DE102009001722A1 - Method of applying heat transfer medium, involves providing thermal contact surface having object, and applying phase change material having thermal compound to thermal contact surface - Google Patents
Method of applying heat transfer medium, involves providing thermal contact surface having object, and applying phase change material having thermal compound to thermal contact surface Download PDFInfo
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- DE102009001722A1 DE102009001722A1 DE102009001722A DE102009001722A DE102009001722A1 DE 102009001722 A1 DE102009001722 A1 DE 102009001722A1 DE 102009001722 A DE102009001722 A DE 102009001722A DE 102009001722 A DE102009001722 A DE 102009001722A DE 102009001722 A1 DE102009001722 A1 DE 102009001722A1
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- H01—ELECTRIC ELEMENTS
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
- H01L23/427—Cooling by change of state, e.g. use of heat pipes
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/4846—Connecting portions with multiple bonds on the same bonding area
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
- H01L2224/48472—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
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- H01L23/18—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
- H01L23/24—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device solid or gel at the normal operating temperature of the device
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- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
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Abstract
Description
Die Erfindung betrifft ein Verfahren zum Aufbringen eines Wärmeleitmediums auf eine Wärmeableitfläche. Insbesondere in der Leistungselektronik ist es häufig erforderlich, die in einem elektronischen Bauelement oder einer Baugruppe anfallende Verlustwärme über eine Wärmeableitfläche in Richtung eines Kühlkörpers abzuleiten, um eine Überhitzung des Bauelementes oder der Baugruppe zu vermeiden. Für eine gute Wärmeabfuhr ist ein möglichst optimaler thermischer Kontakt zwischen der Wärmeableitfläche und dem Kühlkörper erforderlich.The The invention relates to a method for applying a heat transfer medium on a heat dissipation surface. Especially in power electronics, it is often necessary in a electronic component or a module accumulating heat loss over a Heat dissipation surface in the direction of a Derive heat sink, to overheat the Component or the assembly to avoid. For a good heat dissipation is one possible optimal thermal contact between the heat dissipation surface and the heat sink required.
Besonders günstig ist es, wenn die Wärmeableitfläche eine korrespondierende Montagefläche des Kühlkörpers möglichst großflächig kontaktiert. Allerdings berühren sich die Wärmeableitfläche und die Montagefläche aufgrund unvermeidlichen Oberflächenrauigkeiten und Welligkeiten nur über einen Teil der maximal möglichen thermischen Kontaktfläche, d. h. es gibt im allgemeinen zahlreiche Stellen, an denen die Wärmeableitfläche und die Montagefläche lokal voneinander beabstandet sind. Um in diesen Bereichen den Wärmeübergangswiderstand zu verringern, wird üblicherweise eine Wärmeübergangsmedium verwendet, das die bestehenden Unebenheiten ausgleicht. Bei derartigen Wärmeübergangsmedien handelt es sich beispielsweise um Wärmeleitpasten oder Wärmeleitfolien.Especially Cheap it is when the heat dissipation surface a corresponding mounting surface of Heat sink as possible contacted over a large area. Indeed touch the heat dissipation surface and the mounting surface due to unavoidable surface roughness and ripples just over a part of the maximum possible thermal contact surface, d. H. There are generally numerous places where the heat dissipation surface and the mounting surface are locally spaced from each other. In order in these areas the heat transfer resistance It is common practice to reduce this a heat transfer medium used, which compensates for the existing bumps. In such Heat transfer media For example, these are thermal compounds or heat conducting films.
Bei Wärmeableitflächen von maximal wenigen Quadratzentimetern und vergleichsweise kleinen Verlustleistungen sind diese Maßnahmen normalerweise ausreichend. Größere Wärmeableitflächen, beispielsweise von mehr als 50 cm2, wie sie beispielsweise bei Leistungshalbleitermodulen zum Einsatz kommen, können jedoch eine deutlich größere Welligkeit aufweisen als kleine Bauteile. Außerdem können sich größere Wärmeableitflächen bedingt durch unterschiedliche thermische Ausdehnungskoeffi zienten von miteinander verbundenen Komponenten des zu kühlenden Leistungshalbleitermoduls je nach Temperatur der beteiligten Komponenten unterschiedlich stark verbiegen.With heat dissipation surfaces of a few square centimeters at most and relatively low power losses, these measures are usually sufficient. Larger heat dissipation surfaces, for example of more than 50 cm 2 , as used for example in power semiconductor modules, but can have a much greater ripple than small components. In addition, larger Wärmeableitflächen can bend due to different coefficients of thermal expansion of interconnected components of the power semiconductor module to be cooled depending on the temperature of the components involved vary greatly.
Werden bei einer derartigen Anordndung Wärmeleitfolien als Wärmeleitmedium verwendet, so besteht nur bei bestimmten Temperaturen bzw. Temperaturverteilungen ein ausreichender thermischer Kontakt zwischen der Wärmeableitfläche und der Montagefläche des Kühlkörpers. Zudem verhindert eine durchgehende Wärmeleitfolie, dass zumindest an einigen Stellen ein direkter Kontakt zwischen der Wärmeableitfläche und der Montagefläche zustande kommt. Die damit erzielbare Kühlwirkung ist somit nicht optimal, da der Wärmeübergangswiderstand eines direkten Kontaktes von Wärmeableitfläche und Montagefläche signifikant geringer ist als der Wärmeübergangswiderstand bei einer dazwischen angeordneten Wärmeleitfolie.Become in such an arrangement Wärmeleitfolien as Wärmeleitmedium used, it exists only at certain temperatures or temperature distributions a sufficient thermal contact between the heat dissipation surface and the mounting surface of the heat sink. moreover prevents a continuous thermal foil, that at least in some places a direct contact between the heat dissipation surface and the mounting surface comes about. The cooling effect that can be achieved is therefore not optimal, because the heat transfer resistance a direct contact of heat dissipation surface and mounting surface significantly less than the heat transfer resistance at an interposed heat conducting foil.
Alternativ zu einer Wärmeleitfolie wird als Wärmeleitmedium auch Wärmeleitpaste verwendet. Diese hat jedoch den Nachteil, dass sie nach dem Auftragen auf die Wärmeableitfläche oder die Montagefläche leicht verschmiert, was zu unterwünschten Verschmutzungen der Umgebung führen kann.alternative to a heat conducting foil is used as a heat transfer medium also thermal grease used. However, this has the disadvantage that they after application on the heat dissipation surface or the mounting surface slightly smeared, causing unwanted soiling of the Lead environment can.
Die Aufgabe der vorliegenden Erfindung besteht darin, ein Verfahren zum Aufbringen eines Wärmeleitmediums auf eine thermische Kontaktfläche bereitzustellen, mit dem das Wärmeleitmedium auf einfache Weise und mit einer vorgegeben Verteilung über die Kontaktfläche aufgebracht werden kann, ohne dass dabei die nähere Umgebung der Kontaktfläche durch das Wärmeleitmedium verunreinigt wird.The The object of the present invention is a method for applying a Wärmeleitmediums to provide for a thermal contact surface, with the heat transfer medium in a simple way and with a given distribution over the contact area can be applied without causing the closer environment of the contact surface by the heat transfer medium is contaminated.
Diese Aufgabe wird durch ein Verfahren zum Aufbringen eines Wärmeleitmediums gemäß Patentanspruch 1 gelöst Ausgestaltungen und Weiterbildungen der Erfindung sind Gegenstand von Unteransprüchen.These Task is achieved by a method for applying a Wärmeleitmediums according to claim 1 solved Embodiments and developments of the invention are the subject of dependent claims.
Das vorliegende Verfahren dient dazu, ein Wärmeleitmedium auf eine erste thermische Kontaktfläche eines ersten Objektes aufzubringen, die mit einer zweiten thermischen Kontaktfläche eines zweiten Objektes in thermischen Kontakt gebracht werden soll. Hierzu wird ein erstes Objekt mit einer ersten thermischen Kontaktfläche bereitgestellt. Auf diese erste thermische Kontaktfläche wird eine Wärmeleitpaste aufgebracht, die ein Phasenwechselmaterial (”Phase Change Material” PSD) aufweist oder aus einem solchen Material besteht. Nach dem Aufbringen der Wärmeleitpaste, jedoch bevor die zweite thermische Kontaktfläche mit der mit der Wärmeleitpaste versehenen ersten thermischen Kontaktfläche in Kontakt gebracht wird, wird die auf die erste thermische Kontaktfläche aufgebrachte Wärmeleitpaste ausgehärtet. Hierbei ist zu beachten, dass das Herstellen des thermischen Kontaktes der zweiten thermischen Kontaktfläche mit der mit der Wärmeleitpaste versehenen ersten thermischen Kontaktfläche nicht Gegenstand von Anspruch 1 ist.The The present method serves to heat a heat transfer medium to a first thermal contact surface a first object to be applied with a second thermal contact area a second object is to be brought into thermal contact. For this purpose, a first object with a first thermal contact surface is provided. On this first thermal contact surface is a thermal grease applied, which has a phase change material ("PSD") or consists of such a material. After applying the thermal grease, but before the second thermal contact surface with the one provided with the thermal paste first thermal contact surface is brought into contact, which is applied to the first thermal contact surface Cured thermal compound. in this connection It should be noted that the establishment of the thermal contact of the second thermal contact surface with the with the thermal grease provided first thermal contact surface is not the subject of claim 1 is.
Die Wärmeleitpaste enthält ein Mittel, beispielsweise ein Lösungsmittel, welches gewährleistet, dass die Wärmeleitpaste bei Raumtemperatur, d. h. bei etwa 20°C, pastös ist und dadurch auf einfache Weise auf die erste thermische Kontaktfläche aufgebracht werden kann.The Thermal Compounds contains an agent, for example a solvent, which ensures that the thermal paste at room temperature, d. H. at about 20 ° C, is pasty and therefore in a simple way can be applied to the first thermal contact surface.
Durch den nachfolgenden Aushärteschritt wird das Mittel zumindest soweit ausgedampft oder aber chemisch innerhalb der Wärmeleitpaste umgesetzt, dass die Wärmeleitpaste sowohl bei Raumtemperatur als auch bei höheren Temperaturen, beispielsweise bis 60°C, eine feste, wachsartige Konsistenz besitzt.By the subsequent curing step becomes the agent at least as far evaporated or chemically within the thermal compound implemented that thermal paste both at room temperature and at higher temperatures, for example up to 60 ° C, has a firm, waxy consistency.
Hierdurch kann das erste Objekt zusammen mit der aufgebrachten und ausgehärteten Wärmeleitpaste beispielsweise gelagert oder in einer Transportverpackung verpackt werden. Insbesondere kann die Wärmeleitpaste mit einer vorgegebenen räumlichen Verteilung auf die erste thermische Kontaktfläche aufgebracht werden. Die Verteilung der Wärmeleitpaste kann ab hängig von den Geometrie des ersten und zweiten Objektes sowie der thermisch bedingten Änderung dieser Geometrie gewählt werden. Beispielsweise kann die Wärmeleitpaste in der Mitte der ersten thermischen Kontaktfläche mit einer höheren Flächendichte aufgebracht werden als am Rand.hereby can be the first object together with the applied and cured thermal compound for example stored or packed in a transport packaging become. In particular, the thermal compound with a given spatial Distribution are applied to the first thermal contact surface. The Distribution of the thermal compound can depend on from the geometry of the first and second object as well as the thermally induced change chosen this geometry become. For example, the thermal grease in the middle of the first thermal contact surface with a higher one areal density be applied as on the edge.
Die Erfindung wird nachfolgend anhand von Ausführungsbeispielen unter Bezugnahme auf Figuren näher erläutert. In den Figuren bezeichnen, soweit nicht anders angegeben, gleiche Figuren gleiche Elemente mit gleicher oder äquivalenter Funktion. Es zeigt:The Invention will now be described with reference to exemplary embodiments with reference closer to figures explained. In the figures, unless stated otherwise, denote the same Figures are the same elements with the same or equivalent function. It shows:
Die
Leistungshalbleitechips
Auf
ihrer der oberseitigen Metallisierung
Bei
den Isolationsträgern
Die
Verbindungsschichten
Das
Leistungshalbleitermodul
Weiterhin
umfasst das Leistungshalbleitermodul
Das
Leistungshalbleitermodul
Über die
Verbindungsschichten
Die
thermischen Kontaktflächen
Die
Wärmeleitpaste
weist ein Phasenwechselmaterial (Phase Change Material) auf, das
gewährleistet,
dass die Wärmeleitpaste
nach dem Aushärten
bei niedrigen Temperaturen, insbesondere bei Raumtemperatur, d.
h. bei etwa 20°C,
fest ist und sich bei höheren
Temperaturen, wie sie beim Betrieb des Moduls auftreten, z. B. bei über 60°C, und/oder unter
einem hohen Anpressdruck zwischen Leistungshalbleitermodul
Zum Beispiel kann die Wärmeleitpaste nach dem Aushärten bei jeder Temperatur von unter 50°C eine dynamische Viskosität von mindestens 10000 Pa·s aufweisen. Zusätzlich oder alternativ kann die Wärmeleitpaste nach dem Aushärten bei jeder Temperatur von über 60°C eine dynamische Viskosität von maximal 400 Pa·s aufweisen. Unabhängig davon oder ergänzend dazu kann die Wärmeleitpaste nach dem Aushärten und/oder vor dem dem Zufügen eines Lösungsmittels eine Grenztemperatur im Bereich von beispielsweise 45°C bis 60°C besitzen. Als Grenztemperatur wird dabei die Temperatur angesehen, bei der der Betrag der Änderung der Viskosität η mit der Temperatur T, d. h. die Größe maximal ist.For example, the thermal paste may have a dynamic viscosity of at least 10,000 Pa.s after curing at any temperature below 50 ° C. Additionally or alternatively, the thermal paste can have a dynamic viscosity of at most 400 Pa · s after curing at any temperature of about 60 ° C. Regardless of or in addition thereto, the thermal compound may have a limit temperature in the range of, for example, 45 ° C to 60 ° C after curing and / or prior to the addition of a solvent. In this case, the temperature at which the amount of change in the viscosity η with the temperature T, ie the magnitude, is considered as the limit temperature is maximum.
Damit
die bei Raumtemperatur z. B. wachsartig feste Wärmeleitpaste
Die
Wärmeleitpaste
Zum
Aushärten
kann die Wärmeleitpaste nach
dem Auftragen und vor der Montage des Leistungshalbleitermoduls
Während die
Unterseite
Gemäß einer
weiteren, in
Gemäß einer
in
Die
Fasern
Anstelle
einzelner Fasern
Gemäß einer
ebenfalls in
Die
anhand der vorangehenden Figuren erläuterte Wärmeleitpaste kann bei allen
Ausgestaltungen der Erfindung die unter Bezugnahme auf die
Sämtliche
Leistungshalbleitermodule können,
wie anhand von
Bei
allen vorangehenden Beispielen wurde die Wärmeleitpaste
Vertiefungen, beispielsweise in einer Bodenplatte oder einem Kühlkörper können auf beliebige Weise, z. B. durch Prägen oder Fräsen oder Formgießen oder Formpressen oder Ätzen, erzeugt werden.recesses For example, in a bottom plate or a heat sink can in any way, for. B. by embossing or milling or molding or molding or etching, be generated.
Als
Wärmeleitpaste
eignet sich beispielsweise PSX-D (”PowerstrateXtreme®”) der Firma
Henkel. Gemäß einer
Ausgestaltung kann eine geeignete Wärmeleitpaste silikonfrei sein.
Die Wärmeleitpaste
Die
auf eine thermische Kontaktfläche
Wie
weiterhin in
Die Erfindung wurde vorangehend unter Bezugnahme auf ein Leistungshalbleitermodul näher erläutert. Grundsätzlich kann eine Wärmeleitpaste in gleicher Weise auch auf andere thermisch miteinander zu koppelnde Objekte aufgebracht werden.The The invention has been described above with reference to a power semiconductor module explained in more detail. Basically a thermal grease in the same way to other thermally coupled with each other Objects are applied.
Claims (35)
Priority Applications (1)
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Cited By (10)
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DE102010062914A1 (en) * | 2010-12-13 | 2012-06-14 | Robert Bosch Gmbh | Semiconductor i.e. power semiconductor, for use in direct current power semiconductor of electronic commutated electromotor of motor car, has ceramic layer comprises pores that are filled with thermal conductive medium e.g. adhesive |
US20140035123A1 (en) * | 2012-08-03 | 2014-02-06 | Mitsubishi Electric Corporation | Semiconductor device and method for manufacturing semiconductor device |
US10068830B2 (en) | 2014-02-13 | 2018-09-04 | Honeywell International Inc. | Compressible thermal interface materials |
DE102015204240B4 (en) | 2014-03-10 | 2019-12-24 | Mitsubishi Electric Corporation | Semiconductor device and method for its production |
DE102016202067B4 (en) | 2015-03-16 | 2020-07-02 | Mitsubishi Electric Corporation | Power semiconductor device |
US10781349B2 (en) | 2016-03-08 | 2020-09-22 | Honeywell International Inc. | Thermal interface material including crosslinker and multiple fillers |
US11041103B2 (en) | 2017-09-08 | 2021-06-22 | Honeywell International Inc. | Silicone-free thermal gel |
US11072706B2 (en) | 2018-02-15 | 2021-07-27 | Honeywell International Inc. | Gel-type thermal interface material |
EP3933913A1 (en) | 2020-06-30 | 2022-01-05 | Siemens Aktiengesellschaft | Power module with at least two power units |
US11373921B2 (en) | 2019-04-23 | 2022-06-28 | Honeywell International Inc. | Gel-type thermal interface material with low pre-curing viscosity and elastic properties post-curing |
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US9196510B2 (en) * | 2013-11-12 | 2015-11-24 | Infineon Technologies Ag | Semiconductor package comprising two semiconductor modules and laterally extending connectors |
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DE10343502A1 (en) * | 2003-09-19 | 2005-05-04 | Eupec Gmbh & Co Kg | Forming thermally conducting connection between semiconducting module heat dissipation surface and cooling element, involves placing heat-conducting paste between heat dissipation surface and cooling element |
US20070164424A1 (en) * | 2003-04-02 | 2007-07-19 | Nancy Dean | Thermal interconnect and interface systems, methods of production and uses thereof |
US20090039498A1 (en) * | 2007-08-06 | 2009-02-12 | Infineon Technologies Ag | Power semiconductor module |
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US20070164424A1 (en) * | 2003-04-02 | 2007-07-19 | Nancy Dean | Thermal interconnect and interface systems, methods of production and uses thereof |
DE10343502A1 (en) * | 2003-09-19 | 2005-05-04 | Eupec Gmbh & Co Kg | Forming thermally conducting connection between semiconducting module heat dissipation surface and cooling element, involves placing heat-conducting paste between heat dissipation surface and cooling element |
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Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102010062914A1 (en) * | 2010-12-13 | 2012-06-14 | Robert Bosch Gmbh | Semiconductor i.e. power semiconductor, for use in direct current power semiconductor of electronic commutated electromotor of motor car, has ceramic layer comprises pores that are filled with thermal conductive medium e.g. adhesive |
US20140035123A1 (en) * | 2012-08-03 | 2014-02-06 | Mitsubishi Electric Corporation | Semiconductor device and method for manufacturing semiconductor device |
US10068830B2 (en) | 2014-02-13 | 2018-09-04 | Honeywell International Inc. | Compressible thermal interface materials |
DE102015204240B4 (en) | 2014-03-10 | 2019-12-24 | Mitsubishi Electric Corporation | Semiconductor device and method for its production |
DE102016202067B4 (en) | 2015-03-16 | 2020-07-02 | Mitsubishi Electric Corporation | Power semiconductor device |
US10781349B2 (en) | 2016-03-08 | 2020-09-22 | Honeywell International Inc. | Thermal interface material including crosslinker and multiple fillers |
US11041103B2 (en) | 2017-09-08 | 2021-06-22 | Honeywell International Inc. | Silicone-free thermal gel |
US11072706B2 (en) | 2018-02-15 | 2021-07-27 | Honeywell International Inc. | Gel-type thermal interface material |
US11373921B2 (en) | 2019-04-23 | 2022-06-28 | Honeywell International Inc. | Gel-type thermal interface material with low pre-curing viscosity and elastic properties post-curing |
EP3933913A1 (en) | 2020-06-30 | 2022-01-05 | Siemens Aktiengesellschaft | Power module with at least two power units |
WO2022002464A1 (en) | 2020-06-30 | 2022-01-06 | Siemens Aktiengesellschaft | Power module having at least three power units |
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