DE102005063373A1 - Solar illumination simulator used in measuring solar cell opto-electronic characteristics, comprises pulsed high intensity source with reflective dynamic spectral mask - Google Patents

Solar illumination simulator used in measuring solar cell opto-electronic characteristics, comprises pulsed high intensity source with reflective dynamic spectral mask Download PDF

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Publication number
DE102005063373A1
DE102005063373A1 DE102005063373A DE102005063373A DE102005063373A1 DE 102005063373 A1 DE102005063373 A1 DE 102005063373A1 DE 102005063373 A DE102005063373 A DE 102005063373A DE 102005063373 A DE102005063373 A DE 102005063373A DE 102005063373 A1 DE102005063373 A1 DE 102005063373A1
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DE
Germany
Prior art keywords
solar cell
solar
high intensity
spectral
spectral mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102005063373A
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German (de)
Inventor
Ralf Adelhelm
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of DE102005063373A1 publication Critical patent/DE102005063373A1/en
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21S—NON-PORTABLE LIGHTING DEVICES; SYSTEMS THEREOF; VEHICLE LIGHTING DEVICES SPECIALLY ADAPTED FOR VEHICLE EXTERIORS
    • F21S8/00—Lighting devices intended for fixed installation
    • F21S8/006—Solar simulators, e.g. for testing photovoltaic panels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0437—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using masks, aperture plates, spatial light modulators, spatial filters, e.g. reflective filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G01J2001/083—Testing response of detector
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

This method produces a beam simulating solar radiation from a known high intensity source, e.g. a pulsed xenon tube. The beam is incident on solar cells, for testing purposes. The method of beam path guidance in the dispersion unit acts in effect, as a dynamic spectral mask. A number of mirrors lying close together can be moved. In accordance with the instantaneous location of each mirror, a fraction of the spectrally-dispersed beam is reflected into an exit beam path, for further use (i.e. incidence on the solar cell under test). The moving mirror system resembles a known digital light processor (DLP) in function. It is, however, suitable for the extended spectral range and intensities appropriate for solar cell testing. It withstands the very high beam intensity of the solar simulator. The mirror(s) are moved at such a velocity or rotary speed, that the desired spectral masking is achieved over time. This movement velocity is related to an e.g. 5 ms irradiation interval from the solar simulator. In this way the spectral irradiation is varied in a desired time-resolved manner. Dynamic spectrometric measurements are taken simultaneously with solar cell output measurements. The output is e.g. the solar cell short circuit current. All data is sent for further processing. Reference cells are used in conjunction with the multiplexing methods. An independent claim IS INCLUDED FOR the corresponding method.
DE102005063373A 2005-05-06 2005-05-06 Solar illumination simulator used in measuring solar cell opto-electronic characteristics, comprises pulsed high intensity source with reflective dynamic spectral mask Withdrawn DE102005063373A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102005021437 2005-05-06

Publications (1)

Publication Number Publication Date
DE102005063373A1 true DE102005063373A1 (en) 2007-05-16

Family

ID=37982763

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102005063373A Withdrawn DE102005063373A1 (en) 2005-05-06 2005-05-06 Solar illumination simulator used in measuring solar cell opto-electronic characteristics, comprises pulsed high intensity source with reflective dynamic spectral mask

Country Status (1)

Country Link
DE (1) DE102005063373A1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2413019A1 (en) * 2009-03-27 2012-02-01 Abengoa Solar New Technologies, S.A. Variable-spectrum solar simulator
DE102011052046A1 (en) 2011-07-21 2013-01-24 Wavelabs Solar Metrology Systems Gmbh Device for generating a homogeneously illuminated surface and corresponding method
WO2015023348A1 (en) * 2013-08-15 2015-02-19 The Boeing Company Spectral balancing technique
CN111911841A (en) * 2020-08-17 2020-11-10 长春理工大学 Automatic irradiation uniformity adjusting system for collimation type solar simulator
CN112003564A (en) * 2020-09-18 2020-11-27 北京航空航天大学 Distributed photovoltaic system branch power abnormity early warning method based on intelligent terminal

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2413019A1 (en) * 2009-03-27 2012-02-01 Abengoa Solar New Technologies, S.A. Variable-spectrum solar simulator
EP2413019A4 (en) * 2009-03-27 2014-04-02 Abengoa Solar New Tech Sa Variable-spectrum solar simulator
DE102011052046A1 (en) 2011-07-21 2013-01-24 Wavelabs Solar Metrology Systems Gmbh Device for generating a homogeneously illuminated surface and corresponding method
WO2013011008A1 (en) 2011-07-21 2013-01-24 Wavelabs Solar Metrology Systems Gmbh Device and method for generating a homogeneously illuminated surface
WO2015023348A1 (en) * 2013-08-15 2015-02-19 The Boeing Company Spectral balancing technique
US20150049386A1 (en) * 2013-08-15 2015-02-19 The Boeing Company Spectral balancing technique
US9910266B2 (en) * 2013-08-15 2018-03-06 The Boeing Company Spectral balancing technique
CN111911841A (en) * 2020-08-17 2020-11-10 长春理工大学 Automatic irradiation uniformity adjusting system for collimation type solar simulator
CN111911841B (en) * 2020-08-17 2024-01-19 长春理工大学 Automatic irradiation uniformity adjusting system for collimation type solar simulator
CN112003564A (en) * 2020-09-18 2020-11-27 北京航空航天大学 Distributed photovoltaic system branch power abnormity early warning method based on intelligent terminal

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