1998-08-04 1998-08-04 Arrangement for adjustable wavelength-dependent detection in a fluorescence microscope Revoked DE19835070B4 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE1998135070 DE19835070B4 (en) 1998-08-04 1998-08-04 Arrangement for adjustable wavelength-dependent detection in a fluorescence microscope
JP21781199A JP4608688B2 (en) 1998-08-04 1999-07-30 Laser scanning fluorescence microscope and image recording method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE1998135070 DE19835070B4 (en) 1998-08-04 1998-08-04 Arrangement for adjustable wavelength-dependent detection in a fluorescence microscope

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DE19835070B4 DE19835070B4 (en) 2006-03-16

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DE (1) DE19835070B4 (en)

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DE10148782A1 (en) * 2001-09-28 2003-04-24 Zeiss Carl Jena Gmbh Optical modulation element
DE10156695B4 (en) * 2001-11-17 2004-07-15 Leica Microsystems Heidelberg Gmbh Scanning microscope, scanning microscopy method and bandpass filter
US7075716B2 (en) 2000-07-17 2006-07-11 Leica Microsystems Cms Gmbh Arrangement for spectrally sensitive reflected-light and transmitted-light microscopy
EP1795938A2 (en) * 2005-12-08 2007-06-13 Carl Zeiss MicroImaging GmbH Method and device for examining samples
EP1882969A1 (en) * 2006-07-28 2008-01-30 Carl Zeiss MicroImaging GmbH Laser scanning microscope
DE102009011681A1 (en) 2009-02-23 2010-08-26 Obrebski, Andreas, Dr. Changer for optical elements
DE102009012874A1 (en) 2009-03-12 2010-09-16 Carl Zeiss Microlmaging Gmbh Microscope, in particular laser scanning microscope
CN102578994A (en) * 2011-01-07 2012-07-18 富士胶片株式会社 Endoscope system
US8294897B2 (en) 2008-10-10 2012-10-23 Carl Zeiss Microimaging Gmbh Method for imaging a sample using a microscope, and microscope and data storage center
US9645291B1 (en) * 2016-04-18 2017-05-09 Ii-Vi Incorporated Voltage-tunable optical filters for instrumentation applications
DE112004000340B4 (en) * 2003-02-28 2020-04-16 Fei Company Microscope system
EP3538942A4 (en) * 2016-11-12 2020-11-11 Caliber Imaging & Diagnostics, Inc. Confocal microscope with positionable imaging head
WO2022023501A1 (en) * 2020-07-30 2022-02-03 Abberior Instruments Gmbh Detection device for a laser scanning microscope
DE102004029733B4 (en) 2003-07-26 2022-03-31 Leica Microsystems Cms Gmbh Scanning microscope and method for scanning microscopy
US11988605B2 (en) 2018-10-22 2024-05-21 Robert Bosch Gmbh Filter device for an optical module for a lab-on-a-chip analysis device, optical module for a lab-on-a-chip analysis device and method for operating an optical module for a lab-on-a-chip analysis device

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US7075716B2 (en) 2000-07-17 2006-07-11 Leica Microsystems Cms Gmbh Arrangement for spectrally sensitive reflected-light and transmitted-light microscopy
DE10148782A1 (en) * 2001-09-28 2003-04-24 Zeiss Carl Jena Gmbh Optical modulation element
DE10156695B4 (en) * 2001-11-17 2004-07-15 Leica Microsystems Heidelberg Gmbh Scanning microscope, scanning microscopy method and bandpass filter
US6954306B2 (en) 2001-11-17 2005-10-11 Leica Microsystems Heidelberg Gmbh Scanning microscope, method for scanning microscopy, and bandpass filter
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DE102009012874A1 (en) 2009-03-12 2010-09-16 Carl Zeiss Microlmaging Gmbh Microscope, in particular laser scanning microscope
WO2010102767A1 (en) 2009-03-12 2010-09-16 Carl Zeiss Microimaging Gmbh Microscope, in particular laser scanning microscope
US8699130B2 (en) 2009-03-12 2014-04-15 Carl Zeiss Microscopy Gmbh Microscope, in particular laser scanning microscope
CN102578994A (en) * 2011-01-07 2012-07-18 富士胶片株式会社 Endoscope system
US9645291B1 (en) * 2016-04-18 2017-05-09 Ii-Vi Incorporated Voltage-tunable optical filters for instrumentation applications
US10935778B2 (en) 2016-11-12 2021-03-02 Caliber Imaging & Diagnostics, Inc. Confocal microscope with positionable imaging head
EP3538942A4 (en) * 2016-11-12 2020-11-11 Caliber Imaging & Diagnostics, Inc. Confocal microscope with positionable imaging head
US11796786B2 (en) 2016-11-12 2023-10-24 Caliber Imaging & Diagnostics, Inc. Confocal microscope with positionable imaging head
US11988605B2 (en) 2018-10-22 2024-05-21 Robert Bosch Gmbh Filter device for an optical module for a lab-on-a-chip analysis device, optical module for a lab-on-a-chip analysis device and method for operating an optical module for a lab-on-a-chip analysis device
WO2022023501A1 (en) * 2020-07-30 2022-02-03 Abberior Instruments Gmbh Detection device for a laser scanning microscope

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DE19835070B4 (en) 2006-03-16
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