DE102006028530A1 - Mikroskopvorrichtung - Google Patents

Mikroskopvorrichtung Download PDF

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Publication number
DE102006028530A1
DE102006028530A1 DE102006028530A DE102006028530A DE102006028530A1 DE 102006028530 A1 DE102006028530 A1 DE 102006028530A1 DE 102006028530 A DE102006028530 A DE 102006028530A DE 102006028530 A DE102006028530 A DE 102006028530A DE 102006028530 A1 DE102006028530 A1 DE 102006028530A1
Authority
DE
Germany
Prior art keywords
objective
drive
microscope
different directions
light beams
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE102006028530A
Other languages
English (en)
Inventor
Rainer Uhl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FEI Co
Original Assignee
Till I D GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Till I D GmbH filed Critical Till I D GmbH
Priority to DE102006028530A priority Critical patent/DE102006028530A1/de
Priority to US11/558,122 priority patent/US7573635B2/en
Publication of DE102006028530A1 publication Critical patent/DE102006028530A1/de
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

Die vorliegende Erfindung betrifft eine Mikroskopvorrichtung zur wahlweisen Untersuchung einer Probe mit mindestens einem ersten Lichtstrahlenbündel aus einer ersten Richtung und einem zweiten Lichtstrahlenbündel aus einer zweiten, von der ersten Richtung verschiedenen Richtung, mit einem Mikroskopobjektiv und einem Strahlablenkungselement, wobei das Strahlablenkungselement mittels eines Antriebs betätigbar ist, um wahlweise das erste oder das zweite Lichtstrahlenbündel in das Mikroskopobjektiv einzukoppeln, und wobei das Strahlablenkungselement mittels des Antriebs drehbar ist, um mindestens die Austrittsrichtung des ersten Lichtstrahlenbündels von dem Strahlablenkungselement wahlweise zu verändern, wenn das erste Lichtstrahlenbündel in das Mikroskopobjektiv eingekoppelt wird.
DE102006028530A 2005-11-11 2006-06-21 Mikroskopvorrichtung Ceased DE102006028530A1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE102006028530A DE102006028530A1 (de) 2005-11-11 2006-06-21 Mikroskopvorrichtung
US11/558,122 US7573635B2 (en) 2005-11-11 2006-11-09 Microscope device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005054332 2005-11-11
DE102006028530A DE102006028530A1 (de) 2005-11-11 2006-06-21 Mikroskopvorrichtung

Publications (1)

Publication Number Publication Date
DE102006028530A1 true DE102006028530A1 (de) 2007-05-16

Family

ID=37982783

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102006028530A Ceased DE102006028530A1 (de) 2005-11-11 2006-06-21 Mikroskopvorrichtung

Country Status (2)

Country Link
US (1) US7573635B2 (de)
DE (1) DE102006028530A1 (de)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006039896A1 (de) * 2006-08-25 2008-02-28 Till I.D. Gmbh Mikroskop
WO2009120336A1 (en) 2008-03-26 2009-10-01 Yale University Optical system that selectively provides either of a collimated light beam or a convergent light beam
DE102010041426A1 (de) * 2010-09-27 2012-05-03 Siemens Aktiengesellschaft Messeinheit und Verfahren zur optischen Untersuchung einer Flüssigkeit zur Bestimmung einer Analyt-Konzentration
DE102011017078A1 (de) * 2011-04-15 2012-10-18 Leica Microsystems Cms Gmbh Weitfeld-Mikroskop-Beleuchtungssystem und Weitfeld-Beleuchtungsverfahren
EP2666049A1 (de) * 2011-01-20 2013-11-27 Applied Precision, Inc. Lichtabtastsysteme
US9690086B2 (en) 2013-11-20 2017-06-27 Leica Microsystems Cms Gmbh Wide-field microscope illumination system and wide-field illumination method
EP3341710A4 (de) * 2015-08-26 2019-04-24 The United States of America, as represented by The Secretary, Department of Health & Human Services Systeme und verfahren für nichtlineare optische mehransichtsbildgebung zur verbesserung des signal-rausch-verhältnisses und der auflösung in der punktabtastenden multifotonen-mikroskopie

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2225598A1 (de) * 2007-12-21 2010-09-08 Koninklijke Philips Electronics N.V. Rastermikroskop und verfahren zum abbilden einer probe
DE102008021577A1 (de) * 2008-04-30 2009-11-05 Carl Zeiss Microlmaging Gmbh Verfahren zum Kalibrieren einer Ablenkeinheit in einem TIRF-Mikroskop, TIRF-Mikroskop und Verfahren zu dessen Betrieb
EP2439576B1 (de) * 2009-06-02 2018-05-16 Nikon Corporation Bildverarbeitungsvorrichtung und -programm sowie mikroskop dafür
EP2360505B1 (de) 2010-01-21 2017-03-01 Olympus Corporation Mikroskopvorrichtung
US9335533B2 (en) * 2010-10-13 2016-05-10 The University Of Vermont And State Agricultural College Adjustable total internal reflectance microscopy (TIRFM) illuminator apparatus
CN103384845B (zh) * 2011-03-01 2016-05-18 通用电气医疗集团生物科学公司 激光束选择器
US9753265B2 (en) * 2011-03-01 2017-09-05 Ge Healthcare Bio-Sciences Corp. Variable orientation illumination-pattern rotator
US9507136B2 (en) * 2011-11-15 2016-11-29 Ge Healthcare Bio-Sciences Corp. Mode-switchable illumination system for a microscope
DE102012102983A1 (de) 2012-04-05 2013-10-10 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zum Bestimmen eines kritischen Winkels eines Anregungslichtstrahls
DE102016108987A1 (de) 2016-05-13 2017-11-16 Leica Microsystems Cms Gmbh Optisches Rastermikroskop und Untersuchungsverfahren
DE102016011227C5 (de) 2016-09-19 2020-04-09 Leica Microsystems Cms Gmbh Mikroskopsystem und Verfahren zur Abbildung einer Probe unter Verwendung eines Mikroskopsystems
CA3100816A1 (en) 2018-04-18 2019-10-24 Gentex Corporation Confined field of view illumination in surgical microscopy
CN113302537B (zh) * 2018-12-14 2023-07-21 罗兰大学 用于切换光路的组件和包括该组件的光学显微镜

Citations (5)

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Publication number Priority date Publication date Assignee Title
DE19960807C1 (de) * 1999-12-16 2001-02-15 T I L L Photonics Gmbh Vorrichtung zum Ablenken eines Strahls
DE10233549A1 (de) * 2002-07-23 2004-02-12 Leica Microsystems Heidelberg Gmbh Scanmikroskop mit Manipulationslichtstrahl
US20040174523A1 (en) * 2003-03-03 2004-09-09 Till Photonics Gmbh Apparatus for total internal reflection microscopy
WO2004077121A1 (en) * 2003-02-28 2004-09-10 Till I.D. Gmbh Microscope system with beam hub unit having beam multiplexer for alternatively selecting beam ports
DE10328308A1 (de) * 2003-06-23 2005-01-27 Till I.D. Gmbh Vorrichtung zum Ablenken eines Strahls

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US3490828A (en) * 1967-04-24 1970-01-20 Hertel & Reuss Werk Fur Optik Microscope with means for varying the direction of light to the object to be viewed
US4060322A (en) * 1974-07-10 1977-11-29 Canon Kabushiki Kaisha Image information handling device
US4674845A (en) * 1984-09-01 1987-06-23 Canon Kabushiki Kaisha Stereoscopic microscope with means for varying stereoscopic viewing angle
DE3711843A1 (de) * 1987-03-09 1988-09-22 Leitz Ernst Gmbh Revolver-dreheinrichtung fuer optische bauelemente sowie verfahren zur regelung der drehzahl derselben
US5532873A (en) * 1993-09-08 1996-07-02 Dixon; Arthur E. Scanning beam laser microscope with wide range of magnification
US5706128A (en) * 1995-09-11 1998-01-06 Edge Scientific Instrument Company Llc Stereo microscope condenser
US6787745B2 (en) * 2001-01-09 2004-09-07 Avanex Corporation Fiber optic signal detector with two switchable input channels
JP4414722B2 (ja) * 2003-10-15 2010-02-10 オリンパス株式会社 レーザー顕微鏡

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19960807C1 (de) * 1999-12-16 2001-02-15 T I L L Photonics Gmbh Vorrichtung zum Ablenken eines Strahls
DE10233549A1 (de) * 2002-07-23 2004-02-12 Leica Microsystems Heidelberg Gmbh Scanmikroskop mit Manipulationslichtstrahl
WO2004077121A1 (en) * 2003-02-28 2004-09-10 Till I.D. Gmbh Microscope system with beam hub unit having beam multiplexer for alternatively selecting beam ports
US20040174523A1 (en) * 2003-03-03 2004-09-09 Till Photonics Gmbh Apparatus for total internal reflection microscopy
DE10309269A1 (de) * 2003-03-03 2004-09-23 Till Photonics Gmbh Vorrichtung für Totale Interne Reflexions-Mikroskopie
DE10328308A1 (de) * 2003-06-23 2005-01-27 Till I.D. Gmbh Vorrichtung zum Ablenken eines Strahls

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006039896A1 (de) * 2006-08-25 2008-02-28 Till I.D. Gmbh Mikroskop
DE102006039896B4 (de) * 2006-08-25 2008-05-21 Ludwig-Maximilian-Universität Mikroskop
WO2009120336A1 (en) 2008-03-26 2009-10-01 Yale University Optical system that selectively provides either of a collimated light beam or a convergent light beam
EP2257845A1 (de) * 2008-03-26 2010-12-08 Yale University Optisches system mit selektiver bereitstellung kollimierter oder konvergenter lichtstrahlen
EP2257845A4 (de) * 2008-03-26 2012-04-25 Univ Yale Optisches system mit selektiver bereitstellung kollimierter oder konvergenter lichtstrahlen
EP2913699A1 (de) * 2008-03-26 2015-09-02 Yale University Optisches System mit selektiver Bereitstellung kollimierter oder konvergenter Lichtstrahlen
US8456725B2 (en) 2008-03-26 2013-06-04 Yale University Optical system that selectively provides either of a collimated light beam or a convergent light beam
DE102010041426A1 (de) * 2010-09-27 2012-05-03 Siemens Aktiengesellschaft Messeinheit und Verfahren zur optischen Untersuchung einer Flüssigkeit zur Bestimmung einer Analyt-Konzentration
EP2666049A1 (de) * 2011-01-20 2013-11-27 Applied Precision, Inc. Lichtabtastsysteme
EP2666049A4 (de) * 2011-01-20 2014-06-25 Ge Healthcare Bio Sciences Lichtabtastsysteme
US9645374B2 (en) 2011-01-20 2017-05-09 Ge Healthcare Bio-Sciences Ab Light-scanning systems
DE102011017078A1 (de) * 2011-04-15 2012-10-18 Leica Microsystems Cms Gmbh Weitfeld-Mikroskop-Beleuchtungssystem und Weitfeld-Beleuchtungsverfahren
US9239456B2 (en) 2011-04-15 2016-01-19 Leica Microsystems Cms Gmbh Widefield microscope illumination system and widefield illumination method
DE102011017078B4 (de) * 2011-04-15 2019-01-31 Leica Microsystems Cms Gmbh Weitfeld-Mikroskop-Beleuchtungssystem, Verwendung desselben und Weitfeld-Beleuchtungsverfahren
EP2697678B1 (de) * 2011-04-15 2019-12-11 Leica Microsystems CMS GmbH Weitfeld-mikroskop-beleuchtungssystem und weitfeld-beleuchtungsverfahren
US9690086B2 (en) 2013-11-20 2017-06-27 Leica Microsystems Cms Gmbh Wide-field microscope illumination system and wide-field illumination method
EP3341710A4 (de) * 2015-08-26 2019-04-24 The United States of America, as represented by The Secretary, Department of Health & Human Services Systeme und verfahren für nichtlineare optische mehransichtsbildgebung zur verbesserung des signal-rausch-verhältnisses und der auflösung in der punktabtastenden multifotonen-mikroskopie
US11041807B2 (en) 2015-08-26 2021-06-22 The United States Of America, As Represented By The Secretary, Department Of Health And Human Services Systems and methods for multi-view nonlinear optical imaging for improved signal-to-noise ratio and resolution in point scanning multi-photon microscopy

Also Published As

Publication number Publication date
US7573635B2 (en) 2009-08-11
US20070153373A1 (en) 2007-07-05

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
R081 Change of applicant/patentee

Owner name: FEI COMPANY, HILLSBORO, US

Free format text: FORMER OWNER: TILL I.D. GMBH, 82166 GRAEFELFING, DE

Owner name: FEI COMPANY, HILLSBORO, US

Free format text: FORMER OWNERS: FEI ELECTRON OPTICS B.V., EINDHOVEN, NL; FEI MUNICH GMBH, 82166 GRAEFELFING, DE

R082 Change of representative

Representative=s name: VOSSIUS & PARTNER PATENTANWAELTE RECHTSANWAELT, DE

R002 Refusal decision in examination/registration proceedings
R003 Refusal decision now final