DE102013003073B4 - Test device and test method for load monitoring and forecasting system - Google Patents

Abstract

Test device for a load monitoring and forecasting system that can be connected to an electrical system (2.2) - hereinafter referred to as the RTTR system (3.7), the load monitoring and forecasting system comprising a fiber-optic temperature measurement sensor system (2.0), and in the RTTR system (3.7) According to a thermal system model (5.1) assigned to the system (5.1), a forecast program executing rating processes is implemented, and forecast values can be generated in the rating processes from operating values (M1, MT) of the electrical system, characterized in that • the test device (1.0) has a data communication data interface (1.2) for the RTTR system (3.7), via which the forecast values generated by the RTTR system from operating values (M1, MT) can be read in numerical form (5.3num), • that the test device (1.0) simulators (1.5, 1.6 ) for the operating values (5.3num) read in numerically, • and the test device (1.0) interfaces to the RTTR System (3.7) for the output of simulation values (sMT, sM1) generated by the simulators (1.5, 1.6).

Description

The invention relates to a test device and a functional test method for an electrical load monitoring and forecasting system. The term "load monitoring and forecasting system" is referred to throughout in the following with the short form RTTR system.

RTTR systems are known to the person skilled in the art. Their use is used to monitor the electrical current carrying capacity and load optimization. The English term, real time thermal rating 'means a system with which load monitoring and forecasting can be carried out on an electrical energy route (overhead line, cable route). Part of RTTR systems is a fiber optic temperature sensor system, which is also known to the person skilled in the art.

RTTR systems are used and offered by various companies; For example, under the name VALCAP from nkt cables GmbH, Cologne (see also technical paper in energy management, 2008, Jg 107, pp. 80-83 in volume 25/26), CYMCAP from Cooper Power Systems (Canada); RTTR Calculation Engine from LIOS GmbH, Cologne; Monitoring system from OSSCAD GmbH & Co. KG (see ONLINE AMPACITY DETERMINATION OF A 220-KV CABLE USING AN OPTICAL FIBER BASED MONITORING SYSTEM, Jicable'11, 19 - 23 June 2011 - Versailles). The following should also be mentioned from the patent literature: US 5,933,355 A or EP 0862258 B1 ,

The electrical system is simulated as a thermal model (also referred to as an RTTR model) in accordance with the thermal parameters of the energy conductor and the thermal properties of the conductor route (thermal conductivity values and temperatures). The parameters are modeled in a thermal equivalent circuit diagram in the model. The thermal model is the basis for the use of an RTTR system, whereby the stationary and dynamic operation of the system is calculated.

In accordance with the model, a forecast program executing ratings processes is implemented in the RTTR system. In the rating processes, forecast values can be generated from the operating values of the electrical system (primarily measured values for currents and measured values for temperatures).

The forecast program continues to provide forecast values with which the dynamic load behavior with regard to conductor temperature and current load can be optimized. The start values of the equivalent circuit diagram can be specified using the standards IEC 60287 and IEC 60853. According to the standards, the thermal long-term behavior of the electrical system is taken into account when calculating the conductor current for stationary operation. When calculating the conductor current for dynamic system operation (conductor temperature in the event of overload and duration of the overload), the short-term thermal behavior is considered, taking into account the current thermal state (hot spot) of the system in accordance with the current conductor current (system current).

As is known, an RTTR system comprises at least one computer, at least the prognosis program, at least one temperature measurement sensor system (for example as a DTS system), a fiber optic measurement cable, a current detection, associated process interfaces (current and temperature interface) for reading in from current measurement - and temperature measurement data existing operating data and a communication module for process control technology. The local temperature curve along the energy conductor is recorded with the measuring cable. One task of the measurement data processing is the determination of locally unacceptable and critical temperature values (hot spots) along the plant route. Hot spots limit the current carrying capacity of the system because the temperature resistance of the plastic insulation can be exceeded.

The 1 shows an example of an RTTR system.

According to the current and temperature measurement data of the system (current conductor temperature, current conductor current), an RTTR calculation is carried out during operation using the system-specific thermal model (hereinafter also referred to as the “rating process”). The results determined in the following as stationary forecast values and dynamic forecast values are displayed on a monitor and / or transferred to the process control system via a process interface.

The maximum temperature measured in the system in one operating state is the hot spot of the system. The predicted conductor current for stationary operation is the current that can be fed into the system for an unlimited period of time without the maximum permissible conductor temperature being exceeded. For example, in an electrical cable system with XLPE-insulated cables, the maximum permissible conductor temperature is 90 ° C. The predicted conductor current for dynamic operation is the current (overload current) that can be fed into the system for a short period (overload period) without the maximum permissible conductor temperature (overload temperature) being exceeded. The overload duration and the overload temperature are generally stored as fixed numerical values, and thus form part of the thermal system model.

The rating process of the forecast program can be optimized with the help of correction data that take into account the long-term thermal behavior of the system and or by integrating system-specific temperature reference data. To determine this correction data, the degree of load (ratio of maximum conductor current to average conductor current) of the system or independently determined correction functions of the forecast program can be used. For example, for plant-specific temperature reference data, the measurement of the ambient temperature in the thermally unstressed soil area of the plant is used.

It is the object of the invention to provide a test device and a functional test method with which an RTTR system can be tested.

The solution to the problem can be found in the features of the independent claim, further preferred features being formulated in the respective subclaims.

• • dass die Testvorrichtung eine Datenkommunikationsdatenschnittstelle zum RTTR-System umfasst, über welche die vom RTTR-System aus Betriebswerten generierten Prognosewerten in numerischer Form einlesbar sind,
• • dass die Testvorrichtung Simulatoren für die in numerischer Form eingelesenen Betriebswerte umfasst,
• • und die Testvorrichtung Schnittstellen zum RTTR-System zur Ausgabe von von den Simulatoren erzeugten Simulationswerten umfasst.

Essential features of the test device are

• That the test device comprises a data communication data interface to the RTTR system, via which the forecast values generated by the RTTR system from operating values can be read in numerically,
• That the test device comprises simulators for the operating values read in numerically,
• • and the test device comprises interfaces to the RTTR system for the output of simulation values generated by the simulators.

Further features can be claimed as follows, wherein these features can be implemented individually or together.

The test device includes a device for displaying first forecast values generated by the RTTR system from operating values and a device for displaying first simulation values output from the RTTR system and second forecast values generated therefrom.

The test device comprises a device for displaying first forecast values that were generated by the RTTR system from operating values and a device for displaying simulation values that are output to the RTTR system in order to generate the second forecast values therefrom.

Preferably, a first simulator is a temperature simulator for generating a temperature simulation value, and further preferably a second simulator is a current simulator for generating a current simulation value. The current simulator can be designed in software, via which a current simulation value can be generated numerically.

The value of the current current of the conductor current is generally measured by the network technology and sent directly to the computer using the network protocol. Alternatively, the conductor current can also be provided by the network technology as a derived measured value (e.g. as a 0 to 20 mA analog current signal). In this case, the derived analog current measurement values are read in by the computer via a special current interface.

A control device for the simulators can be present in the test device, with which the values to be simulated can be adjusted.

A separate display takes place in the test device if the first forecast values and the second forecast values lie outside a predetermined tolerance interval.

The test device can be integrated in an RTTR system.

• • Messdaten und Prognosewerte eines stationären und eines dynamischen Betriebszustandes einer Anlage werden als Referenzdatensätze von der Testvorrichtung eingelesen.
• • Messdaten und Prognosewerte werden in der Testvorrichtung verwendet, um Simulationsdaten für das RTTR-System mit Hilfe von Simulatoren zu generieren.
• • Simulierte Daten (Strom und Hot-spot) werden in das RTTR-System als ,neue Messwerte‘ in numerischer Form eingespeist, wobei das RTTR-System neue Prognosewerte berechnet.
• • Neue auf Simulation beruhende Prognosewerte werden den alten auf Messdaten beruhenden Prognosewerten gegenüber gestellt.

The test device can thus be set up as follows:

• • Measured data and forecast values of a stationary and a dynamic operating state of a system are read in as reference data sets by the test device.
• • Measurement data and forecast values are used in the test device in order to generate simulation data for the RTTR system with the aid of simulators.
• • Simulated data (electricity and hot spot) are fed into the RTTR system as "new measured values" in numerical form, the RTTR system calculating new forecast values.
• • New forecast values based on simulation are compared with the old forecast values based on measurement data.

In the following, preferred features of the method presented are formulated, which can be implemented individually or jointly, if applicable.

• • gemäß ersten Betriebswerten der elektrischen Anlage werden vom RTTR-System in einem ersten Ratingvorgang erste Prognosewerte generiert,
• • gemäß an die Testvorrichtung in numerischer Form übermittelten Betriebswerten gleicher Größe werden von der Testvorrichtung aus den übermittelten Betriebswerten neue Betriebswerte simuliert und vom RTTR-System eingelesen,
• • vom RTTR-System werden zweite Prognosewerte in einem zweiten Ratingvorgang generiert, wonach die ersten Prognosewerte mit den zweiten Prognosewerte verglichen werden.

The following steps take place in the procedure for the functional test in the stationary operation of the system:

• According to the first operating values of the electrical system, the RTTR system generates the first forecast values in a first rating process,
• Operating values of the same size transmitted to the test device in numerical form, the test device simulates new operating values from the transmitted operating values and reads them in from the RTTR system,
• • The RTTR system generates second forecast values in a second rating process, after which the first forecast values are compared with the second forecast values.

The first operating values are in the form of measurement data as a current measurement value and as a temperature measurement value. Thus, a current simulation value is simulated in the test device from the transmitted current measured value by means of a current simulator, and a temperature simulation value is simulated from the transmitted temperature measured value by means of a temperature simulator, which are transferred to the RTTR system in the form of measured values.

The current measurement value and / or the temperature measurement value can be adapted or corrected via correction data stored in correction functions in the forecast program before the first stationary rating process.

• • basierend auf stationären Ratingvorgängen für den stationären Betrieb der elektrischen Anlage sind dynamische Referenzdatensätze in dem RTTR-System hinterlegt, die die Parameter Leitertemperatur bei Überlast; Überlastdauer und zulässigen Überlaststrom umfassen,
• • über Tastaturbefehl werden aus einem abgelegten dynamischen Referenzdatensatz zwei der drei Parameter ausgewählt, wonach das RTTR-System in einem ersten dynamischen Ratingvorgang erste dynamische Prognosewerte generiert,
• • der dynamische Prognosewert und die beiden gewählten Parameter werden im Speicher als erster dynamischer Referenzdatensatz hinterlegt,
• • der dynamische Prognosewert und die beiden gewählten Parameter werden an die Testvorrichtung übermittelt,
• • die Testvorrichtung übermittelt die Werte für den zweiten dynamischen Ratingvorgang an das RTTR System,
• • das RTTR-System generiert in einem zweiten dynamischen Ratingvorgang zweite dynamische Prognosewerte.

The following process steps are carried out for a dynamic function test:

• • Based on stationary rating processes for the stationary operation of the electrical system, dynamic reference data sets are stored in the RTTR system, which contain the parameters conductor temperature in the event of an overload; Include overload duration and permissible overload current,
• A keyboard command is used to select two of the three parameters from a stored dynamic reference data set, after which the RTTR system generates the first dynamic forecast values in a first dynamic rating process,
• The dynamic forecast value and the two selected parameters are stored in the memory as the first dynamic reference data record,
• The dynamic forecast value and the two selected parameters are transmitted to the test device,
• The test device transmits the values for the second dynamic rating process to the RTTR system,
• • The RTTR system generates second dynamic forecast values in a second dynamic rating process.

In comparing the first forecast values with the second forecast values, a tolerance band can be applied in which the functional test is marked as successful.

The first forecast values and the second forecast values can be displayed and / or saved.

The advantages of the invention are in particular that the test device can be integrated in an RTTR system. The operation of the RTTR system and the use of a test device are possible immediately without modification or hardware intervention.

Overview of the figures and descriptions of the figures

• 1: eine Testvorrichtung (Stand der Technik),
• 2: ein Beispiel für ein RTTR-System,
• 3A: funktioneller Ablauf stationäre Funktionsprüfung,
• 3B: funktioneller Ablauf dynamische Funktionsprüfung und
• 4: Ablauf der Funktionsprüfung als Flussdiagramm.

The invention is illustrated in several figures, the figures showing in detail:

• 1 : a test device (prior art),
• 2 : an example of an RTTR system,
• 3A : functional sequence of a stationary functional test,
• 3B : functional sequence dynamic function test and
• 4 : Sequence of the functional test as a flow chart.

In 2 an example of a test device is shown. The test device 1.0 includes a microprocessor including software (test program) 1.1 , which also works to generate the simulation values to be explained.

The end of the measuring cable 2.1 does not become a temperature measurement sensor system 2.0 led, but to the fiber optic input (interface 1.7 ) of the test device 1.0 to connect to the temperature reference fiber 1.8 manufacture. The fiber optic output 1.7 the test device 1.0 is then used with the help of an optical connection cable to the temperature measurement sensor system ( 2.0 and 3.2 ) guided. The measuring cable 2.1 is through the tester 1.0 , Looped '. The temperature measurement sensor system displays a zone over the length of the measurement cable 2.1 , The temperature (locally distributed) is measured over the entire length, at least in the zone of the electrical system and in the zone of the temperature reference fiber 1.8 ,

In the event that the conductor amperage from the network technology as analog measured values 2.3 a current actuator is provided 1.6 for use. The analog current values are in this case the test device 1.0 fed and from the test device directly to the computer 3.0 forwarded. During the stationary function test procedure, the simulated current data from the test device via the actuator 1.6 to the current interface ( 1.9 . 3.1 ) of the computer 3.0 transferred and made available for the rating process. The current actuator switches outside of the functional test procedure 1.6 the analog measured values 2.3 directly to the power interface 3.1 by.

To generate the temperature simulation data, the temperature simulator ( 1.5 ) used. It is a temperature reference fiber 1.8 designated glass fiber, which is wound on a heat-conducting coil device and is thermally connected to a built-in heating / cooling system (Peltier element). In addition, there are temperature sensors for temperature control on and in the coil device. A microcontroller (microprocessor with on-chip components such as DAC (digital analog converter) can be used in combination with the temperature control element 1.5 the temperature of the coil device and thus the temperature of the temperature reference fiber 1.8 can be regulated to the specified temperature setpoint. The temperature reference fiber is (as already mentioned) via optical connectors 1.7 in series with the measuring cable installed in the system 2.1 connected.

• • Messung des örtlich verteilten Temperaturverlaufs in der Zone des Messkabels 2.1 und in der Zone der Temperaturreferenzfaser 1.8 der Testvorrichtung;
• • Übertragung der örtlichen verteilten Temperaturmessdaten von Temperaturmess-Sensorik 2.0 zum RTTR-System 3.7;
• • Kennzeichnung des örtlichen und zeitlichen Temperaturverlaufs der Temperaturreferenzfaser 1.8 mit der Visualisierungssoftware (Zonendarstellung) des RTTR-Systems;
• • Herstellung von ersten stationären Prognosewerten (berechnete Leitertemperatur, stationärer Leiterstrom bei 90 °C Leitertemperatur) für den stationären Betrieb der Anlage;
• • Herstellung von ersten dynamischen Prognosewerten (Leitertemperatur bei Überlast, oder Überlastdauer und/oder dynamischer Leiterstrom) für den dynamischen Betrieb der Anlage;

• • Anmeldung der Testvorrichtung per Kommunikationssoftware 1.2 bei der Prozessleittechnik 4.0 und/oder am Computer 3.0 und Freigabe durch die Prozessleittechnik;
• • Erzeugung eines Referenzdatensatzes und Übertragung des Referenzdatensatzes in numerischer Form auf die Testvorrichtung;
• • Simulierung der Temperaturdaten mit Hilfe eines als Heiz-Kühl-Element ausgebildeten Temperatursimulators (Temperaturstellglied 1.5);
• • Simulierung der Stromdaten mit Hilfe eines Stromsimulators 1.6;
• • Übertragung der simulierten Daten zum RTTR-System 3.7 als neue Messwerte;

• • Herstellung von zweiten Prognosewerten aus den von der Testvorrichtung empfangenen Werten und Vergleich mit ersten Prognosewerten;
• • Speicherung und Protokollierung des Vergleiches und/oder Übertragung zur Leittechnik;
• • Darstellung des Vergleichs;
• • Meldung per Netzwerktechnik an die Prozessleittechnik.

Process steps in detail:

• • Measurement of the locally distributed temperature profile in the zone of the measuring cable 2.1 and in the zone of the temperature reference fiber 1.8 the test device;
• • Transmission of the local distributed temperature measurement data from temperature measurement sensors 2.0 to the RTTR system 3.7 ;
• • Identification of the local and temporal temperature profile of the temperature reference fiber 1.8 with the visualization software (zone display) of the RTTR system;
• • Production of the first stationary forecast values (calculated conductor temperature, stationary conductor current at 90 ° C conductor temperature) for the stationary operation of the system;
• • Production of the first dynamic forecast values (conductor temperature in the event of overload, or overload duration and / or dynamic conductor current) for the dynamic operation of the system;

• • Registration of the test device via communication software 1.2 in process control technology 4.0 and / or on the computer 3.0 and approval by process control engineering;
• • Generation of a reference data set and transmission of the reference data set in numerical form to the test device;
• • Simulation of the temperature data using a temperature simulator designed as a heating / cooling element (temperature control element 1.5 );
• • Simulating the current data using a current simulator 1.6 ;
• • Transfer of the simulated data to the RTTR system 3.7 as new measured values;

• Production of second forecast values from the values received by the test device and comparison with first forecast values;
• • Storage and logging of the comparison and / or transfer to the control system;
• • Presentation of the comparison;
• • Message via network technology to the process control system.

With the help of the forecast program, which is coordinated with the plant via the thermal model 5.2 For example, reference data sets can be created for the test device with which the RTTR system can be checked. The RTTR default values and possible correction data 5.8 be the forecast program 5.2 supplied and the calculated forecast values for the test device are stored as reference data sets and on the data memory 1.3 deposited. For the load adjustment of the system, only the forecast program is required 5.2 on the computer 3.0 be deposited, not the thermal model 5.1 ,

The current values ( M1 ) and the hot spot values ( MT ) of the stationary reference data set are in numerical form 5.3 transmitted to the test device and there for the simulation by already mentioned simulators of the current values ( sM1 ) and the temperature values ( SMT ) used.

The generated phase current value ( sM1 ) and the generated hot spot value ( SMT ) are visualized on the test device 1.4 and / or via communication interface to the computer 3.0 and / or via process interface to the control technology 4.0 transfer.

The thermal model 5.1 , the correction data 5.8 and the (independent) forecasting program 5.2 are system-specific, ie they refer to a special electrical system. To achieve an independent check of the functionality, the default values for the Test device take into account the thermal and electrical properties (parameters) of the system. This is achieved by plant-specific reference data sets in the data memory 1.3 the table stored in the test device can be called up and fed in. Via microprocessor 1.1 reference data records can be called up.

Based on the current and temperature data of the system (as numerical default values 5.3 ) and the overload sizes ( 5.6 ) takes place per measurement cycle with the forecast program 5.2 the calculation of reference data sets and forecast values taking into account possible correction data 5.8 , According to the RTTR default data, the reference data records are calculated at least once and in the data memory 1.3 the test device.

Example of a functional test in stationary plant operation ( 3A)

• • stationärer Messwert Strom (M1 = 141 A)
• • stationäre Temperatur (Hot-Spot) in der Anlage bei 141 A (MT = 20,0 °C)
• • im ersten Ratingvorgang nach Anlagenmodell berechnete Leitertemperatur, erster Prognosewert Temperatur T'_max = 26,1 °C;
• • im ersten Ratingvorgang nach Anlagenmodell berechneter zulässiger Leiterstrom bei anlagenbedingter maximalen Leitertemperatur von 90°C; erster Prognosewert Strom I'_max = 487 A.

When the function test (also called test operation) is completed, the data communication interface becomes 1.2 used for reading in numerical default data (MTn, M1n) of the test device. A stationary reference data set ( 5.4 ) can look as follows:

• • stationary measured value current (M1 = 141 A)
• • stationary temperature (hot spot) in the system at 141 A (MT = 20.0 ° C)
• • conductor temperature calculated in the first rating process according to the system model, first forecast value temperature T ' _max = 26.1 ° C;
• • In the first rating process, the permissible conductor current calculated according to the system model at a system-related maximum conductor temperature of 90 ° C; first forecast value current I ' _max = 487 A.

The measured values come from the operation of the electrical system and are via the DTS system 2.0 and the current measuring point have been determined. In an initial rating process, the RTTR system generates the first stationary forecast values from the measured values 5.4 ' according to the system model with system-related maximum conductor temperature of 90 ° C. Of course, with another electrical system and correspondingly associated other system model and other system-related maximum conductor temperature, different forecast values can result as the calculation result.

The 4 shows the formal process and the program execution during a functional test.

The user actuates the I / O selection at the start of the functional test 1.4 on the front panel of the test device 1.0 in the form of a selection menu 6.2 , The stationary measured value current M1 and the measured value stationary temperature hot spot MT are in the form of numerical data 5.3 (M1n, MTn) - also referred to as stationary default values - transmitted from the RTTR system to the test device. Further selectable reference data sets can be stored in a storage medium (SD card, flash, EEPROM).

The test device generates according to the transmitted numerical data 5.3 (M1n, MTn) a temperature simulation value SMT and a current simulation value sM1 , The values are via appropriate interfaces 1.7 and 1.9 passed to the RTTR system.

After confirming the Start button, the control parameters are loaded according to the selected reference data set (or the transmitted numerical data) [ 6.3 ]. Then the control task is started [ 6.4 ] to simulate the temperature (hot spot) SMT the current value sM1 as well as the communication task for data communication between tester and computer 3.0 , The term “task” means an additional program that is executed by the processor almost parallel to the main program. In [ 6.5 ] the current interface is configured in such a way that the phase current value which corresponds to the stationary default value M1n ( 5.3 ) should be simulated by the current simulator (here 141 A) and transferred to the RTTR system. The main program then goes into a loop, which is only interrupted by pressing a stop button [ 6.6 ]. Within the loop there is permanent output on the display 1.4 which inform the user about the current state of the current control and the temperature control [ 6.7 ].

The temperature control for generating a temperature simulation value according to the stationary default value takes place within the control task 6.13 instead of. The default values ( MT . M1 ) for temperature control are temperature setpoints for the temperature simulator and current setpoints for the current actuator. Analogous to the communication task, the task goes into an endless loop [6.14], which can only be canceled by the main program. The temperature control within the loop is based on the EVA principle. For the input, the test device reads in the temperature of the manipulated variable using a temperature sensor [ 6.15 ], and processes the current actual value of the temperature simulator together with the 'required' setpoint (here 20 ° C) within a control algorithm and uses it to determine a new manipulated variable 6.16 , The new manipulated variable is then output on the actuator [ 6.17 ].

Within the communication task [ 6.10 ] there is data communication between computers 3.0 of the RTTR system 3.7 and test device 1.0 , The task runs quasi-parallel to the main program. The interface is first within the communication task 1.2 initialized. The task then goes into an endless loop [ 6.12 ], which are only interrupted in the main program when the task is completed. The data transfer takes place within the loop.

After successfully adjusting the two manipulated variables ( 5.3 ) Conductor current value and critical temperature value (hot spot) can these values from the RTTR system as new measured values sM1 and SMT via the current interface 3.1 and the temperature interface 3.2 be recorded.

In a second rating process, the RTTR system then generates second stationary forecast values 5.4 " (as T " _max and as I" _max ) generated and output. The second stationary forecast values are shown in a table on the display 5.4 " together with the first stationary forecast values 5.4 ' - So second forecast value conductor temperature T " _max and second forecast value conductor current I" _max are shown.

The function test has a positive result if the second forecast values match the first forecast values within a predetermined tolerance band ΔT, ΔI; thus the value T " _max ± ΔT is approximately 26.1 ° C and the value I" _max ± ΔI is approximately 487 A.

If the values T " _max and I" _max within the tolerance _band do not match the values T ' _max and I' _max , the function test has a negative result.

Example of a functional test in dynamic plant operation ( 3B)

The monitoring of an electrical system in dynamic operation by an RTTR system is based on the thermal system model with stationary system operation. The functional test according to the invention for dynamic operation follows the previous functional test for stationary operation. After the functional test for the stationary case, the user can trigger a dynamic functional test by calling the test program.

The dynamic rating of a plant's short-term overload operation is a numerical rating procedure. Since the calculation is based on the forecast values of the stationary operation of the system, only numerical data are generated in the first dynamic rating process, saved and made available again for the second dynamic rating process. The dynamic rating process takes place on the computer. In contrast to the stationary function test, the test device does not simulate measurement data.

Three parameters are important in the dynamic operation of the system: overload duration, overload temperature and overload current. When calculating the dynamic forecast values, the user can choose two of the three parameters (dynamic default values 5.5 ' ), for example: overload current = 600 A and overload duration = 4 h. The default values (height of the conductor temperature in the event of an overload and the duration of the overload) and possible correction data 5.8 via the I / O control panel 1.4 and / or via the communication interface 1.2 the RTTR system 3.7 made available. The default values can be used as a reference data record 5.6 saved and on the data storage 1.3 be deposited.

The RTTR system generates according to this example 3.7 in a second dynamic rating process dR2 the third parameter ( 5.7 " ); here the overload temperature - for example with the result 80 ° C.

The generated and generated third parameters are again displayed and reported on the display 1.4 and / or via the communication interface 1.2 ,

The functional test is then carried out by comparing the value ( 5.7 ' ) in the first dynamic rating process dR1 with the value ( 5.7 " ) of the second dynamic rating process dR2 ,

Consideration of a fault tolerance band

The temperature simulation and current simulation values generated as actual values in the test device have a certain degree of uncertainty (signal fluctuations) compared to the default values. That the RTTR system receives the simulated temperature and current data with a certain inaccuracy and thus calculates the corresponding second forecast values for the stationary and dynamic operation also with a certain inaccuracy. Taking into account an error tolerance band (ΔT ΔI), the deviations are compared and evaluated, which is then identified in the output and display with "OK" or "Error".

In one case, the hot spot could be correctly identified by the computer, but the system power could be incorrectly reported. The rating process for conductor temperature and conductor current is therefore incorrect. The reason could be an incorrect scaling parameter of the current interface. In another case, the values plant current and hot spot could be correct. However, the rating process delivers a different result when calculating the conductor temperature and the conductor current than expected. The error could be the consideration of another thermal model of the electrical system, which is not applicable for the system.

The test device can be set up in such a way that a functional test of one or more electrical systems is possible with it. Energy cables are used to transport (maximum voltage level e.g. 380 kV voltage level) and for distribution (high voltage level e.g. 110 kV network) electrical energy. Power cables with different structures and thermal properties are available for these tasks. The topology of the energy network corresponds to that of a mesh network. If n energy cables are to be thermally monitored and the electricity load is to be optimized, the RTTR system can be expanded to include n forecast programs. For the use of a common test device for n plants, the hardware and software of the test device can be expanded in accordance with plant-specific forecast programs. If the operator of the system wants to use a second DTS temperature measurement sensor for reasons of redundancy, the test device must be expanded by a further temperature control element.

The invention is described in summary as follows. A test device and a functional test method are presented with which it is possible to generate simulation values of operating values of an electrical system in such a way that an RTTR system in operation can be specifically checked for its function in the stationary or dynamic operation of the electrical system. The RTTR system can (also) be checked as part of maintenance.

LIST OF REFERENCE NUMBERS

1.0

Test device for an RTTR system

1.1

Microprocessor with test program (software)

1.2

Data communication interface

1.3

data storage

1.4

I / 0 interface (display, button, etc.)

1.5

Temperature simulator (heating-cooling system)

1.6

current simulator

1.7

Fiber optic connector to the temperature actuator 1.5 and the measuring cable 2.1

1.8

Temperature reference fiber on the package

1.9

Electrical interface (optional) to the current simulator 1.6 , to the current measured value 2.3 and for current cuts 3.1

2.0

Fiber optic temperature measurement sensors (e.g. DTS)

2.1

Measuring cable = fiber optic temperature measuring cable

2.2

Electrical system; Power cable assembly

2.3

Current reading

3.0

Computer (PC)

3.1

Current interface

3.2 = 1.7

Temperature interface of the temperature measurement sensor system (DTS)

3.3

Interface to the process control center

3.4

Data processing and data backup

3.5

Data communication interface to the test device

3.6

monitor

3.7

RTTR system

4.0

process control

5.1

thermal model (plant-specific)

5.2

Forecast program (RTTR software)

5.3

= M1n, MTn stationary default values (numerical)

5.4

stationary reference data set

5.4 ', 5.4 "

Forecast values for stationary plant operation

5.5 ', 5.5 "

dynamic parameters

5.6

dynamic reference data set

5.7 ', 5.7 "

Forecast values for dynamic plant operation

5.8

correction data

6.1

Load reference records

6.2

Endless loop with menu selection and program start

6.3

Load controller parameters

6.4

Start communication module 6.10 and start controller module 6.13 for temperature control

6.5

Output of the simulated conductor current

6.6

Loop with stop button

6.7

menu output

6.8

Switch off the control current

6.9

Switch off the communication module and controller module

6.10

Start communication module

6.11

Initialize communication interface

6.12

Infinite loop with data request to computer 3.0 , Error assessment and evaluation

6.13

Start the controller module

6.14

endless loop

6.15

Determine actual temperature

6.16

control algorithm

6.17

Generation of the manipulated variable for conductor current

M1

Measured value conductor current

MT

Reading hot spot

M1n

MTn numerical default values 5.3

sM1

simulated measured value conductor current

SMT

simulated measured value temperature

R1

first stationary rating process

R2

second stationary rating process

dR1

first dynamic rating process

dR2

second dynamic rating process

I ' _max

first stationary forecast value conductor current

I " _max

second stationary forecast value conductor current

T ' _max

first stationary forecast value conductor temperature

T " _max

second stationary forecast value conductor temperature

Claims (13)

Test device for a load monitoring and forecasting system that can be connected to an electrical system (2.2) - hereinafter referred to as the RTTR system (3.7), the load monitoring and forecasting system comprising a fiber-optic temperature measurement sensor system (2.0), and in the RTTR system (3.7) According to a thermal system model (5.1) assigned to the system (2.2), a forecast program executing rating processes is implemented, and forecast values can be generated in the rating processes from operating values (M1, MT) of the electrical system, characterized in that • the test device (1.0) has a data communication data interface (1.2) for the RTTR system (3.7), via which the forecast values generated by the RTTR system from operating values (M1, MT) can be read in numerical form (5.3num), • that the test device (1.0) simulators (1.5, 1.6 ) for the operating values (5.3num) read in numerically, • and the test device (1.0) interfaces to the R TTR system (3.7) for outputting simulation values (sMT, sM1) generated by the simulators (1.5, 1.6). Test device after Claim 1 , characterized in that the test device (1.0) has a device for displaying first forecast values generated by the RTTR system from operating values (M1, MT) and for displaying simulation values (sMT, sM1) and output from the RTTR system (3.7) second forecast values generated therefrom. Test device after Claim 1 or 2 , characterized in that a first simulator is a temperature simulator (1.5) for generating a temperature simulation value (sMT), and a second simulator is a current simulator (1.6) for generating a current simulation value (sM1, 6.5). Test device after Claim 3 , characterized in that the current simulator is designed in software, via which a current simulation value (sM1, 6.5) can be generated numerically. Test device according to one of the preceding claims, characterized in that in the test device (1.0) there is a control device for the simulators (1.5, 1.6) with which the operating values (M1n, MTn) to be simulated can be adjusted. Test device according to one of the preceding claims, characterized in that in the test device (1.0) there is a device for displaying the first forecast values (5.4 ', 5.7') and the second forecast values (5.4 ", 5.7") can be displayed, even if they lie outside a specified tolerance interval (ΔT, ΔI). Test device according to one of the preceding claims, characterized in that the test device (1.0) is integrated in an RTTR system (3.7). Method for testing the function of a load monitoring and forecasting system which can be connected to an electrical system (2.2) and is referred to below as the RTTR system (3.7) by means of the Claims 1 to 7 Test device (1.0) described, characterized in that for the functional test in the stationary operation of the system • according to first operating values (M1, MT) of the electrical system (2.2) from the RTTR system (3.7) in a first rating process (R1) first forecast values (5.4 ') are generated, • in accordance with operating values (5.3num) of the same size transmitted to the test device (1.0) in numerical form by the test device (1.0) from the transmitted operating values (5.3num), new operating values (sM1, sMT) are simulated and the RTTR System (3.7) are read in, • second forecast values (5.4 ") are generated by the RTTR system (3.7) in a second rating process (R2), • after which the first forecast values are compared with the second forecast values. Procedure for functional test according to Claim 8 , characterized in that the first operating values (M1, MT) are in the form of measurement data of current and temperature, that a current simulation value (sM1) is simulated in the test device (1.0) from the transmitted current measured value (M1n) by means of a current simulator (1.6), and from the transmitted temperature measurement value (MTn) by means of a temperature simulator (1.5), a temperature simulation value (sMT) is simulated, which are transferred to the RTTR system (3.7) in the form of measurement values. Procedure for functional testing according to one of the Claims 8 to 9 , characterized in that the current measurement value (M1) and / or the temperature measurement value (MT) are adjusted or corrected via correction data (5.8) stored in correction functions in the forecast program (5.2) before the first stationary rating process (R1). Method for checking the function of a load monitoring and forecasting system which can be connected to an electrical system (2.2) and is called the RTTR system (3.7) below, by means of the in the Claims 1 to 6 described test device (1.0), characterized in that the following method steps for a dynamic functional test run: • based on in the Claims 8 to 10 Formulated stationary rating processes (R1, R2) for the stationary operation of the electrical system contain dynamic reference data records in the RTTR system (3.7), which define the parameters conductor temperature in the event of an overload; Overload duration and permissible overload current include, • Two of three parameters can be selected from a stored dynamic reference data record (5.6 '), from which the first dynamic rating values (5.7') are generated in a first dynamic rating process (dR1) in the RTTR system (3.7), • the dynamic forecast value and the two selected parameters are stored in the memory as the first dynamic reference data record, • the dynamic forecast value and the two selected parameters are transmitted to the test device (2.0), • the test device transmits the values for a second dynamic rating process to the RTTR System (3.7), • the RTTR system (3.7) generates second dynamic forecast values (5.7 ") in a second dynamic rating process (dR2). Procedure for functional testing according to one of the Claims 8 to 11 , characterized in that a tolerance band (ΔT, ΔI) is used in the comparison of the first forecast values with the second forecast values, in which the functional test is identified as successful. Procedure for functional testing according to one of the Claims 8 to 11 , characterized in that the first forecast values and the second forecast values are displayed and / or saved.

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