DE112014001826A5 - Haltestift und Leiterplatten-Prüfvorrichtung - Google Patents

Haltestift und Leiterplatten-Prüfvorrichtung Download PDF

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Publication number
DE112014001826A5
DE112014001826A5 DE112014001826.0T DE112014001826T DE112014001826A5 DE 112014001826 A5 DE112014001826 A5 DE 112014001826A5 DE 112014001826 T DE112014001826 T DE 112014001826T DE 112014001826 A5 DE112014001826 A5 DE 112014001826A5
Authority
DE
Germany
Prior art keywords
circuit board
holding pin
board tester
tester
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE112014001826.0T
Other languages
English (en)
Other versions
DE112014001826B4 (de
Inventor
Stefan Kümpflein
Michael Huber
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ingun Pruefmittelbau GmbH
Original Assignee
Ingun Pruefmittelbau GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ingun Pruefmittelbau GmbH filed Critical Ingun Pruefmittelbau GmbH
Publication of DE112014001826A5 publication Critical patent/DE112014001826A5/de
Application granted granted Critical
Publication of DE112014001826B4 publication Critical patent/DE112014001826B4/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
DE112014001826.0T 2013-04-04 2014-04-03 Haltestift und Leiterplatten-Prüfvorrichtung Expired - Fee Related DE112014001826B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE202013101438.9 2013-04-04
DE202013101438.9U DE202013101438U1 (de) 2013-04-04 2013-04-04 Haltestift und Leiterplatten-Prüfvorrichtung
PCT/EP2014/056760 WO2014161972A2 (de) 2013-04-04 2014-04-03 Haltestift und leiterplatten-prüfvorrichtung

Publications (2)

Publication Number Publication Date
DE112014001826A5 true DE112014001826A5 (de) 2015-12-24
DE112014001826B4 DE112014001826B4 (de) 2020-03-19

Family

ID=50543024

Family Applications (2)

Application Number Title Priority Date Filing Date
DE202013101438.9U Expired - Lifetime DE202013101438U1 (de) 2013-04-04 2013-04-04 Haltestift und Leiterplatten-Prüfvorrichtung
DE112014001826.0T Expired - Fee Related DE112014001826B4 (de) 2013-04-04 2014-04-03 Haltestift und Leiterplatten-Prüfvorrichtung

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE202013101438.9U Expired - Lifetime DE202013101438U1 (de) 2013-04-04 2013-04-04 Haltestift und Leiterplatten-Prüfvorrichtung

Country Status (2)

Country Link
DE (2) DE202013101438U1 (de)
WO (1) WO2014161972A2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012209353B4 (de) * 2012-06-04 2018-12-06 Continental Automotive Gmbh Prüfvorrichtung zum Testen einer Flachbaugruppe
US11128071B2 (en) 2019-10-25 2021-09-21 Schweitzer Engineering Laboratories, Inc. Interface for a printed circuit board assembly adapter module
DE102019134764A1 (de) * 2019-12-17 2021-06-17 Trumpf Werkzeugmaschinen Gmbh + Co. Kg Prüfvorrichtung sowie Verfahren zur Zustandskontrolle von Vakuumsaugern einer Greifeinrichtung

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3405566C2 (de) * 1984-02-14 1986-09-25 Siemens AG, 1000 Berlin und 8000 München Verriegelungseinrichtung für eine Vorrichtung zur automatischen Prüfung von Flachbaugruppen
DE102011054260B4 (de) 2011-10-06 2020-06-18 Ingun Prüfmittelbau Gmbh Vorrichtung und Verfahren zum Prüfen von Leiterplatten
DE102012209353B4 (de) * 2012-06-04 2018-12-06 Continental Automotive Gmbh Prüfvorrichtung zum Testen einer Flachbaugruppe

Also Published As

Publication number Publication date
DE202013101438U1 (de) 2014-07-09
DE112014001826B4 (de) 2020-03-19
WO2014161972A3 (de) 2014-12-18
WO2014161972A2 (de) 2014-10-09

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Legal Events

Date Code Title Description
R012 Request for examination validly filed
R016 Response to examination communication
R018 Grant decision by examination section/examining division
R020 Patent grant now final
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee