DE112013002224B4 - Spektrometer mit eingebauter ATR und Zubehörfach - Google Patents

Spektrometer mit eingebauter ATR und Zubehörfach Download PDF

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Publication number
DE112013002224B4
DE112013002224B4 DE112013002224.9T DE112013002224T DE112013002224B4 DE 112013002224 B4 DE112013002224 B4 DE 112013002224B4 DE 112013002224 T DE112013002224 T DE 112013002224T DE 112013002224 B4 DE112013002224 B4 DE 112013002224B4
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Prior art keywords
light
optical element
spectrometer
base plate
receive
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DE112013002224.9T
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German (de)
English (en)
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DE112013002224T5 (de
Inventor
Michael S. Bradley
Federico Izzia
John Magie Coffin
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Thermo Electron Scientific Instruments LLC
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Thermo Electron Scientific Instruments LLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0202—Mechanical elements; Supports for optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0213—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using attenuators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE112013002224.9T 2012-04-27 2013-04-25 Spektrometer mit eingebauter ATR und Zubehörfach Active DE112013002224B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/458,000 2012-04-27
US13/458,000 US8547555B1 (en) 2012-04-27 2012-04-27 Spectrometer with built-in ATR and accessory compartment
PCT/US2013/038204 WO2013163420A1 (en) 2012-04-27 2013-04-25 Spectrometer with built-in atr and accessory compartment

Publications (2)

Publication Number Publication Date
DE112013002224T5 DE112013002224T5 (de) 2015-01-22
DE112013002224B4 true DE112013002224B4 (de) 2020-08-06

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Family Applications (1)

Application Number Title Priority Date Filing Date
DE112013002224.9T Active DE112013002224B4 (de) 2012-04-27 2013-04-25 Spektrometer mit eingebauter ATR und Zubehörfach

Country Status (5)

Country Link
US (1) US8547555B1 (https=)
JP (1) JP6259816B2 (https=)
DE (1) DE112013002224B4 (https=)
GB (1) GB2516406B (https=)
WO (1) WO2013163420A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022121038A1 (de) * 2022-08-19 2024-02-22 WiredSense GmbH FTIR-Spektrometer

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016094434A1 (en) * 2014-12-08 2016-06-16 University Of Virginia Patent Foundation Systems and methods for multispectral photoacoustic microscopy
DE102016008885B4 (de) * 2016-07-20 2020-09-17 Spectrolytic GmbH Schmuckstück mit ATR-Spektrometer und Kit mit dem Schmuckstück
JP6849405B2 (ja) * 2016-11-14 2021-03-24 浜松ホトニクス株式会社 分光計測装置及び分光計測システム
EP3598105A1 (en) * 2018-07-20 2020-01-22 Omya International AG Method for detecting phosphate and/or sulphate salts on the surface of a substrate or within a substrate, use of a lwir detecting device and a lwir imaging system
EP3910323A1 (en) * 2020-05-12 2021-11-17 CIC nanoGUNE - Asociación Centro de Investigación Cooperativa en Nanociencias Combined spectroscopy system including raman and atr-ftir
CN114184570A (zh) * 2021-12-21 2022-03-15 蓝莫德(天津)科学仪器股份有限公司 一种atr红外光谱人体结石分析仪
US12416571B2 (en) 2022-12-23 2025-09-16 Thermo Electron Scientific Instruments Llc Spectrometer with absolute transmission accessory
WO2024175879A1 (en) * 2023-02-23 2024-08-29 Edinburgh Instruments Limited Fourier transform infrared spectroscopy instrument

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE29918295U1 (de) 1999-10-16 2000-08-03 Bruker Optik GmbH, 76275 Ettlingen ATR-Meßzelle für die FTIR-Spektroskopie
DE102006037524A1 (de) 2006-08-10 2008-02-21 Bruker Optik Gmbh Spektrometersystem mit IR-Mikroskop und elektronisch umschaltbaren Detektoren
DE102010031189B4 (de) 2010-07-09 2014-04-03 Bruker Optik Gmbh ATR-Objektiv für ein IR-Mikroskop und Verfahren zu dessen Betrieb

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US5338935A (en) 1992-09-25 1994-08-16 Truett William L Positioning device for infrared accessories in FTIR spectrometers
US5859434A (en) 1993-02-18 1999-01-12 Cic Photonics, Inc. Infrared spectroscopic sampling accessory having a remotely mounted crystal plate
US6038022A (en) 1997-05-29 2000-03-14 Spectra-Tech, Inc. Coupling device for integrating and interfacing accessory modules with spectrometers for spectroscopic analysis
EP0982584B1 (en) 1998-08-28 2006-02-08 Perkin-Elmer Limited Spectrometer accessory for carrying out attenuated total reflectance measurements
US6667808B2 (en) * 2000-03-08 2003-12-23 Thermo Electron Scientific Instruments Corporation Multifunctional fourier transform infrared spectrometer system
US7075645B2 (en) * 2002-05-09 2006-07-11 Euro-Celtique S.A. Spectroscopic analyzer for blender
US7652765B1 (en) * 2004-03-06 2010-01-26 Plain Sight Systems, Inc. Hyper-spectral imaging methods and devices
JP4773168B2 (ja) * 2005-09-13 2011-09-14 国立大学法人北海道大学 電気化学赤外分光装置
US7582869B2 (en) 2006-07-20 2009-09-01 Sas Photonics, Llc System and method for optical analysis
US20090116021A1 (en) * 2007-10-05 2009-05-07 Jeffry Mark Bulson Method and apparatus for determining composition and concentration of contaminants on a film encapsulated in a plasma display panel
JP5181689B2 (ja) * 2008-01-18 2013-04-10 横河電機株式会社 近赤外光及び赤外光の分光分析装置
US9664563B2 (en) * 2009-12-02 2017-05-30 University Of Hawaii Fabry-perot fourier transform spectrometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE29918295U1 (de) 1999-10-16 2000-08-03 Bruker Optik GmbH, 76275 Ettlingen ATR-Meßzelle für die FTIR-Spektroskopie
DE102006037524A1 (de) 2006-08-10 2008-02-21 Bruker Optik Gmbh Spektrometersystem mit IR-Mikroskop und elektronisch umschaltbaren Detektoren
DE102010031189B4 (de) 2010-07-09 2014-04-03 Bruker Optik Gmbh ATR-Objektiv für ein IR-Mikroskop und Verfahren zu dessen Betrieb

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Bruker Optics Inc., "TENSOR series FTIR-spectrometer", 2002, URL: www.tajhizshimi.com/Tensor%2027.pdf, [abgerufen am 24.02.2016] *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102022121038A1 (de) * 2022-08-19 2024-02-22 WiredSense GmbH FTIR-Spektrometer

Also Published As

Publication number Publication date
GB201420983D0 (en) 2015-01-07
GB2516406A (en) 2015-01-21
WO2013163420A1 (en) 2013-10-31
US8547555B1 (en) 2013-10-01
GB2516406B (en) 2020-02-12
DE112013002224T5 (de) 2015-01-22
JP6259816B2 (ja) 2018-01-10
JP2015515011A (ja) 2015-05-21

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