DE102005045748A1 - Measuring device e.g. for measuring work piece, has height measurement h1 having first surface and first surface deviating second surface with first lighting unit provided and light line with width -B1 projects on first surface - Google Patents

Abstract

The measuring device has a height measurement h1 having a first surface (1.1) and a first surface deviating second surface (1.2) with a first lighting unit (2) provided. A light line (2.1) with a width -B1 projects on the first surface. A camera (3) records the light line projected on the workpiece (1) for evaluation by an image processing system (6). The lighting unit is provided so that the first surface is lit up more intensively than the second surface and the height measurement and length (l1) of the first surface of project part (L1.1) of the light line is determined. An independent claim is included for a method.

Description

The invention relates to a measuring device for measuring a workpiece having at least one to be measured, a height h ₁ having a first surface and at least one deviating from the first surface second surface with a first illumination unit, the at least one light line having a width b ₁ on the projected first surface, and at least a first camera for detecting the light line projected onto the workpiece for the purpose of evaluation thereof by an image processing system.

The Method and the measuring device are used to measure workpieces with Profiles. workpieces in the context of the invention are z. B. steel, aluminum or plastic endless profiles, the be obtained in the rolling or extrusion process, but also their divided individual pieces, but especially floorboards with their profiles on the side edges.

It Methods and devices are known in the context of the known Line triangulation one or more lines of light on profiles of workpieces project and these lines in the sense of a three-dimensional geometry acquisition evaluate.

Also for the Measurement of the side edges of floor panels are facilities known that project a laser line on the profile and the projection evaluate this line in the sense of a geometry measurement. These Facilities allow one around the projection of the line Expected area to determine within which the projection may come to lie in good case. Do not use these facilities to consider the different calibration formulas which vary depending on the location of the line projection detail would and can hence the dimensions only inaccurate capture.

Of the Invention is based on the object, a measuring device such train and arrange that optimal image data is generated and an optimal evaluation of the same is guaranteed.

The object is achieved according to the invention characterized in that the lighting unit is designed and arranged such that the first surface is intensively illuminated than the second surface and at least one of the height dimension h ₁ corresponding length l ₁ of a projected to the first surface portion of the light line is determined.

hereby is achieved that resulting from the projected light line Image information concerning the aforementioned height is exhausted. Depending on the training of the workpiece can in addition to those determined by the known triangulation method moderation further dimensions determined, in particular due to the known orientation and arrangement of the lighting device were not determinable.

Especially allows the device according to the invention in addition to the precise Calibration of the depth measurement - the well-known triangulation method - with the same equipment to perform a simultaneous recording of the height dimensions of the profile. Of Furthermore, a measurement of a so-called "banana", that is a curvature transverse to the longitudinal direction, with the device according to the invention even then possible if the profile during the passage repeatedly changed the distance to the measuring device. These Measuring device is mainly in the measurement of the lateral Profiles in floor panels advantageous.

The inventive extension This method consists in that the horizontal edge pieces of Exploits light line projection, which then adjust when the to be measured profile z. B. a kink to the rear - from the Camera seen - makes and goes into a horizontal plane, the one piece goes far to the rear or is offset.

At these places are created in the projection of the light line subregions, their boundaries are horizontal or nearly horizontal.

Missing one the vertical distance z. B. between the horizontal boundary one of these subareas and z. B. the horizontal boundary, the resulting from the termination of the light line at the upper edge of the face, so you can according to specification a previously determined calibration factor directly a height dimension of the profile win.

critical is that the horizontal measurements in the image, which provide depth information, and the vertical measurements that provide altitude information due to the different measuring principles a different algorithmic conversion of the raw result, d. H. of the measured Distance in pixels, condition to z. B. an output of the measured value in mm.

While the height measurement (vertical) is essentially (for example, at approximately telecentric optics) with a linear calibration factor In principle, a non-linear function should be used for the depth measurement. In practice, in the profile measurement of floor panels because of the small tolerance of about 0.01 mm for the depth difference and for the depth measurement, a linear calibration is possible because there is an approximately linear characteristic in the interesting differential measuring range.

One Another advantage of the method according to the invention consists in Determination of the so-called "banana", ie a curvature in Longitudinal direction of the Profile. This is especially true in the measurement of profiled Floor panel side edges in demand. Could do this you simply have several absolute depth measurements along the profile carry out, order from these in the form of a linear regression z. B. maxima and Minima of the deviation from the ideal line to win, however, is this method is insufficient, as the measurements by vibration and jerking of the plate when going through in front of the camera, across the general direction of movement, falsified can be. It is therefore a reference surface provided, fixed with the conveyor connected is. In each camera image is by means of horizontal measuring structures the current distance of the profile to the reference surface is calculated and the difference deducted to the setpoint from the aforementioned measurement, the for the Determination of the outer contour - the so-called "banana survey" - is used become the adulterating influences of the transport medium eliminated.

It is also advantageous for this purpose that an angle of incidence α _{1 of} the light line on the first surface can be set between 0 ° and 60 °. Thus, an optimal illumination of the first surface is ensured, so that the resulting camera image or the resulting image contour provides an optimal measurement result.

An additional possibility, according to a development, that the illumination unit is designed and arranged such that the angle of incidence α _{1 of} the light line on the first surface of an incident angle α ₂ on the second surface deviates by more than 10 °. Due to the different angles of incidence, a different illumination intensity results, which is necessary in particular for the recognition and the subsequent evaluation of the resulting image contours. The greater the difference in the illumination intensity of adjacent areas, the more accurate the desired measure can usually be determined. Especially with transition surfaces such as radii, which must be taken into account in the measurement, an illumination according to the invention of adjacent interfaces is necessary for optimal evaluation.

Further, it is advantageous that simultaneously with the first surface, a third surface is illuminated, which has a height h ₂ , and an angle of incidence α _{3 of} the light line on the third surface between 0 ° and 60 ° is adjustable. If several subareas to be measured with a similar orientation are optimally illuminated at the same time, while the adjoining boundary surfaces are correspondingly poorly illuminated, a simultaneous measurement of the aforementioned subareas is possible.

It is also advantageous that the illumination unit is designed and arranged such that the light line has a triangulation angle γ of more than 20 ° with respect to the second surface having a depth dimension t ₂ to be measured, wherein between the part projected onto the first surface (L _1.1 ) and a projected onto the third surface portion (L _1.2 ) of the light line due to the triangulation angle γ a lateral offset v ₁ with v ₁ = t ₁ / tan γ can be generated. In addition to the inventive detection and determination of the height dimension of the different surfaces can be determined simultaneously using the same light line and taking advantage of the triangulation above-mentioned depth, ie the offset between two surfaces. The illumination or illumination according to the invention and the resulting image contour ensure optimum determination of the depth dimension or the offset, in contrast to the previously customary triangulation methods in which usually only one illumination unit is used that does not take into account the light intensity on the various adjacent surfaces.

It is advantageously provided that the width b _{1 of} the light line is at least as large as the offset v ₁ plus the depth dimension t ₂ and / or that for the ratio of the width b _{1 of} the light line to the height to be measured h a value between 0.2 and 2 is provided or adjustable. The inventive width of the light line ensures an evaluation of the resulting image contour based on an integration process over the surface of this contour, so that a very accurate evaluation of the height dimensions on the one hand and the offset between the two contours due to the Triangulationswinkels on the other hand is guaranteed. The width b ₁ should correspond at least to the maximum occurring displacement of the line in the direction of the profile plus the width of the arranged transversely to the direction measurement structure, so probably the arranged transversely to the running direction and arranged along the direction of measurement on the projection one and the same light line are.

In connection with the design and arrangement according to the invention, it is advantageous that a second light line is provided, wherein at least for the light line of the triangulation angle γ to the workpiece is providable. Depending on the design of the workpiece, the use of a second light line, which is aligned according to the one or more surfaces to be measured, is advantageous.

Advantageous it is further that the camera has an optical axis and the lighting unit has a main beam direction S, wherein the optical axis can be aligned approximately normal to the surface and between the optical axis and the main beam direction S an angle δ provided is that is so big like the triangulation angle γ. Thus, an evaluation of the determined contours on the one hand and on the other hand, guarantees a triangulation procedure.

Besides that is It is advantageous that a conveyor for the workpiece is provided, which is the workpiece in the direction of a main conveying direction F linearly past the camera and the lighting unit, wherein between the main conveying direction F and an plane spanned by the light line with an angle the size 90 ° - γ provided is. Thus, you can the workpieces in the current process according to their length over several positions or positions be measured and several workpieces are checked one after the other. By the angle according to the invention at the same time the triangulation method is applicable.

Further It is advantageous that the image processing system has a monitor has and the contour of the respective projected onto the workpiece Part of the light line with respect the crowd l and v can be evaluated and the evaluation can be displayed on the monitor. The above the lighting according to the invention projected, generated by the light line on the respective sub-areas Contours are over the image processing system displayed on a monitor, wherein the user in advance with the help of the monitor the evaluation logic can define.

there it is advantageous that by means of the image processing system on the monitor, a structure of measuring points can be generated, at least a part of the contour of the respective projected part of the light line or corresponds to the brightness levels generated on the workpiece, wherein a calibration or learning mode is provided, which is an optical overlay ensures the contour of the parts with the measuring point structure. The measurement point structure is based on the aforementioned area integration method generated and corresponds to the critical and evaluated pixels especially in the transition area light / dark, ie in the edge area of the respective contour. In calibration mode can different factors, especially the angle between the optical Axis of the camera and the contour to be evaluated or the contour underlying subarea, the workpiece material or its optical properties, the light used and the Position of the light line are taken into account.

Finally is It is advantageous that for the purpose of determining the dimensions l and v the measuring point structure can be calibrated and evaluated, wherein for the dimensions l and v different Calibration method and / or different Kalibrierfak factors providable are. While in the determination of height measurements in essence with z. B. approximately telecentric Optics can be used with a linear calibration factor, is for the depth measurement based on the triangulation in principle non-linear calibration factor or a non-linear function in Bring approach, so for the evaluation of the contour according to the invention different calibration or factors are provided. In practice, when profiling of floorboards because of the small tolerance dimensions, although also for the depth measurement a linear calibration factor applicable in the resulting differential measuring range is an approximately linear characteristic. Nevertheless, this calibration factor differs from that for the altitude measurement, so that even in this case a different calibration for Capture of the two dimensions necessary is.

Advantageous It is also this that the image processing system with respect Dimensions h and v has tolerance values beyond which a signal can be generated and / or on the workpiece can be applied. Especially in the measurement of large workpieces such as floorboards is the application of an optical signal in the form of a color mark for sorting out or sorting good and bad parts advantageous. For smaller workpieces sorting can be done by compressed air nozzles, wherein the aforementioned signal relates to the control of the compressed air nozzle.

Finally, it is advantageous that the conveying device has at least one first reference surface, on which the light line can be projected, and a distance dimension a formed between the reference surface and a surface of the workpiece can be determined. The depth gauge according to the invention ensures the determination and detection of a curvature, in particular in the case of elongate workpieces within the conveying plane, a so-called "banana", since the profile edges of adjacent planks do not abut properly, especially in the case of floor planks It is generally known to carry out several absolute depth measurements along the profile From this, in the form of a linear regression, to obtain the different maxima and minima of the deviation from the ideal line, however, this method is inadequate insofar as the measurement by vibration and jerking of the plate during Transporting can be falsified in particular transversely to the actual direction of movement. According to the invention, the distance of the workpiece from the reference surface is calculated, so that an offset or a movement of the conveyor can be taken into account in the depth dimension obtained as described above. This eliminates distorting influences of the transport medium. In each camera image, the current distance of the profile from the reference surface is calculated by means of horizontal measuring structures, and the difference to the desired value is subtracted from the measured value, which is used to determine the outer contour.

Further It is advantageous that an incremental encoder is provided, the Ensuring the determination of the feed of the workpiece, and taking into account of the feed and the distance a the curvature of the workpiece can be determined. Considering the workpiece position Can in particular for long workpieces, the curvature of the workpiece on the Workpiece length determined and displayed.

Advantageous It is also that the lighting unit is an LED light source Range of variation regarding the wavelength of the emissable light less than 10% is preferably in one range with one wavelength between 700 nm and 1200 nm. With a very small fluctuation range can the external influences the measurement will be greatly reduced. Depending on the ambient emission is to choose a frequency their share is possible is low. The choice of the light frequency is with consideration on the optimal illumination of the surfaces of great importance. In particular depending from the workpiece to be measured or the material and the surface condition of the workpiece is an appropriate selection of the frequency range for that too using light of advantage.

there It is advantageously provided that in addition to opposite the first measuring device to the workpiece or to the conveyor a second measuring device is provided. It is also advantageous that the conveyor a second reference surface in the measuring range of the second measuring device, by means of a second distance measure a 'can be determined, and that the distance measure a determined using the first measuring device the second distance measure a 'determined with the second measuring device can be correlated are. By the correlation of the two distance measures can a movement of the workpiece on the conveyor and a movement of the conveyor and in the assessment of the different differential measures in particular with consideration on the given banana curvature be taken into account.

The object is also achieved by a method for a device according to one of the preceding claims for measuring workpieces having at least one to be measured, a height h ₁ having first surface, wherein the first surface is illuminated by projecting the light line at least partially and at least the part (L _1.1 ) of the light line is detected by the camera for the purpose of evaluation, wherein the height h _{1 of} at least the first surface is determined by determining the length l ₁ of the projected on the first surface portion of the light line.

Furthermore, it is advantageous that in addition to the angle of incidence α _{1 of} the projected light line, a triangulation angle γ is provided, wherein the triangulation angle γ has a value between 20 ° and 65 °.

Finally, it is advantageous that the light line is projected onto the second surface and the third surface of the workpiece and the offset v ₁ generatable in a direction transverse to the direction of projection of the light line between the part of the light line on the first surface and the part of the light line the third surface is determined and that the depth dimension t _{2 of} the second surface is determined, wherein t _{2 is} calculated over t ₂ = v ₁ tan γ.

Further it is advantageous that the workpiece transversely to the direction of projection passed by the measuring device becomes.

Advantageous it is further that the profile projected onto the workpiece Light line with respect to Dimensions l and v over the image processing system evaluated and the evaluation of the Monitor is displayed.

Besides that is it is advantageous that by means of the image processing system on the Monitor the profile of the light line or the generated brightness levels on the workpiece at least partially corresponding contour of each illuminated Parts is detected. Also, the structure is made up of measuring points on the Monitor generates the contour of each part of the light line equivalent. The respective contour and the corresponding measuring point structure are superimposed on the monitor and the dimensions l and v are determined.

there It is advantageous that the correlation between the measuring point structure underlying measurement points and the contour of the parts and the altitude h lying measuring points and the depth measurements t underlying measurement points be calibrated differently.

After all, it is beneficial that a potash is displayed for the depth dimensions t and the height dimensions h and the calibration information is automatically assigned to the previously generated measuring point structure.

Advantageous In addition, it is also the case that the distance measure a designed as a depth measure lies between the reference surface the measuring device and the surface of the workpiece is determined.

Besides that is it is advantageous that opposite to the surface the second distance measure a 'between the second reference surface the conveyor and another area of the workpiece is determined.

Further it is advantageous that the distance measure a and the second distance measure a 'are correlated and a curvature of the workpiece with regard to one Transport level is determined.

It is advantageous that the width b _{1 of} the light line is adjusted and / or varied.

Finally is it is advantageous that the light emitted by the lighting unit Frequency range is set and / or varied.

method and device for measuring profiles, wherein a profile means a conveyor in front of at least one electronic camera and at least one illumination is passed and that at least one lighting than structured lighting for the Line triangulation performed is that projects a line across the direction of travel on the profile, that the axis of the line projector in the plane of the running direction the continuous profile forms an angle to the camera axis, that an image processing system is connected to the camera, that generated by the lighting and captured by the camera Evaluate light effects on the profile and display on one as well connected monitor that performs in a teach mode Camera image is displayed on the monitor, and in the camera image superimposed measuring structures via The illustration of the light projection are laid out that the outer edges of the Light effects in the image determined with the help of the measuring structures and their distances be determined that the measuring structures for measuring the tread depth the Measure edges running transversely to the direction of travel of the profile while the measuring structures for measuring the height dimensions of the profile measure the edges, the longitudinal the running direction that provided a user interface is, which allows two in the picture through measurement structures and their linking determined Coordinates and the resulting distance optionally with a calibration information for the Depth or height measurement to provide the previously generated measurement structures in another remain assigned to automated call that at least one Calibration information for distances in the direction of the profiles and at least one calibration information for distances across can be entered to the direction of the profiles that for each measuring structure Abstandstole tolerances can be entered, when exceeded a Signal is generated. That a projected light line has a width which has at least the maximum occurring displacement the line in the direction of the profile plus the width of the transverse to Direction arranged measuring structures, and that both the transverse to the direction as well as arranged longitudinally to the direction Measurement structures on the projection one and the same light line arranged are. That the measuring structures for the height dimensions of the profile over light edges be placed longitudinally the running direction and due to the triangulation situation in the picture as paragraphs the light line projection arise. that at least one structured Lighting a reference surface the conveyor captured, stuck with the conveyor connected is that at least one horizontal measuring structure over the Projection of the line is placed on the reference surface and the distance between the reference surface and at least one profile area is measured by the distance in the picture between the edge of the light on the reference edge and at least a light edge in the profile is evaluated. That as soon as the starting area of the profile to be measured in the effective range of the camera-projector arrangement arrives, a start signal is generated that the feed of the profile is registered with an incremental encoder that takes several pictures while the run of the profile take place that in the successively absorbed Images each depth measurements between reference surface and Profile done and that from these measurements and the associated Incremental encoder feed information the curvature of the incremental encoder Profile is measured in a plane parallel to the spanned Plane between camera and projector axis. That about the connected image processing system the curvature of the profile is displayed in a graphical representation. That the Line projector with a LED light source works.

Further Advantages and details of the invention are in the claims and explained in the description and shown in the figures. It shows:

1 a perspective schematic diagram of a workpiece with groove and a lighting device with light line and a camera;

2 a workpiece according to 1 with a second illumination device with a second line;

3 a representation of the monitor after 1 ;

4 a schematic diagram with conveyor in the view from above;

5 a perspective view of a workpiece with groove and light line;

6 a monitor representation of the component according to 5 ,

At an in 1 represented workpiece 1 it is a floorboard, which has a chamfer or groove shown here in sections on its side edge. The floorboards 1 is doing about a conveyor, not shown 5 moved in the main conveying direction F shown here.

For the purpose of measuring the groove or chamfer, this is from the lateral direction through a lighting unit 2 illuminated, which is a line of light 2.1 on the workpiece 1 projected. The workpiece 1 has three partial surfaces forming the groove 1.1 to 1.3 on, of which the first part surface 1.1 and the third partial area 1.3 have the same orientation, whereas the second part 1.2 perpendicular to the two previously mentioned sub-areas 1.1 . 1.3 is aligned. The lighting unit 2 is positioned such that its main beam direction is at a main incident angle α ₁ to the first sub-area 1.1 and at the angle of incidence α ₃ on the third face 1.3 incident. The angles α ₁ and α ₂ are approximately 45 °. Due to the relative position of the second partial area 1.2 is the angle of incidence α ₂ between the vertical on the second partial surface 1.2 and the main steel direction S about 90 °, so that the second partial surface 1.2 is illuminated weaker than the first and third partial area 1.1 . 1.3 that belong to the lighting unit 2 are aligned.

The light line 2.1 is also projected in a triangulation angle γ, so that due to the distance t ₂ between the first partial surface 1.1 and the third subarea 1.3 a lateral offset v ₁ between the on the respective sub-areas 1.1 . 1.3 By the light line projected contours L _1.1 and L _1.2 results.

Laterally to the workpiece 1 is a camera for evaluating the profile 3 provided the the projected light line 2.1 how they work from the workpiece 1 reflected, captured. The camera 3 is arranged such that it optimally detects the individual contours L _1.1 and L _1.3 on the one hand and the relative position between these two contours L _1.1 and L _1.3 , ie the lateral intent v ₁ .

The first part surface 1.1 has a height h ₁ , so that for the contour L _1.1 on the first face 1.1 a corresponding length l ₁ results. The third subarea 1.3 has a height h ₃ , so that the length l ₃ results for the contour L _1.3 projected thereon.

Augrund the triangulation angle γ and the distance t ₂ between the first and the third partial surface 1.1 . 1.3 results between the two contours L _1.1 and L _1.3 offset v ₁ , which also by the camera 3 is detected.

According to 2 are two lighting units 2 . 2 ' one of which has a triangulation angle γ and the other 2 ' one perpendicular to the first and third part surface 1.1 . 1.3 arranged main beam direction S has. The use of two lighting units 2 . 2 ' may possibly be due to the geometry of the workpiece 1 , in particular with regard to the different height dimensions h ₁ , h ₃ and the depth to be measured t ₂ depending on the workpiece 1 to be required. The second lighting unit 2 ' generates a light line 2.1 'with the width b ₂ .

3 puts a monitor 4 representing the two contours L _1.1 , L _1.3 with the lateral offset v ₁ according to FIG 1 shows. For the purpose of evaluating this offset v ₁ on the one hand and the height of the two contours L _1.1 , L _1.3 on the other hand, superimposed on the two contours L _1.1 , L _1.3 each have a measuring structure S _1.1 , S _1.3 with different measuring lines 8th . 8th' . 7 . 7 ' generated whose pixels are evaluated according to the corresponding brightness level. As soon as the brightness value of the respective pixel along the respective measuring line 7 . 8th exceeds or falls below a value, this pixel is used as a measuring point for the determination of the transition light / dark and according to 3 preferably marked as a star.

In the middle partial area is a measuring structure S with several measuring lines 7 . 7 ' superimposed on the contour L _1.1 , L _1.3 , which serve to detect the two horizontal transitions to the right and left of the bright contour L _1.1 , L _1.3 to the dark background and to determine these transition coordinates. Advantageously, a center point M _1.1 , M _1.3 between the transition coordinates is then calculated in each case in order to obtain an independence from the light intensity in the calculation of the offset v ₁ , which would inevitably be present if only one transition or one edge of the contour L _1.1 , L _{1.3 was} evaluated and used as the basis for determining the offset v ₁ . The geometric horizontal offset v _{1 of} these two centers M _1.1 , M _1.3 corresponds to the offset of the two contours L _1.1 , L _1.3 . From this, taking into account the triangulation angle γ, the depth dimension t _{2 of} the groove can be calculated.

If the number of pixels between the centers M _1.1 , M _{1.3 is} calibrated with a factor dependent on the lens focal length, the measuring distance and the angle between the camera axis and the projector axis, the depth of the groove can be calculated using known algorithms. The width b _{1 of} the light line 2.1 is of essential importance since, for the purpose of determining the brightness threshold value on the one hand, and the position of the measurement line 8th . 8th' On the other hand, an area integration method is used.

Next to them are measuring lines 8th . 8th' superimposed in the vertical direction of the respective contour L _1.1 , L _1.3 and correspondingly detects the respective vertical transitions above and below the bright contour L _1.1 , L _1.3 to the dark background and determines the transition coordinates or transition points. This allows the height h of each contour to be determined.

4 shows a conveyor 5 for the workpiece 1 , being opposite to the workpiece 1 one each from lighting unit 2.2 'and camera 3 . 3 ' formed measuring device is provided. The one from the two cameras 3 . 3 ' Captured image data is transmitted via a common image processing system 6 processed and over a monitor 4 optically according to 3 shown. For the purpose of generating the triangulation angle γ, that of the respective lighting unit 2 . 2 ' generated light line 2.1 . 2.1 'over a deflection mirror 2.4 . 2.4 ' corresponding 1 on the side of the workpiece 1 and the conveyor 5 projected. For detecting the relative position between the workpiece 1 and the conveyor 5 this also has, opposite in the region of the respective measuring device, a first or second reference surface 5.1 . 5.2 on, with the respective distance between the part surface 1.1 and the reference surface 5.1 according to the triangulation method according to 1 can be determined. The same applies to the reference surface 5.2 and an unspecified part surface of the workpiece 1 on the opposite side.

On both sides of the floorboard 1 are each a measuring device with camera for the groove side and the spring side of the profile pair 3 and line projector 2 attached, the line projector via a mirror deflection 2.4 features.

In an extended version, not shown, further measuring devices are mounted, which specifically the spring side z. B. from above to take measurements that in the vertical direction to the workpiece 1 run and can not be detected by the two side of the plate mounted sensor units. In the case of z. B. all around profiled extrusion or rolled products such as plastic profiles or profile wires, etc. is an overlapping measurement with four or more measuring devices advantageous.

The two cameras 3 . 3 ' are with the image processing system 6 connected via a keyboard, not shown, and the monitor 4 as user interface.

For the production mode is the image processing system 6 equipped with interfaces that deliver in case of exceeding tolerance limits of the DUT signals for controlling not shown alarm devices, signing devices or generate a system stop signal.

The workpiece 1 according to 5 has a lateral groove, in contrast to the workpiece 1 according to 1 is also limited to the top. The front side is the light line 2.1 represented in principle, from the front with a triangulation angle γ on the faces 1.1 . 1.3 and 1.4 incident. Over the length of the contours L _1.1 , L _1.3 and L _1.5 thus formed, the height h ₁ to h _{3 of} the respective partial surfaces can be described as previously described 1.1 to 1.3 determine. From the offset v ₁ , taking into account the triangulation angle γ and other parameters, in particular the orientation of the optical axis 3.1 the camera 3 T ₂ depth gauge will be determined. Depending on the design of the workpiece 1 or alignment of the partial surfaces to be measured 1.2 to 1.3 is a corresponding orientation of the lighting unit 2 or the camera 3 necessary.

An in 6 illustrated monitor image represents the evaluation of the workpiece 1 according to 5 The camera image therefore captures the three contours L _1.1 , L _1.3 , L _1.5 , whereby the generation of the corresponding measurement lines 7 and 8th the evaluation of the length l ₁ to l _{5 of} the contour L _1.1 , L _1.3 , L _1.5 and thus the height h ₁ to h _{3 of} the respective sub-area 1.2 to 1.3 of the workpiece 1 he follows. In a similar way, horizontal measuring lines 7 generated and determined by the center determination of the respective measuring point structure S _1.1 to S _1.5 or contour L _1.1 to L _{1.5 of} the offset v ₁ and thus the depth dimension t ₂ .

1

Workpiece, floorboard

1.1

first area

1.2

second area

1.3

third area

2

lighting unit

2 '

lighting unit

2.1

light line

2.1 '

light line

2.2

second light line

2.4

deflecting

2.4 '

deflecting

3

first camera

3 '

second camera

3.1

optical axis

4

monitor

5

Conveyor

5.1

first reference surface

5.2

second reference surface

6

Image processing system

7

Measuring line vertical

7 '

Measuring line vertical

8th

Measuring line horizontal

8th'

Measuring line horizontal

a

Pitch

a '

second Pitch

b ₁

width

b ₂

width

F

Main direction

h ₁

height dimension

h ₂

height dimension

h ₃

height dimension

l

measure

₁

length

l ₃

length

₅

length

L _1.1

part the light line, contour

L _1.3

part the light line, contour

L _1.5

part the light line, contour

M _1.1

Focus

M _1.3

Focus

S

Boresight

S _1.1

Structure, Measuring points structure

S _1.3

Structure, Measuring points Structure

S _1.5

Structure, Measuring points Structure

t

depth

t ₂

Depth measurement, distance

v

measure

v ₁

offset, measure

α ₁

angle of incidence

α ₂

angle of incidence

α ₃

angle of incidence

δ

angle

γ

triangulation

Claims (33)

Measuring device for measuring a workpiece ( 1 ) with at least one to be measured, a height dimension h ₁ having the first surface ( 1.1 ) and at least one of the first surface ( 1.1 ) deviating second surface ( 1.2 ) with a first illumination unit ( 2 ), which have at least one light line ( 2.1 ) with a width b ₁ on the first surface ( 1.1 ) and at least one first camera ( 3 ) for detecting the on the workpiece ( 1 ) projected light line ( 2.1 ) for the purpose of evaluation by an image processing system ( 6 ), characterized in that the lighting unit ( 2 ) is designed and arranged such that the first surface ( 1.1 ) is illuminated more intensely than the second surface ( 1.2 ) and at least one of the height dimension h ₁ corresponding length l _{1 of} a on the first surface ( 1.1 ) projected part (L _1.1 ) of the light line ( 2.1 ) can be determined. Measuring device according to claim 1, characterized in that an angle of incidence α _{1 of} the light line ( 2.1 ) on the first surface ( 1.1 ) is adjustable between 0 ° and 60 °. Measuring device according to claim 1 or 2, characterized in that the lighting unit ( 2 ) is designed and arranged such that the angle of incidence α _{1 of} the light line ( 2.1 ) on the first surface ( 1.1 ) from an angle of incidence α ₂ on the second surface ( 1.2 ) deviates by more than 10 °. Measuring device according to one of the preceding claims, characterized in that simultaneously with the first surface ( 1.1 ) a third surface ( 1.3 ), which has a height dimension h ₂ , and an angle of incidence α _{3 of} the light line ( 2.1 ) on the third surface ( 1.3 ) is adjustable between 0 ° and 60 °. Measuring device according to one of the preceding claims, characterized in that the illumination unit ( 2 ) is designed and arranged such that the light line ( 2.1 ) with respect to the to be measured, a depth measure t ₂ having second surface ( 1.2 ) has a triangulation angle γ of more than 20 °, between which on the first surface ( 1.1 ) projected part (L _1.1 ) and one on the third surface ( 1.3 ) projected part (L _1.3 ) of the light line ( 2.1 ) can be generated on the basis of the triangulation angle γ a lateral offset v ₁ with v ₁ = t ₁ / tan γ. Measuring device according to claim 5, characterized in that the width b _{1 of} the light line ( 2.1 ) is at least as large as the offset v ₁ plus the depth dimension t ₂ . Measuring device according to one of claims 1 to 5, characterized in that for the ratio of the width b _{1 of} the light line ( 2.1 ) to the height to be measured h a value between 0.2 and 2 is provided or adjustable. Measuring device according to one of the preceding claims, characterized in that a second light line ( 2.2 ) is provided, wherein at least for the light line ( 2.2 ) the triangulation angle γ to the workpiece ( 1 ) is predictable. Measuring device according to one of the preceding claims, characterized in that the camera ( 3 ) an optical axis ( 3.1 ) and the illumination unit ( 2 ) has a main beam direction S, the optical axis ( 3.1 ) approximately normal to the surface ( 1.1 . 1.3 ) is alignable and between the optical axis ( 3.1 ) and the main beam direction S an angle δ is provided which is at most as large as the triangulation angle γ. Measuring device according to one of the preceding claims, characterized in that a conveying device ( 5 ) for the workpiece ( 1 ) is provided, which the workpiece ( 1 ) in the direction of a main conveying direction F linearly on the camera ( 3 ) and the lighting unit ( 2 ), wherein between the main conveying direction F and through the light line ( 2.1 ) plane spanned an angle with the size 90 ° - γ is provided. Measuring device according to one of the preceding claims, characterized in that the image processing system ( 6 ) a monitor ( 4 ) and the contour of the respective on the workpiece ( 1 ) projected part (L _1.1 , L _1.3 ) of the light line ( 2.1 ) is evaluable with respect to the dimensions l and v and the evaluation on the monitor ( 4 ) can be displayed. Measuring device according to claim 11, characterized in that by means of the image processing system ( 6 ) on the monitor ( 4 ) a structure (S _1.1 , S _1.3 ) can be generated from measuring points that at least a part of the contour of each projected part (L _1.1 , L _1.3 ) of the light line ( 2.1 ) or the brightness levels generated therewith on the workpiece ( 1 ), wherein a calibration or learning mode is provided, which ensures an optical superposition of the contour of the parts (L _1.1 , L _1.3 ) with the measuring point structure (S _1.1 , S _1.3 ). Measuring device according to claim 12, characterized in that that for the purpose of determining the dimensions l and v the measuring point structure can be calibrated and evaluated, being for the dimensions l and v different calibration and / or different Calibration factors are providable. Measuring device according to one of claims 11 to 13, characterized in that the image processing system ( 6 ) has tolerance values with respect to the dimensions h and v, at which point a signal can be generated and / or generated on the workpiece ( 1 ) is applicable. Measuring device according to one of claims 10 to 14, characterized in that the conveying device ( 5 ) at least one first reference surface ( 5.1 ), to which the light line ( 2.1 ) and a depth dimension a between the reference surface ( 5.1 ) and a surface ( 1.1 . 1.2 ) of the workpiece ( 1 ) can be determined. Measuring device according to one of claims 10 to 15, characterized in that an incremental encoder is provided, which determines the feed of the workpiece ( 1 ), and taking into account the feed and the distance a, the curvature of the workpiece ( 1 ) can be determined. Measuring device according to one of the preceding claims, characterized in that the illumination unit ( 2 ) an LED light source whose fluctuation range with respect to the wavelength of the emissable light is less than 10%. Measuring device according to one of the preceding claims, characterized in that in addition to the first measuring device opposite the workpiece ( 1 ) or to the conveyor ( 5 ) A second measuring device is provided. Measuring device according to one of claims 10 to 18, characterized in that the conveying device ( 5 ) a second reference surface ( 5.2 ) in the measuring range of the second measuring device, by means of a second distance measure a 'can be determined. Measuring device according to claim 19, characterized in that that the distance measure a determined by the first measuring device a and the second distance measure a 'determined with the second measuring device can be correlated are. Method for a device according to one of the preceding claims for measuring workpieces ( 1 ) with at least one to be measured, a height dimension h ₁ having the first surface ( 1.1 ), the first surface ( 1.1 ) by projecting the light line ( 2.1 ) is at least partially illuminated and at least the part (L _1.1 ) of the light line ( 2.1 ) through the camera ( 3 ) is detected for the purpose of evaluation, characterized in that the height dimension h _{1 of} at least the first surface ( 1.1 ) by determining the length l _{1 of} the on the first surface ( 1.1 ) projected part (L _1.1 ) of the light line ( 2.1 ) is determined. A method according to claim 21, characterized in that in addition (α to the incident angle of the projected line of light ₁ 2.1 ) the triangulation angle γ is provided, wherein the triangulation angle γ has a value between 20 ° and 65 °. Method according to one of claims 21 to 22, characterized in that a) the light line ( 2.1 ) on the second surface ( 1.2 ) and the third surface ( 1.3 ) of the workpiece ( 1 b) which is projected in a direction transverse to the direction of projection of the light line (FIG. 2.1 ) Generable offset v ₁ between the part (L _1.1 ) of the light line ( 2.1 ) on the first surface ( 1.1 ) and the part (L _1.3 ) of the light line ( 2.1 ) on the third surface ( 1.3 ), c) the depth dimension t _{2 of} the second surface ( 1.2 ), where t _{2 is} calculated over t ₂ = v ₁ tan γ. Method according to one of claims 21 to 23, characterized in that the workpiece ( 1 ) is guided past the measuring device transversely to the direction of projection. Method according to one of claims 21 to 24, characterized in that the profile of the on the workpiece ( 1 ) projected light line ( 2.1 ) with respect to the dimensions l and v via the image processing system ( 6 ) and the evaluation via the monitor ( 4 ) is shown. Method according to one of claims 21 to 25, characterized in that a) by means of the image processing system ( 6 ) on the monitor ( 4 ) a profile of the light line ( 2.1 ) or the generated brightness levels on the workpiece ( 1 ) at least partially corresponding contour of the respective illuminated parts (L _1.1 , L _1.3 ) is detected, b) the structure (S _1.1 , S _1.3 ) from measuring points on the monitor ( 4 ) is generated, the contour of the respective part (L _1.1 , L _1.3 ) of the light line ( 2.1 ) Corresponds, c) the respective contour and the corresponding measuring points structure (S _1.1, S _1.3) (on the monitor 4 ), d) the dimensions l and v are determined. Method according to one of Claims 21 to 26, characterized in that a) the correlation between the measuring points on which the measuring point structure (S _1.1 , S _1.3 ) is based and the contour of the parts (L _1.1 , L _1.3 ) is calibrated, b) the Height measurements h underlying measurement points and the depth of measurement t underlying measurement points are calibrated differently. Method according to one of claims 21 to 27, characterized in that a) a calibration information for the depth dimensions t and the height measurements h is displayed, b) the calibration information of the previously generated measuring point structure (S _1.1 , S _1.3 ) is automatically assigned. Method according to one of claims 21 to 28, characterized in that the distance measure a formed between the reference surface (15 5.1 ) of the measuring device and the surface ( 1.1 . 1.2 ) of the workpiece ( 1 ) is determined. Method according to one of claims 21 to 29, characterized in that opposite to the surface ( 1.2 ) the second distance measure a 'between the second reference surface ( 5.2 ) of the conveyor ( 5 ) and another surface of the workpiece ( 1 ) is determined. A method according to claim 30, characterized in that the distance measure a and the second distance measure a 'are correlated and a curvature of the workpiece ( 1 ) with respect to a transport plane. Method according to one of claims 21 to 31, characterized in that the width b _{1 of} the light line ( 2.1 ) is adjusted and / or varied. Method according to one of claims 21 to 32, characterized in that the of the lighting unit ( 2 ) emitted frequency range is adjusted and / or varied.