DE112006003699A5 - Auslenkbares mikromechanisches System sowie dessen Verwendung - Google Patents

Auslenkbares mikromechanisches System sowie dessen Verwendung Download PDF

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Publication number
DE112006003699A5
DE112006003699A5 DE112006003699T DE112006003699T DE112006003699A5 DE 112006003699 A5 DE112006003699 A5 DE 112006003699A5 DE 112006003699 T DE112006003699 T DE 112006003699T DE 112006003699 T DE112006003699 T DE 112006003699T DE 112006003699 A5 DE112006003699 A5 DE 112006003699A5
Authority
DE
Germany
Prior art keywords
deflectible
micromechanical system
micromechanical
deflectible micromechanical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE112006003699T
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English (en)
Other versions
DE112006003699B4 (de
Inventor
Holger Dipl.-Ing. Conrad
Thomas Dipl.-Ing. Klose
Thilo Dr.-Ing. Sandner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Original Assignee
Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV filed Critical Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV
Publication of DE112006003699A5 publication Critical patent/DE112006003699A5/de
Application granted granted Critical
Publication of DE112006003699B4 publication Critical patent/DE112006003699B4/de
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0001Transmitting or indicating the displacement of elastically deformable gauges by electric, electro-mechanical, magnetic or electro-magnetic means
    • G01L9/0002Transmitting or indicating the displacement of elastically deformable gauges by electric, electro-mechanical, magnetic or electro-magnetic means using variations in ohmic resistance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/18Measuring force or stress, in general using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0041Transmitting or indicating the displacement of flexible diaphragms
    • G01L9/0051Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance
    • G01L9/0052Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements
    • G01L9/0055Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements bonded on a diaphragm

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Micromachines (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
DE112006003699T 2006-02-03 2006-02-03 Auslenkbares mikromechanisches System sowie dessen Verwendung Active DE112006003699B4 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/DE2006/000243 WO2007087767A1 (de) 2006-02-03 2006-02-03 Auslenkbares mikromechanisches system sowie dessen verwendung

Publications (2)

Publication Number Publication Date
DE112006003699A5 true DE112006003699A5 (de) 2008-10-23
DE112006003699B4 DE112006003699B4 (de) 2012-07-19

Family

ID=36282959

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112006003699T Active DE112006003699B4 (de) 2006-02-03 2006-02-03 Auslenkbares mikromechanisches System sowie dessen Verwendung

Country Status (4)

Country Link
US (1) US7841242B2 (de)
CN (1) CN101379377B (de)
DE (1) DE112006003699B4 (de)
WO (1) WO2007087767A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012087286A1 (en) 2010-12-20 2012-06-28 Intel Corporation Micro deflectors on touch sensor
CN102692705B (zh) * 2011-06-16 2014-05-14 重庆大学 基于moems工艺集成角度传感器的微扫描光栅
EP3082428A4 (de) 2013-12-09 2017-08-02 Respira Therapeutics, Inc. Pde5-inhibitorpulverformulierungen und zugehörige verfahren
US9470503B2 (en) * 2014-02-26 2016-10-18 Apple Inc. Strain-based sensing of mirror position
DE102014217799B4 (de) * 2014-09-05 2019-11-21 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Piezoelektrischer Positionssensor für piezoelektrisch angetriebene resonante Mikrospiegel
DE102016206671A1 (de) * 2016-04-20 2017-10-26 Robert Bosch Gmbh Längenausdehnungsüberwachung zur Bestimmung der Alterung einer Batteriezelle oder eines Batteriemoduls
CN108664903B (zh) * 2018-04-23 2019-12-31 江苏大学 一种触觉信号自动采集装置
US11880031B1 (en) 2020-01-14 2024-01-23 Apple Inc. Strain-based sensing of dual-axis mirror rotation

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3123788A (en) * 1964-03-03 Piezoresistive gage
US4442717A (en) * 1982-09-20 1984-04-17 Kulite Semiconductor Products, Inc. Compensation and normalization apparatus for shear piezoresistive gage sensors
US5034645A (en) * 1989-01-13 1991-07-23 Digital Equipment Corporation Micro-beam tactile sensor for the measurement of vertical position displacement
JPH09232595A (ja) * 1996-02-26 1997-09-05 Denso Corp 圧力検出装置
CN1139058C (zh) * 1997-07-29 2004-02-18 西加特技术有限责任公司 低质量盘片驱动器悬架
US6134087A (en) * 1998-06-10 2000-10-17 Magnecomp Corp. Low voltage, high displacement microactuated disk drive suspension
US6444487B1 (en) * 1998-07-28 2002-09-03 Rosemount Aerospace Inc. Flexible silicon strain gage
US6239953B1 (en) * 1999-10-15 2001-05-29 Magnecomp Corp. Microactuated disk drive suspension with heightened stroke sensitivity
CN1937037A (zh) * 2000-11-28 2007-03-28 新科实业有限公司 带有压电微驱动机构的磁头弹簧片组件
US6807875B2 (en) * 2000-12-01 2004-10-26 Honeywell International Inc. Self-compensating position sensor
JP2005233953A (ja) * 2004-02-17 2005-09-02 Robert Bosch Gmbh マイクロメカニカル式の高圧センサを製造するための方法及びマクロメカニカル式の圧力センサ

Also Published As

Publication number Publication date
CN101379377B (zh) 2011-05-11
US7841242B2 (en) 2010-11-30
DE112006003699B4 (de) 2012-07-19
US20090293632A1 (en) 2009-12-03
CN101379377A (zh) 2009-03-04
WO2007087767A1 (de) 2007-08-09

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