DE102022125220A1 - Measuring device for determining an extrapolated position of an object, processing device, method, computer program and computer-readable medium - Google Patents

Abstract

The invention relates to a measuring device (10) for determining an extrapolated position (RC) of an object (7) with at least one measurement control device (12), wherein the measuring device (10) is designed to determine the extrapolated position (RC) of the object (7) from at least two positions (RA, RB) of the object (7) according to a predetermined extrapolation method. The measuring device (10) comprises at least one laser diode measuring beam device (11) which is designed to output at least one measuring beam (14) in a respective measuring process. A detector device (13) of the measuring device (10) is designed to detect reflection point coordinates (17) of reflection points (16) on a surface (8) of the object (7) in the respective measuring process.

Description

The invention relates to a measuring device for determining an extrapolated position of an object according to the features of the preamble of claim 1. The invention also relates to a processing device comprising at least one measuring device according to the features of the preamble of claim 19, a method for operating a measuring device according to the features of Preamble of claim 21, a computer program according to the features of the preamble of claim 22 and a computer-readable medium according to the features of the preamble of claim 23.

Processing devices for laser-based processing of an object are known from the prior art and are used, for example, in the surface processing of metal objects. Another area of application for processing devices for laser-based processing is medical technology. The laser-based processing devices are used in medical technology, for example, to correct optical ametropia and/or pathological or unnaturally changed areas of the cornea. For example, a pulsed laser and a beam focusing device can be designed such that laser pulses cause photodisruption and/or photoablation in a focus located within an organic tissue in order to remove a tissue, in particular a tissue lenticule, from the cornea.

The beam focusing device is set up to focus the processing laser for processing the object on predetermined points whose positions are defined in relation to the object. The predetermined points can be arranged in a predetermined pattern in or on the object in order, for example, to be able to provide a predetermined separation surface. During processing of the object, the processing laser beam can be sequentially focused on the predetermined points by the processing device in order to incorporate the predetermined pattern into the object and/or to cut the object along the predetermined points.

Particularly with relatively finely designed patterns, it is necessary to appropriately fix the object to be processed in order to minimize movements and vibrations of the object during processing in order to avoid incorrect processing of the object. However, sufficient fixation of the object may not be possible or possible fixation may not be sufficient to minimize movements and/or vibrations of the object to a sufficient extent.

In order to be able to compensate for movements and/or vibrations of the object during processing, it is common to detect the movement of the object using a measuring device and to control the processing laser in such a way that the movement of the object is taken into account. This procedure is used, among other things, in eye treatment if the object is an eye. In this context, this process is referred to as eye tracking. Here, a viewing direction of the eye is recorded at different times during an eye treatment and, based on the recorded viewing directions of the eye, a future viewing direction of the eye is predicted in order to align the processing laser according to the future viewing direction of the eye, so that the desired pattern is displayed on the eye despite the movement of the eye eye is provided.

For example, it is known from the prior art to project a predetermined infrared pattern onto the eye, which is detected by a camera unit of the measuring device. The disadvantage of this type of eye tracking is the relatively high computational effort that is required to capture the pattern in images and the necessary provision of a corresponding light source, which increases the space required by the measuring device.

The invention is based on the object of providing a measuring device which enables a space-saving and less computationally intensive determination of a future position of the object.

This object is achieved by the measuring device according to the invention according to the features of claim 1, the processing device according to the invention according to the features of claim 19, the method according to the invention according to the features of claim 21, the computer program according to the invention according to the features of claim 22 and the computer-readable medium according to the invention Features of claim 23 solved. Advantageous embodiments with useful developments of the invention are specified in the respective subclaims, with advantageous embodiments of each aspect of the invention being viewed as advantageous embodiments of the other aspects of the invention.

A first aspect of the invention relates to a measuring device for determining an extrapolated position of an object with at least one measurement control device. In other words, the measuring device is set up to determine a future position of the Object to be determined in an extrapolation process. The measuring device is set up to carry out respective measuring processes at at least two different times in order to determine respective positions of the object at the at least two times in a predetermined reference system. In other words, the measuring device is set up to determine the position of the object at the respective times in each of the measuring processes. The predetermined reference system can, for example, describe a Cartesian coordinate system, which can be described in relation to a predetermined reference point and predetermined reference directions. The reference point can, for example, be related to the measuring device or a processing laser of a processing device.

The measuring device is set up to determine the extrapolated position of the object from the at least two layers according to a predetermined extrapolation method. In other words, the measuring device is set up to determine the extrapolated position of the object from the at least two positions of the object according to the predetermined extrapolation method, which describes a position of the object at a specific, future point in time. The extrapolated position of the object can, for example, be provided to a processing device in order to align a beam path of a processing laser and/or a focusing of the processing laser depending on the extrapolated position of the object.

The measuring device comprises at least one laser diode measuring beam device which is designed to output at least one measuring beam along a predetermined respective beam path in order to project a predetermined measuring pattern area onto a surface of the object in a respective measuring process. In other words, the laser diode measuring beam device of the measuring device is designed to output the at least one measuring beam onto the object along the predetermined beam path in order to image the predetermined measuring pattern area on the surface of the object. The predetermined measuring pattern area can be defined by predetermined geometric relations of the predetermined beam path of the at least one measuring beam to predetermined beam paths of other measuring beams. The predetermined measuring pattern area can specify a predetermined arrangement of reflection points of respective measuring beams and/or a reflection surface to be generated on the surface by the at least one measuring beam, wherein the reflection surface can have a predetermined or known intensity distribution. The laser diode measuring beam device can, for example, have at least one lens mirror device, which can be set up in particular as a MEMS, which can have at least one mirror unit that can be aligned in a predetermined direction by means of an actuator. The measuring device can have one or a plurality of radiation sources. The one or more radiation sources can be aligned in predetermined directions by one or more actuators. In addition or as an alternative, it can be provided that the laser diode measuring beam device can be set up as an array, which can have several radiation sources. The measuring beam device can be set up based on the exemplary features to output the at least one measuring beam in a respective, predetermined direction. It can be provided that the laser diode measuring beam device is set up as a digital mirror device, which has several mirrors. The mirrors can be individually adjusted to either output the respective measuring beam or to block the output. By designing it as a digital mirror device, it can be possible to provide the measurement pattern area by adjusting the respective mirrors. A respective mirror can be assigned to each of the radiation sources. The laser diode measuring beam device can also be set up to align the measuring beam in a predetermined direction by positioning the mirror. The alignment of the mirror can be adjusted by the laser diode measuring beam device in order to emit the measuring beam in different directions during a measuring process, for example to enable scanning of the surface. The laser diode measuring beam device can be set up to set a wavelength of the measuring beam within a predetermined spectrum. The laser diode measuring beam device can be set up as a tunable laser device, for example.

The measuring device comprises at least one detector device, which is set up to detect at least one reflected measuring beam of the measuring beam in the respective measuring process. The at least one reflected measuring beam can be the at least one measuring beam, which is reflected at at least one respective reflection point on the surface of the object by a reflection of the measuring beam emitted by the laser diode measuring beam device. The detector device is set up to determine reflection point coordinates of the at least one reflection point of the measurement pattern surface in relation to the predetermined reference system. In other words, the measuring device has the at least one detector device, which is set up to detect the at least one reflected measuring beam and the reflection points to determine coordinates of the at least one reflection point at which the at least one measuring beam is reflected on the surface of the object. The detector device can be set up to determine the reflection point coordinates of the at least one reflection point in relation to the predetermined reference system using a method according to the prior art, for example by means of triangulation, intensity measurement, transit time detection.

The at least one measurement control device is set up to identify a predetermined referencing feature in relation to the object according to a predetermined identification method by means of the at least one reflection point of the predetermined measurement pattern surface of the respective measurement process. The predetermined referencing feature is stored in the at least one measurement control device. The predetermined referencing feature can, for example, be an area of the object, which can be identified, for example, due to a special nature of the object, and can be particularly suitable for determining the position of the object.

The at least one measurement control device is designed to determine a position of the predetermined reference feature in relation to the predetermined reference system according to a predetermined position determination method as a function of the reflection point coordinates of the at least one reflection point of the measurement pattern surface. In other words, the measurement control device is intended to use the at least one reflection point in the predetermined identification method in order to identify the predetermined reference feature of the object. In the predetermined identification method, for example, a detected intensity of the reflection point or the reflection point coordinates can be used to identify the reference feature of the object. It can be provided, for example, that the presence of the predetermined reference feature is determined by the at least one measurement control device when the detected intensity of the at least one reflection point exceeds a predetermined threshold value. This can be the case, for example, if the reference feature is a predetermined point of the object which can be easily delimited from other areas of the object based on its reflection properties. The position of the reference feature in relation to the object is stored in the at least one measurement control device.

The at least one measurement control device is set up to determine, according to a predetermined position determination method, a position of the predetermined referencing feature in relation to the predetermined reference system as a function of the reflection point coordinates of at least one reflection point in relation to the predetermined reference system. In the said case, it can be provided that the reflection point coordinates of the reflection point whose intensity value exceeds the predetermined threshold value is defined as the position of the reference feature in relation to the predetermined reference system. In other words, the predetermined position determination method determines at which location the reference feature of the object is located in the reference system.

At least one measurement control device is set up to determine the position of the object in the reference system of the respective measurement process from the position of the reference feature in relation to the predetermined reference system and the position of the referencing feature in relation to the object. In other words, the position of the predetermined referencing feature of the object is known both in relation to the predetermined reference system and in relation to the object. The at least one measurement control device is able to determine the position of the object in relation to the predetermined reference system due to the known position of the predetermined referencing feature in relation to the reference system of the known position of the predetermined referencing feature in relation to the object.

The invention has the advantage that positions of the object can be recorded from respective measurement processes using the lidar method and used to predict the future position.

The invention also includes further developments which result in additional advantages.

A further development of the invention provides that the object is a human or animal eye. In other words, the measuring device is set up to determine a position of a volume model of a human or animal eye in the reference system. The measuring device is set up to determine the extrapolated position of the volume model from the at least two positions. This results in the advantage that the measuring device is set up to carry out so-called eye tracking. The extrapolated position of the volume model can be used, for example, in a laser treatment of the eye or in devices that are set up to provide virtual reality.

A further development of the invention provides that the at least one laser diode measuring beam device is set up to output the at least one measuring beam as a collimated beam. In other words, the laser diode measuring beam device is set up to output the at least one measuring beam with a focal point that is at infinity. The at least one laser diode measuring beam device can, for example, have a collimator through which the generated measuring beam can be guided before it is guided onto the object.

A further development of the invention provides that the at least one laser diode measuring beam device has at least one expansion element in the respective beam path of the at least one measuring beam, which is designed to expand the at least one measuring beam to a predetermined optical beam diameter in order to generate the at least one reflection point of the measuring pattern with a predetermined reflection surface on the surface of the object. In other words, it is provided that the laser diode measuring beam device is designed to provide the at least one measuring beam with a predetermined optical beam diameter. To provide the measuring beam with the predetermined optical beam diameter, the laser diode measuring beam device comprises at least one expansion element. The expansion element can, for example, comprise lenses that are arranged in an inverted Galilean arrangement and can have a converging lens and a diverging lens. The laser diode measuring beam device is designed to guide the measuring beam through the expansion element so that the optical beam diameter of the measuring beam is increased by the expansion element to the predetermined optical beam diameter. It can be provided, for example, that the laser diode measuring beam device can provide the measuring beam with an optical beam diameter of 2-4 mm by means of the expansion element. In other words, the measuring beam provided by the laser diode measuring beam device can have a beam diameter that is, for example, 2.0 mm, 2.1 mm, 2.2 mm, 2.3 mm, 2.4 mm, 2.5 mm, 2.6 mm, 2.7 mm, 2.8 mm, 2.9 mm, 3.0 mm, 3.1 mm, 3.2 mm, 3.3 mm, 3.4 mm, 3.5 mm, 3.6 mm, 3.7 mm, 3.8 mm, 3.9 mm or 4.0 mm. The beam diameter of 2 mm to 4 mm can be provided, for example, if the at least one measuring beam is to provide a measuring pattern area for detecting an apex of a cornea. The laser diode measuring beam device can also be designed to provide a measuring beam with a beam diameter of up to 3 cm. In other words, the beam diameter can be 0.1 cm, 0.2 cm, 0.3 cm, 0.4 cm, 0.5 cm, 0.6 cm, 0.7 cm, 0.8 cm, 0.9 cm, 1.0 cm, 1.1 cm, 1.2 cm, 1.3 cm, 1.4 cm, 1.5 cm, 1.6 cm, 1.7 cm, 1.8 cm, 1.9 cm, 2.0 cm, 2.1 cm, 2.2 cm, 2.3 cm, 2.4 cm, 2.5 cm, 2.6 cm, 2.7 cm, 2.8 cm, 2.9 cm or 3.0 cm. The provision of this beam diameter can be provided, for example, if a measuring pattern area is to be provided for detecting an eye. By expanding the measuring beam, it is possible to create a measuring pattern area with one measuring beam. It can also be provided that several measuring beams are guided through respective expansion elements or at least one expansion element in order to increase their beam diameter.

A further development of the invention provides that the measuring device is set up as a time-of-flight measurement lidar. In other words, the measuring device is a lidar device which is set up to determine a distance of a reflection point from the sensor device or another reference via a time-of-flight measurement. Lidar means light detection and ranging or light imaging, detection and ranging. The laser diode measuring beam device is set up to output the at least one measuring beam in a pulsed manner. In other words, it is provided that the at least one measuring beam is not output as a continuous wave, but only as time-limited pulses of a predetermined pulse duration. The at least one measuring beam is thus output in such a way that the respective output has a predetermined start time and a predetermined end time during the measuring process. The at least one detector device is set up to detect the coordinates of the at least one reflection point using a time-of-flight measurement which describes a measurement of a time-of-flight of the respective reflected measuring beam from a time of transmission by the laser diode measuring beam device to a time of reception of the reflected measuring beam by the detector device. In other words, the detector device is set up to determine a point in time from which the emitted pulse is received by the detector device. The measuring device is set up to determine the transit time from the point in time at which the pulse is emitted and the point in time at which the pulse is received by the measuring device. Taking geometric relationships into account, the distance between the reflection point and the detector device can be determined from the transit time. Taking the determined distance into account, the detector device can determine the reflection point coordinates of the respective reflection point.

The measuring device can be set up, for example, to determine a reception time at which the respective reflected measuring beam is detected by the detector device. The measuring device can be set up, for example, to specify a respective emission time of the measuring beam by the laser diode measuring beam device and/or to call it up in the laser diode measuring beam device. The measuring device can be set up to call up the reception time of the reflected measuring beam by the detector device from the detector device and to determine a running time of the measuring beam from a time difference between the emission time and the reception time. If the beam path of the measuring beam is known, a distance of the reflection point to the detector device and thus the surface of the object can be determined by the measuring device from the running time of the measuring beam. The measuring device can also be set up to determine a direction of the reflection point in relation to the at least one detector device. For this purpose, the detector device can have, for example, a predetermined two-dimensional pattern of detector units. The detector device can be set up to determine the detector unit that receives the reflected measuring beam. As a result, an impact position of the reflected measuring beam on the detector device is known. The detector device can be set up, for example, to determine the reflection point coordinates of the reflection point in relation to the predetermined reference system from a position of the detector device, a position of the laser diode measuring beam device, the beam path and the travel time of the measuring beam. The predetermined reference system can be defined by a reference origin and reference directions, which can be defined, for example, in relation to a processing device that the measuring device can have.

A further development of the invention provides that the measuring device is set up as a modulated continuous wave lidar. In other words, the measuring device is set up to output the at least one measuring beam during the measuring process over a predetermined period of time, wherein the at least one measuring beam has a time-dependent predetermined modulation. The modulation can, for example, relate to a frequency of the at least one measuring beam. The at least one detector device is set up to determine the coordinates of the respective reflection points using a modulation deviation between a current modulation and a detected modulation of the reflected measuring beam. In other words, the modulation which the reflected measuring beam detected by the detector device has can be related to the at least one measuring beam emitted, whereby a runtime can be determined.

A further development of the invention provides that the measuring device is designed as an intensity lidar, wherein the at least one laser diode measuring beam device is designed to output the at least one measuring beam with an output intensity, and the at least one detector device is designed to detect a reception intensity of the respective reflected measuring beam.

The at least one detector device is set up to determine the reflection point coordinates of the respective at least one reflection point depending on an intensity difference between the output intensity and the reception intensity. In other words, it is provided that the measuring device is set up to determine the coordinates of the at least one reflection point from a difference between an intensity of the measuring beam emitted by the laser diode measuring beam device and an intensity of the reflected measuring beam received by at least one detector device.

A development of the invention provides that the laser diode measuring beam device is set up to output a plurality of measuring beams along predetermined respective beam paths in order to project the predetermined measuring pattern area onto the surface of the object in the respective measuring process. In other words, it is provided that the laser diode measuring beam device is set up to output a plurality of the measuring beams in order to project the predetermined measuring pattern area onto the surface of the object in the respective measuring process. It is thus provided that the predetermined measuring pattern area is generated by a plurality of measuring beams. The measuring beams can be guided along respective, different beam paths so that the predetermined measuring pattern area can have a plurality of reflection points. The development results in the advantage that the measuring pattern area can have a plurality of reflection points, which can have respective reflection point coordinates. This makes it possible to determine the position of the feature from a plurality of reflection point coordinates.

A further development of the invention provides that the measuring device is set up to output the measuring beams simultaneously. In other words, the measuring beams become identical given point in time during a measurement process. For example, it can be provided that the measuring beams are output by splitting an original beam into the measuring beams through an optic. The further development has the advantage that the duration of a measuring process can be reduced.

A further development of the invention provides that the measuring device is set up to output the measuring beams sequentially in a measuring process. In other words, the respective measuring beams are output one after the other. For example, it can be provided that the object is scanned during a measuring process, with the individual measuring beams being output one after the other. The measuring device can, for example, be set up to direct the original beam onto a mirror and to change an alignment of the mirror during the measuring process in order to provide the individual measuring beams along the respective beam paths.

A further development of the invention provides that the measurement control device is set up to determine an intensity distribution of the measurement pattern area for the predetermined identification method. In other words, the measurement control device is set up to determine which intensity the predetermined measurement pattern area has at respective positions on the surface of the object. In other words, the measurement control device is set up for spatially resolved intensity detection of the measurement pattern area. It can be provided at peak that the measurement pattern area has several reflection points. The measurement control device is set up to detect the intensity of the at least one measurement beam reflected by a respective reflection point. This means that the intensity of the respective reflected measurement beam can be assigned to each of the reflection points. Additionally or alternatively, it can be provided that the measurement control device is set up to determine the intensity distribution within a respective reflection point. This is particularly advantageous if the reflection point is generated by a measurement beam with an enlarged beam diameter. The measurement control device can thus be set up to determine how the intensity is distributed within the respective reflection point. The measuring device is set up to identify the specified reference feature of the object in a predetermined identification process depending on a predetermined intensity feature of the specified reference feature. The specified intensity feature can, for example, describe a property which is related to the intensity of the reference feature and enables identification of the reference feature based on the intensity. The specified intensity feature can, for example, specify a threshold value, whereby the reference feature can be identified by the intensity falling below or exceeding the threshold value. This can, for example, make it possible to identify all reference features defined as points or areas based on their reflection behavior. It can, for example, be provided that the reference feature is a specified area. This can have a surface texture which absorbs and acts, whereby reflection points within the specified area have a lower intensity than reflection points which are arranged outside the specified area. This makes it possible to identify the specified area by the intensity of the respective reflection points falling below.

A further development of the invention provides that the at least one measurement control device is set up to determine a height distribution of the measurement pattern area in the predetermined identification method and to identify the predetermined reference feature of the object depending on a predetermined height feature of the predetermined reference feature. In other words, the measurement control device is set up to determine the height distribution of the measurement pattern area. The height distribution of the measurement pattern area can be determined, for example, from reflection point coordinates on the surface. The measuring device is set up to carry out the predetermined identification method in order to identify the predetermined reference feature, taking into account the determined height distribution of the measurement pattern area. The reference feature of the object is identified in the measurement pattern area depending on the predetermined height feature of the object. It can therefore be provided that the predetermined height feature describes a predetermined threshold value which describes a height difference of the reference feature to other areas of the object. The predetermined height feature can, for example, specify that a reference feature provided as a point has a maximum height in relation to a reference. In particular, it can be provided to identify an apex of an eye as a reference feature of the object on the basis of a characteristic height profile as a height feature.

A further development of the invention provides that the referencing feature comprises at least one predetermined referencing point of the object. In other words, it is the referencing feature by at least one predetermined referencing point. The referencing feature can also have several of the referencing points. For example, it can be provided that the referencing feature can have one or more points that can be reliably detected by the measuring device. The predetermined referencing points can also be characterized in that their respective position in relation to the object is known precisely and is relatively independent of the boundary conditions of the measuring process. It can therefore be provided that the at least one referencing feature comprises at least one referencing point of the object, which is arranged on a relatively strong area of the object. This results in the advantage that it can be assumed that the position of the referencing point in relation to the object does not change due to local deformations of the object.

A further development of the invention provides that the reference feature comprises a predetermined surface topology of the surface of the object. In other words, it is provided that the measuring device is set up to identify the predetermined surface topology of the surface of the object and to determine the position of the surface topology. It can be provided that the at least one reference feature comprises a characteristic depression in a height profile of the object.

In other words, it is provided that the measuring device is set up to record the predetermined surface topology of the surface of the object. Because the reflection point coordinates of the reflection points are specified in relation to the predetermined reference system, the measurement control device is able to determine the surface topology of the surface of the object also in relation to the predetermined reference system. The at least one measurement control device can, for example, be set up to arrange the respective reflection point coordinates of the reflection points in a point cloud and to connect the reflection points of the point cloud to one another according to a predetermined method, such as a marching cubes algorithm. The position determination can, for example, include searching for a section of the surface of the object whose surface topology has a maximum match with the predetermined surface topology. The position of the surface topology in the object can be determined, for example, in a coordinate system of the object.

A further development of the invention provides that the at least one referencing feature comprises a predetermined volume model of the object. In other words, it is provided that the measuring device is set up to record a predetermined volume model of the object as a referencing feature. The at least one measurement control device is set up to identify the predetermined volume model of the object and to determine a position of the volume model of the object.

A further development of the invention provides that the laser diode measuring beam device comprises at least one surface emitter unit. In other words, the measuring device is designed to emit measuring beams through the at least one surface emitter unit. The surface emitter unit is designed in particular as a semiconductor element which is designed to emit a measuring beam perpendicular to the plane of the semiconductor element. The further development of the invention results in the advantage that the laser diode measuring beam device can be provided in a space-saving and inexpensive manner.

A further development of the invention provides that the laser diode measuring beam device comprises at least one surface emitter array. In other words, the laser diode measuring beam device has at least one array for outputting the measuring beams, which comprises several of the surface emitter units. The surface emitter array can be a one-dimensional or two-dimensional arrangement of surface emitter units in a plane. The surface emitter units can be provided in a checkerboard pattern, for example. The further development has the advantage that the laser diode measuring beam device enables the emission of several measuring beams.

A further development of the invention provides that the laser diode measuring beam device is set up to emit the measurement pattern in an infrared spectrum and/or a near-infrared spectrum. In other words, the measuring beams that are emitted by the laser diode measuring beam device have wavelengths in the infrared spectrum and/or in the near-infrared spectrum. The measuring beams can therefore have a wavelength in the near-infrared spectrum between 780 to 3000 nm, in particular in the infrared spectrum between 780 nm to 1000 nm. The further development has the advantage that the measuring beams have a wavelength range which causes little damage to surfaces. This makes it possible to use the measuring device even on sensitive surfaces, in particular biological surfaces.

A second aspect of the invention relates to a processing device with at least one processing laser for processing an object and at least one processing control device, wherein the processing device comprises at least one measuring device according to the first aspect of the invention.

The respective processing laser can be designed to process a predefined object. The respective processing laser can, for example, be designed to at least partially separate a corneal volume with predefined interfaces of a human or animal eye by means of photodisruption and/or to remove corneal layers by means of ablation and/or to cause a laser-induced refractive index change in the cornea and/or the lens of the eye.

A further development of the invention provides that the processing control device of the processing devices is set up to change an alignment and/or focusing of the respective processing laser for processing the object depending on the extrapolated position of the volume model and/or the movement of the volume model. In other words, the processing control device is set up to align and/or focus the respective processing laser. The processing control device is set up to adjust the alignment and/or focusing of the respective processing laser depending on the determined extrapolated position of the volume model. For example, it can be provided that the respective processing laser is aligned and/or focused depending on the extrapolated position of the volume model so that a movement of the object can be compensated.

A third aspect of the invention relates to a method for operating a measuring device for determining an extrapolated position of an object by a measuring device with at least one measurement control device. In the method, respective measurement processes are carried out by the measuring device at at least two different points in time, with each of the objects being determined at the at least two points in time in a reference system.

The measuring device determines the extrapolated position of the object from the at least two positions according to a predetermined extrapolation method.

In the method it is provided that at least one measuring beam is output by at least one laser diode measuring beam device of the measuring device in the respective measuring process along a predetermined respective beam path for projecting a predetermined measuring pattern area onto a surface of the object. In the respective measuring process, at least one reflected measuring beam of the at least one measuring beam is detected by at least one detector device of the measuring device, which is reflected at a respective reflection point of the at least one measuring beam of the predetermined measuring pattern area on the surface of the object. The at least one detector device determines reflection point coordinates of the at least one reflection point with respect to the predetermined reference system.

The at least one measurement control device of the measuring device identifies a predetermined referencing feature of the object according to a predetermined identification method using the at least one reflection point of the predetermined measurement pattern on the surface of the object.

It is provided that a predetermined position of the predetermined referencing feature in relation to the object is stored in the at least one measurement control device. The at least one measurement control device of the measuring device uses a predetermined position determination method to determine a position of the predetermined referencing feature in relation to the predetermined reference system as a function of the reflection point coordinates of the at least one reflection point in relation to the predetermined reference system.

The at least one measurement control device of the measuring apparatus determines the position of the object in the reference system of the respective measuring process from the position of the referencing feature in relation to the predetermined reference system and the position of the referencing feature in relation to the object.

The respective method can comprise at least one additional step that is carried out precisely when a use case or application situation occurs that has not been explicitly described here. The step can comprise, for example, the output of an error message and/or the output of a request to enter user feedback. Additionally or alternatively, it can be provided that a standard setting and/or a predetermined initial state is set.

Another aspect of the invention relates to a computer program. The computer program comprises instructions which, for example, execute a pro program code. The program code can comprise at least one control data record with the respective control data for the respective laser. When the program code is executed by means of a computer or a computer network, it is caused to execute the previously described method or at least one embodiment thereof.

A further aspect of the invention relates to a computer-readable medium (storage medium) on which the aforementioned computer program or its instructions are stored. To execute the computer program, a computer or a computer network can access the computer-readable medium and read out its contents. The storage medium is designed, for example, as a data memory, in particular at least partially as a volatile or non-volatile data memory. A non-volatile data storage can be a flash memory and/or an SSD (solid state drive) and/or a hard drive. A volatile data storage can be a RAM (random access memory). The commands can be present, for example, as source code of a programming language and/or as assembler and/or as binary code.

Further features and advantages of one of the described aspects of the invention can result from the developments of another of the aspects of the invention. The features of the embodiments of the invention can therefore be present in any combination with one another, unless they have been explicitly described as mutually exclusive.

• 1 eine schematische Darstellung einer Bearbeitungsvorrichtung, welche eine Messvorrichtung aufweist;
• 2 eine schematische Darstellung einer Messvorrichtung;
• 3 eine schematische Darstellung einer weiteren Messvorrichtung;
• 4 eine schematische Darstellung einer weiteren Messvorrichtung;
• 5 eine schematische Darstellung einer weiteren Messvorrichtung; und
• 6 eine schematische Darstellung eines Ablaufs eines Verfahrens zum Betreiben einer Messvorrichtung.

In the following, additional features and advantages of the invention are described with reference to the figures in the form of advantageous embodiments. The features or combinations of features of the embodiments described below can be present in any combination with one another and/or the features of the embodiments. This means that the features of the embodiments can supplement and/or replace the features of the embodiments and vice versa. Thus, embodiments are also to be regarded as encompassed and disclosed by the invention that are not explicitly shown or explained in the figures, but which emerge and can be produced by separate combinations of features from the embodiments and/or embodiments. Thus, embodiments are also to be regarded as disclosed that do not have all the features of an originally formulated claim or that go beyond or deviate from the combinations of features set out in the references to the claims. The embodiments are shown in:

• 1 a schematic representation of a processing device having a measuring device;
• 2 a schematic representation of a measuring device;
• 3 a schematic representation of another measuring device;
• 4 a schematic representation of another measuring device;
• 5 a schematic representation of another measuring device; and
• 6 a schematic representation of a sequence of a method for operating a measuring device.

In the figures, identical or functionally identical elements are provided with the same reference symbols.

1 shows a schematic representation of a processing device which has a measuring device.

1 shows a schematic representation of the processing device 1, which can have a processing laser beam source 2 and a processing control device 3. The processing laser beam source 2 can be set up to output a processing laser beam 4, which can be intended to process a surface 8 of an object 7 to be processed. The processing control device 3 can be set up to control the laser beam source and a beam deflection device 5 as well as a focusing device 6 in order to focus the processing laser beam 4 on predetermined processing points on the object 7 to be processed. The processing laser beam 4 can be guided by the processing control device 3 in such a way that a predetermined pattern can be generated on a surface 8 of the object 7. It can be provided that in order to process the object 7, a predetermined power and/or energy density must be exceeded by the processing laser beam 4 at the positions of the processing points, for example in order to enable melting and/or an optical breakthrough in the object 7.

For this reason, it may be necessary for a position RA of the object 7 to be known during processing. This can, for example, ensure that the processing laser beam 4 is adapted to the position RA of the object 7 and is therefore focused on the predetermined depth despite a possible change in the position RA. When the position of the object 7 changes, the situation can arise that there is a latency in the adjustment of the Processing laser beam 4 can result in a position RA of the object 7 detected in a measuring process, so that the object 7 can already have a different position RB after the processing laser beam 4 has been adapted.

It may therefore be necessary to carry out a first measuring process at a first point in time in order to record the first position RA of the object 7 and to carry out a second measuring process at a second point in time in order to record the second position RB of the object 7 in order to be able to determine a future, predicted position RC of the object 7 in an extrapolation process.

In order to enable the determination of the object positions RA, RB of the object 7 in a predetermined reference system R1, which can be related to the processing device 1, for example, the processing device 1 can have a measuring device 10. The measuring device 10 can have at least one laser diode measuring beam device 11, which can be operated by a measurement control device 12 of the measuring device 10. The measuring device 10 can also have at least one detector device 13. The laser diode measuring beam device 11 can be set up to emit measuring beams 14 during a measuring process along predetermined respective beam paths. The measuring beams 14 can have predetermined geometric relationships to one another, so that they can be arranged in a predetermined geometric measuring pattern. It can be provided that the emission of the measuring beams 14 by the laser diode measuring beam device 11 can take place in such a way that no adjustment of a focus of the respective measuring beams 14 takes place. The detector device 13 can be set up to detect reflected measuring beams 15 which were reflected at reflection points 16 on the surface 8 of the object 7. The detector device 13 can be set up to detect respective reflection point coordinates 17 for at least some of the reflection points 16 on the surface 8 of the object 7. The reflection points 16 can be arranged on a cornea 18, onto which the processing laser can be aligned. The detector device 13 can be set up to provide the reflection point coordinates 17 of the reflection points 16 to the measurement control device 12. The measurement control device 12 can be set up to determine a surface topology 19 of the surface 8 from the reflection point coordinates 17. The measurement control device 12 can be set up to arrange the reflection points 16 at respective reflection point coordinates 17 in a point cloud and to connect them to one another according to a predetermined method in order to be able to reconstruct the surface 8. The reflection point coordinates 17 can be described in the reference system R1. This can make it possible for the measurement control device 12 to be set up to also describe the surface topology 19 in the reference system. A position of the cornea 18 can thus be determined in the reference system R1. The object position RA of the object 7 in the reference system R1 can be determined by the measurement control device 12 by providing the measurement control device 12 with a volume model 20 of the object 7 which can describe the volume of the object 7. The measurement control device 12 can be set up to identify and localize the detected surface topology 19 in the volume element. This makes it possible to determine a position of the surface topology 19 in relation to the volume model 20. The surface topology 19 can be determined in the volume model 20, for example, by determining a maximum match of the detected surface topology 19 with a local topology of the volume model 20. It can be provided that the volume model 20, which corresponds to the object 7, is predetermined in advance. Alternatively, it can be provided that the measurement control device 12 is set up to reconstruct the volume model 20 from previous measurement processes.

Because the position of the surface topology 19 in the reference system R1 is known, as is the position R2 of the surface topology 19 in the volume model 20, it is possible to derive the object position RA of the volume model 20 with the reference system R1. Since the volume model 20 describes the volume of the object 7, the object position RA of the object 7 can thus be determined in the reference system R1.

The measuring device 10 can be configured to carry out a second measuring process at a second point in time in order to determine a second object position RB of the object 7. The measuring device 10 can be configured to determine a future, predicted object position RC for a specific future point in time from the two object positions RA, RB.

In a further step, it may be possible for the processing device 1 to be set up to output the processing laser depending on the predicted object position RC of the object 7, in order to thus take a movement of the object 7 into account.

2 shows a schematic representation of a measuring device.

It can be provided that the measuring pattern area 9 is formed by the at least one measuring beam 14 is to be projected onto the surface 8 of the object 7, wherein it can be provided that the measuring beam 14 should have a predetermined beam diameter 28 in order to image an area on the surface 8 of the object 7 through the measuring beam 14. The laser diode measuring beam device 11 can have an expansion element 27 which can be set up to expand the measuring beam 14 to the predetermined beam diameter 28. The measuring device 10 10 can have a surface emitter unit 22 22 as a laser diode measuring beam device 11 which can be set up to emit the at least one measuring beam 14. The laser diode measuring beam device 11 can be set up to guide the measuring beam 14 emitted by the surface emitter unit 22 through the expansion element 27 in order to provide a predetermined beam diameter 28. Beam diameter 28 can, for example, be widened to a value of 3 mm, whereby the measurement pattern area 9 formed by the at least one measurement beam 14 can have a suitable size to measure a central region of an eye. To measure an entire visible region of an eye, it can be provided to widen the beam diameter 28 to a value of, for example, 2 cm using the widening element 27. The widened measurement beam 14 can image a continuous measurement pattern area 9 on the surface 8 of the object 7. The detector device 13 can be set up to detect a plurality of reflection points 16 which are formed by the at least one measurement beam 14 on the surface 8 of the object 7. A respective reflected measurement beam 14 is emitted at a respective one of the reflection points 16. A respective one of the reflected measurement beams 14 can have a respective intensity. The detector device 13 can be set up to determine the intensity of a respective measurement beam 14. Intensity can depend, for example, on an intensity of the expanded measuring beam 14 that was reflected at the respective reflection point 16. It can be the case, for example, that the measuring beam 14 has a maximum intensity in a center and that the intensity of the measuring beam 14 decreases towards the edge of the measuring beam 14. The intensity of the reflected measuring beam 15 can also be influenced by an angle of the surface 8 or by a local reflectivity of the surface 8 of the object 7.

The detector device 13 can be set up to detect respective reflection points 16 in the measurement pattern area 9 on the surface 8 of the object 7 and to determine their reflection point coordinates 17 and their respective intensity. Due to the continuous measurement pattern, the measurement pattern area 9 can have an infinite number of reflection points 16. For this reason, the detector device 13 can detect reflection points 16 according to a predetermined pattern. For example, it can be provided that reflections which are at predetermined distances from one another are examined. From the respective reflection point coordinates 17, the detector device 13 can determine a height profile of the surface 8 of the object 7. From the respective intensities, the detector device 13 can determine an intensity distribution of the measurement pattern area 9 on the surface 8 of the object 7. The detector device 13 can be set up to identify the reference feature 26 based on the reflection points 16. The referencing feature 26 can, for example, be a predetermined topology of the surface 8 of the object 7 or a predetermined reference point of the object 7. The referencing feature 26 can, for example, have a height feature and an intensity feature through the detector device 13, the referencing feature 26, for example in the intensity distribution and/or the height profile. In the figure shown, the referencing feature 26 can be a reference point which can be arranged at an apex 29 of an eye. The position of the apex 29 in relation to the object 7 can be stored in the measurement control device 12. The apex 29 can, for example, have a height feature such that the apex 29 is a point which has a maximum height. It can be provided, for example, that the detector device 13 can evaluate a height profile of the surface 8 in order to identify the referencing feature 26. From the reflection point coordinates 17 of the respective reflection points 16, the detector device 13 can determine the position of the referencing feature 26 in relation to the predetermined reference system R1. From the position of the referencing point in relation to the predetermined reference system R1 and from the position of the referencing point stored in the control device in relation to the object 7, the measurement control device 12 can determine the position of the object 7 in the reference system R1.

3 shows another schematic representation of a measuring device.

The measuring device 10 can have a surface emitter array 21 as a laser diode measuring beam device 11, which can have a plurality of surface emitter units 22, which can be arranged one-dimensionally or two-dimensionally in a predetermined pattern. The detector device 13 can be arranged in combination in the laser diode measuring beam device 11 and have a plurality of detector units 23, which can also be arranged in a predetermined pattern. The laser diode measuring beam device 11 can be set up to generate respective measuring beams by means of the surface emitter units 22 len 14, which are arranged in the predetermined pattern to one another. The predetermined pattern can be defined, for example, by means of distances and/or angles between the individual measuring beams 14. The measuring beams 14 can be guided onto the object 7 and, for example, directed onto the entrance surface of the object 7. The measuring beams 14 can be reflected at respective reflection points 16 and sent back as reflected measuring beams 15. The reflected measuring beams 15 can be detected by the detector units 23 of the detector device 13. The measuring beams 14 can be output in a pulsed manner in a respective measuring cycle, so that an emission time of the measuring beams 14 by the respective surface emitter units 22 is known. The detector units 23 of the detector device 13 can be set up to detect the reflected pulses and to measure the detection times of the reflected pulses. As a result, the measuring device 10 can be set up to determine a transit time of the measuring beam 14 to the reflection point 16 and from the reflection point 16 to the detector unit 23. Taking the speed of light into account, a path length of the pulse can be determined. With a known direction of the detected reflected measuring beams 15, it is therefore possible to determine three-dimensional reflection point coordinates 17 of the respective reflection points 16. The reflection point coordinates 17 can be provided to the measurement control device 12, which can use them to reconstruct the surface topology 19 of the object 7. The surface topology 19 may, for example, include a general orientation of the cornea 18 and/or unevenness of the cornea 18. Alternatively, it can also be provided that the measuring beams 14 are output in a modulated manner, for example by means of a so-called chirping, in which case the measuring beams 14 are not pulsed, but rather continuous, in which the measuring beam 14 is modulated in a predetermined manner over time. For example, it can be provided to modulate a frequency of the measuring beam 14 and to determine the time and thus the path length of the measuring beam 14 and the reflected measuring beam 15 by superimposing a frequency of an emitted measuring beam 14 with a frequency of a detected reflected measuring beam 15. It can be provided that the measuring device 10 works in a so-called flash lidar method, whereby the measuring beams 14 are emitted at the same time and the arrival times of the respective reflected measuring beams 15 are detected by the detector device 13 at the respective times. This makes it possible to carry out a simultaneous measurement in contrast to a rasterized measurement, in which an emitted measuring beam 14 is guided sequentially along several directions.

4 shows another schematic representation of a measuring device.

The measuring device 10 shown can have laser diode measuring beam devices 11 and detector devices 13 that are locally separated from one another. It may be possible for several of the detector devices 13 to be provided, which detect respective reflection point coordinates 17 of at least some of the reflection points 16. The reflection point coordinates 17 can then be combined into a surface topology 19 by the measurement control device 12.

5 shows another schematic representation of a measuring device.

The measuring device 10 can have a deflection unit 25, which can be, for example, a mirror that can reflect a provided original laser beam 24 in different directions at different times, so that the respective measuring beams 14 can be provided along the respective beam paths. In this case, the surface 8 of the object 7 can be scanned sequentially. In this case, the detector device 13 can also be spatially resolving, but it can also be possible for the detector device 13 to be set up only to detect a transit time of the respective measuring beams.

6 shows a schematic representation of a possible sequence of a method for operating a measuring device.

The method can be provided for determining an extrapolated position RC of a volume model 20 of an object 8.

In the method, respective measuring processes can be carried out by the measuring device 10 at at least two different points in time, wherein respective positions RA, RB of the object 7 are determined at the at least two points in time in a reference system R1.

In a step S1, at least one measuring beam 14 can be output in the respective measuring process by at least one laser diode measuring beam device 11 of the measuring device 10 along a predetermined respective beam path for projecting a predetermined measuring pattern area onto a surface 8 of the object 7.

In a step S2, at least one reflected measuring beam 15 of the at least one measuring beam 14 can be detected by at least one detector device 13 of the measuring device 10 in the respective measuring process, which reflected beam is at a respective reflection point 16 of the at least one measuring beam 14 is reflected on the surface 8 of the object 7. By means of the at least one detector device 13 of the measuring device 10, reflection point coordinates 17 of at least some of the reflection points 16 can be determined in relation to the predetermined reference system R1,

In a step S3, a predetermined reference feature of the object 7 can be identified by the at least one measurement control device 12 of the measuring apparatus 10 according to a predetermined identification method using the at least one reflection point of the predetermined measurement pattern on the surface 8 of the object 7 of the respective measurement process. A predetermined position of the predetermined reference feature in relation to the object 7 can be stored in the at least one measurement control device 12.

In a step S4, the at least one measurement control device 12 of the measuring device 10 can determine a position of the predetermined referencing feature in relation to the predetermined reference system R1 as a function of the reflection point coordinates 17 of the at least one reflection point 16 in relation to the predetermined reference system R1 according to a predetermined position determination method. In a step S5, the at least one measurement control device 12 of the measuring device 10 can determine the position RA, RB of the object 7 in the reference system R1 of the respective measuring process from the position of the referencing feature in relation to the predetermined reference system R1 and the position of the referencing feature 19 in relation to the object.

In a step S6, the extrapolated position RC of the object 7 can be determined by the at least one measurement control device 12 of the measuring device 10 from the at least two positions RA, RB according to a predetermined extrapolation method.

Overall, the examples show how a measuring device can be provided to determine an extrapolated position of an object.

Claims (23)

Measuring device (10) for determining an extrapolated position (RC) of an object (7) with at least one measurement control device (12), wherein the measuring device (10) is set up to - carry out respective measuring processes at at least two different times in order to determine respective positions (RA, RB) of the object (7) at the at least two times in a predetermined reference system (R1), and - to determine the extrapolated position (RC) of the object (7) from the at least two positions (RA, RB) according to a predetermined extrapolation method, characterized in that - the measuring device (10) comprises at least one laser diode measuring beam device (11) which is set up to output at least one measuring beam (14) along a predetermined respective beam path in the respective measuring process for projecting a predetermined measuring pattern area (9) onto a surface (8) of the object (7), - the measuring device (10) comprises at least one detector device (13) which is set up to output at least one reflected measuring beam in the respective measuring process (15) of the at least one measuring beam (14) which is reflected at a respective reflection point (16) of the at least one measuring beam (14) of the predetermined measuring pattern area (9) on the surface (8) of the object (7), and to determine reflection point coordinates (17) of the at least one reflection point (16) in relation to the predetermined reference system (R1), - the at least one measurement control device (12) is set up to identify a predetermined referencing feature (26) of the object (7) according to a predetermined identification method by means of the at least one reflection point (16) of the predetermined measuring pattern area (9) on the surface (8) of the object (7) of the respective measuring process, wherein a predetermined position of the predetermined referencing feature (26) in relation to the object (7) is stored in the at least one measurement control device (12), - the at least one measurement control device (12) is set up to determine a position of the predetermined referencing feature (26) in relation to the object (7) according to a predetermined position determination method. Reference to the predetermined reference system (R1) as a function of the reflection point coordinates (17) of the at least one reflection point (16) in relation to the predetermined reference system (R1), - to determine the position (RA, RB) of the object (7) in the reference system (R1) of the respective measuring process from the position of the referencing feature (26) in relation to the predetermined reference system (R1) and the position of the referencing feature (26) in relation to the object. Measuring device (10) according to one of the preceding claims, wherein the at least one laser diode measuring beam device (11) is configured to output the at least one measuring beam (14) as a collimated beam. Measuring device (10). Claim 2 , wherein the at least one laser diode measuring beam direction (11) has at least one expansion element (27) in the respective beam path of the at least one measuring beam (14), which is designed to expand the at least one measuring beam (14) to a predetermined optical beam diameter (28) in order to expand the at least one To generate reflection point (16) of the measurement pattern surface (9) with a predetermined reflection surface on the surface (8) of the object (7). Measuring device (10) according to one of the preceding claims, wherein the measuring device (10) is set up as a time-of-flight measurement lidar, wherein the at least one laser diode measuring beam device (11) is set up to output the at least one measuring beam (14) in a pulsed manner, wherein the at least one detector device (13) is set up to detect the reflection point coordinates (17) of the respective at least one reflection point (16) using a time-of-flight measurement which describes a measurement of a time of flight of the respective reflected measuring beam (15) from a time of emission of the measuring beam (14) by the laser diode measuring beam device (11) to a time of reception of the reflected measuring beam (15) by the detector device (13). Measuring device (10) according to one of the preceding claims, wherein the measuring device (10) is configured as a modulated continuous wave lidar, wherein the at least one laser diode measuring beam device (11) is configured to output the at least one measuring beam (14) in a time-modulated manner, and the at least one detector device (13) is configured to determine the reflection point coordinates (17) of the respective at least one reflection point (16) using a modulation deviation between a current modulation of the measuring beam (14) and a detected modulation of the reflected measuring beam (15). Measuring device (10) according to one of the preceding claims, wherein the measuring device (10) is set up as an intensity lidar, wherein the at least one laser diode measuring beam device (11) is set up to output the at least one measuring beam (14) with a predetermined output intensity, and the at least one detector device (13) is set up to detect a reception intensity of the respective reflected measuring beam (15), wherein the at least one detector device (13) is set up to determine the reflection point coordinates (17) of the respective at least one reflection point (16) as a function of an intensity difference between the output intensity and the reception intensity. Measuring device (10) according to one of the preceding claims, wherein the at least one laser diode measuring beam device (11) is designed to output a plurality of measuring beams (14) along predetermined respective beam paths in the respective measuring process for projecting the predetermined measuring pattern area (9) onto the surface (8) of the object (7). Measuring device (10) according to one of the preceding claims, wherein the measuring device (10) is set up to output the measuring beams (14) simultaneously. Measuring device (10) according to one of the preceding claims, wherein the measuring device (10) is set up to output the measuring beams (14) sequentially in a measuring process. Measuring device (10) according to one of the preceding claims, wherein the at least one measurement control device (12) is configured to determine an intensity distribution of the measurement pattern area (9) in the predetermined identification method and to identify the predetermined referencing feature (26) of the object (7) depending on a predetermined intensity feature of the predetermined referencing feature (26). Measuring device (10) according to one of the preceding claims, wherein the at least one measurement control device (12) is set up to determine a height distribution of the measurement pattern surface (9) in the predetermined identification method, and the predetermined referencing feature (26) of the object (7) as a function from a predetermined height feature of the predetermined referencing feature (26). Measuring device (10) according to one of the preceding claims, wherein the referencing feature (26) comprises at least one predetermined reference point of the object (7). Measuring device (10) according to one of the preceding claims, wherein the referencing feature (26) comprises a predetermined surface topology (19) of the surface (8) of the object (7). Measuring device (10) according to one of the preceding claims, wherein the referencing feature (26) comprises a predetermined volume model (20) of the object (7). Measuring device (10) according to one of the preceding claims, wherein the object (7) is a human or animal eye. Measuring device (10) according to one of the preceding claims, wherein the laser diode measuring beam device (11) comprises at least one surface emitter unit (22). Measuring device (10). Claim 16 , wherein the laser diode measuring beam device (11) comprises at least one surface emitter array (21). Measuring device (10) according to one of the preceding claims, wherein the laser diode measuring beam device (11) is set up to emit the measuring beams (14) in an infrared spectrum and/or a near-infrared spectrum. Processing device (1) with at least one processing laser beam source (2) for processing an object (7) and at least one processing control device (3), the processing device (1) having at least one measuring device (10) according to one of Claims 1 until 18 includes. Processing device (1) according to Claim 19 , wherein the processing control device (3) is configured to change an alignment and/or focusing of a processing laser for processing the object (7) depending on the extrapolated position (RC) of the volume model (20). Method for determining an extrapolated position (RC) of an object (7) by a measuring device (10) with at least one measurement control device (12), wherein - by means of which the measuring device (10) respective measuring processes are carried out at at least two different times in order to determine respective positions (RA, RB) of the object (7) at the at least two points in time in a predetermined reference system, and - by means of which the measuring device (10) obtains the extrapolated position (RC) from the at least two positions (RA, RB) according to a predetermined extrapolation method ) of the object (7) is determined, characterized in that - by at least one laser diode measuring beam device (11) of the measuring device (10), in the respective measuring process at least one measuring beam (14) along a predetermined respective beam path for projecting a predetermined measuring pattern area onto a surface (8) of the object (7), - by at least one detector device (13) of the measuring device (10), in the respective measuring process at least one reflected measuring beam (15) of the at least one measuring beam (14) is detected, which is at a respective Reflection point (16) of the at least one measuring beam (14) of the predetermined measuring pattern surface is reflected on the surface (8) of the object (7), and reflection point coordinates (17) of the at least one reflection point (16) with respect to the predetermined reference system (R1). will be determined. Computer program comprising instructions which cause the measuring device (10) to operate according to one of the Claims 1 until 18 a procedure according to Claim 21 executes. Computer-readable medium on which a computer program according to Claim 22 is stored.

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