DE102011016301B8 - Testkontaktor für ein integriertes Schaltkreisbauteil und Verwendung - Google Patents

Testkontaktor für ein integriertes Schaltkreisbauteil und Verwendung Download PDF

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Publication number
DE102011016301B8
DE102011016301B8 DE102011016301A DE102011016301A DE102011016301B8 DE 102011016301 B8 DE102011016301 B8 DE 102011016301B8 DE 102011016301 A DE102011016301 A DE 102011016301A DE 102011016301 A DE102011016301 A DE 102011016301A DE 102011016301 B8 DE102011016301 B8 DE 102011016301B8
Authority
DE
Germany
Prior art keywords
integrated circuit
circuit component
test contactor
contactor
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE102011016301A
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English (en)
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DE102011016301A1 (de
DE102011016301B4 (de
Inventor
Klaus Schnell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yamaichi Electronics Deutschland GmbH
Original Assignee
Yamaichi Electronics Deutschland GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamaichi Electronics Deutschland GmbH filed Critical Yamaichi Electronics Deutschland GmbH
Priority to DE102011016301A priority Critical patent/DE102011016301B8/de
Publication of DE102011016301A1 publication Critical patent/DE102011016301A1/de
Application granted granted Critical
Publication of DE102011016301B4 publication Critical patent/DE102011016301B4/de
Publication of DE102011016301B8 publication Critical patent/DE102011016301B8/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
DE102011016301A 2011-04-07 2011-04-07 Testkontaktor für ein integriertes Schaltkreisbauteil und Verwendung Active DE102011016301B8 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE102011016301A DE102011016301B8 (de) 2011-04-07 2011-04-07 Testkontaktor für ein integriertes Schaltkreisbauteil und Verwendung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102011016301A DE102011016301B8 (de) 2011-04-07 2011-04-07 Testkontaktor für ein integriertes Schaltkreisbauteil und Verwendung

Publications (3)

Publication Number Publication Date
DE102011016301A1 DE102011016301A1 (de) 2012-10-11
DE102011016301B4 DE102011016301B4 (de) 2013-08-22
DE102011016301B8 true DE102011016301B8 (de) 2013-11-28

Family

ID=46875086

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102011016301A Active DE102011016301B8 (de) 2011-04-07 2011-04-07 Testkontaktor für ein integriertes Schaltkreisbauteil und Verwendung

Country Status (1)

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DE (1) DE102011016301B8 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013009424A1 (de) 2013-06-04 2014-12-04 Volkswagen Aktiengesellschaft Notfallassistenz ohne aktivierte Querführungsunterstützung
DE102014016995B3 (de) * 2014-11-18 2016-03-03 Yamaichi Electronics Deutschland Gmbh Testkontaktor zum Kontaktieren von Halbleiterelementen, Verfahren zum Kontaktieren von Halbleiterlementen und Verwendung eines Testkontaktors
DE102014016996B3 (de) * 2014-11-18 2016-03-03 Yamaichi Electronics Deutschland Gmbh Testkontaktor, Testkontaktorsystem, Verwendung eines Testkontaktors und Testverfahren

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090088006A1 (en) * 2007-09-28 2009-04-02 Kazumi Uratsuji Socket for semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090088006A1 (en) * 2007-09-28 2009-04-02 Kazumi Uratsuji Socket for semiconductor device

Also Published As

Publication number Publication date
DE102011016301A1 (de) 2012-10-11
DE102011016301B4 (de) 2013-08-22

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R012 Request for examination validly filed
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R082 Change of representative

Representative=s name: MUELLER-BORE & PARTNER PATENTANWAELTE, EUROPEA, DE

R018 Grant decision by examination section/examining division
R081 Change of applicant/patentee

Owner name: YAMAICHI ELECTRONICS DEUTSCHLAND GMBH, DE

Free format text: FORMER OWNER: YAMAICHI ELECTRONICS DEUTSCHLAND GMBH, 81829 MUENCHEN, DE

Effective date: 20130409

R082 Change of representative

Representative=s name: MUELLER-BORE & PARTNER PATENTANWAELTE PARTG MB, DE

Effective date: 20130409

Representative=s name: MUELLER-BORE & PARTNER PATENTANWAELTE, EUROPEA, DE

Effective date: 20130409

R020 Patent grant now final

Effective date: 20131123