DE1806456B2 - - Google Patents

Info

Publication number
DE1806456B2
DE1806456B2 DE1806456A DE1806456A DE1806456B2 DE 1806456 B2 DE1806456 B2 DE 1806456B2 DE 1806456 A DE1806456 A DE 1806456A DE 1806456 A DE1806456 A DE 1806456A DE 1806456 B2 DE1806456 B2 DE 1806456B2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE1806456A
Other versions
DE1806456C3 (de
DE1806456A1 (de
Inventor
Wallace H. Miami Springs Coulter
Walter R. Hialeah Hogg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coulter Electronics Ltd
Original Assignee
Coulter Electronics Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coulter Electronics Ltd filed Critical Coulter Electronics Ltd
Publication of DE1806456A1 publication Critical patent/DE1806456A1/de
Publication of DE1806456B2 publication Critical patent/DE1806456B2/de
Application granted granted Critical
Publication of DE1806456C3 publication Critical patent/DE1806456C3/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/131—Details
    • G01N15/132—Circuits

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Developing Agents For Electrophotography (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE1806456A 1967-11-01 1968-10-31 Verfahren zur Feststellung derjenigen Teilchengröße (Scheidegröße) eines Teilchensystems oberhalb bzw. unterhalb welcher eine bestimmte Fraktion der Gesamtmasse des Systems liegt und Vorrichtung zur Ausführung dieses Verfahrens Expired DE1806456C3 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US67984067A 1967-11-01 1967-11-01

Publications (3)

Publication Number Publication Date
DE1806456A1 DE1806456A1 (de) 1969-06-19
DE1806456B2 true DE1806456B2 (de) 1974-04-11
DE1806456C3 DE1806456C3 (de) 1974-11-14

Family

ID=24728587

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1806456A Expired DE1806456C3 (de) 1967-11-01 1968-10-31 Verfahren zur Feststellung derjenigen Teilchengröße (Scheidegröße) eines Teilchensystems oberhalb bzw. unterhalb welcher eine bestimmte Fraktion der Gesamtmasse des Systems liegt und Vorrichtung zur Ausführung dieses Verfahrens

Country Status (12)

Country Link
US (1) US3557352A (de)
JP (1) JPS5126826B1 (de)
BE (1) BE723231A (de)
CA (1) CA938723A (de)
CH (1) CH498389A (de)
DE (1) DE1806456C3 (de)
FR (1) FR1590410A (de)
GB (1) GB1249470A (de)
IL (1) IL30981A (de)
NL (1) NL154326B (de)
SE (1) SE350837B (de)
SU (1) SU510165A3 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3701029A (en) * 1970-10-27 1972-10-24 Coulter Electronics Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
US3801901A (en) * 1970-10-27 1974-04-02 Coulter Electronics Particle study apparatus including an axial trajectory sensor
US3801903A (en) * 1970-10-27 1974-04-02 Coulter Electronics Particle study apparatus including an axial trajectory sensor
US3783391A (en) * 1971-02-08 1974-01-01 Coulter Electronics Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
US3783390A (en) * 1971-02-09 1974-01-01 W Hogg Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
US3699319A (en) * 1971-03-10 1972-10-17 Robert H Berg Average volume digital computer and digital volume totalizer for cells and particles
US3763357A (en) * 1971-12-22 1973-10-02 Bausch & Lomb Threshold circuit for converting a video signal to a binary video signal
US3801904A (en) * 1972-09-11 1974-04-02 Coulter Electronics Particle study apparatus including an axial trajectory sensor
US3867613A (en) * 1972-11-01 1975-02-18 Minnesota Mining & Mfg Particle counting apparatus
US3863056A (en) * 1973-06-29 1975-01-28 Coulter Electronics Method and apparatus for multichannel voting
US3892489A (en) * 1973-08-17 1975-07-01 Smithkline Corp Data acquisition system
US3936739A (en) * 1974-02-12 1976-02-03 Coulter Electronics, Inc. Method and apparatus for generating error corrected signals
US3902053A (en) * 1974-03-18 1975-08-26 Coulter Electronics Pre-set circuit for measuring a dividing particle size of a particulate system
US3944797A (en) * 1974-08-06 1976-03-16 Coulter Electronics, Inc. Method and apparatus for determining the correct percentiles of the size distribution of a particulate system
US3936666A (en) * 1974-09-16 1976-02-03 Coulter Electronics, Inc. Apparatus for measuring a particle size dividing one of the mass or particle number of a particulate system into predetermined fractions
US4041468A (en) * 1976-10-07 1977-08-09 Pfizer Inc. Method and system for analysis of ambulatory electrocardiographic tape recordings
ES485470A1 (es) * 1978-12-19 1980-09-01 Contraves Ag Procedimiento para establecer un umbral de separacion para separar por lo menos dos clases de senales para analizar particulas y usos similares
ES487980A1 (es) * 1979-03-27 1980-10-01 Contraves Ag Dispositivo para un aparato analizador de particulas
US4706207A (en) * 1985-06-24 1987-11-10 Nova Celltrak, Inc. Count accuracy control means for a blood analyses system
US5452237A (en) * 1994-02-28 1995-09-19 Abbott Laboratories Coincidence error correction system for particle counters
HUE025804T2 (en) * 2003-03-19 2016-04-28 Church Of Spiritual Tech System for measuring and displaying changes in living body resistance
KR20120083093A (ko) * 2011-01-17 2012-07-25 삼성전자주식회사 입자측정장치 및 이를 이용한 입자측정방법
EP2836815B1 (de) 2012-04-12 2020-08-05 Bio-Rad Laboratories, Inc. Partikelausgabevorrichtung und verfahren
FR3034520B1 (fr) * 2015-04-02 2020-02-14 Horiba Abx Sas Dispositif de comptage de particules
CN110553954B (zh) * 2019-08-22 2021-09-28 中国电建集团华东勘测设计研究院有限公司 一种确定含超大粒径巨粒土的颗粒级配的方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1177774A (fr) * 1960-04-26 1959-04-29 Evans Electroselenium Ltd Perfectionnements aux appareils de comptage des petites particules
US3392331A (en) * 1961-04-06 1968-07-09 Coulter Electronics Particle analyzer threshold level control
US3271672A (en) * 1961-09-20 1966-09-06 Coulter Electronics Particle studying device control circuit
GB1112770A (en) * 1964-12-10 1968-05-08 Hitachi Ltd Method and apparatus for analysing the particle size distribution of powder
US3444464A (en) * 1965-11-26 1969-05-13 Coulter Electronics Multiple aperture fittings for particle analyzing apparatus
US3331950A (en) * 1966-07-11 1967-07-18 Coulter Electronics Particle distribution plotting apparatus

Also Published As

Publication number Publication date
GB1249470A (en) 1971-10-13
DE1806456C3 (de) 1974-11-14
CH498389A (fr) 1970-10-31
IL30981A0 (en) 1968-12-26
FR1590410A (de) 1970-04-13
NL6815543A (de) 1969-05-05
IL30981A (en) 1972-03-28
DE1806456A1 (de) 1969-06-19
SE350837B (de) 1972-11-06
CA938723A (en) 1973-12-18
NL154326B (nl) 1977-08-15
SU510165A3 (ru) 1976-04-05
JPS5126826B1 (de) 1976-08-09
US3557352A (en) 1971-01-19
BE723231A (de) 1969-04-30

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
E77 Valid patent as to the heymanns-index 1977
8339 Ceased/non-payment of the annual fee