DD80779A1 - - Google Patents

Info

Publication number
DD80779A1
DD80779A1 DD13960169A DD13960169A DD80779A1 DD 80779 A1 DD80779 A1 DD 80779A1 DD 13960169 A DD13960169 A DD 13960169A DD 13960169 A DD13960169 A DD 13960169A DD 80779 A1 DD80779 A1 DD 80779A1
Authority
DD
German Democratic Republic
Application number
DD13960169A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to DD13960169A priority Critical patent/DD80779A1/xx
Priority to GB3529/70A priority patent/GB1286793A/en
Priority to DE2009307A priority patent/DE2009307C3/de
Priority to SU1421267A priority patent/SU398067A3/ru
Priority to PL1970140363A priority patent/PL69869B1/pl
Priority to FR7016423A priority patent/FR2042416B1/fr
Publication of DD80779A1 publication Critical patent/DD80779A1/xx

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/50—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
    • H10P72/57—Mask-wafer alignment

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
DD13960169A 1969-05-05 1969-05-05 DD80779A1 (cg-RX-API-DMAC7.html)

Priority Applications (6)

Application Number Priority Date Filing Date Title
DD13960169A DD80779A1 (cg-RX-API-DMAC7.html) 1969-05-05 1969-05-05
GB3529/70A GB1286793A (en) 1969-05-05 1970-01-24 Process and apparatus for the parallel alignment of a semi-conductor wafer relative to a mask
DE2009307A DE2009307C3 (de) 1969-05-05 1970-02-27 Verfahren und Vorrichtung zum parallelen Ausrichten einer Halbleiterscheibe gegenüber einer Maske
SU1421267A SU398067A3 (cg-RX-API-DMAC7.html) 1969-05-05 1970-04-03
PL1970140363A PL69869B1 (cg-RX-API-DMAC7.html) 1969-05-05 1970-05-02
FR7016423A FR2042416B1 (cg-RX-API-DMAC7.html) 1969-05-05 1970-05-05

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD13960169A DD80779A1 (cg-RX-API-DMAC7.html) 1969-05-05 1969-05-05

Publications (1)

Publication Number Publication Date
DD80779A1 true DD80779A1 (cg-RX-API-DMAC7.html) 1971-03-20

Family

ID=5481173

Family Applications (1)

Application Number Title Priority Date Filing Date
DD13960169A DD80779A1 (cg-RX-API-DMAC7.html) 1969-05-05 1969-05-05

Country Status (6)

Country Link
DD (1) DD80779A1 (cg-RX-API-DMAC7.html)
DE (1) DE2009307C3 (cg-RX-API-DMAC7.html)
FR (1) FR2042416B1 (cg-RX-API-DMAC7.html)
GB (1) GB1286793A (cg-RX-API-DMAC7.html)
PL (1) PL69869B1 (cg-RX-API-DMAC7.html)
SU (1) SU398067A3 (cg-RX-API-DMAC7.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT406100B (de) * 1996-08-08 2000-02-25 Thallner Erich Kontaktbelichtungsverfahren zur herstellung von halbleiterbausteinen

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3674368A (en) * 1970-05-11 1972-07-04 Johannsmeier Karl Heinz Out of contact optical alignment and exposure apparatus
FR2507695B1 (fr) * 1981-06-12 1986-05-23 Marchal Equip Auto Distributeur de courant haute tension, notamment pour un allumage de moteur a combustion interne
US7578642B2 (en) 2005-08-05 2009-08-25 The Boeing Corporation Flexible single rail drilling system
CN117572732A (zh) * 2024-01-16 2024-02-20 上海图双精密装备有限公司 调平辅助装置及调平方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT406100B (de) * 1996-08-08 2000-02-25 Thallner Erich Kontaktbelichtungsverfahren zur herstellung von halbleiterbausteinen

Also Published As

Publication number Publication date
PL69869B1 (cg-RX-API-DMAC7.html) 1973-10-31
FR2042416A1 (cg-RX-API-DMAC7.html) 1971-02-12
FR2042416B1 (cg-RX-API-DMAC7.html) 1974-06-14
DE2009307B2 (de) 1973-11-29
DE2009307C3 (de) 1974-06-27
GB1286793A (en) 1972-08-23
DE2009307A1 (de) 1970-11-19
SU398067A3 (cg-RX-API-DMAC7.html) 1973-09-17

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