DE102013001457A1 - In a workpiece processing machine to be recorded temperature-compensated probe and method for temperature compensation of a probe - Google Patents

In a workpiece processing machine to be recorded temperature-compensated probe and method for temperature compensation of a probe

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Publication number
DE102013001457A1
DE102013001457A1 DE102013001457.3A DE102013001457A DE102013001457A1 DE 102013001457 A1 DE102013001457 A1 DE 102013001457A1 DE 102013001457 A DE102013001457 A DE 102013001457A DE 102013001457 A1 DE102013001457 A1 DE 102013001457A1
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Germany
Prior art keywords
probe
temperature
signals
workpiece
signal
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Pending
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DE102013001457.3A
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German (de)
Inventor
Norbert Mörsch
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Blum Novotest GmbH
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Blum Novotest GmbH
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Priority to DE102013001457.3A priority Critical patent/DE102013001457A1/en
Publication of DE102013001457A1 publication Critical patent/DE102013001457A1/en
Application status is Pending legal-status Critical

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/20Compensating for effects of temperature changes other than those to be measured, e.g. changes in ambient temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/002Measuring arrangements characterised by the use of optical means for measuring two or more coordinates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups
    • G01B21/02Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups for measuring length, width, or thickness by measuring coordinates of points
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical means
    • G01B5/0011Arrangements for eliminating or compensation of measuring errors due to temperature or weight
    • G01B5/0014Arrangements for eliminating or compensation of measuring errors due to temperature or weight due to temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical means
    • G01B5/004Measuring arrangements characterised by the use of mechanical means for measuring coordinates of points
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic means
    • G01B7/004Measuring arrangements characterised by the use of electric or magnetic means for measuring coordinates of points

Abstract

The proposed temperature compensation for a pickup to be included in a workpiece processing machine provides a contact or contactless measuring probe for acquiring measured values on a workpiece and for outputting the measured values of representative signals, wherein the probe has a sensing device for one or more dimensional probing of a workpiece, at least one A touch sensor for converting such touches into the representative signals, at least one temperature sensor, which is incorporated in the probe to produce a signal representative of the temperature of the probe, and a linking device, which the signals of the touch sensor with the signals of the temperature sensor to a associated temperature compensated detection signal, which is intended to be issued to a numerical control of the workpiece processing machine.

Description

  • background
  • Here, a method for temperature compensation of a probe to be included in a workpiece processing machine and a temperature-compensated probe will be described. The latter is adapted, for example, to be received in a workpiece processing machine.
  • The workpiece processing machine may be a (numerically controlled) machine tool, a (multi-axis) machining center, a (multi-axis) milling machine or the like. Hereinafter, the term machine tool is used for all these or such machines. Such a machine has a spindle on which a tool or a workpiece is mounted; the spindle may be fixedly positioned or, for example, moved and driven in three orthogonal directions X, Y, Z within a working space of the machine.
  • The tool can be moved by the machine tool into a measuring space, an area specified for the measurement, a touch or non-contact button. The non-contact button detects the proximity of a surface, for example, with a capacitive, inductive or optical device. The touching button detects a surface on contact. For each detected feature, contact and contactless probes pass corresponding measurement data to a numerical (machine) controller, which may include a computer program. Together with machine position information from the controller, the probe measurement data allows the (numerical) controller to obtain an accurate picture of the dimensions of the tool or workpiece.
  • State of the art
  • From the DE 102 62 188 A1 is a multidirectional probe known. This probe has a housing in which an annular support bearing is formed, which defines an X, Y-bearing plane and a normal to this central axis Z of the probe. A support body has an annular abutment, by which a longitudinal axis of the support body is defined. A spring is clamped between the housing and the support body and endeavor to keep the latter in a rest position in which abuts the abutment on the support bearing and the longitudinal axis of the support body coincides with the central axis Z of the probe. A stylus recording is centrally located on the support body to receive a stylus. A transmission member is slidably guided in the housing along the central axis Z to implement any deflections of the support body from its rest position into rectilinear movements. A sensor converts such movements of the transmission element into measuring signals. One end of the transmission member is arranged centrally on the Taststiftaufnahme and only one adjacent to the other end portion is guided in the direction of the central axis Z. The transmission member is arranged at a location of the support body, which, viewed from the sensor, lies beyond the storage plane. The sensor can be part of a light barrier with path-dependent analog measurement signal. The Taststiftaufnahme can be guided along the longitudinal axis of the support body on this slidably and resiliently biased toward a normal position defined by a stop.
  • From the US 3,250,012 A is a probe with a cylindrical housing is known, which is composed of a proximal and a distal housing part. The proximal housing part has a radially outwardly projecting flange for attaching the probe to a carriage of a measuring or machine tool. The distal housing part ends with a radially inwardly projecting flange on which a spherical segment-shaped concave support bearing is formed. On this support bearing rests an approximately hemispherical support body, which forms with its convex outer surface an annular abutment and has on its proximal side a flat annular surface. At this annular surface is an end face of a piston-like transmission member, which is axially displaceably guided in the distal housing part and loaded by a clamped between the transmission member and the end facing him of the proximal housing part spring. In the housing and partially in the piston-like transmission member, a sensor is housed, which converts axial displacements of the piston into measurement signals. From the support body axially extends a Taststiftaufnahme away, on which a stylus is attached to a probe.
  • From the WO 00/17602 A1 are also known touch probe. Here, the transmission member is a straight piece of wire of considerable length and is housed in a housing, the length of which exceeds that of the transmission element substantially. A similar multidirectional probe is off DE 42 17 641 A1 known.
  • There, too, a hemispherical support body is arranged within a distal housing part against which a transmission member in the form of a spring-loaded piston presses. However, the flat surface of the hemispherical support body here is the one from which the stylus receiver extends away, whereas the spherical surface of the support body is in turn piston-like Transition member faces and is loaded on this by a spring in the axial direction.
  • The Applicant are known from their operational practice machine tools with tool holders and probes, which are to be used in the tool holder of the machine tools. For example, a machine tool may have a rotating spindle shaft and a shaft housing for supporting the spindle shaft for high-speed machining. Due to the high rotational speeds of the spindle shaft, the spindle shaft and also the shaft housing heat up. Therefore, the shaft housing of the spindle shaft is equipped with a cooling, which, however, is usually not sufficient to dissipate the heat completely. The inevitable during operation heat input to the clamped in the spindle shaft tool holder and the tool mounted therein leads to thermally induced measurement and processing errors. When changing a tool holder, this first ambient temperature, as well as a tool disposed therein, such. B. a probe. The resulting from the heat input into the spindle shaft heating causes the tool holder and the tool length. If a workpiece is now approached with the probe in probe direction "Z", then the heated probe touches the workpiece earlier than would be the case with a non-heated probe. As a result, the probe is deflected prematurely. This has the consequence that a "deflected" signal earlier than it would be correct (possibly via a receiver) sent to a (numerical) machine control of the workpiece processing machine and received there. At the time of the "deflected" signal, the machine controller reads out the actual position of the Z axis on the machine-internal measuring system. This position deviates by the same amount from the correct value by which the probe has lengthened. This incorrect measurement thus corresponds to the extent of the thermally induced elongation of the probe.
  • None of these arrangements takes into account dimensional changes resulting from temperature fluctuations of the probe.
  • From the DE 10 2007 043 030 A1 is a tool holder and a probe with a tool holder known. The tool holder serves to attach a probe to a machine tool with an interface. The tool holder has, viewed from the interface for the spindle, a material portion which differs from the usual base material of a tool holder by a smaller coefficient of linear expansion or a smaller thermal conductivity. Thus, an undesirably large heat input is avoided in the tool holder, so that a thermal expansion remains relatively low. This is intended to reduce a dimensional change due to thermal expansion to an even tolerable level. In this case, a thermal expansion of the tool holder is reduced by the position, dimensioning and material selection of the material section from the interface to a tool at normal temperature conditions on motor spindles after inserting a tool holder. The material section can be the complete tool holder to z. B. to a probe, so that the tool holder is completely formed of a material with a smaller coefficient of linear expansion / a smaller thermal conductivity. A heat input into an area after the material section z. B. in a probe and in the material section should be so clearly delayed. However, temperature fluctuations from the environment of the machine tool, for. As the working space of a machining center, which also change the probe / tool in its length, are not compensated. In addition, it takes a relatively long time in this concept, until after a change of the probe / tool thermally stable conditions have occurred.
  • Underlying problem
  • The aim of the temperature compensation presented here is to take the temperature-induced change in length of the probe into account so that measurement errors caused by temperature changes are reduced to a minimum.
  • solution
  • The proposed temperature compensation for a pickup to be included in a workpiece processing machine provides a contact or contactless measuring probe for acquiring measured values on a workpiece and for outputting the measured values of representative signals, wherein the probe comprises a sensing device for one or more dimensional probing of a workpiece, at least one A touch sensor for converting such touches into the representative signals, at least one temperature sensor incorporated in the probe to produce a signal representative of the temperature of the probe, and a linking device for combining the signals of the probe sensor with the signals of the temperature sensor associated temperature compensated detection signal, which is intended to be issued to a numerical control of the workpiece processing machine.
  • Below a probe is here both a tool scanner and a workpiece scanner Understood. Temperature of the probe here is understood to mean the temperature resulting from thermal radiation from the surroundings of the probe, as well as by heat conduction from mechanically connected to the probe components in the probe, as well as by heating the probe from its surroundings via convection. Under a measured value here is both a binary switching signal "0", "1" and an analog measurement result, for. B. "0.000" ... "10,000", understood, with the type of coding, so for example as a voltage or current value, or as a digitally coded pulse train is irrelevant. Likewise, a workpiece is understood to mean both a tool and a workpiece, depending on the measuring task. In addition, the probe can be configured to communicate either directly or, for example, wirelessly via a receiving interface of the probe with a numerical control of the workpiece processing machine.
  • This temperature compensation presented here has the advantage that the numerical control of the workpiece processing machine is already provided a temperature-compensated detection signal. Thus, the probe provides a probing signal that can be further processed directly in the numerical control, without even there would also be an arithmetic temperature compensation of the probing signal, for example. The probing signal can thus be transmitted in a standardized data protocol. In addition, no separate temperature value signal needs to be transmitted to the numerical controller. Thus, the temperature-compensated probe in this way can be directly used together with a wide variety of numerical controls. However, variants are also provided in which instead of or in addition one or more strain gauges are mounted on the probe to measure a temperature-induced elongation of the probe at a representative point and send this measurement result to the numerical control of the workpiece processing machine for billing. The respective measurement results can also be converted into length changes by a previous calibration.
  • Under a probing here any relative movement between the probe and a workpiece is understood, which possibly causes a transition in the probing signal between "not touched" and "touched" or vice versa.
  • In a variant of the temperature-compensated measuring probe, a plurality of temperature sensors are accommodated in the measuring probe whose signals in the linking device are linked to the signals of the touch sensor. This allows different sections of the probe and their materials / temperature-related properties (thermal conductivity, thermal expansion coefficient) to be taken into account for even more precise temperature compensation of the probing signal than would be possible with only one temperature sensor. With only one temperature sensor, the temperature of the probe is detected at a position found by tests. The temperature determined at this point is then representative of the temperature of the entire probe. It is exploited that there are during the heating phase of the probe in this place, whose temperature is above the temperature measured by the temperature sensor and places whose temperature is below the temperature detected by the temperature sensor. By using two or more temperature sensors, the temperature distribution in the probe can be determined more accurately. Thus, a more accurate temperature compensation of the probe can be performed.
  • In a further variant of the temperature-compensated measuring probe, the (non-temperature-compensated) signals of the touch sensor are combined with the signals of the temperature sensor, for example in the linking device to form a temperature-compensated detection signal in such a way that a signal of the touch sensor in dependence on the temperature, which the signal of the / each temperature sensor, is output with a time delay as a temperature-compensated detection signal. In particular, if the probing speed of the measuring probe in the measuring direction (X / Y direction or Z direction) and possibly the running time of the (non-temperature-compensated) touch probe from the probe to the numerical control are known, the degree of delay of the transmission can be of the probe signal based on the temperature change of the probe.
  • For example, if the probe length is 1 μm per 1 ° K increase in temperature, and the relative probing speed between the workpiece and the probe is 40 mm / s, transmission of the probing signal to the numerical controller will be converted per 1 ° K increase in temperature as shown here 25 μs delayed. Since the probing signal arrives delayed by 25 μs in the numerical control, this responds accordingly delayed. As a result, the probe moves in the probe direction by exactly the path length of 1 micron, by which the probe is extended by the temperature rise. This can be detected by the path detection of the workpiece processing machine and processed in the numerical control of the workpiece processing machine. As a result, the elongation of the probe for processing and the control of the workpiece processing machine has no influence - reducing the machining accuracy of the workpiece.
  • In another variant of the temperature-compensated measuring probe, the (non-temperature-compensated) signals of the touch sensor are combined with the signals of / each temperature sensor, for example in the linking device, to form a temperature-compensated detection signal such that a switching threshold (in a path-dependent signal) of the touch sensor ( = Transition between "not touched" and "touched") is changed in dependence on the temperature, which reproduces the signal of the / each temperature sensor, so that the signal of the Antastsensors is output as a temperature-compensated detection signal. In this case, the switching threshold is changed as a function of the temperature (and possibly the measuring direction (X / Y direction or Z direction) of the probe). In this way, the switching time is shifted as it results from the temperature-induced change in length and the (constant) sensing speed of the probe. Another advantage of this variant is that the compensation of the Z-probe signal is independent of the probing speed. Can not be used to distinguish or detect the Antastrichtung the scanning speed.
  • In a further variant of the temperature-compensated measuring probe, the linking device combines the signals of the at least one touch sensor with the signals of the / each temperature sensor to form a temperature-compensated detection signal in such a way that the signals of the / each temperature sensor according to a stored function according to time, course, and / or Amount can be changed and a corresponding switching threshold is specified to the at least one Antastsensor.
  • In a variant of the temperature-compensated probe, the probe has a housing in which an annular support bearing is formed, which defines an X, Y-bearing plane and a normal Z-axis of the probe to normal. A support body has an annular abutment, by which a longitudinal axis of the support body is defined. A spring is clamped between the housing and the support body and endeavors to hold the latter in a rest position in which the abutment rests against the support bearing and the longitudinal axis of the support body at least approximately coincides with the central axis Z of the probe. A stylus recording is centrally located on the support body to receive a stylus. Alternatively, the stylus can also be an integral part of the support body, so that the Taststiftaufnahme is not displaced relative to the support body. A transmission member is slidably guided in the housing along the central Z-axis to implement any deflections of the support body from its rest position in rectilinear movements. In this case, the transmission member may be connected to the support body via a ball joint. The movement of the transfer member is not exactly straight along the Z-axis; Rather, the transfer member performs a kind of wobbling movement in deflections in the X, Y-bearing plane of the probe.
  • The touch sensor converts such movements of the transmission element into the signals. One end of the transmission member is arranged centrally on the Taststiftaufnahme and only one adjacent to the other end portion is guided in the direction of the central axis Z. The transmission member is disposed at a position of the support body, which is beyond the storage level viewed from the Antastsensor.
  • The touch sensor may be part of a light barrier with path-dependent analog measurement signal, or a binary switching sensor. The Taststiftaufnahme can be guided along the longitudinal axis of the support body on this slidably and resiliently biased toward a normal position defined by a stop. In such a probe, a movement direction detector is provided, which is at least adapted to distinguish relative movements between the probe and a workpiece along the central Z-axis of the probe of movements in the X, Y-bearing plane of the probe and this reproducing signals to the linking device leave. The linking device is set up to output temperature-compensated probing signals during relative movements between the measuring probe and a workpiece along the central Z-axis of the measuring probe and during relative movements between the measuring probe and a workpiece along the central Z-axis of the measuring probe in the X, Y-bearing plane of the To output probes temperature-uncompensated signals of the touch sensor.
  • A multi-dimensional probe can be used for probing measurements in the Z direction as well as for lateral measurements in the X and Y directions. While the heating lengthens the probe primarily due to its structure and proportions (in the Z-direction), the probe ball remains exactly in the central Z-axis of the probe. This means that changes in the length of the probe (due to temperature) do not influence the correctness / accuracy of measurements in the X, Y direction to a first approximation. The temperature compensation must therefore not take place with X, Y probing. The measuring mechanism of a measuring probe consists of a fixed part, which is firmly connected to the housing of the measuring probe and embodies the bearing for the moving part, and a moving part. The latter is held by spring force in a stable rest position in the fixed part. The moving part picks up the stylus. Will the stylus of the stylus contact the workpiece deflected, then the associated movement of the moving part of the measuring mechanism is picked up by a suitable sensor and evaluated by the device electronics. For most probes that are used in machine tools, the shape of the moving part of the measuring instrument causes the signal change at the sensor to take place more rapidly in the Z direction than in the X, Y direction. In this case, the scanning speeds used by the machine are identical for all directions (X, Y, and Z). Thus, the movement direction detector can evaluate a high signal change rate of the path-dependent analog measuring signals of the touch sensor as relative movements between the probe and a workpiece along the central Z axis of the probe and (at comparable probing speed) a comparatively low signal change rate of the path-dependent analog measuring signals of the touch sensor relative movements between the probe and a workpiece in the X, Y bearing plane of the probe.
  • In another variant of the temperature-compensated probe several movement direction sensors for the different directions of movement of the relative movements between the probe and a workpiece are provided, is achieved by the mechanical arrangement and orientation that only one of the Z-direction associated movement direction sensor, a temperature compensation activating signal to the Linking device is output.
  • In a further variant of the temperature-compensated measuring probe, acceleration sensors are provided in order to detect the different directions of movement of the measuring probe. Due to their mechanical arrangement and orientation is achieved that only one of the Z-direction associated movement direction sensor, a temperature compensation activating signal is output to the linking device. This variant of a temperature-compensated probe has a measuring mechanism with several sensors for the different directions of movement. Due to the corresponding mechanical arrangement of the sensors to the directions of movement, a relative movement between the probe and a workpiece with a Z-movement component only in the Z-direction associated sensor leads to a signal change.
  • In a further variant, the measuring mechanism can also be constructed mechanically such that the separate deflection directions are assigned their own touch sensors in order to detect the different directions of movement of the relative movements between the measuring probe and a workpiece. Due to their mechanical arrangement and orientation is achieved that in such a variant, only the signal of the Z-direction associated Antastsensors must be temperature compensated. For this purpose, based on the signal of the Z-direction associated Antastsensors an activating signal is output to the linking device. Alternatively, only the signal of the Z-direction associated Antastsensors is compensated for the temperature. The movement direction sensor can thus be dispensed with or serves only to switch on the compensation only for signals of the sensor assigned to the Z direction.
  • Another variant of the temperature-compensated probe has three antisensors, for example in the form of strain gauges. These each form a separate touch sensor, each deflection direction causing a signal change of one, two or all three strain gauges. By evaluating the three strain gauge signals, the deflection direction and also the amount of deflection can be determined. Again, only the signal of the Z-direction associated sensor is temperature compensated.
  • Another variant of the temperature-compensated probe has a plurality of touch sensors for the different directions of movement of the relative movements between the probe and a workpiece. Due to the mechanical arrangement and orientation of the antitast sensors, it is achieved that a temperature compensation-activating signal is output to the linking device only by a scanning sensor assigned to the Z direction. Alternatively or additionally, only the signal of the antivessel sensor assigned to the Z direction can be temperature-compensated.
  • In another variant of the temperature-compensated measuring probe, the linking device is to manually specify a direction of movement transmitted to the measuring probe by means of a switch. Alternatively, the linking device, the direction of movement of the probe can also be specified by the numerical control of the workpiece processing machine. Depending on the machine concept, either the probe can move in relation to the stationary workpiece or the probe can stop and the workpiece is moved to the probe via a table movement.
  • In another variant of the temperature-compensated measuring probe, the numerical control of the workpiece processing machine transmits the measuring direction to the measuring probe via a data interface at the beginning of each measuring movement, so that during movements along the Z-axis Axis, the temperature compensation by the linking device is to be activated.
  • Finally, a temperature compensation of a probe can also take place in that the probe transmits via a data interface of a numerical control of a workpiece processing machine at the beginning of each measurement movement or at intervals a temperature or length correction value, the numerical control in measurements along the Z axis, the temperature compensation is offset with the determined via a displacement measuring system of the workpiece processing machine position value.
  • Brief description of the drawing
  • Other objects, features, advantages and applications will become apparent from the following description of some embodiments and associated drawings. All described and / or illustrated features alone or in any combination form the subject matter disclosed herein, also independent of their grouping in the claims or their relationships.
  • 1 shows a flowchart of a method variant presented here.
  • 2 schematically shows a machine tool, which is coupled to a machine control, which is adapted to receive signals from a probe and, if necessary, to send signals.
  • 3 and 4 show how the signals of each Antastsensors are linked to the signals of each temperature sensor to a temperature-compensated detection signal.
  • 5 and 6 Show probe schematically in longitudinal section in different elongation and in different Antastsituationen.
  • Detailed description
  • A temperature-compensated measuring probe which is to be recorded in a workpiece-processing machine and which makes contact or contactlessly serves for detecting measured values on a workpiece and for outputting the measured values of representative signals.
  • As in 1 illustrates a sensing device of the probe one or more dimensional probing of a workpiece. This sensing device controls a probing sensor to convert such probes into signals. A temperature sensor associated with the probe generates a signal representative of the temperature of the probe. In a linking device, the signals of the touch sensor with the signals of the temperature sensor are then linked to a temperature-compensated sound signal, which is intended to be output to a numerical control of the workpiece processing machine when the probing along the Z (entral) axis of the probe takes place. Otherwise, the uncompensated signal of the touch sensor is output to the numerical control of the workpiece processing machine.
  • In a variant of the method, signals of a plurality of temperature sensors assigned to the measuring probe in the linking device are combined with the signals of the touch sensor to form a temperature-compensated detection signal.
  • The signals of the / each Antastsensors with the signals of / each temperature sensor are linked to a temperature-compensated detection signal in such a way that a signal of the Antastsensors depending on the temperature, which reproduces the signal of / each temperature sensor, time-delayed output as a temperature-compensated detection signal becomes. Alternatively, the signals of the / each touch sensor may be combined with the signals of each temperature sensor and a temperature gradient generated from the temperature signal (s) to form a temperature compensated strobe signal such that a signal from the touch sensor is dependent on the temperature the signal of the / each temperature sensor reproduces, time-delayed output as a temperature-compensated detection signal. This is also in the 3 . 4 illustrated.
  • For temperature compensation of a probe emitting analog signals (see, for example, also 5 . 6 ), the signals of the / each touch sensor ASE can be linked to the signals of the / each temperature sensor TS1... n to a temperature compensated sound signal TKAS in such a way that a switching threshold of a signal of the touch sensor ASE as a function of the temperature which the signal T of the / each temperature sensor TS1 ... n is changed, so that the signal of the touch sensor ASE is output as a temperature-compensated detection signal TKAS.
  • A movement direction detector BRD can distinguish at least relative movements between the probe and a workpiece along the central Z-axis of the probe from the relative movements between the probe and a workpiece in the X, Y-bearing plane and give this reproducing direction signals to the linking device VE (see 3 ) The linking device VE is a logic circuit or a Microcontroller, which is set up and intended to output temperature-compensated probing signals TKAS during relative movements between the probe and a workpiece along the central Z-axis of the probe and temperature-uncompensated for relative movements between the probe and a workpiece in the X, Y-bearing plane of the probe Output signals of the touch sensor ASE.
  • The movement direction detector BRD can determine the direction signals from the signal change rate of the path-dependent analog measurement signal (see 6 ) and send the direction signals to the linking device VE. During relative movements between the probe and a workpiece along the central Z-axis of the probe, the link device VE outputs temperature-compensated probing signals TKAS and in relative movements between the probe and a workpiece in the X, Y-bearing plane of the probe, the linkage device VE temperature-uncompensated signals of the touch sensor ASE.
  • As in 6 illustrated, the movement direction detector BRD evaluates a high signal change rate of the path-dependent analog measurement signal of the touch sensor ASE as relative movements between the probe and a workpiece along the central Z-axis of the probe. A comparatively low signal change rate of the path-dependent analog measuring signal of the touch sensor ASE is evaluated as a relative movement between the probe and a workpiece in the X, Y bearing plane of the probe.
  • In the case of a binary-switching measuring probe, or in the case of a measuring probe behaving outwards (also) like a binary-switching measuring probe, or in the case of a measuring probe with a binary switching scanning sensor, no information about the scanning direction can be determined from the switching signal. Therefore, in the probe several movement direction sensors for the different directions of movement of the relative movements between the probe and a workpiece by their mechanical arrangement and orientation can achieve that only one of the Z-direction associated movement direction sensor, the temperature compensation activating signal is output to the linking device VE. Alternatively, the acceleration sensors can detect the different directions of movement of the relative movements between the probe and a workpiece and achieve by their mechanical arrangement and orientation that only in one of the Z direction associated movement direction sensor, a temperature compensation activating signal is output to the linkage device VE.
  • Alternatively, the linking device (VE), the direction of movement of the relative movements between the probe and a workpiece by means of a not further illustrated switch manually, or by the numerical control NC of the workpiece processing machine WBM be specified.
  • The above-described variants of the method and the device are only for the better understanding of the structure, the operation and the properties of the proposed solution; they do not restrict the revelation to the exemplary embodiments. The figures are schematic, essential features and effects being shown, in part, clearly enlarged, in order to clarify the functions, operating principles, technical configurations and features. In this case, every mode of operation, every principle, every technical embodiment and every feature which is / are disclosed in the figures or in the text, with all claims, every feature in the text and in the other figures, other modes of operation, principles, technical embodiments and features contained in or resulting from this disclosure are combined freely and arbitrarily, so that all conceivable combinations attributable to the described solution. In this case, combinations between all individual versions in the text, that is to say in every section of the description, in the claims and also combinations between different variants in the text, in the claims and in the figures.
  • The device and method details explained above are shown in context; It should be noted, however, that they are independent of each other and can also be freely combined with each other. The ratios of the individual parts and sections thereof to one another and their dimensions and proportions shown in the figures are not to be understood as limiting. Rather, individual dimensions and proportions may differ from those shown.
  • Also, the claims do not limit the disclosure and thus the combination options of all identified features with each other. All features shown are also explicitly disclosed individually and in combination with all other features here.
  • QUOTES INCLUDE IN THE DESCRIPTION
  • This list of the documents listed by the applicant has been generated automatically and is included solely for the better information of the reader. The list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions.
  • Cited patent literature
    • DE 10262188 A1 [0004]
    • US 3250012 A [0005]
    • WO 00/17602 Al [0006]
    • DE 4217641 A1 [0006]
    • DE 102007043030 A1 [0010]

Claims (20)

  1. Temperature compensated probe (MTS, MTE) to be recorded in a workpiece processing machine (WBM) for detecting measured values on a workpiece (WS) and for outputting the measured values of representative signals, wherein the measuring probe (MTS, MTE) A sensing device (TE) for one or more dimensional probing of a workpiece (WS), At least one touch sensor (ASE) for converting such probes into signals, At least one temperature sensor (TS) associated with the probe (MTS) for generating a probe temperature (MTS) representative signal (T), and • has a linking device (VE), which the signals of at least one Antastsensors (ASE) with the signals (T) of the temperature sensor (TS) linked to a temperature compensated probe signal (TKAS), which is intended to a numerical control (NC) of Workpiece processing machine (WBM) to be issued.
  2. Temperature compensated probe (MTS, MTE) according to the preceding claim, wherein a plurality of temperature sensors (TS) are associated with the probe (MTS) whose signals in the linking device (VE) with the signals of at least one Antastsensors (ASE) to a temperature-compensated probe signal (TKAS) be linked.
  3. Temperature-compensated measuring probe (MTS, MTE) according to one of the preceding claims, wherein the linking device (VE) the signals of at least one Antastsensors (ASE) with the signals (T) of the / each temperature sensor (TS) to a temperature-compensated detection signal (TKAS) in a manner linked, that a signal of the at least one Antastsensors (ASE) depending on the temperature, which reproduces the signal (T) of the / each temperature sensor (TS) is time-delayed output as a temperature-compensated detection signal (TKAS), and / or wherein the linking device (VE) combines the signals of the at least one touch sensor (ASE) with the signals (T) of the / each temperature sensor (TS) into a temperature-compensated detection signal (TKAS) in such a way that a switching threshold of a signal of the at least one touch sensor ( ASE) is changed as a function of the temperature which reproduces the signal (T) of the / each temperature sensor (TS), so that the signal of the touch sensor (ASE) is output as a temperature-compensated detection signal (TKAS), and / or wherein the linking means (VE) combines the signals of the at least one touch sensor (ASE) with the signals (T) of the / each temperature sensor (TS) to form a temperature compensated strobe signal (TKAS) in a manner that the signals (T) of the / each temperature sensor (TS) according to a stored function according to time, course, and / or amount are changed and a corresponding switching threshold to the at least one Antastsensor (ASE) is specified.
  4. Temperature Compensated Probe (MTS, MTE) which has one or more strain gauges attached to the probe to measure a temperature-related elongation of the probe at a representative location and send that measurement to the numerical control of a workpiece processing machine for offsetting.
  5. Temperature compensated probe (MTS, MTE) according to one of the preceding claims, wherein the probe has a housing (G) in which an annular support bearing (SL) is formed, which has an X, Y bearing plane and a normal Z-axis of the normal Assembled probe defined, a support body (TK) has an annular abutment (GL), by which a longitudinal axis of the support body (TK) is defined, a spring (F) between the housing (G) and the support body (TK) is clamped and striving, to hold the latter in a rest position in which abutment (GL) abuts the support bearing (SL) and the longitudinal axis of the support body (TK) at least approximately coincides with the central axis Z of the probe (MTS, MTE), a stylus recording (TSA) on Supporting body (TK) is centrally arranged to receive a stylus (TS), a transmission member (UG) in the housing (G) along the central Z-axis slidably guided by any deflections of the support body (TK), caused d urch a relative movement between the probe and a workpiece to convert from its rest position into linear movements, and at least one Antastsensor (ASE) such movements of the transmission member into the signals, with one end of the transmission member (UG) on the Taststiftaufnahme (TSA) arranged centrally and only a portion adjacent to the other end is guided in the direction of the central axis Z, wherein the transmission member (UG) at a position of the support body (TK) is arranged, which viewed from the at least one touch sensor (ASE) beyond the storage plane wherein the at least one touch sensor (ASE) is part of a light barrier with path-dependent analog measurement signal or a binary switching signal and the stylus (TSA) arranged on the support body (TK) or part of the support body (TK) and slidable along its longitudinal axis guided and fed towards a defined by a stop normal position ernd biased.
  6. Temperature Compensated Probe (MTS, MTE) having a direction of motion detector (BRD) adapted to (i) at least relative movements between the probe and a workpiece along the central Z-axis of the probe of movements in the X, Y bearing plane and (ii) outputting reproducing directional signals to the linking device (VE), and wherein the linking device (VE) is adapted to output temperature-compensated sound signals (TKAS) during relative movements between the measuring probe and a workpiece along the central Z-axis of the measuring probe, and in the case of relative movements between the probe and a workpiece in the X, Y bearing plane of the probe, output temperature-uncompensated signals of the probe sensor (ASE).
  7. Temperature-compensated measuring probe (MTS, MTE) according to one of the preceding claims, wherein the movement direction detector (BRD) is adapted to determine the direction signals from the signal change rate of the path-dependent analog measuring signal and relative movements between the probe and a workpiece along the central Z-axis of the To output probes temperature-compensated probing signals (TKAS) and to output temperature-uncompensated signals of at least one Antastsensors (ASE) for relative movements between the probe and a workpiece in the X, Y-bearing plane of the probe, and / or wherein the movement direction detector (BRD) a high signal change rate the path-dependent analog measurement signal of the touch sensor (ASE) as a relative movement between the probe and a workpiece along the central Z-axis of the probe evaluates and a comparatively low signal change rate of the path-dependent analog measurement signal of Antastsensors (ASE) a ls Evaluates the relative movement between the probe and a workpiece in the X, Y bearing plane of the probe.
  8. Temperature-compensated measuring probe (MTS, MTE) according to one of the preceding claims, wherein a plurality of touch sensors (ASE) are provided for the different directions of movement of the relative movements between the probe and a workpiece, wherein achieved by the mechanical arrangement and orientation of the touch sensors (ASE) that a signal activating the temperature compensation signal is output to the linking device (VE) only by a scanning sensor (ASE) assigned to the Z direction, and / or only the signal of the scanning sensor (ASE) assigned to the Z direction is to be compensated with respect to the temperature.
  9. Temperature-compensated measuring probe (MTS, MTE) according to one of the preceding claims, wherein acceleration sensors are provided to detect the different directions of movement of the relative movements between the probe and a workpiece and is achieved by the mechanical arrangement and orientation that in only one of the Z-direction associated movement direction sensor, a temperature compensation activating signal is output to the linking device (VE).
  10. Temperature-compensated measuring probe (MTS, MTE) according to one of the preceding claims, wherein the linking device (VE), the direction of movement of relative movements between the probe and a workpiece manually by means of a switch is to specify, and / or wherein the linking device (VE) the direction of movement of the relative movements between the probe and a workpiece by the numerical control (NC) of the workpiece processing machine (WBM) is to specify.
  11. Temperature-compensated measuring probe (MTS, MTE) according to the preceding claim, wherein the numerical control (NC) of the workpiece processing machine (WBM) transmits the direction of movement to the probe via a data interface at the beginning of each measuring movement, so that during a relative movement between the probe and a workpiece along the Z-axis of the probe the temperature compensation by the linking device (VE) is to be activated.
  12. Temperature compensation of a probe, whereby the probe transmits, via a data interface of a numerical control (NC) of a workpiece processing machine (WBM) at the beginning of each measuring movement between the probe and a workpiece or at intervals a temperature or length correction value which the numerical control (NC) For measurements along the Z axis of the probe, the temperature compensation is calculated with the position value determined via a path measuring system of the workpiece processing machine (WBM).
  13. Method for temperature compensation of a probe (MTS, MTE), which is to be incorporated in a workpiece processing machine (WBM), comprising the steps of • probing a workpiece (WS) by means of a probe (TE) of the probe (MTS, MTE), • converting such probes into Signals by means of at least one Antastsensors (ASE) of the probe, • Generating a temperature for the probe (MTS) representative signal (T) by means of at least one temperature sensor (TS), which is assigned to the probe (MTS), and • Linking the signals of at least one Antastsensors (ASE) with the signals (T) of the temperature sensor (TS) to a temperature-compensated probing signal (TKAS) of the probe, which is intended to a numerical control (NC) of the workpiece processing machine (WBM) output to become.
  14. Method for temperature compensation of a probe (MTS, MTE) according to the preceding method claim, wherein signals of several of the probe (MTS) associated temperature sensors (TS1, TS2, ...) in the linking device (VE) with the signals of the at least one touch sensor (ASE) be linked to a temperature-compensated detection signal (TKAS) of the probe.
  15. Method for temperature compensation of a probe (MTS, MTE) according to one of the preceding method claims, wherein the signals of the at least one touch sensor (ASE) with the signals (T) of / each temperature sensor (TS) linked to a temperature-compensated detection signal (TKAS) in a manner be that a signal of the Antastsensors (ASE) in response to the temperature, which reproduces the signal (T) of / each temperature sensor (TS), time-delayed output as a temperature compensated probe signal (TKAS) of the probe, and / or wherein the signals of the at least one touch sensor (ASE) are combined with the signals (T) of the / each temperature sensor (TS) to form a temperature compensated detection signal (TKAS) in such a way that a switching threshold of a signal of the touch sensor (ASE) depends on the Temperature, which reproduces the signal (T) of / each temperature sensor (TS) is changed, so that the signal of the at least one Antastsensors (ASE) is output as a temperature-compensated detection signal (TKAS) of the probe, and / or wherein the signals of the at least one touch sensor (ASE) with the signals (T) of the / each temperature sensor (TS) to a temperature compensated detection signal (TKAS) in such a way that the signals (T) of the / each temperature sensor (TS) according to a deposited function according to time, course, and / or amount are changed and a corresponding switching threshold to the at least one Antastsensors (ASE) of the probe is specified.
  16. Method for temperature compensation of a probe (MTS, MTE) according to one of the preceding method claims, a movement direction detector (FR) (i) at least relative movements between probe and workpiece along the central Z-axis of the probe of relative movements between probe and workpiece in the X, Y (Ii) this reproduces reproducing direction signals to the linking device (VE), and wherein the linking device (VE) outputs relative to movements between probe and workpiece along the central Z-axis of the probe temperature-compensated probing signals (TKAS) and relative movements between Probe and workpiece in the X, Y bearing plane of the probe outputs temperature-uncompensated signals of at least one touch sensor (ASE).
  17. Method for temperature compensation of a probe (MTS, MTE) according to one of the preceding method claims, wherein the movement direction detector (BRD) determines the direction signals from the signal change rate of the path-dependent analog measuring signal and at relative movements between probe and workpiece along the central Z-axis temperature-compensated probing signals (TKAS) outputs and outputs relative to movements between the probe and workpiece in the X, Y-bearing plane of the probe temperature-uncompensated signals of at least one Antastsensors (ASE), and / or wherein the movement direction detector (BRD) evaluates a high signal change rate of the path-dependent analog measurement signal of the at least one touch sensor (ASE) as relative movements between the probe and the workpiece along the central Z axis and a comparatively low signal rate of the path-dependent analog measurement signal of the at least one Antastsensors (ASE) Evaluates relative movements between probe and workpiece in the X, Y bearing plane, and / or wherein a plurality of movement direction sensors for the different relative movements between the probe and workpiece by their mechanical arrangement and orientation achieve that only in one of the Z direction associated movement direction sensor, a temperature compensation activating signal is output to the linking device (VE).
  18. Method for temperature compensation of a probe (MTS, MTE) according to one of the preceding method claims, wherein acceleration sensors detect the different directions of the relative movements between probe and workpiece and achieve by the mechanical arrangement and orientation that only in one of the Z-direction associated movement direction sensor, the temperature compensation activating signal is output to the linking device (VE).
  19. Method for temperature compensation of a probe (MTS, MTE) according to one of the preceding method claims, wherein the linking device (VE) transmitted to the probe movement direction of the relative movements between the probe and the workpiece by means of a switch is manually specified, and / or wherein the linking device (VE) is transmitted to the probe transmitted movement direction of the relative movements between the probe and the workpiece by the numerical control (NC) of the workpiece processing machine (WBM).
  20. Method for temperature compensation of a probe (MTS, MTE) according to the previous method claim, wherein the numerical control (NC) of the workpiece processing machine (WBM) transmits to the probe via a data interface at the beginning of each measuring movement, the direction of the relative movements between the probe and the workpiece, so that during relative movements between the probe and the workpiece along the Z-axis of the probe, the temperature compensation by the linking device (VE) is to be activated, and / or wherein the probe via a data interface of a numerical control (NC) of a workpiece processing machine (WBM) at the beginning of each measuring movement or in time intervals a temperature or length correction value transmitted to the numerical control (NC) in measurements along the Z-axis, the temperature compensation signal with the determined via a path measuring system of the workpiece processing machine (WBM) calculated position value.
DE102013001457.3A 2013-01-28 2013-01-28 In a workpiece processing machine to be recorded temperature-compensated probe and method for temperature compensation of a probe Pending DE102013001457A1 (en)

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DE102013001457.3A DE102013001457A1 (en) 2013-01-28 2013-01-28 In a workpiece processing machine to be recorded temperature-compensated probe and method for temperature compensation of a probe
US14/166,429 US9500533B2 (en) 2013-01-28 2014-01-28 Temperature-compensated measuring probe to be received in a workpiece-processing machine, and temperature compensation of a measuring probe
EP14152753.1A EP2759800A1 (en) 2013-01-28 2014-01-28 Temperature-compensated measuring probe to be held in a machine tool and temperature compensation of a measuring probe
JP2014013223A JP6363349B2 (en) 2013-01-28 2014-01-28 Temperature compensated measuring probe to be received in the workpiece processing machine, and temperature compensation of the measuring probe

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US9500533B2 (en) 2016-11-22

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