DE198290C - - Google Patents
Info
- Publication number
- DE198290C DE198290C DE1906198290D DE198290DD DE198290C DE 198290 C DE198290 C DE 198290C DE 1906198290 D DE1906198290 D DE 1906198290D DE 198290D D DE198290D D DE 198290DD DE 198290 C DE198290 C DE 198290C
- Authority
- DE
- Germany
- Prior art keywords
- selenium
- light source
- light
- cells
- zero
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims description 20
- 229910052711 selenium Inorganic materials 0.000 claims description 20
- 239000011669 selenium Substances 0.000 claims description 20
- 230000000694 effects Effects 0.000 claims description 3
- 238000004804 winding Methods 0.000 description 5
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000009699 differential effect Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/34—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
- G01J1/36—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
Ιΐ-;,Λ>ί i; Ιΐ - ;, Λ> ί i ;
KAISERLICHESIMPERIAL
PATENTAMT.PATENT OFFICE.
PATENTSCHRIFTPATENT LETTERING
KLASSE 42 L· GRUPPECLASS 42 L GROUP
G.WILHELM RUHMER in BERLIN.G.WILHELM RUHMER in BERLIN.
Selenphotometer. Patentiert im Deutschen Reiche vom 3. Juli 1906 ab. Selenium photometer. Patented in the German Empire on July 3, 1906.
Bei dem den Gegenstand vorliegender Erfindung bildenden Selenphotometer sollen besonders··'genaue Messungen' erzielt werden. Dies geschieht durch die Benutzung zweier flacher, einseitig lichtempfindlicher Selenzellen, die so angeordnet sind, daß während einer Phase des Meßvorganges die erste Selenzelle von der zu messenden Lichtquelle, die zweite Selenzelle von der Lichtquelle bekannter Intensität, bei der zweiten Phase die zweite Selenzelle von der zu messenden Lichtquelle, die erste Selenzelle von der bekannten Lichtquelle beeinflußt wird. Da in jedem Falle die Einwirkungen beider Lichtquellen gleichzeitig die Stellung des Zeigers des Nullinstrumentes beeinflussen, so kann ein bedeutend schneller reagierendes und daher wesentlich empfindlicheres Nullinstrument angewendet werden als im Falle der Anwendung nur einer Selenzelle.The selenium photometer forming the subject of the present invention should be particularly accurate Measurements' can be achieved. This is done by using two flat selenium cells that are light-sensitive on one side, which are arranged so that the first selenium cell during a phase of the measuring process from the light source to be measured, the second selenium cell from the light source of known intensity, in the second phase the second selenium cell from the light source to be measured, the first selenium cell from the known light source being affected. Since in each case the effects of both light sources at the same time affect the position of the pointer of the zero instrument, so a significant faster reacting and therefore much more sensitive zero instrument used than in the case of using only one selenium cell.
In beiliegender Zeichnung ist eine spezielleIn the accompanying drawing is a special one
Ausführungsform der Erfindung dargestellt.Embodiment of the invention shown.
Die beiden Selenzellen S1 .und S2 sind aufThe two selenium cells S 1 and S 2 are open
einer rotierenden Achse zwischen der zu messenden Lichtquelle L und der Vergleichslichtquelle / angeordnet. Der Strom einer Batterie B gelangt durch einen auf der rotierenden Achse angebrachten Schleifring a in die Selenzellen und geht durch dieselben und den Kommutator b, c zu den Differentialwicklungen des Galvanometers G und zur Batterie zurück.a rotating axis between the light source L to be measured and the comparison light source /. The current from a battery B enters the selenium cells through a slip ring a attached to the rotating shaft and goes through the same and the commutator b, c to the differential windings of the galvanometer G and back to the battery.
Während einer halben Umdrehung ist somit die Selenzelle S1 der Lichtquelle L zugekehrt, der sie durchfließende Strom geht durch die Linkswicklung des Differentialgalvanometers, gleichzeitig ist die Selenzelle S2 der Lichtquelle / zugekehrt und der diese durchfließende Strom geht durch die Rechtswicklung des Differentialg'alvanometers.During half a revolution, the selenium cell S 1 faces the light source L , the current flowing through it goes through the left-hand winding of the differential galvanometer, at the same time the selenium cell S 2 faces the light source / and the current flowing through it goes through the right-hand winding of the differential galvanometer.
Nach einer halben Umdrehung wird die Selenzelle S1 der Lichtquelle / und die Selenzelle S.2 der Lichtquelle L zugekehrt; der Strom der ersteren durchfließt die Rechtswicklung, der Strom der letzteren die Linkswicklung des Differentialgalvanometers. >;Der Zeiger desselben unterliegt also in jedem Moment der Differenzwirkung der beiden Selenzellenströme; die Größe des resultierenden Ausschlags, ist, Gleichheit der Zellen vorausgesetzt, von der Differenz der Beleuchtungen der beiden Zellen durch die beiden Lichtquellen abhängig und wird Null, wenn diese Null ist. Durch Verschiebung der Selenzellenanordnung bzw. der Lichtquellen auf einer Photometerbank läßt sich diese Nullstellung und damit die Abgleichung der Lichtquellen erreichen.After half a revolution, the selenium cell S 1 is turned towards the light source / and the selenium cell S. 2 is turned towards the light source L; the current of the former flows through the right-hand winding, the current of the latter through the left-hand winding of the differential galvanometer. >; The pointer of the same is therefore subject to the differential effect of the two selenium cell currents at every moment; the magnitude of the resulting deflection, assuming the cells are identical, is dependent on the difference in the illuminations of the two cells by the two light sources and becomes zero when this is zero. By shifting the selenium cell arrangement or the light sources on a photometer bank, this zero position and thus the adjustment of the light sources can be achieved.
Aus den Abständen der Lichtquellen von der Selenzellenanordnung ergibt sich dann in bekannter Weise die Intensität der zu messenden Lichtquelle in bezug auf .die Vergleichslichtquelle. The distances between the light sources and the selenium cell arrangement then result in in known way the intensity of the light source to be measured in relation to .die comparison light source.
Durch Ausbildung des bei derartigen Selenphotometern benutzten Nullinstrumentes zu einem Kontaktrelais läßt sich die Einstellung der Lichtquellen durch eine einfache mechanische Anordnung automatisch bewirken, was. für viele Zwecke, z. B. für ein registrierendes Photometer, von Vorteil ist.By training the zero instrument used in such selenium photometers A contact relay allows the setting of the light sources by a simple mechanical Arrangement automatically effect what. for many purposes, e.g. B. for a registering Photometer, is beneficial.
Claims (2)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE198290T | 1906-07-03 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE198290C true DE198290C (en) | 1908-05-14 |
Family
ID=34624853
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE1906198290D Expired DE198290C (en) | 1906-07-03 | 1906-07-03 |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE198290C (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1423940B1 (en) * | 1960-01-29 | 1972-02-03 | North American Aviation Inc | pyrometer |
-
1906
- 1906-07-03 DE DE1906198290D patent/DE198290C/de not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1423940B1 (en) * | 1960-01-29 | 1972-02-03 | North American Aviation Inc | pyrometer |
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