DD51714A1 - Device for microscopic examination under high pressure at low temperatures - Google Patents

Device for microscopic examination under high pressure at low temperatures

Info

Publication number
DD51714A1
DD51714A1 DD11368865A DD11368865A DD51714A1 DD 51714 A1 DD51714 A1 DD 51714A1 DD 11368865 A DD11368865 A DD 11368865A DD 11368865 A DD11368865 A DD 11368865A DD 51714 A1 DD51714 A1 DD 51714A1
Authority
DD
German Democratic Republic
Prior art keywords
high pressure
under high
low temperatures
microscopic examination
examination under
Prior art date
Application number
DD11368865A
Other languages
German (de)
Inventor
Annelies Heymer
Hans Niegel
Wolfgang Schneider
Original Assignee
Annelies Heymer
Hans Niegel
Wolfgang Schneider
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Annelies Heymer, Hans Niegel, Wolfgang Schneider filed Critical Annelies Heymer
Priority to DD11368865A priority Critical patent/DD51714A1/en
Publication of DD51714A1 publication Critical patent/DD51714A1/en

Links

DD11368865A 1965-10-16 1965-10-16 Device for microscopic examination under high pressure at low temperatures DD51714A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DD11368865A DD51714A1 (en) 1965-10-16 1965-10-16 Device for microscopic examination under high pressure at low temperatures

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD11368865A DD51714A1 (en) 1965-10-16 1965-10-16 Device for microscopic examination under high pressure at low temperatures

Publications (1)

Publication Number Publication Date
DD51714A1 true DD51714A1 (en) 1966-12-05

Family

ID=37998292

Family Applications (1)

Application Number Title Priority Date Filing Date
DD11368865A DD51714A1 (en) 1965-10-16 1965-10-16 Device for microscopic examination under high pressure at low temperatures

Country Status (1)

Country Link
DD (1) DD51714A1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19803551C1 (en) * 1998-01-30 1999-08-26 Reck Sample cell for microscopic investigation under conditions of high pressure, combined with extreme heating or cooling
DE102005051386A1 (en) * 2005-10-27 2007-05-03 Forschungszentrum Rossendorf E.V. additional microscope
DE102005051406A1 (en) * 2005-10-27 2007-05-03 Forschungszentrum Rossendorf E.V. Optical coupling element for a flow cell
DE102005061984B4 (en) * 2005-12-23 2011-08-18 Forschungszentrum Jülich GmbH, 52428 Pressure cell for optical observation under pressure
DE102014018858B3 (en) * 2014-12-15 2015-10-15 Alfred-Wegener-Institut Helmholtz-Zentrum für Polar- und Meeresforschung High-pressure resistant sample chamber for transmitted light microscopy and method for its production

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19803551C1 (en) * 1998-01-30 1999-08-26 Reck Sample cell for microscopic investigation under conditions of high pressure, combined with extreme heating or cooling
DE102005051386A1 (en) * 2005-10-27 2007-05-03 Forschungszentrum Rossendorf E.V. additional microscope
DE102005051406A1 (en) * 2005-10-27 2007-05-03 Forschungszentrum Rossendorf E.V. Optical coupling element for a flow cell
DE102005061984B4 (en) * 2005-12-23 2011-08-18 Forschungszentrum Jülich GmbH, 52428 Pressure cell for optical observation under pressure
DE102005061984B9 (en) * 2005-12-23 2012-05-10 Forschungszentrum Jülich GmbH Pressure cell for optical observation under pressure
DE102014018858B3 (en) * 2014-12-15 2015-10-15 Alfred-Wegener-Institut Helmholtz-Zentrum für Polar- und Meeresforschung High-pressure resistant sample chamber for transmitted light microscopy and method for its production
WO2016095887A1 (en) 2014-12-15 2016-06-23 Alfred-Wegener-Institut High-pressure-resistance specimen chamber for transmitted light microscopy and method for producing same

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