DE102012219203B3 - Device for force- or displacement measurement, has two meander arrangements connected to each other by coupling piece to form parallel spring arrangement, where each meander arrangement has neutral silicon springs and active silicon springs - Google Patents
Device for force- or displacement measurement, has two meander arrangements connected to each other by coupling piece to form parallel spring arrangement, where each meander arrangement has neutral silicon springs and active silicon springs Download PDFInfo
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- DE102012219203B3 DE102012219203B3 DE201210219203 DE102012219203A DE102012219203B3 DE 102012219203 B3 DE102012219203 B3 DE 102012219203B3 DE 201210219203 DE201210219203 DE 201210219203 DE 102012219203 A DE102012219203 A DE 102012219203A DE 102012219203 B3 DE102012219203 B3 DE 102012219203B3
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- silicon
- meander
- coupling piece
- spring
- arrangement
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
- G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/14—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring distance or clearance between spaced objects or spaced apertures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/04—Measuring force or stress, in general by measuring elastic deformation of gauges, e.g. of springs
- G01L1/044—Measuring force or stress, in general by measuring elastic deformation of gauges, e.g. of springs of leaf springs
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/18—Measuring force or stress, in general using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/16—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force
- G01L5/161—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using variations in ohmic resistance
- G01L5/162—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using variations in ohmic resistance of piezoresistors
Abstract
Description
Die Erfindung betrifft eine Vorrichtung zur Kraft- und/oder Wegmessung mit neutralen Siliziumfedern und aktiven Siliziumfedern, die durch Abstandsstücke verbunden sind, wobei die aktiven Siliziumfedern piezoresistive Widerstände enthalten, die in einer Wheatstoneschen Vollbrücke verschaltetet sind.The invention relates to a device for force and / or distance measurement with neutral silicon springs and active silicon springs, which are connected by spacers, wherein the active silicon springs piezoresistive resistors, which are connected in a Wheatstone full bridge.
Im Stand der Technik sind verschiedene Vorrichtungen zur Kraft- und Wegmessung bekannt.Various devices for force and displacement measurement are known in the prior art.
Ein Mikrotaster zur Messung von Kräften und Wegen ist aus der Druckschrift „G. N. Peggs, A. J. Lewis, S. Oldfield: Design for a compact high-accuraccy CMM. In. Annals of the CIRP, Vol. 48/1/1999, Seite 417–420” bekannt. Bei diesen Sensoren werden mittels eines Tastelements und eines Taststifts Kräfte auf flexible metallische Federelemente übertragen. Die Auslenkungen, also die Wege der Federelemente, werden mit kapazitiven Sensoren gemessen. Die Auslenkungen betragen nur wenige Mikrometer, was beim Einbau des Mikrotasters in Koordinatenmessgeräten nachteilig ist. Damit verbunden sind erhöhte Gefahren der Beschädigung des Taststiftes.A microprobe for measuring forces and paths is known from the document "G. N. Peggs, A.J. Lewis, S. Oldfield: Design for a compact high-accuracy CMM. In. Annals of the CIRP, Vol. 48/1/1999, page 417-420 ". In these sensors, forces are transmitted to flexible metallic spring elements by means of a probe element and a stylus. The deflections, ie the paths of the spring elements, are measured with capacitive sensors. The deflections amount to only a few micrometers, which is disadvantageous when installing the micro-probe in coordinate measuring machines. This is associated with increased risks of damage to the stylus.
Ein Dreiachsen-Kraftsensor wird in „mst/news Nr. 1/09, February 2009, S. 16–17: Multidimensional Force and Displacement Sensor for Micro Metrology.: A. Tribrewala, A. Phataralaoha und St. Büttgenbach” beschrieben. Hierbei sind in einer Siliziummembran piezoresistive Widerstände zu Brücken zusammengeschaltet. Die Membran ist mit einem Taststift mit Antastkugel verbunden. Auch bei dieser Anordnung sind die Messwege sehr klein und betragen nur ca. 10 Mikrometer.A three-axis force sensor is described in "mst / news No. 1/09, February 2009, pp. 16-17: Multidimensional Force and Displacement Sensor for Micro Metrology .: A. Tribrewala, A. Phataralaoha and St. Büttgenbach". Here piezoresistive resistors are connected together in bridges in a silicon membrane. The membrane is connected to a stylus with probing ball. Even with this arrangement, the measurement paths are very small and only about 10 microns.
In
Ferner ist aus
Zusammengefasst bestehen die wesentlichsten Nachteile der aus dem Stand der Technik bekannten 3D-Taster mit Siliziumverformungskörpern mit integrierten piezoresistiven Widerstanden darin, dass die auftretenden Messwege für bestimmte Aufgaben in der Koordinatenmesstechnik zu klein sind.In summary, the main disadvantages of the known from the prior art 3D probe with silicon deformation bodies with integrated piezoresistive resistors is that the measurement paths occurring for certain tasks in the coordinate metrology are too small.
Der Erfindung liegt daher die Aufgabe zugrunde, eine Vorrichtung der eingangs genannten Art zu schaffen, die zur Messung von drei orthogonalen Kräften geeignet ist und bei der größere Messwege auftreten.The invention is therefore an object of the invention to provide a device of the type mentioned, which is suitable for the measurement of three orthogonal forces and occur in the larger measuring paths.
Erfindungsgemäß wird die Aufgabe mit einer Anordnung gelöst, welche die in Anspruch 1 angegebenen Merkmale aufweist.According to the invention the object is achieved with an arrangement having the features specified in claim 1.
Vorteilhafte Ausgestaltungen der Erfindung sind Gegenstand der Unteransprüche.Advantageous embodiments of the invention are the subject of the dependent claims.
Die erfindungsgemäße Vorrichtung zur Messung von dreidimensionalen Kräften mit großen Messwegen besteht darin, dass mehrere neutrale Siliziumrechteckfedern und aktive Siliziumrechteckfedern mäanderförmig angeordnet sind und durch Siliziumabstandsstücke verbunden sind. Aktive Siliziumrechteckfedern enthalten vier piezoresistive Widerstände, die zu einer Vollbrücke verschaltet sind. Zwei solcher mäanderfömigen Anordnungen sind symmetrisch positioniert. Zwei Enden der beiden mäanderförmigen Anordnungen sind an einem Gestell befestigt. Die beiden anderen Enden sind über ein erstes Siliziumkoppelstück fest miteinander verbunden. Zur Stabilisierung der beiden mäanderförmigen Anordnungen können die Enden der Siliziumrechteckfedern, die dem ersten Siliziumkoppelstück gegenüberliegen, durch ein Siliziumjoch verbunden werden. Infolge der mäanderförmigen Anordnungen werden die Wege, um die das erste Siliziumkoppelstück verschoben werden kann, stark vergrößert.The device according to the invention for measuring three-dimensional forces with large measurement paths consists in that a plurality of neutral silicon rectangular springs and active silicon rectangular springs are arranged meander-shaped and are connected by silicon spacers. Active silicon rectangular springs contain four piezoresistive resistors, which are connected in a full bridge. Two such meandering arrangements are symmetrically positioned. Two ends of the two meander-shaped arrangements are attached to a frame. The other two ends are firmly connected to each other via a first silicon coupling piece. To stabilize the two meander-shaped arrangements, the ends of the silicon rectangular springs, which are opposite to the first silicon coupling piece, can be connected by a silicon yoke. Due to the meandering arrangements, the paths by which the first silicon coupling piece can be displaced are greatly increased.
Um eine zweite Kraftkomponente senkrecht zur ersten Kraft auch mit vergrößerten Wegen zu erfassen, müssen zwei vorher beschriebene mäanderförmige Anordnungen zusätzlich rechtwinklig zu der ersteren angebracht werden. Dazu wird am ersten Siliziumkoppelelement ein zweites Siliziumkoppelelement so angeordnet, dass die zwei freien Enden einer dritten und vierten mäanderförmigen Anordnung daran befestigt werden können. Die beiden anderen freien Enden sind an einem dritten Siliziumkoppelstück fest angebracht.In order to detect a second force component perpendicular to the first force, even with enlarged paths, two previously described meander-shaped arrangements must additionally be installed at right angles to the former. For this purpose, a second silicon coupling element is arranged on the first silicon coupling element so that the two free ends of a third and fourth meander-shaped arrangement can be attached thereto. The two other free ends are firmly attached to a third silicon coupling piece.
Um auch die dritte Kraftkomponente mit vergrößerten Messwegen erfassen zu können, werden zwei weitere mäanderförmige Anordnungen rechtwinklig zu den vorherigen mäanderförmigen Anordnungen symmetrisch angeordnet. Die zwei freien Enden der weiteren symmetrischen Anordnung sind durch ein viertes Siliziumkoppelelement fest verbunden. An dem vierten Siliziumkoppelelement greifen die Messgrößen, also die Kräfte, in drei senkrechten Richtungen an. In diesen drei Richtungen treten stark vergrößerte Wege auf. Mit Längen der neutralen und der aktiven Siliziumrechteckfedern von ca. 32 mm und mit einer Waferdicke von ca. 0,4 mm lassen sich mit jeweils nur drei mäanderförmig angeordneten Siliziumrechteckfedern Messwege von ca. ±0,5 mm erreichen. In order to be able to detect the third force component with enlarged measuring paths, two further meander-shaped arrangements are arranged symmetrically at right angles to the previous meander-shaped arrangements. The two free ends of the further symmetrical arrangement are firmly connected by a fourth silicon coupling element. At the fourth silicon coupling element, the measured variables, ie the forces, act in three perpendicular directions. In these three directions occur greatly enlarged ways. With lengths of the neutral and active silicon rectangular springs of approx. 32 mm and a wafer thickness of approx. 0.4 mm, measuring paths of approx. ± 0.5 mm can be achieved with only three silicon-squared feathers arranged in a meandering pattern.
Vorteilhafte Ausführungen sehen vor, dass die Abstandsstücke und die Koppelstücke wahlweise aus Silizium, Invar oder Glas hergestellt werden.Advantageous embodiments provide that the spacers and the coupling pieces are optionally made of silicon, Invar or glass.
Da die aktiven Siliziumrechteckfedern mit vier in einer Vollbrücke verschalteten piezoresistiven Widerständen in der Regel eine Offset-Brückenausgangsspannung sowie einen Temperaturkoeffizienten aufweisen, kann zur Kompensation von Offset und TK eine Referenz-Siliziumrechteckfeder benutzt werden. Die Referenz-Siliziumrechteckfeder besitzt auch vier in einer Vollbrücke verschaltete piezoresistive Widerstände sowie den gleichen Offset und TK wie die aktive Siliziumrechteckfeder. Die Referenz-Siliziumrechteckfeder wird keiner mechanischen Belastung ausgesetzt, sie dient also nur der Kompensation. Dazu wird die Differenz zwischen den Brückenausgangsspannungen von der Referenz-Siliziumrechteckfeder und von der aktiven Siliziumrechteckfeder gebildet.Since the active silicon rectangular springs with four piezoresistive resistors connected in a full bridge usually have an offset bridge output voltage and a temperature coefficient, a reference silicon rectangular spring can be used to compensate for offset and TK. The reference silicon rectangular spring also has four piezoresistive resistors connected in a full bridge as well as the same offset and TK as the active silicon rectangular spring. The reference silicon rectangular spring is not exposed to mechanical stress, so it only serves to compensate. For this purpose, the difference between the bridge output voltages is formed by the reference silicon rectangular spring and by the active silicon rectangular spring.
Es ist auch möglich, dass die Differenzspannungen für mehrere aktive Siliziumrechteckfedern und mehrere Referenz-Siliziumrechteckfedern, welche die gleichen Offsetspannungen und die gleichen Temperaturkoeffizienten aufweisen, gebildet werden.It is also possible for the differential voltages to be formed for a plurality of active silicon rectangular springs and a plurality of reference silicon rectangular springs having the same offset voltages and the same temperature coefficients.
Ausführungsbeispiele der Erfindung werden im Folgenden anhand von Zeichnungen näher erläutert.Embodiments of the invention are explained in more detail below with reference to drawings.
Darin zeigen:Show:
Einander entsprechende Teile sind in allen Figuren mit den gleichen Bezugszeichen versehen.Corresponding parts are provided in all figures with the same reference numerals.
Die in
Greift am Siliziumkoppelstück
Anstelle von Silizium kann auch Invar oder Glas als Material für die Abstandsstücke
Es ist auch möglich, dass die aktiven Siliziumrechteckfedern
In
In
In
BezugszeichenlisteLIST OF REFERENCE NUMBERS
- 11
- neutrale Siliziumrechteckfedernneutral silicon rectangular springs
- 1.11.1
- erste neutrale Siliziumrechteckfederfirst neutral silicon rectangular spring
- 1.21.2
- zweite neutrale Siliziumrechteckfedersecond neutral silicon rectangular spring
- 22
- aktive Siliziumrechteckfedernactive silicon rectangular springs
- 33
- piezoresistive Widerständepiezoresistive resistors
- 3.1, 3.2, 3.3, 3.43.1, 3.2, 3.3, 3.4
- piezoresistive Widerstände der Referenz-Siliziumrechteckfederpiezoresistive resistors of the reference silicon rectangular spring
- 3.5, 3.6, 3.7, 3.83.5, 3.6, 3.7, 3.8
- piezoresistive Widerstände der aktiven Siliziumrechteckfederpiezoresistive resistors of the active silicon rectangular spring
- 44
- erste mäanderförmige Anordnungfirst meandering arrangement
- 55
- zweite mäanderförmige Anordnungsecond meandering arrangement
- 1212
- dritte mäanderförmige Anordnungthird meandering arrangement
- 1313
- vierte mäanderförmige Anordnungfourth meandering arrangement
- 1414
- fünfte mäanderförmige Anordnungfifth meander-shaped arrangement
- 1515
- sechste mäanderförmige Anordnungsixth meander-shaped arrangement
- 66
- Abstandsstückespacers
- 77
- Gestellframe
- 88th
- erstes Siliziumkoppelstückfirst silicon coupling piece
- 99
- zweites Siliziumkoppelstücksecond silicon coupling piece
- 1010
- drittes Siliziumkoppelstückthird silicon coupling piece
- 1111
- viertes Siliziumkoppelstückfourth silicon coupling piece
- 1616
- Messkraftmeasuring force
- 17, 1817, 18
- Referenz-SiliziumrechteckfederReference silicon rectangle spring
- UB U B
- Speisespannungsupply voltage
- UDR U DR
- BrückenausgangsspannungBridge output voltage
- TKTK
- Temperaturkoeffizienttemperature coefficient
- UDM U DM
- Messspannungmeasuring voltage
- UOffset U offset
- Offsetspannungoffset voltage
- ΔT.DELTA.T
- Temperaturänderungtemperature change
Claims (8)
Priority Applications (1)
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DE201210219203 DE102012219203B3 (en) | 2012-10-22 | 2012-10-22 | Device for force- or displacement measurement, has two meander arrangements connected to each other by coupling piece to form parallel spring arrangement, where each meander arrangement has neutral silicon springs and active silicon springs |
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DE201210219203 DE102012219203B3 (en) | 2012-10-22 | 2012-10-22 | Device for force- or displacement measurement, has two meander arrangements connected to each other by coupling piece to form parallel spring arrangement, where each meander arrangement has neutral silicon springs and active silicon springs |
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DE102012219203B3 true DE102012219203B3 (en) | 2013-11-14 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014219280B3 (en) * | 2014-09-24 | 2015-11-26 | SIOS Meßtechnik GmbH | Device for positioning and measuring of measuring objects |
GB2537580A (en) * | 2015-01-19 | 2016-10-26 | Imp Innovations Ltd | A force measurement mechanism |
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DE102008037926B3 (en) * | 2008-08-14 | 2010-02-04 | SIOS Meßtechnik GmbH | Device for tactile measurement of three-dimensional forces, has touch element, tracer pin and parallel spring-elements with strain sensors, where parallel spring-element is arranged transverse to tracer pin |
DE102009020533B3 (en) * | 2009-05-08 | 2010-09-30 | SIOS Meßtechnik GmbH | Device e.g. micro tracer, for measurement of force components during touching of measuring objects, has spring elements with same rigidity comprising extension sensors that are hooked to Wheatstone bridge and arranged on spring elements |
DE102010012701A1 (en) * | 2010-03-24 | 2011-11-17 | Bundesrepublik Deutschland, vertr.d.d. Bundesministerium für Wirtschaft und Technologie, d.vertr.d.d. Präsidenten der Physikalisch-Technischen Bundesanstalt | Microforce sensor for measuring micro forces at nano range and milli Newton range, has spring region provided between two support regions and stiffener marking unit, respectively, where spring regions comprise two-winged meander shape |
DE102011007350A1 (en) * | 2011-04-14 | 2012-10-18 | SIOS Meßtechnik GmbH | Force-moment sensor for performing tactile measurement of force, moment and deformation, has support element spaced apart from set of supplementary parallel spring assemblies, and another support element that supports sensor at frame |
-
2012
- 2012-10-22 DE DE201210219203 patent/DE102012219203B3/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102008037926B3 (en) * | 2008-08-14 | 2010-02-04 | SIOS Meßtechnik GmbH | Device for tactile measurement of three-dimensional forces, has touch element, tracer pin and parallel spring-elements with strain sensors, where parallel spring-element is arranged transverse to tracer pin |
DE102009020533B3 (en) * | 2009-05-08 | 2010-09-30 | SIOS Meßtechnik GmbH | Device e.g. micro tracer, for measurement of force components during touching of measuring objects, has spring elements with same rigidity comprising extension sensors that are hooked to Wheatstone bridge and arranged on spring elements |
DE102010012701A1 (en) * | 2010-03-24 | 2011-11-17 | Bundesrepublik Deutschland, vertr.d.d. Bundesministerium für Wirtschaft und Technologie, d.vertr.d.d. Präsidenten der Physikalisch-Technischen Bundesanstalt | Microforce sensor for measuring micro forces at nano range and milli Newton range, has spring region provided between two support regions and stiffener marking unit, respectively, where spring regions comprise two-winged meander shape |
DE102011007350A1 (en) * | 2011-04-14 | 2012-10-18 | SIOS Meßtechnik GmbH | Force-moment sensor for performing tactile measurement of force, moment and deformation, has support element spaced apart from set of supplementary parallel spring assemblies, and another support element that supports sensor at frame |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014219280B3 (en) * | 2014-09-24 | 2015-11-26 | SIOS Meßtechnik GmbH | Device for positioning and measuring of measuring objects |
GB2537580A (en) * | 2015-01-19 | 2016-10-26 | Imp Innovations Ltd | A force measurement mechanism |
JP2018505409A (en) * | 2015-01-19 | 2018-02-22 | インペリアル・イノベ−ションズ・リミテッド | Force measurement mechanism |
US10247628B2 (en) | 2015-01-19 | 2019-04-02 | Imperial Innovations Limited | Force measurement mechanism |
EP3247986B1 (en) * | 2015-01-19 | 2019-06-26 | Imperial Innovations Ltd | A force measurement mechanism |
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