DE102006004417B8 - Verfahren zum unbeaufsichtigten Training eines nicht-linearen und nicht-lokalen Filters - Google Patents

Verfahren zum unbeaufsichtigten Training eines nicht-linearen und nicht-lokalen Filters Download PDF

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Publication number
DE102006004417B8
DE102006004417B8 DE102006004417A DE102006004417A DE102006004417B8 DE 102006004417 B8 DE102006004417 B8 DE 102006004417B8 DE 102006004417 A DE102006004417 A DE 102006004417A DE 102006004417 A DE102006004417 A DE 102006004417A DE 102006004417 B8 DE102006004417 B8 DE 102006004417B8
Authority
DE
Germany
Prior art keywords
linear
local filter
unattended
training
unattended training
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE102006004417A
Other languages
English (en)
Other versions
DE102006004417B4 (de
DE102006004417A1 (de
Inventor
Frank Herold
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yxlon International X Ray GmbH
Original Assignee
Yxlon International X Ray GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yxlon International X Ray GmbH filed Critical Yxlon International X Ray GmbH
Priority to DE102006004417A priority Critical patent/DE102006004417B8/de
Publication of DE102006004417A1 publication Critical patent/DE102006004417A1/de
Publication of DE102006004417B4 publication Critical patent/DE102006004417B4/de
Application granted granted Critical
Publication of DE102006004417B8 publication Critical patent/DE102006004417B8/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformation in the plane of the image
    • G06T3/40—Scaling the whole image or part thereof
    • G06T3/4007—Interpolation-based scaling, e.g. bilinear interpolation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/20—Image enhancement or restoration by the use of local operators
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/30—Noise filtering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
DE102006004417A 2006-01-31 2006-01-31 Verfahren zum unbeaufsichtigten Training eines nicht-linearen und nicht-lokalen Filters Expired - Fee Related DE102006004417B8 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE102006004417A DE102006004417B8 (de) 2006-01-31 2006-01-31 Verfahren zum unbeaufsichtigten Training eines nicht-linearen und nicht-lokalen Filters

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102006004417A DE102006004417B8 (de) 2006-01-31 2006-01-31 Verfahren zum unbeaufsichtigten Training eines nicht-linearen und nicht-lokalen Filters

Publications (3)

Publication Number Publication Date
DE102006004417A1 DE102006004417A1 (de) 2007-08-09
DE102006004417B4 DE102006004417B4 (de) 2009-03-19
DE102006004417B8 true DE102006004417B8 (de) 2009-06-25

Family

ID=38282024

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102006004417A Expired - Fee Related DE102006004417B8 (de) 2006-01-31 2006-01-31 Verfahren zum unbeaufsichtigten Training eines nicht-linearen und nicht-lokalen Filters

Country Status (1)

Country Link
DE (1) DE102006004417B8 (de)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001063236A2 (de) * 2000-02-05 2001-08-30 Yxlon International X-Ray Gmbh Verfahren zur automatischen gussfehlererkennung in einem prüfling

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001063236A2 (de) * 2000-02-05 2001-08-30 Yxlon International X-Ray Gmbh Verfahren zur automatischen gussfehlererkennung in einem prüfling

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
CHANG, Chuan-Yu; CHANG, Jia-Wei; JENG, Mu Der: >>An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection<<, 2005, IEEE Robots and Automation, Barcelona, S. 3000-3005, ISBN: 0-7803-8914-X *
HEROLD, F. BAVENDIEK, K. GRIGAT, R.: >>A Third Generation Automatic Defect Recognition System<<, 16th World Conference on Nondestructive Testing (WCNDT'04),Montreal-Canada, Nov 2004, Vol.9,No.11 <Im Internet: http://www.ndt.net/abstract/wcndt 2004/192.htm> HEROLD, Frank GRIGAT, Rolf-Rainer: >>A New Analysis and Classification Method for Automatic Defect Recognition in X-Ray Images of Castings<<, NDT.net - October 2002, Vol. 7, No. 10 <Im Internet: http://www.ndt.net/article/ecndt02/207/207. htm> CHANG, Chuan-Yu CHANG, Jia-Wei JENG, Mu Der: >>An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection<<, 2005, IEEE Robots and Automation, Barcelona, S. 3000-3005, ISBN: 0-7803-8914-X
HEROLD, F.; BAVENDIEK, K.; GRIGAT, R.: >>A Third Generation Automatic Defect Recognition System<<, 16th World Conference on Nondestructive Testing (WCNDT'04),Montreal-Canada, Nov 2004, Vol.9,No.11 <Im Internet: http://www.ndt.net/abstract/wcndt 2004/192.htm> *
HEROLD, Frank; GRIGAT, Rolf-Rainer: >>A New Analysis and Classification Method for Automatic Defect Recognition in X-Ray Images of Castings<<, NDT.net - October 2002, Vol. 7, No. 10 <Im Internet: http://www.ndt.net/article/ecndt02/207/207. htm> *

Also Published As

Publication number Publication date
DE102006004417B4 (de) 2009-03-19
DE102006004417A1 (de) 2007-08-09

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DE102006004417B8 (de) Verfahren zum unbeaufsichtigten Training eines nicht-linearen und nicht-lokalen Filters

Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8396 Reprint of erroneous front page
8364 No opposition during term of opposition
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee