DE19581761T1 - Mass spectrometer system and method using a simultaneous detector and signal range identifiers - Google Patents
Mass spectrometer system and method using a simultaneous detector and signal range identifiersInfo
- Publication number
- DE19581761T1 DE19581761T1 DE19581761T DE19581761T DE19581761T1 DE 19581761 T1 DE19581761 T1 DE 19581761T1 DE 19581761 T DE19581761 T DE 19581761T DE 19581761 T DE19581761 T DE 19581761T DE 19581761 T1 DE19581761 T1 DE 19581761T1
- Authority
- DE
- Germany
- Prior art keywords
- mass spectrometer
- signal range
- spectrometer system
- range identifiers
- simultaneous detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
- H01J43/30—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA2131753 | 1994-09-09 | ||
CA 2131753 CA2131753C (en) | 1994-09-09 | 1994-09-09 | Spectrometer system and method using dual mode detector and signal region flags |
US350767 | 1994-12-07 | ||
US08/350,767 US5463219A (en) | 1994-12-07 | 1994-12-07 | Mass spectrometer system and method using simultaneous mode detector and signal region flags |
PCT/CA1995/000506 WO1996008034A1 (en) | 1994-09-09 | 1995-09-06 | Mass spectrometer system and method using simultaneous mode detector and signal region flags |
Publications (2)
Publication Number | Publication Date |
---|---|
DE19581761T1 true DE19581761T1 (en) | 1998-01-22 |
DE19581761B4 DE19581761B4 (en) | 2006-08-24 |
Family
ID=25677478
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19581761T Expired - Lifetime DE19581761B4 (en) | 1994-09-09 | 1995-09-06 | Mass spectrometer system and method using a simultaneous detector and signal range identifiers |
Country Status (4)
Country | Link |
---|---|
AU (1) | AU3338795A (en) |
DE (1) | DE19581761B4 (en) |
GB (1) | GB2308228B (en) |
WO (1) | WO1996008034A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6362473B1 (en) * | 1998-10-05 | 2002-03-26 | Bruker Daltonik Gmbh | Method for management of daughter ion spectra over several generations |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2102931A5 (en) * | 1970-08-31 | 1972-04-07 | Thomson Csf | Mass spectrometry - instantaneous alternative of direct or high gain reception of ion beam |
US4472630A (en) * | 1982-03-12 | 1984-09-18 | Purdue Research Foundation | Dual mode particle detection apparatus for a spectroscopy system |
CA1245778A (en) * | 1985-10-24 | 1988-11-29 | John B. French | Mass analyzer system with reduced drift |
DE3923847A1 (en) * | 1989-07-19 | 1991-02-07 | Jans Heino | Photon current measuring device - has sec. electron multiplier with anode current supplied to microcomputer via A=D converter |
-
1995
- 1995-09-06 GB GB9705009A patent/GB2308228B/en not_active Expired - Lifetime
- 1995-09-06 DE DE19581761T patent/DE19581761B4/en not_active Expired - Lifetime
- 1995-09-06 WO PCT/CA1995/000506 patent/WO1996008034A1/en active Application Filing
- 1995-09-06 AU AU33387/95A patent/AU3338795A/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
DE19581761B4 (en) | 2006-08-24 |
WO1996008034A1 (en) | 1996-03-14 |
GB2308228B (en) | 1998-07-08 |
AU3338795A (en) | 1996-03-27 |
GB9705009D0 (en) | 1997-04-30 |
GB2308228A (en) | 1997-06-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8110 | Request for examination paragraph 44 | ||
8364 | No opposition during term of opposition | ||
R082 | Change of representative |
Representative=s name: HASELTINE LAKE LLP, DE |
|
R071 | Expiry of right |