DE112020002213T5 - Ermittlung von Bildeffekten - Google Patents
Ermittlung von Bildeffekten Download PDFInfo
- Publication number
- DE112020002213T5 DE112020002213T5 DE112020002213.7T DE112020002213T DE112020002213T5 DE 112020002213 T5 DE112020002213 T5 DE 112020002213T5 DE 112020002213 T DE112020002213 T DE 112020002213T DE 112020002213 T5 DE112020002213 T5 DE 112020002213T5
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- image
- defect
- generating
- computer
- determining
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
- G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
- G06F18/2413—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on distances to training or reference patterns
- G06F18/24133—Distances to prototypes
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/77—Retouching; Inpainting; Scratch removal
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/20—Image preprocessing
- G06V10/24—Aligning, centring, orientation detection or correction of the image
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/82—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
- G06V10/993—Evaluation of the quality of the acquired pattern
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10048—Infrared image
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20084—Artificial neural networks [ANN]
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/06—Recognition of objects for industrial automation
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Evolutionary Computation (AREA)
- Quality & Reliability (AREA)
- Multimedia (AREA)
- Artificial Intelligence (AREA)
- Computing Systems (AREA)
- Health & Medical Sciences (AREA)
- Databases & Information Systems (AREA)
- General Health & Medical Sciences (AREA)
- Medical Informatics (AREA)
- Software Systems (AREA)
- Data Mining & Analysis (AREA)
- Life Sciences & Earth Sciences (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Bioinformatics & Computational Biology (AREA)
- Evolutionary Biology (AREA)
- General Engineering & Computer Science (AREA)
- Image Analysis (AREA)
- Image Processing (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16/503,764 US11030738B2 (en) | 2019-07-05 | 2019-07-05 | Image defect identification |
| US16/503,764 | 2019-07-05 | ||
| PCT/IB2020/055527 WO2021005426A1 (en) | 2019-07-05 | 2020-06-12 | Image defect identification |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE112020002213T5 true DE112020002213T5 (de) | 2022-03-17 |
Family
ID=74066825
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112020002213.7T Pending DE112020002213T5 (de) | 2019-07-05 | 2020-06-12 | Ermittlung von Bildeffekten |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US11030738B2 (https=) |
| JP (1) | JP7482912B2 (https=) |
| CN (1) | CN114072851B (https=) |
| DE (1) | DE112020002213T5 (https=) |
| GB (1) | GB2600587B (https=) |
| WO (1) | WO2021005426A1 (https=) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020243333A1 (en) | 2019-05-30 | 2020-12-03 | The Research Foundation For The State University Of New York | System, method, and computer-accessible medium for generating multi-class models from single-class datasets |
| US11295439B2 (en) * | 2019-10-16 | 2022-04-05 | International Business Machines Corporation | Image recovery |
| CN115461612A (zh) * | 2020-04-28 | 2022-12-09 | 三菱电机株式会社 | 外观检查装置和外观检查方法 |
| US11967139B2 (en) * | 2020-05-19 | 2024-04-23 | Objectvideo Labs, Llc | Adversarial masks for false detection removal |
| CN111667420B (zh) * | 2020-05-21 | 2023-10-24 | 维沃移动通信有限公司 | 图像处理方法及装置 |
| DE102020207324A1 (de) * | 2020-06-12 | 2021-12-16 | Robert Bosch Gesellschaft mit beschränkter Haftung | Plausibilisierung der Ausgabe eines Bildklassifikators mit einem Generator für abgewandelte Bilder |
| JP7535934B2 (ja) * | 2020-12-18 | 2024-08-19 | 株式会社豊田中央研究所 | 不良箇所検出装置、不良箇所検出方法、およびコンピュータプログラム |
| JP7563665B2 (ja) * | 2021-01-26 | 2024-10-08 | 日東電工株式会社 | 検査システム、検査方法及び検査プログラム |
| CN112967248B (zh) * | 2021-03-03 | 2024-01-23 | 北京百度网讯科技有限公司 | 生成缺陷图像样本的方法、装置、介质及程序产品 |
| CN112950606B (zh) * | 2021-03-15 | 2023-04-07 | 重庆邮电大学 | 一种基于小样本的手机屏幕缺陷分割方法 |
| US11216932B1 (en) * | 2021-03-26 | 2022-01-04 | Minds AI Technologies Ltd | Electronic substrate defect detection |
| US11386580B1 (en) * | 2021-08-13 | 2022-07-12 | Goodsize Inc. | System apparatus and method for guiding user to comply with application-specific requirements |
| US12079982B2 (en) * | 2021-11-17 | 2024-09-03 | Yahoo Ad Tech Llc | Object defect detection |
| CN113870262B (zh) * | 2021-12-02 | 2022-04-19 | 武汉飞恩微电子有限公司 | 基于图像处理的印刷电路板分类方法、装置及储存介质 |
| CN114494135B (zh) * | 2021-12-24 | 2024-12-17 | 深圳英博达智能科技有限公司 | Pcb板表面凸点缺陷检测方法、系统、及电子设备 |
| CN114565622B (zh) * | 2022-03-03 | 2023-04-07 | 北京安德医智科技有限公司 | 房间隔缺损长度的确定方法及装置、电子设备和存储介质 |
| CN114332084B (zh) * | 2022-03-11 | 2022-09-16 | 齐鲁工业大学 | 一种基于深度学习的pcb表面缺陷检测方法 |
| CN115661123B (zh) * | 2022-11-14 | 2023-06-23 | 哈尔滨工业大学 | 基于弱监督目标检测的工业品表面缺陷位置检测方法 |
| JP2024082013A (ja) | 2022-12-07 | 2024-06-19 | 株式会社Screenホールディングス | 画像処理装置、特徴抽出器の学習方法、識別器の更新方法、および画像処理方法 |
| CN115937147B (zh) * | 2022-12-09 | 2023-09-26 | 北京小米移动软件有限公司 | 缺陷检测参数的确定方法、装置、设备及存储介质 |
| CN118314490B (zh) * | 2024-06-11 | 2024-09-17 | 合肥工业大学 | 一种特高压变电站空天地多尺度重决策方法及系统 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4644613B2 (ja) | 2006-02-27 | 2011-03-02 | 株式会社日立ハイテクノロジーズ | 欠陥観察方法及びその装置 |
| JP5275017B2 (ja) | 2008-12-25 | 2013-08-28 | 株式会社日立ハイテクノロジーズ | 欠陥検査方法及びその装置 |
| CN101604080B (zh) | 2009-07-10 | 2011-05-04 | 友达光电股份有限公司 | 透镜基板的检测方法及其应用于显示装置的制造方法 |
| JP6403627B2 (ja) | 2015-04-14 | 2018-10-10 | キヤノン株式会社 | インプリント装置、インプリント方法及び物品の製造方法 |
| JP6546826B2 (ja) | 2015-10-08 | 2019-07-17 | 株式会社日立パワーソリューションズ | 欠陥検査方法、及びその装置 |
| KR102376200B1 (ko) * | 2016-05-12 | 2022-03-18 | 에이에스엠엘 네델란즈 비.브이. | 기계 학습에 의한 결함 또는 핫스폿의 식별 |
| WO2018216629A1 (ja) | 2017-05-22 | 2018-11-29 | キヤノン株式会社 | 情報処理装置、情報処理方法、及びプログラム |
| JP7031963B2 (ja) | 2017-08-22 | 2022-03-08 | 株式会社ディスコ | チップの製造方法 |
| JP2019039727A (ja) | 2017-08-23 | 2019-03-14 | 富士通株式会社 | 画像検査装置、画像検査方法および画像検査プログラム |
| US10424059B2 (en) * | 2017-09-11 | 2019-09-24 | International Business Machines Corporation | Quality evaluation |
| JP6936957B2 (ja) | 2017-11-07 | 2021-09-22 | オムロン株式会社 | 検査装置、データ生成装置、データ生成方法及びデータ生成プログラム |
| CN109118482B (zh) | 2018-08-07 | 2019-12-31 | 腾讯科技(深圳)有限公司 | 一种面板缺陷分析方法、装置及存储介质 |
| CN109035248A (zh) * | 2018-09-05 | 2018-12-18 | 深圳灵图慧视科技有限公司 | 疵点检测方法、装置、终端设备、服务器和存储介质 |
| CN109741328B (zh) * | 2019-02-02 | 2023-04-14 | 东北大学 | 一种基于生成式对抗网络的汽车表观质量检测方法 |
-
2019
- 2019-07-05 US US16/503,764 patent/US11030738B2/en active Active
-
2020
- 2020-06-12 WO PCT/IB2020/055527 patent/WO2021005426A1/en not_active Ceased
- 2020-06-12 GB GB2200865.0A patent/GB2600587B/en active Active
- 2020-06-12 DE DE112020002213.7T patent/DE112020002213T5/de active Pending
- 2020-06-12 JP JP2021578101A patent/JP7482912B2/ja active Active
- 2020-06-12 CN CN202080049757.3A patent/CN114072851B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN114072851A (zh) | 2022-02-18 |
| JP2022538468A (ja) | 2022-09-02 |
| US11030738B2 (en) | 2021-06-08 |
| JP7482912B2 (ja) | 2024-05-14 |
| GB2600587A (en) | 2022-05-04 |
| GB2600587B (en) | 2023-11-15 |
| US20210004945A1 (en) | 2021-01-07 |
| GB202200865D0 (en) | 2022-03-09 |
| WO2021005426A1 (en) | 2021-01-14 |
| CN114072851B (zh) | 2025-07-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed | ||
| R084 | Declaration of willingness to licence |