DE19781646T1 - Spannungstolerante elektrostatische Entladungsschutzeinrichtung - Google Patents

Spannungstolerante elektrostatische Entladungsschutzeinrichtung

Info

Publication number
DE19781646T1
DE19781646T1 DE19781646T DE19781646T DE19781646T1 DE 19781646 T1 DE19781646 T1 DE 19781646T1 DE 19781646 T DE19781646 T DE 19781646T DE 19781646 T DE19781646 T DE 19781646T DE 19781646 T1 DE19781646 T1 DE 19781646T1
Authority
DE
Germany
Prior art keywords
voltage
protection device
electrostatic discharge
discharge protection
tolerant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19781646T
Other languages
English (en)
Other versions
DE19781646B4 (de
Inventor
Thimothy J Maloney
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of DE19781646T1 publication Critical patent/DE19781646T1/de
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0255—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0266—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using field effect transistors as protective elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Emergency Protection Circuit Devices (AREA)
DE19781646T 1996-03-21 1997-03-07 Spannungstolerante elektrostatische Entladungsschutzeinrichtung Pending DE19781646T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/621,129 US5719737A (en) 1996-03-21 1996-03-21 Voltage-tolerant electrostatic discharge protection device for integrated circuit power supplies
PCT/US1997/004505 WO1997035373A1 (en) 1996-03-21 1997-03-07 A voltage-tolerant electrostatic discharge protection device

Publications (1)

Publication Number Publication Date
DE19781646T1 true DE19781646T1 (de) 1999-03-11

Family

ID=24488850

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19781646T Pending DE19781646T1 (de) 1996-03-21 1997-03-07 Spannungstolerante elektrostatische Entladungsschutzeinrichtung
DE19781646A Expired - Lifetime DE19781646B4 (de) 1996-03-21 1997-03-07 Spannungstolerante elektrostatische Entladungsschutzeinrichtung

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE19781646A Expired - Lifetime DE19781646B4 (de) 1996-03-21 1997-03-07 Spannungstolerante elektrostatische Entladungsschutzeinrichtung

Country Status (5)

Country Link
US (1) US5719737A (de)
AU (1) AU2537797A (de)
DE (2) DE19781646T1 (de)
GB (1) GB2327159B (de)
WO (1) WO1997035373A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10348446A1 (de) * 2003-10-14 2005-06-02 Zentrum Mikroelektronik Dresden Ag Anordnung für eine ESD-Schutzschaltung

Families Citing this family (34)

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US5852540A (en) * 1997-09-24 1998-12-22 Intel Corporation Circuit for protecting the input/output stage of a low voltage integrated circuit device from a failure of the internal voltage supply or a difference in the power-up sequencing of supply voltage levels
US5956219A (en) * 1998-06-08 1999-09-21 Intel Corporation High voltage power supply clamp circuitry for electrostatic discharge (ESD) protection
US6008970A (en) * 1998-06-17 1999-12-28 Intel Corporation Power supply clamp circuitry for electrostatic discharge (ESD) protection
FR2789226B1 (fr) 1999-01-29 2002-06-14 Commissariat Energie Atomique Dispositif de protection contre les decharges electrostatiques pour composants microelectroniques sur substrat du type soi
US6600356B1 (en) * 1999-04-30 2003-07-29 Analog Devices, Inc. ESD protection circuit with controlled breakdown voltage
US6570225B2 (en) 1999-07-12 2003-05-27 Intel Corporation Method for improved electrostatic discharge protection
US6556398B1 (en) * 1999-10-05 2003-04-29 Winbond Electronics Corporation Voltage tolerance ESD protection circuit
US6552886B1 (en) 2000-06-29 2003-04-22 Pericom Semiconductor Corp. Active Vcc-to-Vss ESD clamp with hystersis for low supply chips
US6510033B1 (en) * 2000-06-30 2003-01-21 Intel Corporation RC-timer circuit to reduce current leakage in future semiconductor processes
US7205641B2 (en) * 2000-12-28 2007-04-17 Industrial Technology Research Institute Polydiode structure for photo diode
US6690065B2 (en) * 2000-12-28 2004-02-10 Industrial Technology Research Institute Substrate-biased silicon diode for electrostatic discharge protection and fabrication method
US6617649B2 (en) 2000-12-28 2003-09-09 Industrial Technology Research Institute Low substrate-noise electrostatic discharge protection circuits with bi-directional silicon diodes
US6633068B2 (en) 2001-05-10 2003-10-14 Industrial Technology Research Institute Low-noise silicon controlled rectifier for electrostatic discharge protection
US6747501B2 (en) 2001-07-13 2004-06-08 Industrial Technology Research Institute Dual-triggered electrostatic discharge protection circuit
US6747861B2 (en) 2001-11-15 2004-06-08 Industrial Technology Research Institute Electrostatic discharge protection for a mixed-voltage device using a stacked-transistor-triggered silicon controlled rectifier
US6750515B2 (en) 2002-02-05 2004-06-15 Industrial Technology Research Institute SCR devices in silicon-on-insulator CMOS process for on-chip ESD protection
US6576974B1 (en) 2002-03-12 2003-06-10 Industrial Technology Research Institute Bipolar junction transistors for on-chip electrostatic discharge protection and methods thereof
US6838707B2 (en) 2002-05-06 2005-01-04 Industrial Technology Research Institute Bi-directional silicon controlled rectifier for electrostatic discharge protection
US20040057172A1 (en) * 2002-09-25 2004-03-25 Maoyou Sun Circuit for protection against electrostatic discharge
DE10255130B4 (de) * 2002-11-26 2007-03-22 Infineon Technologies Ag Schaltungsanordnung zum Schutz integrierter Schaltungen vor elektrostatischen Entladungen mit parallelem Strompfad
US20040105202A1 (en) * 2002-12-03 2004-06-03 Industrial Technology Research Institute Electrostatic discharge protection device and method using depletion switch
US7616414B2 (en) * 2003-04-25 2009-11-10 Broadcom Corporation ESD protection circuit for high speed signaling including T/R switches
US7244992B2 (en) 2003-07-17 2007-07-17 Ming-Dou Ker Turn-on-efficient bipolar structures with deep N-well for on-chip ESD protection
US7583484B2 (en) * 2003-08-20 2009-09-01 Taiwan Semiconductor Manufacturing Company, Ltd. Circuit and method for ESD protection
JP3920276B2 (ja) * 2004-04-20 2007-05-30 Ｎｅｃエレクトロニクス株式会社 静電保護回路
TWI273634B (en) * 2004-12-21 2007-02-11 Transpacific Ip Ltd Novel poly diode structure for photo diode
JP4869343B2 (ja) * 2005-07-22 2012-02-08 エヌエックスピー ビー ヴィ 分配した低電圧クランプ装置を用いて高電圧ｅｓｄ保護を分担する経路
TW200739872A (en) * 2006-04-04 2007-10-16 Univ Nat Chiao Tung Power line electrostatic discharge protection circuit featuring triple voltage tolerance
US8514533B2 (en) 2010-06-24 2013-08-20 Intel Corporation Method, apparatus, and system for protecting supply nodes from electrostatic discharge
US8477467B2 (en) * 2011-07-26 2013-07-02 United Microelectronics Corp. Electrostatic discharge protection circuit
US8630072B2 (en) 2011-07-29 2014-01-14 Silicon Laboratories Inc. Circuits including a diode string comprised of bipolar stages having an adjustable pseudo beta for ESD protection
US8520347B2 (en) 2011-07-29 2013-08-27 Silicon Laboratories Inc. Circuit for ESD protection including dynamically terminated diode strings comprised of bipolar devices
US9583938B2 (en) * 2015-05-01 2017-02-28 International Business Machines Corporation Electrostatic discharge protection device with power management
CN115692403A (zh) * 2021-07-26 2023-02-03 长鑫存储技术有限公司 芯片的静电保护电路

Family Cites Families (10)

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Publication number Priority date Publication date Assignee Title
US3573550A (en) * 1969-03-07 1971-04-06 M & T Chemicals Inc Automatically resetting transient protection device
IT1016268B (it) * 1974-07-02 1977-05-30 Gni Energet In Apparecchio per proteggere dalla sovratensione i tiristori di un con vertitore controllato ad alta tensione
US4585905A (en) * 1983-08-15 1986-04-29 Motorola, Inc. Overvoltage protection circuit for SLIC
US4736271A (en) * 1987-06-23 1988-04-05 Signetics Corporation Protection device utilizing one or more subsurface diodes and associated method of manufacture
US5124877A (en) * 1989-07-18 1992-06-23 Gazelle Microcircuits, Inc. Structure for providing electrostatic discharge protection
EP0435047A3 (en) * 1989-12-19 1992-07-15 National Semiconductor Corporation Electrostatic discharge protection for integrated circuits
US5287241A (en) * 1992-02-04 1994-02-15 Cirrus Logic, Inc. Shunt circuit for electrostatic discharge protection
US5311391A (en) * 1993-05-04 1994-05-10 Hewlett-Packard Company Electrostatic discharge protection circuit with dynamic triggering
US5530612A (en) * 1994-03-28 1996-06-25 Intel Corporation Electrostatic discharge protection circuits using biased and terminated PNP transistor chains
US5546016A (en) * 1995-07-03 1996-08-13 Intel Corporation MOS termination for low power signaling

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10348446A1 (de) * 2003-10-14 2005-06-02 Zentrum Mikroelektronik Dresden Ag Anordnung für eine ESD-Schutzschaltung

Also Published As

Publication number Publication date
AU2537797A (en) 1997-10-10
US5719737A (en) 1998-02-17
GB9820414D0 (en) 1998-11-11
DE19781646B4 (de) 2006-09-07
GB2327159B (en) 2000-07-05
GB2327159A (en) 1999-01-13
WO1997035373A1 (en) 1997-09-25

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