DE112020005481T5 - Vorrichtungen, systeme und verfahren zur bearbeitung optischer komponenten - Google Patents

Vorrichtungen, systeme und verfahren zur bearbeitung optischer komponenten Download PDF

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Publication number
DE112020005481T5
DE112020005481T5 DE112020005481.0T DE112020005481T DE112020005481T5 DE 112020005481 T5 DE112020005481 T5 DE 112020005481T5 DE 112020005481 T DE112020005481 T DE 112020005481T DE 112020005481 T5 DE112020005481 T5 DE 112020005481T5
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DE
Germany
Prior art keywords
optical
output
neural network
procedure
waveform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112020005481.0T
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German (de)
English (en)
Inventor
Siddharth Jacob Varughese
Stephen E. Ralph
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Georgia Tech Research Institute
Georgia Tech Research Corp
Original Assignee
Georgia Tech Research Institute
Georgia Tech Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Georgia Tech Research Institute, Georgia Tech Research Corp filed Critical Georgia Tech Research Institute
Publication of DE112020005481T5 publication Critical patent/DE112020005481T5/de
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
    • H04B10/0731—Testing or characterisation of optical devices, e.g. amplifiers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
    • H04B10/0795—Performance monitoring; Measurement of transmission parameters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
    • H04B10/0799—Monitoring line transmitter or line receiver equipment

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Optical Communication System (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
DE112020005481.0T 2019-11-05 2020-11-05 Vorrichtungen, systeme und verfahren zur bearbeitung optischer komponenten Pending DE112020005481T5 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201962930681P 2019-11-05 2019-11-05
US62/930,681 2019-11-05
US202063057572P 2020-07-28 2020-07-28
US63/057,572 2020-07-28
PCT/US2020/059086 WO2021092156A1 (en) 2019-11-05 2020-11-05 Devices, systems, and methods for processing optical components

Publications (1)

Publication Number Publication Date
DE112020005481T5 true DE112020005481T5 (de) 2022-09-15

Family

ID=75849449

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112020005481.0T Pending DE112020005481T5 (de) 2019-11-05 2020-11-05 Vorrichtungen, systeme und verfahren zur bearbeitung optischer komponenten

Country Status (5)

Country Link
US (1) US12483328B2 (https=)
JP (1) JP7607652B2 (https=)
CN (1) CN114729965A (https=)
DE (1) DE112020005481T5 (https=)
WO (1) WO2021092156A1 (https=)

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JP2024506293A (ja) 2021-02-03 2024-02-13 テクトロニクス・インコーポレイテッド 人間と機械学習のためのオーバーレイ、コンポジット、ダイナミック・アイ・トリガを備えたアイのクラス・セパレータ
US11907090B2 (en) * 2021-08-12 2024-02-20 Tektronix, Inc. Machine learning for taps to accelerate TDECQ and other measurements
US11923896B2 (en) * 2021-03-24 2024-03-05 Tektronix, Inc. Optical transceiver tuning using machine learning
US11923895B2 (en) * 2021-03-24 2024-03-05 Tektronix, Inc. Optical transmitter tuning using machine learning and reference parameters
US20240235669A1 (en) * 2021-03-24 2024-07-11 Tektronix, Inc. Systems and methods for tuning and measuring a device under test using machine learning
US12442852B2 (en) 2022-03-30 2025-10-14 Tektronix, Inc. Tuning a device under test using parallel pipeline machine learning assistance
US11940889B2 (en) * 2021-08-12 2024-03-26 Tektronix, Inc. Combined TDECQ measurement and transmitter tuning using machine learning
US20220334180A1 (en) * 2021-04-20 2022-10-20 Tektronix, Inc. Real-equivalent-time flash array digitizer oscilloscope architecture
US12146914B2 (en) 2021-05-18 2024-11-19 Tektronix, Inc. Bit error ratio estimation using machine learning
EP4096118A1 (en) * 2021-05-28 2022-11-30 ADVA Optical Networking SE Method for determining actual values of one or more characteristics of a phase-modulated optical signal
US12571841B2 (en) 2021-06-04 2026-03-10 Tektronix, Inc. General digital signal processing waveform machine learning control application
US11601204B2 (en) 2021-07-16 2023-03-07 Cisco Technology, Inc. Leveraging coherent detection to measure performance of optical transmitter
US12416662B2 (en) 2022-01-14 2025-09-16 Tektronix, Inc. Machine learning model training using de-noised data and model prediction with noise correction
US12596145B2 (en) 2022-03-30 2026-04-07 Tektronix, Inc. Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance
EP4566247A4 (en) * 2022-10-10 2025-11-12 Huawei Tech Co Ltd RECEIVER DEVICE FOR PULSE AMPLITUDE MODULATION SIGNALS
US20240168471A1 (en) * 2022-11-23 2024-05-23 Tektronix, Inc. Interoperability predictor using machine learning and repository of tx, channel, and rx models from multiple vendors
JP7570452B2 (ja) * 2023-03-27 2024-10-21 東芝情報システム株式会社 機械学習判定モデル、機械学習判定モデル生成方法及び機械学習判定モデル生成用プログラム
CN116614178B (zh) * 2023-05-10 2025-12-23 中国联合网络通信集团有限公司 一种割接状态确定方法、装置、电子设备及存储介质
CN120043644B (zh) * 2025-04-23 2025-08-12 大连理工大学 基于神经网络的超宽带任意光学波形单帧测量方法

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US7643752B2 (en) * 2004-12-22 2010-01-05 Clariphy Communications, Inc. Testing of transmitters for communication links by software simulation of reference channel and/or reference receiver
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US9608721B2 (en) * 2014-05-01 2017-03-28 Mellanox Technologies Demark Aps Method of calculating transmitter and dispersion penalty for predicting optical data link and signal quality
US10585121B2 (en) * 2016-09-12 2020-03-10 Tektronix, Inc. Recommending measurements based on detected waveform type
US10782543B2 (en) * 2017-06-10 2020-09-22 Luxtera Llc Method and system for a distributed mach-zehnder interferometer with integrated feed forward equalizer
CN107342810B (zh) 2017-07-03 2019-11-19 北京邮电大学 基于卷积神经网络的深度学习智能眼图分析方法
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Also Published As

Publication number Publication date
US12483328B2 (en) 2025-11-25
JP7607652B2 (ja) 2024-12-27
CN114729965A (zh) 2022-07-08
WO2021092156A1 (en) 2021-05-14
JP2022554306A (ja) 2022-12-28
US20220407595A1 (en) 2022-12-22

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