DE19581949T1 - Test device for a digital storage device - Google Patents

Test device for a digital storage device

Info

Publication number
DE19581949T1
DE19581949T1 DE19581949T DE19581949T DE19581949T1 DE 19581949 T1 DE19581949 T1 DE 19581949T1 DE 19581949 T DE19581949 T DE 19581949T DE 19581949 T DE19581949 T DE 19581949T DE 19581949 T1 DE19581949 T1 DE 19581949T1
Authority
DE
Germany
Prior art keywords
test parameters
digital storage
array
testing
digital computer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19581949T
Other languages
German (de)
Inventor
Bryon R Macpherson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Maxtor Corp
Original Assignee
Maxtor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Maxtor Corp filed Critical Maxtor Corp
Publication of DE19581949T1 publication Critical patent/DE19581949T1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816—Testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
    • G11B33/10—Indicating arrangements; Warning arrangements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/455—Arrangements for functional testing of heads; Measuring arrangements for heads

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

An apparatus for testing electro-mechanical storage devices, such as disk drives, is provided. A testing device (14) in a digital computer (10) selects test parameters from an array of test parameters stored in the digital computer (10). A random number generator is used in the selection of the test parameters. When errors occur, the array of test parameters is dynamically adapted during testing to change the probability of selecting certain test parameters in response to the error.
DE19581949T 1995-10-25 1995-10-25 Test device for a digital storage device Withdrawn DE19581949T1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1995/013774 WO1997015930A1 (en) 1995-10-25 1995-10-25 Testing apparatus for digital storage device

Publications (1)

Publication Number Publication Date
DE19581949T1 true DE19581949T1 (en) 1998-12-17

Family

ID=22250040

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19581949T Withdrawn DE19581949T1 (en) 1995-10-25 1995-10-25 Test device for a digital storage device

Country Status (6)

Country Link
JP (1) JPH11514480A (en)
KR (1) KR19990067051A (en)
AU (1) AU4134896A (en)
CA (1) CA2235268A1 (en)
DE (1) DE19581949T1 (en)
WO (1) WO1997015930A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006085865A (en) 2004-09-17 2006-03-30 Fujitsu Ltd Disk test apparatus, disk test method, and disk apparatus

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5333084A (en) * 1990-07-13 1994-07-26 Gregory M. Galloway Electronically alignable flexible disk drive
US5422890A (en) * 1991-11-19 1995-06-06 Compaq Computer Corporation Method for dynamically measuring computer disk error rates

Also Published As

Publication number Publication date
KR19990067051A (en) 1999-08-16
WO1997015930A1 (en) 1997-05-01
CA2235268A1 (en) 1997-05-01
AU4134896A (en) 1997-05-15
JPH11514480A (en) 1999-12-07

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Legal Events

Date Code Title Description
8139 Disposal/non-payment of the annual fee