DE112004002986A5 - Prüfanlage zur zerstörungsfreien Materialprüfung - Google Patents
Prüfanlage zur zerstörungsfreien Materialprüfung Download PDFInfo
- Publication number
- DE112004002986A5 DE112004002986A5 DE112004002986T DE112004002986T DE112004002986A5 DE 112004002986 A5 DE112004002986 A5 DE 112004002986A5 DE 112004002986 T DE112004002986 T DE 112004002986T DE 112004002986 T DE112004002986 T DE 112004002986T DE 112004002986 A5 DE112004002986 A5 DE 112004002986A5
- Authority
- DE
- Germany
- Prior art keywords
- testing
- destructive material
- testing system
- material testing
- destructive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Programme-controlled manipulators
- B25J9/16—Programme controls
- B25J9/1679—Programme controls characterised by the tasks executed
- B25J9/1682—Dual arm manipulator; Coordination of several manipulators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2004/012187 WO2006042569A1 (de) | 2004-10-15 | 2004-10-15 | Prüfanlage zur zerstörungsfreien materialprüfung |
Publications (2)
Publication Number | Publication Date |
---|---|
DE112004002986A5 true DE112004002986A5 (de) | 2007-09-20 |
DE112004002986B4 DE112004002986B4 (de) | 2009-10-08 |
Family
ID=34959254
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE112004002986T Expired - Fee Related DE112004002986B4 (de) | 2004-10-15 | 2004-10-15 | Prüfanlage zur zerstörungsfreien Materialprüfung |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE112004002986B4 (de) |
WO (1) | WO2006042569A1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ITFI20050137A1 (it) * | 2005-06-20 | 2006-12-21 | Giovanni Berti | Apparecchiatura mobile per irragiamento e rilevazione di radiazioni |
WO2008119868A1 (en) * | 2007-04-03 | 2008-10-09 | Stresstech Oy | Goniometer |
DE102012112025B4 (de) * | 2012-12-10 | 2016-05-12 | Carl Zeiss Ag | Verfahren und Vorrichtungen zur Positionsbestimmung einer Kinematik |
JP6164441B2 (ja) * | 2013-06-19 | 2017-07-19 | エルジー・ケム・リミテッド | 基材フィルム |
EP2908127B1 (de) * | 2014-02-18 | 2017-07-05 | PANalytical B.V. | Röntgenanalysevorrichtung mit Robotarm |
CN107813293B (zh) * | 2017-10-24 | 2022-09-09 | 北京金轮坤天特种机械有限公司 | 一种柔性加工双机械手环境下使用的六自由度可调底座装置 |
CN110095479B (zh) * | 2019-02-20 | 2022-01-04 | 江苏能建机电实业集团有限公司 | 一种铝型材无损检测设备 |
CN110455802B (zh) * | 2019-08-27 | 2023-05-12 | 江苏金恒信息科技股份有限公司 | 基于视觉识别的合金分析装置及方法 |
WO2023250409A2 (en) * | 2022-06-23 | 2023-12-28 | San Diego State University (SDSU) Foundation, dba San Diego State University Research Foundation | Terahertz nondestructive testing apparatus and method |
DE102023106834A1 (de) | 2023-03-20 | 2024-09-26 | Bayerische Motoren Werke Aktiengesellschaft | Verfahren zum Überprüfen einer Verbindung eines Kontaktiersystems einer Traktionsbatterie |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4065211A (en) * | 1976-03-01 | 1977-12-27 | The United States Of America As Represented By The Secretary Of The Army | Precision X-ray diffraction system incorporating a laser aligner |
US4788440A (en) * | 1981-05-11 | 1988-11-29 | Diffracto Ltd. | Electro-optical systems for control of robots, manipulator arms and coordinate measuring machines |
US4714339B2 (en) * | 1986-02-28 | 2000-05-23 | Us Commerce | Three and five axis laser tracking systems |
JPH01274981A (ja) * | 1988-04-26 | 1989-11-02 | Fuji Heavy Ind Ltd | 工業用ロボットの位置補正装置 |
EP0512620A3 (de) * | 1991-05-07 | 1995-07-05 | Koninklijke Philips Electronics N.V. | Röntgenanalyseapparat |
US6064717A (en) * | 1997-11-21 | 2000-05-16 | Rigaku/Usa, Inc. | Unrestricted motion apparatus and method for x-ray diffraction analysis |
US6227704B1 (en) * | 1999-09-30 | 2001-05-08 | Siemens Corporate Research, Inc. | Laser-based method for aligning apparatus for superimposing X-ray and video images |
-
2004
- 2004-10-15 DE DE112004002986T patent/DE112004002986B4/de not_active Expired - Fee Related
- 2004-10-15 WO PCT/EP2004/012187 patent/WO2006042569A1/de active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2006042569A1 (de) | 2006-04-27 |
DE112004002986B4 (de) | 2009-10-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8127 | New person/name/address of the applicant |
Owner name: GE SENSING & INSPECTION TECHNOLOGIES GMBH, 503, DE |
|
8364 | No opposition during term of opposition | ||
R082 | Change of representative |
Representative=s name: PATENTANWAELTE BAUER VORBERG KAYSER PARTNERSCH, DE Representative=s name: BAUER-VORBERG-KAYSER, DE |
|
R082 | Change of representative |
Representative=s name: PATENTANWAELTE BAUER VORBERG KAYSER PARTNERSCH, DE Representative=s name: BAUER-VORBERG-KAYSER, DE |
|
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |