DD288918A5 - METHOD FOR TESTING THE TIGHTNESS OF OPTOELECTRONIC COMPONENTS - Google Patents

Abstract

The invention relates to a method for testing the tightness of optoelectronic components. It is the object of the invention to provide a test method, with the tightness of Pillgehaeusen electronic components in the leak range 1mm can be detected. According to the invention, the devices to be tested are immersed for about 5 hours in a highly reflective dye solution and the solution is cooled to about 5 ° C. Anschlieszend the washed and dried components are led for leak testing under a corresponding light source. Underneath the light source, the leaking bodies marked with dye reflect on and can be sorted out. {Leakage test; optoelectronics; Electronic Components; Test methods; Mass production; Dye solution; Reflectance; Light source}

Description

Field of application of the invention

The invention relates to a method for testing the tightness of Gehäuson, which is in the electronics industry in the mass production of electronic components with Glasfonstor Anwondung.

Characteristics of the known prior art

For leak testing of electronic components, a variety of methods are known, which differ from each other in their detection limit (fine leak, large leak), their technical and technological complexity and their usability in mass production.

In the field of fine leak testing (<10 ~ ⁴ torr I s ~ ') are mainly Massonspoktromotrischo method using helium as a test gas application. Thus, for example, a helium leak detector for glass / metal prepackaged components is described in US Pat. No. 4,553,435. The disadvantages of such test gas methods are quite clearly rated in the DD WP 112690. They require testing immediately after filling the specimen with helium, since time losses favor the re-emergence of the test gas. For a 100% control in the mass production of electronic components, such a method is unsuitable. In the above-mentioned WP it is proposed to additionally evaluate the partial pressure of the air present in the housing anyway. In the field of large-scale testing (> 10 " ⁴ Torr I s ~ '), various methods of bladder testing are used, as described, for example, in DD WP 238109. These methods are quite reliable, but have mass production the disadvantage that the components must be checked more or less individually to determine leaking housing during the test.

In US PS 3675465 a leak test method is described, which is attributable to the weighing methods in which liquid is usually pressed under pressure in the leaky housing, which leads to the weight increase of the individual component. However, here again, the components have been balanced individually, which is feasible in production only in statistical quality controls.

According to DE OS 2812258, a special method for determining the microporosity of ampoules is the use of an aqueous fluorescence solution which is forced through the micro pore cracks of the ampoule and excited to fluoresce by means of exciting light. For this purpose, however, a complex detector Differenzslgnal circuit / arrangement is necessary. Also common in the manufacture of components are processes in which water vapor is pressed into leaky component housing by means of an autoclave and defective housings are determined by means of electrical measurements (eg short circuit). This test method has the disadvantage that components are destroyed by the thermo-mechanical stress. Furthermore, in the mass production of components, the period between Autoklavbelastimg and electrical assessment of the components is inevitably so large that components dry out in the meantime. As a result, leaky components reach the users.

Object of the invention

The aim of the invention is to increase the safety of the test method for testing the tightness of housings of optoelectronic components.

Explanation of the essence of the invention The invention has for its object to provide a test method of tightness of housings, with the tightness in Large leak area up to the transition area fine leak / large leak of housings with glass windows of electronic components,

In particular pillbox in mass production can be detected.

According to the invention the object of the invention is achieved in that the housing to be tested for several hours in one Dye solution containing highly reflective water-soluble dye left. Preferably, this is Dye solution an aqueous solution containing the highly reflective dye and a wetting agent. The dye solution penetrates into the leaky housing and the highly reflective dye remains even after possible Desiccation of the solution in the housing. Erfind.sgemäß is to subcool the dye solution after immersion of the housing, so that the penetration of the To accelerate dye solution in the leaky housing.

For tightness testing, the housings of the highly reflective dye solution are removed, washed in distilled water, then dried and led to any Vorweilzoit under a similar light source. Untor the light source reflect the filled with dye leaking housing intensive and can be sorted out very easily. The advantage of the method according to the invention is that the Gehäuso gorecht a mass production can dwell as bulk in the dye solution and the Zoit after removal from the dye solution and dom Check untor dor light source can be chosen arbitrarily. Leaking Bauelomonto are permanently marked. This greatly facilitates the production organization.

On the other hand, the 100% igo Dichthoitsprüfung can be automated by being included in the electronic evaluation of the components. The reliability in terms of tightness increases for the Elnzolbauolomonto, because the testedon components are marked with a great security.

Ausführungsbelsplel

The inventive method will be explained in more detail with reference to an embodiment.

For infrared phototransistors in metal-ceramic Pillgehä jse the tightness in Leckberoich S1 pm has been demonstrated. For this purpose, the components are immersed for about 6 hours in an aqueous dye solution.

In the embodiment, the solution consists of

strongly reflecting dye Basonyl red

distilled water

Wetting agents.

The dye solution with immersed housings is subcooled to about 5 ° C during the entire residence time. The dye solution penetrates into the leaky housing and the dye also remains in the housing after the components are removed from the solution, washed in distilled water and then dried. For leak testing, all components are guided under a light source corresponding to the reflectance of the dye, in the embodiment, a tungsten filament lamp. Under the light source, the interior reflects the filled with dye leaking housing intense, so that they can be sorted out very easily. The advantage of the method according to the invention is that the pillar housing, a mass production justice, can dwell as bulk material in the dye solution and the time after removal from the solution and testing under the light source can be chosen arbitrarily. This greatly facilitates the production organization. In addition, it is possible to automate the 100% leak test. For this purpose, an appropriate light source and a color detector is integrated in the electronic meter / evaluator. Since all leaky housings are reliably marked with highly reflective dye, they can be sorted out with great certainty, which increases the reliability of the components.

Claims (2)

1. A method for testing the tightness of housings of electronic components with liquids, in particular of housings with glass windows, characterized in that the housing dipped for several hours in a highly reflective dye solution, preferably in an aqueous solution with dye and a wetting agent and then washed and dried be and that after any time, the housing is guided under a corresponding light source and the leaky reflective housing are sorted out. 2. A method for checking the tightness of housings according to claim 1, characterized in that the highly reflective dye solution is subcooled after immersion of the housing.