DE112023000158A5 - Method for selecting a control parameter set, integrated circuit and power module - Google Patents

Method for selecting a control parameter set, integrated circuit and power module Download PDF

Info

Publication number
DE112023000158A5
DE112023000158A5 DE112023000158.8T DE112023000158T DE112023000158A5 DE 112023000158 A5 DE112023000158 A5 DE 112023000158A5 DE 112023000158 T DE112023000158 T DE 112023000158T DE 112023000158 A5 DE112023000158 A5 DE 112023000158A5
Authority
DE
Germany
Prior art keywords
selecting
integrated circuit
power module
parameter set
control parameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112023000158.8T
Other languages
German (de)
Inventor
Sebastian Engel
Thomas Engelmann
Jens Voss
Jörg Krupar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Elmos Semiconductor SE
Original Assignee
Elmos Semiconductor SE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elmos Semiconductor SE filed Critical Elmos Semiconductor SE
Publication of DE112023000158A5 publication Critical patent/DE112023000158A5/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/04—Modifications for accelerating switching
    • H03K17/041—Modifications for accelerating switching without feedback from the output circuit to the control circuit
    • H03K17/0412—Modifications for accelerating switching without feedback from the output circuit to the control circuit by measures taken in the control circuit
    • H03K17/04123—Modifications for accelerating switching without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
    • H03K17/145—Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16—Modifications for eliminating interference voltages or currents
    • H03K17/161—Modifications for eliminating interference voltages or currents in field-effect transistor switches
    • H03K17/162—Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
DE112023000158.8T 2022-08-12 2023-08-09 Method for selecting a control parameter set, integrated circuit and power module Pending DE112023000158A5 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
LULU502669 2022-08-12
LU502669A LU502669B1 (en) 2022-08-12 2022-08-12 METHOD FOR SELECTING A CONTROL PARAMETER SET, INTEGRATED CIRCUIT AND POWER ASSEMBLY
PCT/EP2023/072081 WO2024033428A1 (en) 2022-08-12 2023-08-09 Method for selecting a drive parameter set, integrated circuit and power assembly

Publications (1)

Publication Number Publication Date
DE112023000158A5 true DE112023000158A5 (en) 2024-04-11

Family

ID=83688672

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112023000158.8T Pending DE112023000158A5 (en) 2022-08-12 2023-08-09 Method for selecting a control parameter set, integrated circuit and power module

Country Status (3)

Country Link
DE (1) DE112023000158A5 (en)
LU (1) LU502669B1 (en)
WO (1) WO2024033428A1 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6808060B2 (en) * 2017-10-03 2021-01-06 三菱電機株式会社 Switching element drive circuit, power conversion device, elevator device, and switching element drive method
DE102019218998A1 (en) * 2019-12-05 2021-06-10 Robert Bosch Gmbh Method and control circuit for controlling at least one power transistor to be switched

Also Published As

Publication number Publication date
LU502669B1 (en) 2024-02-13
WO2024033428A1 (en) 2024-02-15

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Legal Events

Date Code Title Description
R012 Request for examination validly filed